Patents Examined by Akm Zakaria
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Patent number: 11280871Abstract: A method of absolute phase calibration of at least a first port of a test and measurement equipment, comprising: providing the test and measurement equipment having the first port to be calibrated; providing a calibration mixer having a first port, a second port and a local oscillator port; providing at least one phase reproducible source that outputs a local oscillator signal; and performing at least two UOSM measurements at the first port of the test and measurement equipment, wherein at least one of the at least two UOSM measurements is performed with a frequency shift from a first frequency to a second frequency by using the calibration mixer. Furthermore, a calibration system is described.Type: GrantFiled: December 12, 2019Date of Patent: March 22, 2022Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Werner Held, Jan-Patrick Schultheis, Jakob Hammer
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Patent number: 11283436Abstract: Circuitry and methods of operating the same to delay a signal by a precise and variable amount. One embodiment is directed to a high speed delay line used in automated test equipment. The inventors have recognized and appreciated that an input signal having high data rate may be split into parallel split signals having lower data rates that are delayed in respective parallel delay paths before being combined to generate a delayed signal. One advantage of delaying a signal in such a fashion is to provide high delay line timing accuracy at high data speeds, while using a compact circuit design using circuitry components of lower bandwidth with reduced power consumption, for example by using complementary metal-oxide-semiconductor (CMOS). A further advantage is that a high speed delay line may be constructed from multiple lower data rate parallel delay lines that are modular, simplifying circuit design.Type: GrantFiled: April 25, 2019Date of Patent: March 22, 2022Assignee: Teradyne, Inc.Inventors: Jan Paul Anthonie van der Wagt, Denis Zelenin
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Patent number: 11280825Abstract: Systems, devices, and methods for characterizing semiconductor devices and thin film materials. The device consists of multiple probe tips that are integrated on a single substrate. The layout of the probe tips could be designed to match specific patterns on a CMOS chip or sample. The device provides for detailed studies of transport mechanisms in thin film materials and semiconductor devices.Type: GrantFiled: November 12, 2020Date of Patent: March 22, 2022Assignee: Xallent LLCInventor: Kwame Amponsah
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Patent number: 11275127Abstract: According to aspects of the disclosure, an apparatus is disclosed comprising: a controller; an analog-to-digital converter (ADC) coupled to the controller, the ADC including an input terminal for receiving a sensor signal from a transducer; and a diagnostic circuit coupled to the input terminal of the ADC and to the controller, the diagnostic circuit being configured to: generate a diagnostic signal that indicates whether a voltage at the input terminal of the ADC meets a first threshold, and provide the diagnostic signal to the controller, wherein the controller is configured to: receive a data sample from the ADC, detect whether the data sample meets a second threshold, and transition the apparatus into a safe state when: (i) the diagnostic signal indicates that the voltage at the input terminal does not meet the first threshold, and (ii) the data sample meets the second threshold.Type: GrantFiled: December 16, 2019Date of Patent: March 15, 2022Assignee: Allegro MicroSystems, LLCInventors: Jay M. Towne, Peter Tengstrand, Devon Fernandez
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Patent number: 11268931Abstract: Disclosed are method and apparatus for measuring material properties. Segmented field sensors have multiple sensing elements at different spatial geometries to capture field components having substantially different depths of penetration. These sensors are excited and measured on these different sensing elements to facilitate characterization of unknown material properties. This is illustrated in some embodiments using eddy current sensors to characterize materials that are frequency dispersive and/or do not produce a measurable phase shifts. Only a single scalar quantity may provide independent information from one or more of the sensing elements. Property estimation techniques, such as those using precomputed databases of sensor responses are used to estimate the unknown material properties.Type: GrantFiled: June 18, 2019Date of Patent: March 8, 2022Assignee: JENTEK Sensors, Inc.Inventors: Neil J Goldfine, Andrew P Washabaugh, Todd M Dunford, Zachary M Thomas
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Patent number: 11262289Abstract: Embodiments relate to methods, systems and apparatus for detecting corrosion using a detector apparatus with a host component. The method includes a detector apparatus. The detector apparatus includes an energy source; a corrosion proxy thin film that corrodes at a rate where the normalized change of mass of the film over time is greater than the normalized change of mass of the bulk material of the host component in a harsh environment; and the detector, wherein the detector is capable of detecting a change in energy due to corrosion of the corrosion proxy thin film. The method includes exposing the host component and the corrosion proxy thin film to the harsh environment; and detecting a change in energy using the detector due to corrosion of the corrosion proxy thin film.Type: GrantFiled: December 30, 2016Date of Patent: March 1, 2022Assignee: Energy, United States Department ofInventors: Paul R. Ohodnicki, Jr., Malgorzata Ziomek-Moroz
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Patent number: 11255924Abstract: A socket detection apparatus for supporting anomaly detection of an earth wire and a neutral wire includes: a micro-control unit, provided with a test plug of a fire wire connection end, a neutral wire connection end and an earth wire connection end, and a detection circuit connected with the test plug; and an induction antenna arranged corresponding to a fire wire end of a detected power socket, the induction antenna being connected with a first signal input end of the micro-control unit.Type: GrantFiled: June 23, 2021Date of Patent: February 22, 2022Assignee: Uni-Trend Technology (China) Co., Ltd.Inventors: Jizhi Long, Benny Siu Lam Hung, Weikun Han, Zhanhua Jin, Deng Zhang, Shengjun Qiu, Yongsong Lu
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Patent number: 11247232Abstract: In described examples, a first and second driver each include a first-rail output transistor including a first terminal coupled to a first power rail and a second-rail output transistor including a first terminal coupled to a second power rail. The first-rail output transistor of each of the first and second drivers includes a second terminal coupled to a second terminal of the second-rail output transistor of an output node of each respective first and second driver. A resistive load includes a first terminal coupled to the first-driver output node and includes a second terminal coupled to the second-driver output node. A sampling circuit generates an indication of an impedance of at least one of the output transistors of the first and second drivers.Type: GrantFiled: August 2, 2018Date of Patent: February 15, 2022Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Krishnaswamy Nagaraj, Asif Qaiyum, Baher S. Haroun
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Patent number: 11249118Abstract: A current sensing circuit includes a current detection unit having a first resistance element; a first MOS-transistor and a first constant current source connected between a first output end of the current detection unit and a ground terminal; a second MOS-transistor and a second constant current source connected between a second output end of the current detection unit and the ground terminal; a third MOS-transistor having a source connected to the first output end and a gate connected to a drain of the second MOS-transistor; a second resistance element connected between an output terminal and the ground terminal; and a high withstand-voltage MOS-transistor connected between the third MOS-transistor and the output terminal to receive a predetermined control voltage, wherein the gates of the first and second MOS-transistors are commonly connected, and the gate of the first MOS-transistor is connected to the drain thereof.Type: GrantFiled: February 21, 2020Date of Patent: February 15, 2022Assignee: ABLIC INC.Inventor: Keisuke Ito
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Patent number: 11243234Abstract: A monitor circuit for monitoring a level of a first and second regulated source may monitor a voltage level of regulated voltages or a current level of regulated currents. In an embodiment, the monitor circuit includes circuitry responsive to a first regulated current and to a second regulated current. A first circuit responsive to the first regulated current and to the second regulated current generates a first error signal indicative of at least one of an overcurrent condition of the first regulated current and an undercurrent condition of the second regulated current. A second circuit responsive to the first regulated current and to the second regulated current generates a second error signal indicative of at least one of an undercurrent condition of the first regulated current and an overcurrent condition of the second regulated current. A method for monitoring the levels of first and second regulated sources is also provided.Type: GrantFiled: October 2, 2020Date of Patent: February 8, 2022Assignee: Allegro MicroSystems, LLCInventors: Sam Tran, Jay M. Towne, P. Karl Scheller
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Patent number: 11237209Abstract: Apparatus for testing microelectronic components on a substrate, including a scanner operative to scan a light beam over a plurality of thin film transistors disposed on a substrate, one transistor at a time, so as to induce a photoconductive response in the plurality of transistors, one transistor at a time; current sensing circuitry operative, synchronously with said scanner, to measure an output induced by the photoconductive response associated with a transistor and to generate photoconductive response output values, the photoconductive response output values representing a photoconductive response induced by the light beam, for one transistor at a time from among the plurality of transistors; and diagnostic apparatus operative to analyze the electronic response output values and to characterize each of the transistors in accordance therewith.Type: GrantFiled: September 27, 2018Date of Patent: February 1, 2022Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.Inventor: Yalan Zheng
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Patent number: 11237197Abstract: A system and method for making improved measurements of integrated antenna arrays utilizes vector network analyzer (VNA) and a calibrated receive-side system comprising two antennae, dual reflectometers coupled to the two antennae for match correction, a wide band intermediate frequency (IF) strip which connects the receive-side system to the input ports of the VNA, an air gap which separates the receive-side system form the DUT, and a stepmotion baffle configure to be inserted into the air gap to modify antenna coupling. The system and method enable measurement of noise characteristics of the DUT including nonlinear effects of transmitter element coupling between the plurality of transmitter elements within an antenna array.Type: GrantFiled: September 13, 2019Date of Patent: February 1, 2022Assignee: ANRITSU COMPANYInventor: Jon Martens
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Patent number: 11233408Abstract: The present disclosure relates to methods and associated systems for maintaining energy storage devices positioned in a device-exchange station. The method includes, for example, (1) periodically sending, by the device-exchange station, a request to a battery management system (BMS) associated with an energy storage device positioned in the device-exchange station; (2) receiving, by the device-exchange station, maintenance information from the BMS; and (3) in response to the maintenance information, determine whether to perform a maintenance action.Type: GrantFiled: December 28, 2018Date of Patent: January 25, 2022Assignee: Gogoro Inc.Inventors: Yun-Chun Lai, Chien-Chung Chen, I-Fen Shih
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Patent number: 11213692Abstract: A PEMF web using immersive, flux-guided, micro-coils to direct intense, deeply penetrating, magnetic flux into a subject from each micro-coil capable of pointing in an arbitrary direction. Micro-coils are spooled around iron cores, insulated properly, and soldered to connecting wires, all embedded in a polymeric resin, such as cold-cured silicone resin. Nodes protect, enclose, insulate electrically, and otherwise protect the micro-coils. Connectors between nodes provide mechanical stability against breaking of wires, while permitting folding, bending, buckling, and otherwise deflecting to position the nodes as desired with three degrees of freedom.Type: GrantFiled: January 16, 2020Date of Patent: January 4, 2022Assignee: PULSE, LLCInventors: Gregory S. Anderson, Kade E. Huntsman, Dale C. Gledhill, Douglas R. Burrell
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Patent number: 11215645Abstract: A current sensor has two magnetic shields, a target current path, an adjacent current path, and a magneto-electric conversion element. The target current path includes a target partial current path positioned in a spacing. The adjacent current path includes an adjacent partial current path separated from the target partial current path at least in a first direction. Each magnetic shield includes a near end positioned on the same side as the adjacent partial current path in the first direction. In the first direction, the magneto-electric conversion element is positioned between the near end and the center position of the magnetic shield in the first direction.Type: GrantFiled: October 4, 2019Date of Patent: January 4, 2022Assignee: ALPS ALPINECO., LTD.Inventors: Hiroyuki Hebiguchi, Manabu Tamura
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Patent number: 11207541Abstract: Described herein are high-power pulsed electromagnetic field (PEMF) applicator apparatuses. These apparatuses are configured to drive multiple applicators to concurrently deliver high-power PEMF signals to tissue. The apparatuses may be further configured to wirelessly communicate with a remote server for patient monitoring, prescription and/or device servicing.Type: GrantFiled: March 25, 2019Date of Patent: December 28, 2021Assignee: REGENESIS BIOMEDICAL, INC.Inventors: Martin L. Kirk, John Y. Babico, Frank E. Contreras, Joseph E. Bright, Donald B. Tate
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Patent number: 11211369Abstract: The present disclosure describes a service module for a System in a Package (SiP) device. This includes methods of manufacture, use, and testing relating to the same.Type: GrantFiled: March 5, 2019Date of Patent: December 28, 2021Assignee: OCTAVO SYSTEMS LLCInventors: Masood Murtuza, Gene Alan Frantz
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Patent number: 11196098Abstract: A process and system for measuring internal faults in an electrochemical cell. The process for detecting an internal fault in an electrochemical cell includes measuring a voltage difference or a rate of change in voltage difference between a common terminal of a first electrochemical cell and a second electrochemical cell. The measuring is a time measurement. The first electrochemical cell or second electrochemical cell is accepted based on the measuring, or first electrochemical cell or second electrochemical cell is rejected based on the measure of the internal fault of the electrochemical cell.Type: GrantFiled: November 10, 2017Date of Patent: December 7, 2021Assignee: CAMX Power LLCInventor: Christopher H. McCoy
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Patent number: 11191975Abstract: An erythrocyte de-aggregation system includes a band, including a strap and housing securing an iron-cored, micro-coil to an appendage, such as a wrist, of a subject to apply a PEMF into a target vessel in the vascular system of the subject. Typically, all of the blood circulates about the body within a matter of a few minutes, some within seconds, thus treating the entire bloodstream over time. The portable PEMF system intensifies both the concentration of electromagnetic flux per unit area, as well as the depth of penetration into the body. The portable PEMF systems relies on the body's circulatory system to eventually pass the body's entire volume of blood past it over a period of time.Type: GrantFiled: May 30, 2018Date of Patent: December 7, 2021Assignee: Pulse, LLCInventors: Gregory S. Anderson, Kade E. Huntsman, Dale C. Gledhill, Marc E. Jackson
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Patent number: 11187736Abstract: A method of setting an analyzer, the method comprising: providing an analyzer with a first signal source and a second signal source; connecting the signal sources with a device under test; generating a first signal, transmitting the first signal to the device under test, measuring the first transmitted signal and a first signal reflected from the device under test, thereby obtaining first compensation parameters; generating a second signal, transmitting the second signal to the device under test, measuring the second transmitted signal and a second signal reflected from the device under test, thereby obtaining second compensation parameters; using the first and second compensation parameters to compensate the signal sources; and transmitting the first and second signals simultaneously.Type: GrantFiled: February 20, 2020Date of Patent: November 30, 2021Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Werner Held, Jan-Patrick Schultheis