Abstract: A switch matrix for selectively connecting at least one of N signal inputs to at least one of M signal outputs, N and M being integers greater than two, includes a cluster of N input switches arranged about each of the M signal outputs resulting in at least M clusters of N input switches, each input switch having a switch input and a switch output, the switch outputs being connected to respective signal outputs, the clusters and the input switches in the clusters being arranged to permit adjacent switch inputs of adjacent clusters to be connected to form input switch nodes; and a steering switch for each of the signal inputs. The steering switch selectably connects a signal input to an input switch node, wherein the combination of the steering switches and the input switches are operable to connect a desired signal input to a desired signal output.

Abstract: A measurement instrument for measuring the impedance of a device under test (DUT) includes a first source of either a voltage or a current and a second source of either a voltage or a current, wherein the first source is connectable in a first feedback relationship with the DUT and the second source is connectable in a second feedback relationship with both the DUT and the first source. The first and second sources are operated respectively as a current source responsive to the current through the DUT and a voltage source responsive to the voltage across the DUT or operated respectively as a voltage source responsive to the voltage across the DUT and a current source responsive to the current through the DUT. The second feedback relationship has a narrower bandwidth than the first feedback relationship. The resulting voltage across the DUT and the current through the DUT establish the measured impedance of the DUT.

Abstract: A triaxial cable having a center conductor; an outer shield conductor coaxial with the center conductor; and an inner shield conductor coaxial with the center conductor and located between the center conductor and the outer shield conductor. The inner shield conductor has a resistance adapted to control resonance on the inner shield.

Abstract: A method for making electrical measurements of a first and a second DUT, the DUTs being in sufficient proximity to exhibit crosstalk therebetween, the method comprising: applying a first signal to the first DUT; applying a second signal to the second DUT, the first signal and the second signal being contemporaneous and orthogonal to each other; measuring a first DUT response; and measuring a second DUT response. The first and second DUT responses exhibit independence from the second and first signals, respectively.

Abstract: The errors related to the resistance of test conductors and sense/load resistances for a pulse I-V measurement system are determined by making open circuit and through circuit measurements using a combination of DC and pulse instrument measurements.

Abstract: A zero-crossing detector includes a pair of input terminals, the terminals being adapted to receive an AC input signal; a rectifier, the rectifier rectifying the AC input signal; a current source, the current source being powered by the rectified AC input signal; and an optoelectric coupler having a coupler input and a coupler output, the coupler input being driven by the current source and the coupler output providing a zero-crossing signal. The zero-crossing signal is galvanicly isolated from the AC input signal.

Abstract: A solid state switch includes a solid state device having an input terminal, an output terminal and a gate terminal; a quick response circuit selectively operable to initially place the solid state device in a conducting state; and a sustained response circuit selectively operable to maintain the solid state device in the conductive state after the quick response circuit. The input terminal and the output terminal are connected when the solid state device is in the conducting state and the input and the output terminal are disconnected when the solid state device is not in the conducting state.

Abstract: A test instrument network for testing a plurality of DUTs includes a plurality of communicating script processors, the script processors being adapted to execute computer code; and a plurality of measurement resources controllable by the script processors in response to executed computer code, the measurement resources being adapted to test the DUTs. Each script processor and measurement resource may be arbitrarily assigned by the controller to one of at least two groups, only one script processor being assigned to be a master script processor, any other script processor being a slave script processor and any group not including the master script processor being a remote group. The master script processor is exclusively authorized to initiate code execution on any script processor in a remote group. Any slave script processor is only able to initiate operation of measurement resources in it own group.

Abstract: A method for operating a DAC to minimize digital feedthrough includes inputting a clock signal to a DAC clock input, the clock signal having a periodic series of trigger events, wherein input data must be present for a time window between a setup time before a trigger event and a hold time after the trigger event; generating an input data stream, the input data stream having data that is present for the time window; altering the input data stream into a cancellation data stream wherein the data presence is maintained but pseudo-data outside of the time window is added; and applying the cancellation data stream to a DAC data input resulting in an analog signal output.

Abstract: A method for measuring electrical parameters of a DUT having at least three terminals includes applying a first AC voltage to a first terminal; separately driving a second and a third terminal each to a virtual second AC voltage, each virtual voltage requiring a respective current; and measuring an electrical parameter of the DUT based on the first AC voltage and the second and third terminals each being at the virtual second AC voltage.

Abstract: A spatial transformer includes an insulating substrate; a plurality of test terminal assemblies on the substrate; and a plurality of contact surfaces on the transformer, each providing an interconnection point for electrical connection between a respective test terminal assembly and a device under test. Each test terminal assembly has a center conductor trace on an upper substrate surface; a lower substrate guard trace beneath the center conductor trace; and a pair of upper substrate guard traces adjacent to opposite sides of the center conductor trace, the guard traces being electrically interconnected. The guard traces in combination with the center conductor trace provide a desired characteristic impedance for an RF signal applied therebetween or a guarded DC connection for a DC signal applied to the center conductor trace and a DC guard applied to the guard traces.

Abstract: A guarded sense impedance for use in a measurement instrument includes a sense impedance adapted to have a spatially distributed electrical potential and at least one guard structure adapted to have the spatially distributed electrical potential. The guard structure is arranged to provide a spatially distributed guard potential for the sense impedance.

Abstract: A connection system for connecting test equipment to a device under test (DUT) includes a first pair of equal-length triaxial cables, each having a desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each first cable being connected to each other at respective proximal and distal ends of the first cables, the distal end of each first cable center conductor being connected to each other, and the distal end of each of a first cable intermediate conductor being connected to each other; and a second pair of equal-length triaxial cables, each having the desired characteristic impedance between a center conductor and an outer conductor, the outer conductor of each second cable being connected to each other at respective proximal and distal ends of the second cables as well as to the respective proximal and distal ends of the outer conductors of the first cables, the distal end of each second cable center conductor being connected to each other, and the distal e

Abstract: A bias tee for connecting a measurement device to a DUT, where the measurement device has a guard output, includes a DC port; a HF port; and a measurement port. The HF input port is guarded with the guard output during operation of the bias tee.

Abstract: A method for measuring a value of an electrical characteristic of a device under test in a circuit having a load impedance includes applying a voltage to said circuit, the voltage having a selected amplitude; measuring a current in the circuit in response to the voltage; calculating an error value using the impedance, amplitude and current; adjusting the amplitude using the error value; and repeating the preceding steps until the error value reaches a desired value. This results in the selected amplitude changing from an initial value to a final value and the current changing to a final value. The initial value of the selected amplitude and the final value of the current are used to determine the electrical characteristic value.

Abstract: A range-changing circuit includes an array of graduated impedances in serial relationship, and a voltage sensing and limiting switch across one of said impedances. The switch limits the voltage across said one of the impedances in response to a voltage sensed by the switch.

Abstract: A parallel test device for testing a DUT includes a controller that has a test procedure useful for both sequential and parallel testing, a test regimen that includes a parallel procedure, and a parallel wrapper applied to the test procedure to provide the parallel procedure; and a plurality of test instruments that test the DUT in response to the controller.

Abstract: A RF and pulse bias tee for use with a source measure unit (SMU) includes a SMU source terminal; a SMU measure terminal; an output terminal; a SMU measure terminal pulse/RF block between the SMU measure terminal and the output terminal; a SMU source terminal high frequency block having two end nodes and an intermediate node, the end nodes being connected between the SMU source terminal and the output terminal; a RF input; a pulse/DC block between the RF input and the output terminal; a pulse input; and a DC block between the pulse input and the intermediate node.

Abstract: A method for calibrating a pulsed measurement system, the system having a pulse generator unit, a measurement unit and a probe unit having a first and a second probe tip. The first tip, the pulse generator unit and the measurement unit are all interconnected by respective cables to a power divider network and an additional cable connects the second tip to the measurement unit. The method includes determining the transfer characteristics of the power divider network; measuring the characteristics of the system with the probe tips being open; measuring the characteristics of the system with the probe tips being interconnected; and calculating calibration constants for the system from the measurements and the transfer characteristics. The measurements are performed for pulses having specific characteristics.

Abstract: A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device, an error amplifier selectable to control the controlled current or voltage, the error amplifier providing an error signal for the control, and a floating buffer driving the series combination in response to the error signal.