Abstract: Disclosed is a Hall Effect instrument with the capability of compensating for temperature drift consistently, accurately and in real time of operation. The instrument embodies a four-point ohm meter circuit measuring Hall Effect sensor resistance and tracking the effect of temperature on the Hall Effect sensor. The instrument takes into account a relationship between the temperature and a temperature compensation index on a per probe basis, which has exhibited a deterministic difference observed by the present inventor.

Abstract: Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information.

Abstract: Disclosed is an ultrasonic device optimized with both averaging and dithery pulsing techniques. The averaging technique significantly removes white noise; on the other hand, the dithery pulsing significantly removes acoustic noise, which is otherwise accumulated during conventional averaging processes.

Abstract: A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations.

Abstract: A multi-frequency bond-testing system using acoustic probes in conjunction with NDT/NDI inspection instruments. Bond-testing of test objects is carried out at multiple discrete frequencies to produce a single, combined amplitude C-scan. Alternatively, or in combination, the system provides a single, combined phase C-scan to enable proper interpretation of the C-scans. Amplitude and/or phase readings on test objects are normalized at the selected frequencies relative to tests performed on a defect-free object at those frequencies. In this manner, the non-linear behavior of a bond-testing probe over a frequency range chosen for a given inspection is compensated for. The invention enables providing more easily interpretable and sharper images which enable a more reliable and faster reading and identification of defects in the test objects.

Abstract: Disclosed is a non-destructive testing instrument configured, when the digital signal is saturated during one data acquisition session, to display an indicator flag to warn the operator in order to help the operator to clearly see that a measurement is invalid. It's also configured to abandon and not to display the measurement results to stop any further analysis on them.

Abstract: A non-destructive inspection (NDI) instrument includes a sensor connection system configured to receive test signals from at least two different types of NDI sensors which are configured to obtain test signals from an object being tested. The sensor connection system has sensor-specific connection circuits and at least one common sensor connection circuit. A data acquisition circuitry is coupled to the sensor connection and has sensor-specific data acquisition circuits and at least one common data acquisition circuit. It is further coupled to a common digital data processor which executes sensor-specific processing modules and at least one common processing module. A common display screen and user interface is coupled to the data processor and enables programs including sensor-specific user interface modules and at least one common user interface module. The sensor types preferably include all of or any combination of an ultrasound sensor, an eddy current sensor and acoustic sensor.

Abstract: Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.

Abstract: The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The resulting thin-film eddy current array of coils configured to be placed parallel and against the test surface, and a corresponding eddy current circuitry operable to excite and receive eddy current from the array of coils. The array of coils forming at least a first inspection channel and a second inspection channel. The eddy current circuitry is configured and operable in a way that the one of the first pair of driver coils is usable as one of the second pair of driver coils; and one of the first pair of receiver coils is useable as one the second pair of receiver coils.

Abstract: The invention provides a method for compensating the sensitivity variations induced by lift-off variations for an eddy current array probe. The invention uses the eddy current array probe coils in two separate ways to produce a first set of detection channels and a second set of lift-off measurement channels without the need to add coils dedicated to the lift-off measurement operation. Another aspect of the invention provides an improved calibration process which combines the detection and lift-off measurement channel calibration on a simple calibration block including a reference defect without the need of a pre-defined lift-off condition.

Abstract: An orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal [b1] prism. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe provides advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions.

Abstract: Disclosed is an ultrasonic phased array non-destructive inspection system that includes a PA probe, a conventional PA inspection unit and a refraction angle verification unit. The PA inspection unit is employed to emit ultrasonic angle beams into an AWS IIW Block and to receive a set of corresponding echo signals reflected from the calibration block and to provide time-of-flight (TOF) values corresponding to each angle beam. The refraction angle verification unit then provides a true angle for each of the angle beams based on the ultrasonic and geometric characteristics of the block and the measured TOF values. Other calibration blocks such as the DSC and Nayships blocks can also be used for this purpose.

Abstract: Disclosed is a method and a phased array inspection device enabling calibration of the device with an optimized pulse rate, the pulse rate is derived based on the true adaptive value of the impedance of the specific phased array probe circuit or the pulser circuit and the circuit energy consumption limitations. The energy consumption limitations include the total energy made available by the power supply to the pulser and probe circuit and the pulser energy consumption with limitation due to pulser circuit's physical limit such as thermal limitation.

Abstract: A system and method suitable for producing user designated views of non-destructive inspection target with adjustable color, opacity and/or fill-patterns in coordination of the display of inspection scan images. The geometric definition of the inspection target and the inspection scan area are both prepared by independent processes under which vertices and respective primitives are established. The inspection target primitives are given an alpha texture that includes color, opacity and/or fill-pattern designated by the user. The scan area primitives are mapped by a color and/or opacity texture representing inspection signal information such as amplitude. An efficient commercially available graphics accelerator is used to render both of the images of inspection target's chosen view and that of scanned area. The method allows implementation in real-time and on hand-held devices.

Abstract: A weld seam tracking device for tracking weld seams on pipes or the like uses NDT/NDI sensor(s) in conjunction with an NDT/NDI operation, such as an ultrasonic phased array (PA) inspection. Processing of the weld seam tracking data is integrated or combined with the existing data processing element of the existing NDT/NDI inspection devices. Wide scanning areas of phased array probes allow weld seam tracking and inspection to be performed using a single set of probe and data processing elements to achieve both fault scanning and seam tracking with a single run of the PA scan.

Abstract: Disclosed are a method and an NDT/NDI inspection device deploying digital circuitry to conduct detection and compensation of phase and amplitude shift in responding signals. A digital waveform generator, such as a direct digital synthesizer (DDS) is used to generate a digital sine-wave of a specific frequency and amplitude, mimicking the pulser frequency and amplitude. The sine-wave is converted to analog signal through a DAC and transmitted to the transducer. The received analog sine-wave from the transducer is converted back to a digital signal through an ADC. The transmitted and received digital signals are then compared for phase and amplitude differences. A null circuit involving another waveform generating component is employed to compensate the detected phase and amplitude differences. As a result the phase and amplitude differences are effectively eliminated before being further processed and analyzed for defects information.

Abstract: Disclosed is a method and an NDT/NDI calibration process that automatically detects erroneous TOF readings by providing a predetermined time acceptance window. During the calibration process, TOF readings acquired by a UT device are validated to determine whether the TOF reading for the thin test block falls within the range of the predetermined time acceptance window. If the TOF reading for the thin block (T2) falls out of the predetermined time acceptance window, the operator is alerted of an error and to repeat the TOF test for the thin block.

Abstract: A non-destructive inspection (NDI) instrument includes a sensor connection system configured to receive test signals from at least two different types of NDI sensors which are configured to obtain test signals from an object being tested. The sensor connection system has sensor-specific connection circuits and at least one common sensor connection circuit. A data acquisition circuitry is coupled to the sensor connection and has sensor-specific data acquisition circuits and at least one common data acquisition circuit. It is further coupled to a common digital data processor which executes sensor-specific processing modules and at least one common processing module. A common display screen and user interface is coupled to the data processor and enables programs including sensor-specific user interface modules and at least one common user interface module. The sensor types preferably include all of or any combination of an ultrasound sensor, an eddy current sensor and acoustic sensor.