Patents Assigned to Testing Technologies, Inc.
  • Patent number: 6848647
    Abstract: A method wherein a vehicle is capable of movement on or over land, and/or on, over, or under water. Various body, wing, tail, and/or outrigger shapes facilitate movement and develop lift. Buoyancy or semi-buoyancy is developed utilizing various chambers to contain controlled volumes of gaseous or liquid substances. Motion is augmented by propulsion or repulsion mechanisms, including pressurized liquid stream jet (PJET) propulsion. The vehicle is capable of modifying its shape and/or the curvature of various parts, such as wings, tails, and/or outriggers, by manipulating the internal skeleton, the internal compartments supporting the external surfaces, and/or the internal pressure of the shape. Control Agents with mechanized or manual support manage the vehicle's operations controlling various movement particular information, as well as baseline algorithms, such as wind speed, currents, and location.
    Type: Grant
    Filed: November 4, 2002
    Date of Patent: February 1, 2005
    Assignee: Testing Technologies, Inc.
    Inventor: H. Victoria Albrecht
  • Patent number: 6715371
    Abstract: The present invention relates to a method of testing an airbag module for a vehicle and, particularly, but not exclusively, to a method of testing an airbag module for a motor vehicle such as a car. A method of testing an airbag module is provided in which said module is tested for exposure to a given fluid, for example, water. The fluid exposure test ideally comprises the step of inspecting said airbag module or a swab taken therefrom by means of Atomic Absorption Spectroscopy techniques. The present invention thereby provides a testing method sufficiently rigorous to identify fluid damage potentially suffered by a previously installed airbag module during its service life.
    Type: Grant
    Filed: October 18, 2002
    Date of Patent: April 6, 2004
    Assignee: Airbag Testing Technology, Inc.
    Inventor: Peter Byrne
  • Patent number: 6480006
    Abstract: A phase noise measurement method including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver/down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.
    Type: Grant
    Filed: May 2, 2000
    Date of Patent: November 12, 2002
    Assignee: Advanced Testing Technologies Inc.
    Inventor: Robert Matthew Buckley
  • Patent number: 6429796
    Abstract: A method for generating a waveform at a particular frequency in which a segment RAM depth is determined based on the relationship between the frequency and a variable clock value, a RAM based memory system is provided with waveform information, and the waveform is sequentially generated from a combination of the waveform information in the RAM based memory system from a first memory site to a memory site dependent on the segment RAM depth. The generated waveform is filtered to obtain only the waveform at the desired frequency. The RAM based memory system is provided with the waveform information by dividing each desired waveform into segments depending on the clock value and storing each segment in a respective memory site. An analog to digital converter may be evaluated by directing the desired waveform to the analog to digital converter. The generated waveform is tuned in the filter to a center frequency if it is a sinewave or a tuned squarewave.
    Type: Grant
    Filed: July 14, 2000
    Date of Patent: August 6, 2002
    Assignee: Advanced Testing Technologies Inc.
    Inventor: Robert M. Buckley
  • Patent number: 6396536
    Abstract: A method for producing a static composite video signal, e.g., for delivery to a unit under test (UUT), in which a prime image memory (PIM 28) holding a main bit mapped image is provided, sync and blanking patterns for lines of the video signal being generated are held in a composite sync memory (C-Sync 32), and a series of arbitrary bit line patterns defined in a test program are held in two user specified pulse memories (USPs 36,38). Data blocks are arranged in a circular queue in a line parameter memory (LPM 40), each data block corresponding to a complete video line and containing pointers to specific entries in the PIM (28), the C-Sync (32) and the USPs (36,38) and a flag indicative of scan direction. Production of the video signal is initiated by reading the LPM (40)and extracting the pointers from the data blocks for a first line of the video signal being produced.
    Type: Grant
    Filed: May 27, 1999
    Date of Patent: May 28, 2002
    Assignee: Advanced Testing Technologies, Inc.
    Inventors: David Howell, William Biagiotti
  • Patent number: 6269457
    Abstract: A method for regression and verification of hardware, network, and/or software technology platforms to deliver acceptance status details. This method variously prepares instructions and components to support unique business customer environments and manages the regression verification of these environments. Errors, deviations, and recommendations for improvement, with full regression capabilities, are reported to the business user customer in a non-technical business format they can select and customize to receive acceptance status management reporting information.
    Type: Grant
    Filed: June 1, 2000
    Date of Patent: July 31, 2001
    Assignee: Testing Technologies, Inc.
    Inventor: Harriet Lane
  • Patent number: 6057690
    Abstract: A phase noise measurement system including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.
    Type: Grant
    Filed: January 14, 1998
    Date of Patent: May 2, 2000
    Assignee: Advanced Testing Technologies, Inc.
    Inventor: Robert Matthew Buckley
  • Patent number: 5952834
    Abstract: A phase noise measurement system including a low noise programmable synthesizer and a receiver/down converter is provided. The low noise synthesizer provides L-Band Signals which can selectively exhibit low noise close-in or low noise far out. The receiver down converter provides for absolute, additive, and down converted/direct/multiple phase noise measurement.
    Type: Grant
    Filed: January 14, 1998
    Date of Patent: September 14, 1999
    Assignee: Advanced Testing Technologies, Inc.
    Inventor: Robert Matthew Buckley
  • Patent number: 5337014
    Abstract: An improved circuit for phase noise measurements utilizing a frequency down conversion/multiplier and direct spectrum measurement technique. The circuit is particularly useful for field test environments where laboratory instrumentation is normally not available, and fast and accurate phase noise measurements are required. The phase noise measuring circuit includes a frequency mixer which has a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise with a fixed center frequency. The frequency mixer produces a down converted signal comprising the frequency difference signal of the first and second input signals. A lowpass filter passes the down converted signal to a frequency multiplier circuit which produces a second harmonic signal, a fourth harmonic signal, and higher harmonic signals of the down converted signal.
    Type: Grant
    Filed: December 24, 1992
    Date of Patent: August 9, 1994
    Assignees: Harris Corporation, Advanced Testing Technologies, Inc.
    Inventors: Esteban G. Najle, Robert M. Buckley