Abstract: Provided herein are systems and methods for an intelligent diagnostic probe configured to provide troubleshooting guidance during diagnosing faults within vehicle electrical systems. The intelligent diagnostic probe is configured, in some embodiments, to receive raw measurement data, such as voltage, current, and resistance, from tools and take the data into an intelligence system so as to interpret the data and provide actionable output for practitioners operating the intelligent diagnostic probe. The intelligent diagnostic probe is configured, in some embodiments, to divide vehicle electrical diagnosis procedures of into segments, include appropriate tolerance ranges for readings, and provide feedback and suggestions regarding the readings. The intelligent diagnostic probe is configured, in some embodiments, to operate as an artificial intelligence that uses a large number of previously coded measurements to learn to accurately diagnose electrical faults based on currently measured raw data.

Abstract: An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Abstract: An apparatus and a method are provided for a modular lighting system. In one embodiment, the modular lighting system comprises a compact and lightweight outer enclosure that features a plurality of lighting elements. It is envisioned that a subsection of the lighting elements is static, in that it may not be removed from the outer enclosure. The plurality of lighting elements are configured so that they may be detached from the outer enclosure and placed at locations based on the user's discretion so as to substantially reduce shadows and illuminate key areas. The modular lighting system may be operated wirelessly. In at least one embodiment, the detachable lighting elements include independent power sources.

Abstract: An apparatus is provided for a diagnostic circuit test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof in powered and unpowered states. The diagnostic circuit test device comprises a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto. A power supply is interconnected between an internal power source and the conductive probe element. Processors are electrically connected to the conductive probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal. The output signal is representative of at least one of the parameters of the electrical system. A display device is configured to display a reading of the output signal which is representative of the parameter.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: A conductive probe may include a probe body for communicating with a circuit tester or a jumper. The probe body may be formed of metal and may have a free end. A probe tip may be mounted to the end of the probe body. The probe tip may be formed of thorium-tungsten. The probe tip may be configured for contacting a circuit node.

Abstract: An apparatus and a method are provided for a flexible work light comprising an elongate member comprising a translucent material capable of being shaped. A lighting source is housed within, and protected by, the elongate member. One or more support members are attached to the lighting source and extend from a proximal portion to a distal portion of the work light. An electronics housing and a plurality of end caps are respectively disposed on the proximal and distal portions of the work light.