Abstract: A calibration method for calibrating a phased array probe that is used for testing girth welds for defects. The method utilizes a calibration device on which is defined a series of reflectors that correspond to a series of target zones. The phased array probe is placed via a wedge relative to the calibration device and the phased array probe is configured with an initial set of acoustic parameters which define at least a transmitting aperture, a receiving aperture and a beam steering angle. Using a Full Matrix Capture (FMC) acquisition process and a ray-tracing module, the values of the initial set of acoustic parameters are optimized to evolve a final set of acoustic parameters which the phased array probe utilizes for testing actual devices for weld defects.

Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.

Abstract: An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.

Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.

Abstract: Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa·m1/2, wear coefficient higher than 100, and a magnetic susceptibility lower than 0.001.

Abstract: An instrument and a method of detecting a target element in a multi-layer thin coating. L?, L? and L? x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using L? and L? intensities once, and then using the L? and L? intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.

Abstract: An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors.

Abstract: A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.

Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.

Abstract: Disclosed are a method of and an apparatus devising a packet based DDS circuitry for performing packet based a direct digital synthesizing (DDS) function within an electronic testing instrument. The circuitry comprising a DDS logic circuit configured to execute direct digital syntheses on a plurality of consecutive packets of sine-like waves, each packet having a length of a period precisely chosen such that the sine wave at the end of one packet matches up with the sine wave at the start of the immediate subsequent packet. Also disclosed is an eddy current testing circuitry using multiple outputs of the single packet based DDS, one of the output is used in a circuit producing reference signals approximating the response signals. With the usage of the packet based DDS, the reference signal can be highly effective in nulling the unchanging portion of the response signals.

Abstract: Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. Embodiments of presently disclosed harmonic rejection filters are tunable and employed to effectively abate or eliminate signals with frequencies that are multiples of operating frequencies, resulting in the removal of the circling effects on the display.

Abstract: Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods.

Abstract: Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-D camera and visual feedback eyewear. The method including facilitating a virtual display of the inspection plan onto the visual feedback eyewear, moving the probe following the virtual display of the inspection plan, sensing sensed probe positions in real time of the inspection using the 3-D camera and validating the sensed probe position against the inspection plan using the control module. Then the information of the step of validating, such as those spots at which the probe is moved out of the tolerance of the inspection plan, is displayed on the feedback eyewear.

Abstract: A non-destructive inspection and testing instrument includes a housing and a first panel with a first type input to be assembled onto the housing and a second panel with a different, second type input to be assembled onto the housing. A first GUI module for the first panel implements a function upon an actuation of the first type input. A second GUI module for the second panel implements the same function upon an actuation of the second type input. A controller is configured to select the first GUI module when the first panel is associated with the instrument and to select the second GUI module when the second panel is associated with the instrument.

Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays.

Abstract: A pulse generation circuit and method includes using digital signals to trigger a first and second varying analog signals and detecting when they reach one or more reference levels. In response to the first and second varying analog signals reaching one or more reference levels, a first and a second digital control signals are produced and provided as input to a pulser producing a voltage excitation pulse having a width and timing defined by the first and second digital control signals.

Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.

Abstract: Disclosed is an improved method of sizing a defect using a phased array system with a single probe orientation requiring only a simple one-pass scan. It is an improvement of the ADDT standard which is adapted to phased array systems with fixed probe orientations. Based on pre-configured parameters obtained from C-scans, the method as presently disclosed provides novel analysis on C-scans and more complete information on defects, including the orientation and sizes in length and depth or thickness of the defects. Phased array systems devised with the presently disclosed method can perform such inspection and complete sizing automatically for longitudinal, transverse and oblique defects in one pass of scan.

Abstract: A device is disclosed for performing non-destructive inspection and testing (NDT/NDI) of an elongated test object, wherein the inspection system includes: a test object conveyor for conveying the test object along a longitudinal conveyance path; a probe assembly including phased-array probes, the probe assembly being configured to induce signals in the test object and sense echoes reflected from the test object; a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object; and a control system coupled to the test object conveyor and to the probe assembly conveyor and configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path.

Abstract: An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds.