Patents Assigned to Testing Technologies, Inc.
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Patent number: 8788228Abstract: Method for validating a single waveform or series of waveforms that are intended for evaluating signals within an automated testing environment. Test signal data is supplied by an external source. The method creates a golden template from a known, good instance of the waveform under test and algorithmically applies it to other waveforms under test to determine compliance. In the application to video waveforms, timing parameters, deflection parameters and image content parameters are simultaneously tested resulting in efficient concrete and tangible results. Instead of providing the known, good instance of the waveform under test to a processor that implements the method, descriptive parameters of the known, good instance of the waveform may be provided to the processor that calculates data points of the expected video waveforms and then determines rules for the waveform based on the calculated data points.Type: GrantFiled: September 21, 2011Date of Patent: July 22, 2014Assignee: Advanced Testing Technologies, Inc.Inventors: William Biagiotti, Eli Levi, William Harold Leippe
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Patent number: 8782558Abstract: Method, system and computer program for visually highlighting identified failing or erroneous pixel elements of a two-dimensional electronic image. Different visual highlighting techniques are stored in memory. A user selects one of the highlighting techniques using a user interface. A processor applies the selected technique(s) to the image and displays the image on a display with visual indications of the failing pixel elements. The techniques include coloring the pixels with a boundary box enclosing all of the erroneous pixels, enclosing separate irregular-shaped groupings of the pixels with a contour-type boundary line, and coloring pixels and enclosing each within a separate box. In the final technique, video lines with some failing pixels, but within allowable tolerances, will have those pixels colored differently and each pixel is enclosed within the same color box. In all cases, it is possible to convert the test image to black and white for display.Type: GrantFiled: September 16, 2013Date of Patent: July 15, 2014Assignee: Advanced Testing Technologies, Inc.Inventors: William Biagiotti, Eli Levi
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Patent number: 8655617Abstract: Method for validating a single waveform or series of waveforms that are intended for evaluating signals within an automated testing environment. Test signal data is supplied by an external source. The method creates a golden template from a known, good instance of the waveform under test and algorithmically applies it to other waveforms under test to determine compliance. In the application to video waveforms, timing parameters, deflection parameters and image content parameters are simultaneously tested resulting in efficient concrete and tangible results. Instead of providing the known, good instance of the waveform under test to a processor that implements the method, descriptive parameters of the known, good instance of the waveform may be provided to the processor that calculates data points of the expected video waveforms and then determines rules for the waveform based on the calculated data points.Type: GrantFiled: July 3, 2013Date of Patent: February 18, 2014Assignee: Advanced Testing Technologies, Inc.Inventors: William Biagiotti, Eli Levi, William Harold Leippe
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Patent number: 8648869Abstract: Method of capturing multiple format video signals and reformatting them in real-time for display on generic external monitors, is disclosed. This method is intended for, by not limited to, implementation on a multiple function video test instrument with video generation and video capture capabilities. The method is capable of operating with standard and non-standard format synchronized video waveforms and also with deflection-driven video waveforms. Since this innovative method reuses already available functionality in the video test instrument, the new functionality is realized efficiently, economically and does not require any more space within the test instrument.Type: GrantFiled: February 11, 2013Date of Patent: February 11, 2014Assignee: Advanced Testing Technologies, Inc.Inventors: William Biagiotti, Peter F Britch, David R Howell
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Patent number: 8643725Abstract: Method and system for validating video monitors, gauges, indicators and controls within their installed environment is disclosed. The methods do not require access to the electronic signals that control or stimulate those devices. Direct visual capture of the instruments under test is provided along with a novel sequence of operations to compare the present visual presentation to a known-good reference image and optionally, to known-bad reference images. When the method is applied to complex and interconnected systems, such as aircraft cockpits, tangible benefits are realized, including minimizing equipment removal and quicker fault isolation.Type: GrantFiled: March 1, 2013Date of Patent: February 4, 2014Assignee: Advanced Testing Technologies, Inc.Inventors: William Biagiotti, Eli Levi
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Patent number: 8497908Abstract: Arrangement of circuit cards and enclosures in a unified video test apparatus wherein the circuit boards may be arranged within a single enclosure, having a size spanning two slots of an instrument chassis wherein each circuit board includes none, some or all of the functional modules of the video test apparatus. Alternatively, the circuit boards are arranged in different enclosures, with each circuit board including some of the functional modules of the video test apparatus, and the different enclosures may be arranged in a common instrument chassis or in different instrument chassis. A single or multiple software interfaces in a host computer can control the functional modules in the different enclosures in the same or different chassis to cause the arrangement to appear as a homogenous instrument regardless of location of the functional modules, and coordinates interaction between the functional modules.Type: GrantFiled: December 13, 2011Date of Patent: July 30, 2013Assignee: Advanced Testing Technologies, Inc.Inventors: William Biagiotti, Eli Levi
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Patent number: 8489381Abstract: Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.Type: GrantFiled: March 5, 2012Date of Patent: July 16, 2013Assignee: Advanced Testing Technologies, Inc.Inventors: Robert Spinner, Eli Levi, William Harold Leippe, Emery Korpi, Michael Lai, James Kuveikis, Richard E. Chalmers, Richard Engel, Peter F. Britch, William Biagiotti, David Howell
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Patent number: 8484618Abstract: Electronic test system including hardware and software components and method of use which provide obsolescence mitigation. A test program set (TPS) including a test program test is created to enable units to be tested. When a new component is introduced, the change is detected and a new TPS is created with at least part of the test program test. If the new TPS complies with defined, governing rules for the system, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.Type: GrantFiled: November 23, 2011Date of Patent: July 9, 2013Assignee: Advanced Testing Technologies, Inc.Inventor: Robert Spinner
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Patent number: 8469723Abstract: Re-configurable electrical connector including a pair of endcaps, a pair of elongate rails, each removably attached at one end to one of the endcaps, and connector modules arranged between the endcaps and including one or more male or female connecting members adapted to electrically connect at a first end to one electrical component or part thereof and at a second, opposite end to another electrical component or part thereof. Each connector module includes connecting members adapted to electrically connect at a first end to a first electrical component or part thereof and at a second, opposite end to a second electrical component or part thereof, and a bend between the first and second ends such that a plane in which the first end of the connecting member is situated is not parallel to a plane in which the second end of the connecting member is situated.Type: GrantFiled: March 1, 2011Date of Patent: June 25, 2013Assignee: Advanced Testing Technologies, Inc.Inventor: Thomas Leddy
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Patent number: 8359504Abstract: A digital functional test system incorporating both digital stimulus and digital response/compare capability for digital electronic circuitry. The system includes a chassis and a single width VME eXtensions for Instrumentation (VXI) module arranged in or on the chassis. The single width VXI module includes a timing sub-module that generates a stimulus clock signal and a response clock signal, eight pattern sub-modules, and a master oscillator sub-module that provides a clock signal. Each pattern sub-module receives the stimulus and response clock signals, and the clock signal from the master oscillator sub-module, and includes a pattern generating module, a stimulus memory component that stores stimulus data outgoing from the pattern generating module, a response memory component that records response data incoming to the pattern generating module, and a compare reference memory component that provides a reference for a compare function of the recorded response data in the response memory component.Type: GrantFiled: May 18, 2010Date of Patent: January 22, 2013Assignee: Advanced Testing Technologies, Inc.Inventors: Marc Pogosky, Richard Engel, Eli Levi
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Patent number: 8359585Abstract: Methods and systems for obsolescence mitigation of electronic systems including hardware and software components, in particular methods and systems for managing obsolete instrument hardware and application software used in legacy Automated Test Systems (ATS) or Automatic Test Equipment (ATE). When one or more components of a test program set (TPS) has been rendered obsolete, migration to one or more replacement instruments without any impact to the TPS or other remaining legacy instruments in the ATE or ATS is obtained by a translator module interposed between the new instrument and the system bus for translating instructions for the obsolete instrument or set of instruments into instructions or procedures for the new instrument whereby the new instrument thus functions in the same manner as the obsolete instrument or set of instruments.Type: GrantFiled: November 13, 2007Date of Patent: January 22, 2013Assignee: Advanced Testing Technologies, Inc.Inventors: Robert Spinner, William Harold Leippe, James McKenna, Timothy Fox
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Patent number: 8356282Abstract: Integrated application of specific CASE tools that allow a user to accomplish instrument programming and control when generating, capturing and/or analyzing electronic signals, and in doing so automatically generate automation code to replicate a desired instrument setup, acquisition, analysis and sequence control. The CASE tools include, but are not limited to, GUI instrument programming tools, an electronic signal redisplay tool, a waveform analyzer tool, automated code generation tools, macro generation tools, macro and sequence playback tools, a test creation tool, a test sequencer tool, a decision engine that may be part of the test sequencer tool, and test result data logger. A method for analyzing electronic signals that enables multiple tests to be performed after a single signal acquisition, and enables results from the multiple tests to be analyzed is also disclosed.Type: GrantFiled: September 20, 2011Date of Patent: January 15, 2013Assignee: Advanced Testing Technologies, Inc.Inventors: William Harold Leippe, William Biagiotti, Eli Levi, Robert Spinner
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Patent number: 8300153Abstract: Video selection display unit that is capable of routing real-time output signals having a video component from different video signal sources, e.g., different instruments or home entertainment devices, to a single output for display on a monitor or other type of video display. The video selection display unit may be part of an automatic test system or home entertainment system. Control of the video selection display unit can be effected locally via a user interface, such as one or more pushbuttons, and/or remotely over a network which may be the same network used for communication with the instruments or devices or using an infrared remote control unit.Type: GrantFiled: March 6, 2008Date of Patent: October 30, 2012Assignee: Advanced Testing Technologies, Inc.Inventors: Richard Engel, Robert Spinner, William Harold Leippe
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Patent number: 8269529Abstract: Very low phase noise radio frequency (RF) source having multiple discrete frequency outputs used, for example, to calibrate phase noise measurement systems. The calibrator output frequencies can be tailored for a particular application using a scalable architecture.Type: GrantFiled: July 13, 2011Date of Patent: September 18, 2012Assignee: Advanced Testing Technologies, Inc.Inventors: Shahen Minassian, Eli Levi, Richard Engel
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Publication number: 20120225592Abstract: Re-configurable electrical connector including a pair of endcaps, a pair of elongate rails, each removably attached at one end to one of the endcaps, and connector modules arranged between the endcaps and including one or more male or female connecting members adapted to electrically connect at a first end to one electrical component or part thereof and at a second, opposite end to another electrical component or part thereof. Each connector module includes connecting members adapted to electrically connect at a first end to a first electrical component or part thereof and at a second, opposite end to a second electrical component or part thereof, and a bend between the first and second ends such that a plane in which the first end of the connecting member is situated is not parallel to a plane in which the second end of the connecting member is situated.Type: ApplicationFiled: March 1, 2011Publication date: September 6, 2012Applicant: ADVANCED TESTING TECHNOLOGIES, INC.Inventor: THOMAS LEDDY
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Patent number: 8249845Abstract: Arrangement and method for simulating electro-mechanical systems includes a simulator for simulating an operating environment of a plurality of different electro-mechanical systems, a first interface unit for enabling the simulator to interface with a host computer and input/output devices, and a second interface unit for enabling the simulator to be reprogrammed and re-configured to enable simulation of the operating environment of the different electro-mechanical systems. The simulator may include a user-programmable field programmable gate array and a digital signal processing unit coupled to the field programmable gate array.Type: GrantFiled: April 9, 2008Date of Patent: August 21, 2012Assignee: Advanced Testing Technologies, Inc.Inventors: Peter F. Britch, Emery Korpi
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Patent number: 8248297Abstract: System that measures absolute or additive phase noise includes a power divider for dividing an input RF signal, a local oscillator, two mixers, each arranged in a path of a respective signal component from the power divider and receiving input from the power divider and local oscillator, two digital radio frequency memories, each associated with a respective mixer and receiving an input signal therefrom, and a digital signal processor that receives signals from the digital radio frequency memories and outputs a digital data stream indicative of measured phase noise. For absolute phase noise measurement, phase noise of the input RF signal is provided. For additive phase noise measurement, a unit under test is arranged in one of the paths between the power divider and the mixer. The system may be interposed between a radar transmitter of a radar environment simulator and a radar receiver coupled to a radar target display.Type: GrantFiled: September 20, 2011Date of Patent: August 21, 2012Assignee: Advanced Testing Technologies, Inc.Inventors: John Baker, Eli Levi
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Publication number: 20120072774Abstract: Electronic test system including hardware and software components and method of use which provide obsolescence mitigation. A test program set (TPS) including a test program test is created to enable units to be tested. When a new component is introduced, the change is detected and a new TPS is created with at least part of the test program test. If the new TPS complies with defined, governing rules for the system, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.Type: ApplicationFiled: November 23, 2011Publication date: March 22, 2012Applicant: ADVANCED TESTING TECHNOLOGIES, INC.Inventor: ROBERT SPINNER
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Patent number: 8131529Abstract: Method and system to configure a common set of electronic components using software in order to simulate different electronic, mechanical and/or electro-mechanical instruments or instrument functions. For each instrument function or traditional mode of operation to be simulated, software models are created which when directed to the electronic components, cause the electronic components to respond to input in the same manner that the actual, traditional physical instrument would respond to satisfy the same test requirement input. The software models are preferably stored in a model repository which is searchable to enable a user to select the instrument function or traditional mode of operation to be simulated with the corresponding model being provided to the electronic components. Once the model, i.e., a function for each synthetic element, is downloaded and the electronic components configured according to the model functions, testing of the assemblies or other UUTs can begin.Type: GrantFiled: September 1, 2006Date of Patent: March 6, 2012Assignee: Advanced Testing Technologies Inc.Inventors: Robert Spinner, Eli Levi, William Harold Leippe, Emery Korpi, Michael Lai, James Kuveikis, Richard E. Chalmers, Richard Engel, Peter F. Britch, William Biagiotti, David Howell
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Patent number: RE43553Abstract: Electronic test system including hardware and software components and method of use of same which provide obsolescence mitigation. A set of governing rules for the system is defined and a test program test (TPS) is created to enable units to be tested. When a new component is introduced into the system, the change is detected and a new TPS is created. If the new TPS complies with the rules, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of the removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.Type: GrantFiled: July 6, 2010Date of Patent: July 24, 2012Assignee: Advanced Testing Technologies, Inc.Inventor: Robert Spinner