Patents Examined by Anjan Deb
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Patent number: 7332916Abstract: An on-chip signal waveform measurement apparatus mounted on an IC chip measures signal waveforms at detection points on the IC chip. A reference voltage generator successively generates reference voltages different from each other based on a predetermined timing signal, and Signal probing front-end circuits are mounted to correspond to the detection points, respectively, and each buffer-amplifies a voltage at each detection point, compares the buffer-amplified voltage with each reference voltage, and digitizes a comparison result into a binary digital output signal. A multiplexer time-division-multiplexes the binary digital output signals from the signal probing front-end circuits. A data processing unit calculates a judgment output probability for a detected voltage at each detection point detected by the respective signal probing front-end circuits, by counting a number of times of a predetermined binary value of the multiplexed binary digital output signal.Type: GrantFiled: March 3, 2006Date of Patent: February 19, 2008Assignee: Semiconductor Technology Academic Research CenterInventor: Makoto Nagata
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Patent number: 7332917Abstract: A method for calculating frequency-dependent impedance in an integrated circuit (IC) having transistors coupled together by a line follows. First, partition the line into a plurality of rectangles of constant material. Then, solve for the minimum dissipated power in the plurality of rectangles. Finally, determine the frequency-dependent impedance from the minimum dissipated power.Type: GrantFiled: September 21, 2004Date of Patent: February 19, 2008Assignee: LSI Logic CorporationInventors: Kenneth J. Doniger, William M. Loh
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Patent number: 7332923Abstract: A test probe for executing high-frequency measurements comprises: a coaxial high-frequency wave guide containing an inner conductor and an outer conductor for delivering a primary electrical potential and a secondary electrical potential, respectively, a supporting structure conductively connected to at least the outer conductor and to at least two contact elements for creating a contact with an electronic circuit to be tested. The support structure is provided with conductive paths for the transmission respectively of a high-frequency signal from the inner conductor and a high-frequency ground potential from the outer conductor to at least one contact element and each conductive path is conductively connected to the inner or outer conductor. The support structure has at least one U-shaped cut-out with a width essentially equivalent to an outer diameter of the wave guide and sides of the U-shaped cut-out are connected to the outer conductor.Type: GrantFiled: March 6, 2006Date of Patent: February 19, 2008Assignee: SUSS MicroTec Test Systems GmbHInventors: Steffen Schott, Stojan Kanev
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Patent number: 7332914Abstract: Disclosed is a conductor inspection apparatus capable of detecting a state of an inspection-target electric conductor with a high degree of accuracy in a non-contact manner. The inspection apparatus includes a signal supply section 510 for supplying an inspection signal to an inspection-target conductor 520, and two sensor plates 570, 580 disposed approximately parallel to each other in the vicinity of the conductor 520. The inspection apparatus is designed to inspect a configuration of the conductor 520 disposed opposed to the sensor plate 570, in accordance with a measured signal level from the sensor plate 570.Type: GrantFiled: February 27, 2004Date of Patent: February 19, 2008Assignee: OHT Inc.Inventors: Shuji Yamaoka, Akira Nurioka, Mishio Hayashi, Shogo Ishioka
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Patent number: 7330032Abstract: Techniques for imaging a search region to detect a dielectric target include placing multiple electrodes outside the search region. At least two electrodes are activated independently of each other. Emitter circuits are connected to corresponding emitter electrodes. Each emitter circuit is configured for using its emitter electrode to produce an electric field with wavelength longer than about one hundred meters. Receiver circuits are connected to corresponding receiver electrodes. Each receiver circuit is configured for using its receiver electrode to measure a property of an electric field produced, at least in part, by an emitter electrode. A processor determines a property of a dielectric target inside the search region based on measurements from the receiver circuits using a subset of the emitter circuits. Among other uses, these techniques allow humans to be detected inside building-size regions, even when hidden by visually opaque blocking material of small dielectric constant.Type: GrantFiled: November 22, 2004Date of Patent: February 12, 2008Assignee: The Mitre CorporationInventor: Nicholas C. Donnangelo
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Patent number: 7330673Abstract: A device for and method of managing status information on a consumable for an image forming device by using memory included in the consumable is provided. The image forming device having more than one consumables and transferring an electrostatic image formed on a surface of a photosensitive medium onto paper comprises an image forming unit printing a predetermined image in response to a control of a central controller, and a management memory storing management information related to status information of the consumables. The central controller reads the consumable information including remaining lifetime of the consumable from a consumable memory including in the consumable, reads the management information from the management memory included in the image forming device, calculates an amount of use of the consumables during an operation of the image forming device, and updates the consumable information and the management information using the calculated amount of use.Type: GrantFiled: January 24, 2005Date of Patent: February 12, 2008Assignee: Samsung Electronics Co., Ltd.Inventor: Yoon-Seop Eom
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Patent number: 7327150Abstract: For one embodiment, an integrated circuit includes a node to couple one or more components to the integrated circuit to carry current through a package for the integrated circuit. The integrated circuit also includes a monitor to measure a resistance of the package based at least in part on a reference resistance of the package and a resistance of one or more components that are to carry current through the package. For another embodiment, current through one or more components that are to carry current through a package for an integrated circuit is controlled. A resistance of the package is measured based at least in part on a reference resistance of the package and a resistance of one or more components that are to carry current through the package.Type: GrantFiled: October 11, 2005Date of Patent: February 5, 2008Assignee: Intel CorporationInventors: Arvind Kumar, Kambiz Munshi
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Patent number: 7327149Abstract: A current sensing circuit comprises a power device adapted to conduct a bidirectional current between first and second terminals thereof, first and second sensing devices operatively coupled to the power device, a sense amplifier providing first and second voltages to the first and second sensing devices, and a gate drive device providing activating signals to the power switching device and the first and second sensing devices. The first and second sensing devices each has an active area that is substantially identical and significantly smaller than a corresponding active area of the power switching device. The sense amplifier measures the voltage of the first sensing device and maintains the voltage on the second sensing device at the same level as the first sensing device by injecting an additional current into the second sensing device. The sense amplifier further provides an output signal proportional to the bidirectional current.Type: GrantFiled: May 10, 2005Date of Patent: February 5, 2008Assignee: Power-One, Inc.Inventor: Alain Chapuis
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Patent number: 7323878Abstract: The present invention is directed to a ground-current isolating circuit for providing a low voltage barrier between a service neutral conductor and an associated grounding system. The voltage barrier circuit comprises a first current unidirectional element and a second current unidirectional element connected in antiparallel. The unidirectional elements are preferably diodes having a characteristic threshold voltage. The current in a forward biased direction is blocked by the circuit until an applied forward biased voltage exceeds the threshold voltage. The present invention also is directed to a method of isolating a neutral conductor temporarily from an associated grounding system during testing of a structure grounding system.Type: GrantFiled: November 10, 2005Date of Patent: January 29, 2008Assignee: Magicground Technology LLCInventors: Charles A. Gaston, Vaughn G. Silar, Jr.
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Patent number: 7323882Abstract: An electrified wall panel in a modular furniture environment includes a plurality of multi-port electrical distribution blocks diversely located throughout the panel. Certain ones of the multi-port electrical distribution blocks are fixed to wall panel frame members and other ones of the multi-port electrical distribution blocks are free of the wall panel. A plurality of jumper cables, each having connectors at opposite cable ends are adapted to mate with any one of the multi-port electrical distribution block ports. The cables electrically interconnect the distribution blocks to form one complete circuit. There are a plurality of electrical receptacles, each having an electrical connector near one end which are electrically coupled to a port of a corresponding multi-port electrical distribution block. The system is assembled by fixing a jumper mounting bracket to a jumper cable near one end of the jumper cable. The jumper mounting bracket is attached to a support member.Type: GrantFiled: May 14, 2004Date of Patent: January 29, 2008Assignee: Pent Technologies, Inc.Inventors: Daniel L. Hayes, Shawn J. Kondas
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Patent number: 7323879Abstract: A circuit and method for measuring capacitance and capacitance mismatch of at least one capacitor pair are provided. The circuit includes a first switch, a second switch, a third switch and a P-type transistor. A terminal of the first switch is connected to a terminal of a first capacitor, and a terminal of the second switch is connected to a terminal of a second capacitor. A terminal of the third switch is connected to another terminal of the first capacitor and another terminal of the second capacitor, and a gate of the P-type transistor is connected to another terminal of the third switch. When the first, second and third switches are turned on, a capacitance of the first capacitor, a capacitance of the second capacitor, or a capacitance mismatch between the first and second capacitances is measured.Type: GrantFiled: September 30, 2004Date of Patent: January 29, 2008Assignee: United Microelectronics Corp.Inventors: Shu-Hua Kuo, Jui-Ting Li
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Patent number: 7323886Abstract: Capacitance measurement apparatus that enhances the sensitivity and accuracy of capacitive transducers, proximity sensors, and touchless switches. Each of two capacitors (C1, C2) under measurement has one end connected to ground and is kept at substantially the same voltage potential by operational amplifier (A1) or amplifiers (A0, A1) using negative feedback. The apparatus is driven by a periodic e.g. sinusoidal signal source (G1) or sources (G1, G2) and includes a difference amplifier (A2) operative to produce an electrical signal having a linear relationship with a specified arithmetic function of the capacitances of the two capacitors (C1, C2). A touchless switch is implemented using the capacitance measurement apparatus. The touchless switch includes two sensor electrodes (E1, E2) that correspond to the two capacitors (C1, C2) under measurement and in one embodiment has a front surface in the form of a container.Type: GrantFiled: August 12, 2005Date of Patent: January 29, 2008Inventor: Ying Lau Lee
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Patent number: 7323883Abstract: When a signal having two or more frequency components is fed to a circuit to be measured, a phase of the signal output from the circuit to be measured is measured. A phase measurement device measures an output when an input signal having two input frequency components ?10 and ?20 is fed to an amplifier (circuit to be measured). The phase measurement device includes an orthogonal converter that subjects the output of the amplifier to an orthogonal conversion using an average frequency ?0, which is an average of ?10 and ?20. A phase acquisitioner acquires phases ?1 and ?2 of the input frequency components in the output of the orthogonal converter and a phase ?3 of a distortion component. A match time/phase measurer measures a match time ?t during which phase ?1 is matched with phase ?2, and measures phase ?1 (?t) during that time. A distortion component phase measurer measures phase ?3 (?t) of the distortion component in the match time ?t. A display then displays ?1 (?t) and ?3 (?t).Type: GrantFiled: May 19, 2004Date of Patent: January 29, 2008Assignee: Advantest CorporationInventor: Juichi Nakada
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Patent number: 7323858Abstract: A method used to measure pressure in an area which is closed by an solenoid valve (106) performs the following steps: applying voltage to the solenoid valve (106), determining the peak of a curve of the flowing current based on voltage and determining the pressure based on determination of the peak of the curve.Type: GrantFiled: April 17, 2004Date of Patent: January 29, 2008Assignee: Continental AGInventor: Dierk Hein
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Patent number: 7323880Abstract: Novel apparatus and method accurately measure ground circuit impedance. A ground circuit and electrical current source adjusted to 25 amperes or less simulate a ground fault. Ground impedance is determined by dividing voltage drop by amperage to determine impedance directly. In one aspect, impedance is determined and displayed automatically. Power wires of the circuit being measured serve as a means for transmitting voltage and current data. The cable itself serves as a current-carrying and voltage-transmitting conduit to determine directly the circuit impedance. The novel ground circuit impedance device and method measure impedance in underground mine power systems connecting to an outside electrical power substation outside the mine and using portable transformers in the mine.Type: GrantFiled: June 9, 2006Date of Patent: January 29, 2008Inventor: Thomas C. Stitt
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Patent number: 7319334Abstract: A breakdown inspection apparatus for a wire includes a power supply applying a voltage to the wire and an electric field sensor detecting an electric field generated around the wire by the applied voltage so as for a user to determine according to variation of the electric field if there is an open defect in the wire.Type: GrantFiled: May 17, 2005Date of Patent: January 15, 2008Assignee: LG Electronics Inc.Inventors: Seung Min Lee, Dae Hwa Jeong
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Patent number: 7317309Abstract: A wideband signal analyzing apparatus for analyzing an input signal includes frequency-shifting means for generating a plurality of intermediate frequency signals by shifting a frequency of the input signal as much as respectively different frequency-shifting amounts, so that if a frequency band of the input signal is divided into a plurality of frequency bands, each of the frequency bands can be shifted to a predetermined intermediate band, spectrum measuring means for outputting a complex spectrum of each of the intermediate frequency signals, and spectrum reconstructing means for merging the complex spectra.Type: GrantFiled: June 7, 2004Date of Patent: January 8, 2008Assignee: Advantest CorporationInventors: Takahiro Yamaguchi, Masahiro Ishida, Mani Soma
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Patent number: 7317320Abstract: A method and apparatus for measuring body fat using bioelectrical impedance, that reduces measurement errors and improves repeatability by compensating for variation of a contact voltage caused by variation of an electrode contact area.Type: GrantFiled: October 5, 2005Date of Patent: January 8, 2008Assignee: Samsung Electronics Co., Ltd.Inventors: Kun-kook Park, Kyung-Ho Kim, Jeong-Je Park
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Patent number: 7317317Abstract: The micro sensor is fabricated with a guard that shields the electrodes from the surrounding environment, thereby reducing loss of measurement signal through the parasitic capacitances to the substrate and fluid. The guards are low impedance points in the circuit that are biased to track as closely as possible the ac voltages of the respective electrodes. Each guard is suitably connected to the output of a guard buffer that supplies the current required to ensure that the guard is at all times at nearly the same voltage as the electrode it is guarding. The micro sensor has an improved signal to noise ratio (SNR) over an extended measurement frequency range (bandwidth) for monitoring in-situ the cleaning and drying processes for high aspect ratio micro features in dielectric films oriented perpendicular to the fluid-solid interface during the manufacture of ICs, MEMS and other micro-devices.Type: GrantFiled: August 16, 2005Date of Patent: January 8, 2008Assignee: Environmental Metrology CorporationInventors: Bert M. Vermeire, Farhang F. Shadman
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Patent number: 7317321Abstract: A method for testing effectiveness of a cathodic protection device configured to apply at least one voltage across an underground structure and a reference point is described. The method includes providing a sample of the material from which the underground structure is fabricated, placing the sample proximate the underground structure, electrically connecting the sample to the underground structure through a switch, operating the switch at predetermined intervals, and measuring electrical characteristics of the sample at intervals based at least partially on the predetermined intervals and a position of the switch.Type: GrantFiled: May 26, 2006Date of Patent: January 8, 2008Assignee: NTG, Inc.Inventor: Thomas N. Hilleary