Abstract: A measurement system configured to examine a sample. The system comprises an internally reflective element, a contact member, an actuator, an optical assembly, a sensor, and a controller. The contact member and the reflective element are configured to apply a force to the sample. The optical assembly is configured to scan the sample. Whereby prior to the scan, an initial force is applied to the sample, and after the scan, a resulting force is applied to the sample. The sensor is configured to detect the resulting force applied to the sample, and the controller is configured to receive a signal from the sensor indicative of the detected resulting force. The controller is further configured to control the actuator to adjust the force applied to the sample by the contact member and the internally reflective element from the resulting force to the initial force.

Abstract: An embodiment of a module system configured to interface with a microscope is described that comprises an input optical fiber configured to provide an excitation light beam from an external light source; dynamic alignment mirrors configured to adjust the position of the beams paths of the excitation light beam on a first plane; a coupling comprising a first end configured to engage with a complementary end, wherein the excitation light reflects off a turning mirror and travels along a beam path on a second plane through an orifice in the coupling; and an output optical fiber for delivering light from a sample to an external detector, wherein the light from the sample travels along the beam path on the second plane through the orifice in the coupling, reflects off the turning mirror and travels along one of the beam paths on the first plane to the output optical fiber.

Abstract: An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.

Abstract: Methods for linearization of photodetector response include establishing one or more static calibration coefficients based on comparison of test photodetector response to a linear reference photodetector. In some examples, dynamic calibration coefficients are determined based on average photodetector signals. In some applications such as FTIR, linearized ratios are obtained with a single calibration coefficient.

Abstract: An embodiment of a phase mask includes a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.

Abstract: Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.

Abstract: An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.

Abstract: Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.

Abstract: A laser mount assembly includes a lens holder including a collimating lens. A laser subassembly is positioned adjacent the lens holder and includes a vertical-cavity surface-emitting laser, a thermal electric cooler, and a thermistor. A printed circuit board is positioned adjacent the laser subassembly and includes a plurality of heating components. The heating components heat the area between the lens holder and the laser subassembly.

Abstract: A stray light reducing apparatus includes a light source and an entrance slit positioned to pass through light from the light source. A first monochromator mirror is positioned to reflect light passed through the entrance slit. A diffractive surface is positioned to receive and diffract light reflected by the first monochromator mirror. A second monochromator mirror is positioned to reflect light diffracted by the diffractive surface. An exit slit is positioned to pass through light reflected by the second monochromator mirror. A cuvette is positioned to pass through light passed through the exit slit. A long-pass interference filter is positioned to receive light from the light source, reflect light that has a wavelength below a selected value, and pass through light having a wavelength above the selected value. A first sample detector is positioned to receive light reflected by the long-pass interference filter.

Abstract: An embodiment of a method of automatically generating a background measurement in a spectrometer is described that comprises the steps of: collecting a plurality of candidate scans in the spectrometer; determining for each of the plurality of candidate scans if the candidate scan correlates to an orthonormal basis set that is associated with a recent background description; saving each candidate scan that correlates to the orthonormal basis set as a background scan in a scan cache; and generating a new background measurement from a plurality of the background scans stored in the scan cache if a current background measurement is older than a preselected time interval.

Abstract: An image analysis system includes a video camera that collects YUV color images of a liquid sample disposed between a capital and a pedestal, the color images being collected while a light source shines light through an optical beam path between the capital and the pedestal, and a processor adapted to i) obtain from the YUV color images a grayscale component image and a light scatter component image, and ii) obtain at least one binary image of the grayscale component image and at least one binary image of the light scatter component image.

Abstract: A mixing apparatus includes a well plate assembly including a fixed support, and a well movable with respect to the fixed support. A fixed sensor mount has a first portion disposed above the well and a second portion disposed within the well. A plurality of electromagnets are operable to move the well plate assembly vertically with respect to the fixed sensor mount and the fixed support.

Abstract: A diffuse reflectance apparatus includes a housing having a window formed therein, and a diffuse reflectance mirror spaced from the window and having an aperture extending therethrough. A light source provides a beam of light. A first mirror assembly is positioned to reflect the beam of light through the aperture such that it passes through the window. A second mirror assembly is positioned to reflect scattered light from the concave mirror to a detector.

Abstract: A mirror assembly has one or more axes of motion and includes a mirror that is movable and forms an acute angle with a plane orthogonal to its axis of motion. The mirror assembly may include a first reflective mirror surface in the incoming optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion, and a second reflective mirror surface in the outgoing optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion and is moveable in a linear translation to scan the mirror in the interferometer in a way to generate a normal interferogram.

Abstract: A sensing device includes a first substrate having a plurality of TSVs extending therethrough, and a second substrate positioned adjacent the first substrate, with the TSVs being electrically connected to the second substrate. At least one carbon nanotube sensor is positioned on the first substrate. Each of a plurality of contact pads is positioned on the first substrate and on one of the carbon nanotube sensors such that each contact pad is electrically connected to one of the TSVs and the one of the carbon nanotube sensors, and such that an end of the one of the carbon nanotube sensors is embedded in the contact pad.

Abstract: Aspects of the present disclosure are directed to a mirror bearing for an interferometer. An example mirror bearing includes a stationary mounting member and a mobile mirror assembly configured for slidable movement relative to the mounting member along its longitudinal axis. The mounting member is configured for rigid attachment to an interferometer body. A bore extends through the mounting member along its longitudinal axis. A drive coil receiving area of the mounting member is configured to hold a drive coil coupled thereto. The mobile mirror assembly includes a tube configured to receive, at one end of the tube, an end of the mounting member. The mobile mirror assembly also includes a mirror coupled to the opposite end of the tube. A drive magnet is disposed within the tube and is configured to be received within the bore of the mounting member when the mirror bearing is in an assembled configuration.

Abstract: An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattern of features that exhibit contrast when illuminated by a light beam.

Abstract: An apparatus for providing a variable sized aperture for an imaging device includes a first plate having a first plurality of plate apertures extending therethrough and a second plate having a second plurality of plate apertures extending therethrough. A first motor is operably connected to the first plate and a second motor is operably connected to the second plate. The first and second motors are configured to move the first plate and the second plate with respect to one another so as to align any of the first plurality of plate apertures with any of the second plurality of plate apertures to define a plurality of light beam apertures.

Abstract: A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.