Abstract: Disclosed herein are system, method and computer program product embodiments for utilizing soft programming a nonvolatile memory. An embodiment operates by sequentially applying a single soft programming voltage pulse to all memory cells along each word line in the nonvolatile memory that fail soft programming verification in a first phase. This sequential application of the single soft programming voltage pulse in the first phase may repeat a predetermined number of times or until a threshold is met. Once the predetermined number of times completes, or the threshold is met, soft programming proceeds to a second phase where soft programming remains with each word line until all memory cells along the word line passes soft programming verification.

Abstract: A system and method for programming a memory device with debug data upon a system failure is disclosed herein. For example, the system can include a timer device, a buffer, a register, and a memory device. The buffer can be configured to receive debug data. The register can be configured to receive memory address information. Also, the memory device can be configured to store the debug data from the buffer at a memory address corresponding to the memory address information when a timer value of the timer device reaches zero. Further, the system can include a processing unit configured to provide the timer value to the timer device and the memory address information to the register.

Abstract: A method, apparatus, and tangible computer readable medium for processing a Hidden Markov Model (HMM) structure are disclosed herein. For example, the method includes receiving Hidden Markov Model (HMM) information from an external system. The method also includes processing back pointer data and first HMM states scores for one or more NULL states in the HMM information. Second HMM state scores are processed for one or more non-NULL states in the HMM information based on at least one predecessor state. Further, the method includes transferring the second HMM state scores to the external system.

Abstract: Disclosed herein is a semiconductor device comprising a first dielectric disposed over a channel region of a transistor formed in a substrate and a gate disposed over the first dielectric. The semiconductor device further includes a second dielectric disposed vertically, substantially perpendicular to the substrate, at an edge of the gate, and a spacer disposed proximate to the second dielectric. The spacer includes a cross-section with a perimeter that includes a top curved portion and a vertical portion substantially perpendicular to the substrate. The perimeter further includes a discontinuity at an interface of the top curved portion with the vertical portion. Further, disclosed herein are methods associated with the fabrication of the aforementioned semiconductor device.

Abstract: Disclosed herein are system, apparatus, methods and/or combinations and sub-combinations thereof, for using a read data strobe signal received at a host device from a peripheral device to convey variable latency (flow) control or report an error in the data content read from the peripheral device. Reception of the read data strobe signal before a predetermined maximum latency time, provides variable latency control back to the host by indicating when valid data is available for capture. If the read data strobe signal is not received before expiration of a predetermined maximum latency time, the peripheral controller is indicating a read data error back to the host.

Abstract: Computer-based speech recognition can be improved by recognizing words with an accurate accent model. In order to provide a large number of possible accents, while providing real-time speech recognition, a language tree data structure of possible accents is provided in one embodiment such that a computerized speech recognition system can benefit from choosing among accent categories when searching for an appropriate accent model for speech recognition.

Abstract: A system and method for providing electrical isolation between closely spaced devices in a high density integrated circuit (IC) are disclosed herein. An integrated circuit (IC) comprising a substrate, a first device, a second device, and a trench in the substrate and a method of fabricating the same are also discussed. The trench is self-aligned between the first and second devices and comprises a first filled portion and a second filled portion. The first fined portion of the trench comprises a dielectric material that forms a buried trench isolation for providing electrical isolation between the first and second devices. The self-aligned placement of the buried trench isolation allows for higher packing density without negatively affecting the operation of closely spaced devices in a high density IC.

Abstract: A system and method for providing electrical isolation between closely spaced devices in a high density integrated circuit (IC) are disclosed herein. An integrated circuit (IC) comprising a substrate, a first device, a second device, and a trench in the substrate and a method of fabricating the same are also discussed. The trench is positioned between first and second devices and comprises a first filled portion and a second filled portion. The first filled portion of the trench comprises a dielectric material that forms a buried trench isolation for providing electrical isolation between the first and second devices.

Abstract: Disclosed are methods, circuits, apparatuses and systems for providing power to a dynamic load such as a non-volatile memory array. According to embodiments, a voltage source may be adapted to generate and output a supply current at substantially a target voltage through a regulating transistor whose channel is in series between an output terminal of said charge pump and an input terminal of said NVM array. A discharge circuit branch coupled to an output terminal of the regulating transistor may be adapted to drain away current from the regulating transistor output terminal when a voltage at the regulating transistor output terminal exceeds a first defined threshold voltage. A bulk regulating circuit branch coupled to a bulk of the regulating transistor may be adapted to reduce a bulk-voltage of the regulating transistor when a voltage at the regulating transistor output terminal exceeds a defined threshold voltage.

Abstract: A semiconductor may include several vias located in an active region and a die seal region. In the active region, a photoresist can be patterned with openings corresponding to the vias. In the die seal area, however, the photoresist can be patterned to overlap the vias. With this configuration, an underlayer etch will not affect an underlayer resist in the die seal area, allowing the die seal area to be disregarded for purposes of calculating a process window.

Abstract: A semiconductor device includes bit lines provided in a semiconductor substrate; an ONO film that is provided along the surface of the semiconductor substrate and is made of a tunnel oxide film, a trap layer, and a top oxide film; and an oxide film that is provided on the surface of the semiconductor substrate in the middle between the bit lines and contacts the side face of the ONO film, in which the film thickness of the oxide film is larger than the sum of the thicknesses of the tunnel oxide film and the top oxide film, and smaller than the thickness of the ONO film.

Abstract: The present invention provides a semiconductor memory and a control method therefor, the semiconductor device including a first current-voltage conversion circuit connected to a core cell provided in a nonvolatile memory cell array, a second current-voltage conversion circuit connected to a reference cell through a reference cell data line, a sense amplifier sensing an output from the first current-voltage conversion circuit and an output from the second current-voltage conversion circuit, a compare circuit comparing a voltage level at the reference cell data line with a predefined voltage level, and a charging circuit charging the reference cell data line, if the voltage level at the reference cell data line is lower than the predefined voltage level during pre-charging the reference cell data line. According to the present invention, the pre-charging period of the reference cell data line can be shortened, and the data read time can be shortened.

Abstract: Disclosed herein are system, method and computer program product embodiments for utilizing soft programming a nonvolatile memory. An embodiment operates by sequentially applying a single soft programming voltage pulse to all memory cells along each word line in the nonvolatile memory that fail soft programming verification in a first phase. This sequential application of the single soft programming voltage pulse in the first phase may repeat a predetermined number of times or until a threshold is met. Once the predetermined number of times completes, or the threshold is met, soft programming proceeds to a second phase where soft programming remains with each word line until all memory cells along the word line passes soft programming verification.

Abstract: Embodiments of the present invention include an apparatus, method, and system for calculating senone scores for multiple concurrent input speech streams. The method can include the following: receiving one or more feature vectors from one or more input streams; accessing the acoustic model one senone at a time; and calculating separate senone scores corresponding to each incoming feature vector. The calculation uses a single read access to the acoustic model for a single senone and calculates a set of separate senone scores for the one or more feature vectors, before proceeding to the next senone in the acoustic model.

Abstract: Disclose is a non-volatile memory (NVM) cell sensing circuit. The sensing circuit may include a sense-side-line conditioning circuit segment adapted to condition a sense-side-line of the NVM cell. Conditioning may include adjusting a charge density within the NVM cell sense-side-line during a first NVM cell current sensing phase. The conditioning circuit segment may also be adapted to maintain an NVM cell current sensing condition during a second NVM cell current sensing phase. Adjusting a charge density within the NVM cell sense-side-line may include inducing current in the sense-side-line in a direction opposite to the sensing current.

Abstract: A memory device is provided. The memory device includes a preamble disable memory and a memory controller. The preamble disable memory is arranged to store preamble disable data. The preamble disable data includes an indication as to whether a read preamble should be enabled or disabled. In response to a read command, if the preamble disable data includes an indication that the read preamble should be enabled, the memory controller provides the read preamble. Alternatively, in response to the read command, if the preamble disable data includes an indication that the read preamble should be disabled, the memory controller disables the read preamble.

Abstract: A control circuit for controlling a power supply including a first switch and a second switch coupled in series between a first potential and a second potential. The control circuit includes a detection circuit that detects a magnitude relation of a voltage value at a node between the first and second switches and a reference value during a period in which the first switch and the second switch are inactivated. The detection circuit generates a control signal corresponding to the magnitude relation. A regulation circuit regulates a switching timing of the second switch in response to the control signal to decrease a difference between the voltage value at the node and the reference value.

Abstract: Methods for fabricating a FIN structure with a semicircular top surface and rounded top surface corners and edges are disclosed. As a part of a disclosed method, a FIN structure is formed in a semiconductor substrate. The FIN structure includes a top surface having corners and edges. The FIN structure is annealed where the annealing causes the top surface to have a semicircular shape and the top surface corners and edges to be rounded.

Abstract: Efficient and convenient storage systems and methods are presented. In one embodiment, a fractured erase process is performed in which a pre-program process, erase process and soft program process are initiated independently. Memory cells can be pre-programmed and conditioned independent of an erase command. The initiation of the independent pre-programming is partitioned from an erase command which is partitioned from initiation of a soft-programming command. A cell is erased wherein the erasing includes erase operations that are partitioned from the pre-preprogramming process. In one embodiment, the independent pre-program process is run in the background.

Abstract: An apparatus and method for testing is provided. An integrated circuit includes a comparison circuit that is arranged to trip based on a power supply signal reaching a trip point. The integrated circuit also includes an analog-to-digital converter that is arranged to convert the power supply signal into a digital signal. The integrated circuit also includes a storage component that stores a digital value associated with the digital signal, and provides the power supply value at an output pin of the integrated circuit. The integrated circuit includes a latch that is coupled between the analog-to-digital converter and the storage component. The latch is arranged to open when the comparison circuit trips, such that, when the comparison circuit trips, the storage component continues to store a digital value such that the digital value corresponds to the voltage associated with the power supply signal when the comparison circuit tripped.