Patents Examined by Anjan Deb
  • Patent number: 7315169
    Abstract: A fault indicator for indicating the occurrence of a fault in an electrical conductor has a housing, a high capacity battery, at least one light emitting diode (LED) visible from the exterior of the fault indicator upon the occurrence of a fault and which may be automatically reset to a non-fault indicating position a predetermined time after the occurrence of the fault, and electronic circuitry for sensing a fault, for actuating the LEDs to indicate a fault and for resetting the LEDs to a non-fault indicating condition a predetermined time after the fault has occurred. The electronic circuitry conserves energy by drawing insubstantial current from the high capacity battery during non-fault conditions. The electronic circuitry may also include in-rush restraint to avoid false tripping of the fault indicator during surges. An inrush restraint circuit has an output signal that is logically combined with a fault indicator signal to disable the fault indicator during inrush conditions.
    Type: Grant
    Filed: October 25, 2002
    Date of Patent: January 1, 2008
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventors: Kurt James Fenske, Laurence Virgil Feight
  • Patent number: 7315170
    Abstract: In a device for measuring the properties of a device under test connected by a signal transmission path having reciprocity, a terminal on the device under test side of the signal transmission path is opened; pulse signals are transmitted to a terminal on the measuring apparatus side of the signal transmission path; the transmitted pulse signals are monitored and spectrum analyzed on the measuring apparatus; the pulse signals reflected from a terminal on the device under test side of the signal transmission path are monitored and spectrum analyzed on the measuring apparatus; and the frequency properties of propagation delay of the signal transmission path are found by referring to the coefficient obtained based on the impedance of the resistance load, the spectrum of the transmitted pulse signals, and the spectrum of the reflected pulse signals. The effect of an error is eliminated from the measuring results using the resulting frequency properties or propagation delay in actual measurement.
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: January 1, 2008
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventor: Hiroshi Sakayori
  • Patent number: 7315172
    Abstract: A mechanism for measuring noise densities below the noise floor of a measuring instrument. The measuring instrument may first acquire a fully-averaged reference spectral noise density trace and estimate corresponding reference statistical parameters. Based on the reference statistical parameters, the measuring instrument may construct a reference spectral noise density distribution. The measuring instrument may also acquire a fully-averaged sum spectral noise density trace and estimate corresponding sum statistical parameters. Based on the sum statistical parameters, the measuring instrument may construct a sum spectral noise density distribution. The measuring instrument may extract a spectral noise density distribution from the reference and sum distributions. The measuring instrument may also determine a confidence interval based on a desired confidence level.
    Type: Grant
    Filed: August 5, 2005
    Date of Patent: January 1, 2008
    Assignee: National Instruments Corporation
    Inventor: Mohamad A. Zeidan
  • Patent number: 7315173
    Abstract: A method and apparatus for measuring an electric field distribution according to the present invention calculates a distribution of electric field intensity and its direction at arbitrary positions on the surface of the electronic apparatus or its circumference with use of data of measurement positions and measurement results of a potential distribution on a surface of an electronic apparatus. Further, it clearly indicates a flow of electromagnetic energy on the surface or in the circumference of the electronic apparatus by applying mathematical treatments to a magnetic field distribution at circumferential positions of the electronic apparatus. Thus, a distribution of high-frequency electric field generated from the electronic apparatus is measured with high accuracy.
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: January 1, 2008
    Assignee: Hitachi, Ltd.
    Inventors: Hiroki Funato, Takashi Suga, Kouichi Uesaka, Satoshi Nakamura
  • Patent number: 7315171
    Abstract: The invention provides the electronic judging apparatus to detect the working state of the other electric equipment without modifying it inside. The common mode noise around the electric power supplying wires of the other equipment is measured by using the special magnetic core detector attached around the power supplying wire, and the common mode noise is compared with the one measured on the non-working time after amplifying and digital signal treatment of the detected signal. As the modification of the equipment is not required, the monitoring of the working state can be available for various equipments easily and also available from a remote place by transmitting the digital treated signal on the internet communication system.
    Type: Grant
    Filed: October 4, 2006
    Date of Patent: January 1, 2008
    Inventor: Akira Konno
  • Patent number: 7313350
    Abstract: A developing apparatus develops an electrostatic latent image formed on a photoconductive drum with toner into a toner image. A developing roller has a surface on which a thin layer of toner is formed. The developing roller has a ten-point height of irregularities Rz such that 1 ?m<Rz<DV and in pressure contact with the photoconductive drum to supply the toner to the electrostatic latent image. DV is a volume mean particle diameter. A developing blade is pressed against the surface of the developing roller to form a thin toner layer on the developing roller. The toner has parameters (1) 1 ?m<DV<7 ?m, (2) 0.9<roundness<0.97, (3) small-diameter particles (not larger than DV×0.5 ?m) of not more than 20% by number percentage, (4) large-diameter particles (not smaller than DV×2.0 ?m) of not more than 1% by volume percentage.
    Type: Grant
    Filed: January 25, 2005
    Date of Patent: December 25, 2007
    Assignee: Oki Data Corporation
    Inventor: Akihiro Yamamura
  • Patent number: 7312611
    Abstract: The present invention provides an on-chip packed reactor bed design that allows for an effective exchange of packing materials such as beads at a miniaturized level. In accordance with the present invention, there is provided a method of concentrating an analyte within a microfluidic analysis system, comprising the steps of: a) providing a main channel having a trapping zone suitable for trapping packing material; b) providing a slurry of a reagent treated packing material prepared in a solution having a predetermined composition of a solvent; c) inducing a flow of said packing material into said trapping zone through a flow channel connected to said trapping zone so as to load said trapping zone and form a packed bed of said packing material; d) and flowing a sample containing analytes through said packed bed, said reagent acting to concentrate at least some of said analytes within said trapping zone.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: December 25, 2007
    Assignee: The Governors of the University of Alberta
    Inventors: D. Jed Harrison, Richard Oleschuk, Loranelle Shultz-Lockyear, Cameron Skinner, Paul Li
  • Patent number: 7312608
    Abstract: Systems and methods for inspecting electrical conductivity in composite materials having conductive structures are disclosed. In one embodiment, a system of inspecting electrical conductivity in an electrical bonding region includes a coil coupled to an alternating current source that is configured to induce a current in a conductive structure within the region. A processor is coupled to the coil that is operable to detect an impedance property value from the coil that results from the current induced in the conductive structure.
    Type: Grant
    Filed: November 3, 2005
    Date of Patent: December 25, 2007
    Assignee: The Boeing Company
    Inventors: Gary E. Georgeson, Joseph L. Hafenrichter, Everett A. Westerman
  • Patent number: 7313340
    Abstract: A method and apparatus for using a sheet of paper to control document processing is described. In one embodiment, the method includes scanning a first sheet of paper and a first document, identifying one or more processing operations identified on the first sheet of paper, performing the one or more processing operations on the first document, and generating a second sheet of paper that encodes the first document and the processing operations.
    Type: Grant
    Filed: December 17, 2004
    Date of Patent: December 25, 2007
    Assignee: Ricoh Co., Ltd.
    Inventors: Stephen R. Savitzky, Ame Elliott
  • Patent number: 7312613
    Abstract: A method for network diagnosis between a source end and a destination end coupled by a transmission line is provided. The method includes the following steps. First, a first test signal is transmitted from the transmitter to the receiver when the hybrid is set to a first mode. Next, a plurality of first coefficients are extracted from the first test signal received by the canceller during a first period, wherein each one of the first coefficients has an index corresponding to a received order. And then, the hybrid is switched to a second mode to generate a second test signal by sending an original signal to the receiver and the destination. Sequentially, a plurality of second coefficients are extracted from the second test signal received by the canceller during a second period, wherein each one of the second coefficients has an index corresponding to a received order. Therefore, a first index is determined when an absolute value of one of the first coefficients substantially exceeds a first threshold value.
    Type: Grant
    Filed: August 11, 2006
    Date of Patent: December 25, 2007
    Assignee: Via Technologies, Inc.
    Inventors: Tien-Hui Chen, Yi-Hua Lai
  • Patent number: 7313334
    Abstract: An image formation device has an image carrier in which is formed a latent image and a development device in which are detachably mounted a plurality of development units housing a developing agent. When development units of a plurality of colors, used to form color images are mounted in respectively predetermined mounting positions of the development device, operation is in color printing mode; and, a development unit of a single color among the development units of the plurality of colors is mountable in any mounting position of the plurality of mounting positions, and when the development unit of a single color is mounted in any of the positions of the plurality of mounting positions, operation is in monochrome printing mode.
    Type: Grant
    Filed: December 30, 2004
    Date of Patent: December 25, 2007
    Assignee: Seiko Epson Corporation
    Inventor: Hideaki Inukai
  • Patent number: 7313354
    Abstract: An apparatus produces a member having hidden information in which a sheet of conceal paper for hiding the information and a sheet of recording paper having an image recorded thereon are bonded releasably. The apparatus includes a recording paper supply section, a conceal paper supply section, and a fixing section. The recording paper supply section supplies the sheet of recording paper. The conceal paper supply section supplies the sheet of conceal paper. The fixing section fixes the image, which is formed on the sheet of recording paper supplied from the recording paper supply section, onto the sheet of recording paper, and bonds the sheet of conceal paper supplied from the conceal paper supply section to the sheet of recording paper simultaneously.
    Type: Grant
    Filed: January 7, 2005
    Date of Patent: December 25, 2007
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yu Tsuda, Koichiro Shinohara
  • Patent number: 7312615
    Abstract: A Force/Torque (FT) sensor includes memory for storing calibration data associated with the FT sensor. Force and torque analog signals are output to a data acquisition (DAQ) system. The digital calibration data is output to the DAQ system as a digital bitstream comprising a series of predetermined voltage levels driven for predetermined durations. The DAQ system interprets the series of voltage levels on the calibration input as a digital bitstream, receives and quantizes the force/torque signals, and calibrates the force/torque signals using the calibration data. Alternatively, the calibration signals may be routed to a standard serial port on the DAQ system. For small form factor FT sensors, the calibration data may be stored in an associated power supply unit.
    Type: Grant
    Filed: June 27, 2003
    Date of Patent: December 25, 2007
    Assignee: ATI Industrial Automation, Inc.
    Inventor: Dwayne Perry
  • Patent number: 7307426
    Abstract: A method and apparatus for detecting open defects on grounded nodes of an electrical device using capacitive lead frame technology is presented. In accordance with the method of the invention, an accessible signal node that is capacitively coupled the grounded node is stimulated with a known source signal. A capacitive sense plate is capacitively coupled to the stimulated node and grounded node of the electrical device, and a measuring device coupled to the capacitive sense plate capacitively senses a resulting signal. The value of the capacitively sensed signal is indicative of the presence or non-presence of an open defect on one or both of the grounded node and stimulated signal node.
    Type: Grant
    Filed: July 12, 2005
    Date of Patent: December 11, 2007
    Assignee: Agilent Technologies, Inc.
    Inventors: Kenneth P. Parker, Chris R. Jacobsen
  • Patent number: 7307428
    Abstract: A single ended line testing method for qualifying an electrically conducting line, including the steps of sending a plurality of randomized excitation signals from a first end of the line towards a second end of the line, subsequently taking measurements, at the first end of the line, of each reflection of the plurality of randomized excitation signals, and then inversely randomizing the measurements. Line qualification is determined based on an average of the inversely randomized measurements.
    Type: Grant
    Filed: September 25, 2006
    Date of Patent: December 11, 2007
    Assignee: Alcatel
    Inventor: Paul Henri Marie Cautereels
  • Patent number: 7307411
    Abstract: A apparatus and method for creating a universally usable and configurable sensor platform which is used in conjunction with various sensor and sensing elements to sense and measure environmental conditions which incorporates inputs from multiple sensors 6-9 and 12-14. The apparatus incorporates an oscillator 3 which provides a signal whose frequency varies according to the inputs from sensors 6-9 and 12-14 in combination with a microprocessor 1. A cordic block 61 allows for supplemental calculations of trigonometric operations and functions. An output unit 2 converts the signals received from microprocessor 1 into a variety of serial protocols.
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: December 11, 2007
    Assignee: Sensor Platforms, Inc.
    Inventors: George Hsu, Joseph F. Miller
  • Patent number: 7307431
    Abstract: A system and method for inspecting a composite structure, such as to assess thermal degradation or resin curing, are provided in which the dielectric constant of the composite structure is determined using a microwave inverse scattering technique. The dielectric constant of the composite structure may be compared to the dielectric constant of one or more sample structures to determine the presence of thermal degradation or improper curing in the structure. In this regard, a system for inspecting a composite structure comprises a transmitter, a receiver, and a controller. The transmitter may be capable transmitting microwave energy directed toward the structure. The receiver may be capable of receiving microwave energy scattered from the structure. The controller may be capable of determining a dielectric constant of the structure using an inverse scattering algorithm and comparing the dielectric constant of the structure to a dielectric constant of at least one sample structure.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: December 11, 2007
    Assignee: The Boeing Company
    Inventors: Morteza Safai, Gary E. Georgeson
  • Patent number: 7304484
    Abstract: A method for the temperature compensation of a resistance measuring bridge, such as in particular a Wheatstone bridge, is characterized in that a capacitor positioned between the input circuit and a resistance switching circuit of the Wheatstone bridge is successively discharge by means of at least one Wheatstone bridge resistor. In a device for the temperature compensation of a measuring bridge, particularly a Wheatstone bridge, having a measuring bridge and a compensating resistor in the input circuit, one or two switches are located in the resistance switching circuit branch of the measuring bridge as a contact point with the latter and a capacitor is located between the input circuit and the resistance switching circuit branch.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: December 4, 2007
    Assignee: acam-messelectronic GmbH
    Inventors: Augustin Braun, Friedrich Bahnmüller
  • Patent number: 7304481
    Abstract: In one preferred embodiment, an apparatus for testing a cable includes an interface for connecting to a connector of the cable, many resistors, a socket, and a meter for testing resistance of the resistors. The interface has many pins, the resistors respectively connected to the pins in series, and the socket is electrically connected to the pins respectively via the resistors. The meter includes two probes, one of the probes is connected to another connector of the cable, and the other one of the probes is plugged into the socket. Because conductors of the cable are respectively connected to the resistors in series, the user can tell whether the cable has a fault according to the resistance indicated by the meter.
    Type: Grant
    Filed: April 22, 2006
    Date of Patent: December 4, 2007
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Sheng-Liang Wu, Ke-Sheng Wang
  • Patent number: 7304482
    Abstract: A method for measuring and characterizing the nonlinearities of a display device by adaptive bisection using human perception for measurement. This method makes no assumptions about a display device's characteristics and can characterize any type of display device with any arbitrarily complex monotonic display transfer function. Unlike other display measurement solutions, this process is completely software based and has no hardware measurement device requirements that would raise costs and limit portability. As a result, this process can be distributed and applied commercially at a very low cost.
    Type: Grant
    Filed: December 4, 2003
    Date of Patent: December 4, 2007
    Inventors: Robert L. Kay, Carl Brock Brandenberg