Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 16200 and a code rate of 10/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 256-symbol mapping.

Abstract: A random noise generator for generating a plurality of random noise samples per clock cycle, the noise samples having a distribution. The random noise generator comprises at least a first comparator unit and a second comparator unit, the first comparator unit configured to generate a first plurality of samples representing a high-probability part of the distribution and the second comparator unit configured to generate a second plurality of samples representing a low-probability part of the distribution; and a random selection unit connected to at least the first comparator unit and the second comparator unit. The random selection unit is configured to receive the first plurality of samples generated by the first comparator unit and the second plurality of samples generated by the second comparator unit, to output a random selection of samples from the first plurality of samples and the second plurality of samples.

Abstract: An integrated circuit chip includes a plurality of function blocks; a mode controller configured to convert an input signal, received from an external device through an input/output pin, into an input pattern and test mode setting data which include a plurality of bits, and to output the test mode setting data and a mode switching enable signal when a secure pattern generated therein is the same as the input pattern; and a mode setting module configured to control the plurality of function blocks to operate in a test mode according to the mode setting data, in response to the test mode switching enable signal.

Abstract: In one embodiment, a device comprises: a first die having disposed thereon a first plurality of latches wherein ones of the first plurality of latches are operatively connected to an adjacent one of the first plurality of latches; and a second die having disposed thereon a second plurality of latches wherein ones of the second plurality of latches are operatively connected to an adjacent one of the second plurality of latches. Each latch of the first plurality of latches on said first die corresponds to a latch in the second plurality of latches on said second die. Each set of corresponding latches are operatively connected. A scan path comprises a closed loop comprising each of said first and second plurality of latches. One of the second plurality of latches is operatively connected to another one of the second plurality of latches via an inverter.

Abstract: An apparatus includes a memory and a controller. The memory may be configured to store data. The controller may be configured to process a plurality of input/output requests to a plurality of blocks of the memory that are not marked as bad on a block list, perform a code rate test that programs the plurality of blocks of the memory at three or more code rates of an error correction code scheme, and mark any of the plurality of blocks identified as bad during the code rate test on the block list.

Abstract: Systems, apparatuses, and methods related to host-based error correction are described. Error correction operations can be performed on a host computing system as opposed to on a memory system. For instance, data containing erroneous bits can be transferred from a memory system to a host computing system and error correction operations can be performed using circuitry resident on the host computing system. In an example, a method can include receiving, by a host computing system, data that comprises a plurality of uncorrected bits from a memory system coupleable to the host computing system, determining an acceptable error range for the data based at least in part on an application associated with the data, and performing, using error correction logic resident on the host computing system, an initial error correction operation on the data based at least in part on the acceptable error range.

Abstract: Methods, systems, and devices for data compression for global column repair are described. In some cases, a testing device may perform a first internal read operation to identify errors associated with on one or more column planes. A value (e.g., a bit) indicating whether an error occurred when testing each column plane may be stored. The testing device may perform a second internal read operation on the same column planes, or on column planes of a different bank of memory cells. The values (e.g., bits) indicating whether errors occurred during the first internal read operation and the values indicating whether errors occurred during the second internal read operation may be combined and stored in a register. The stored values may be read out (e.g., as a burst) to repair the defective column planes.

Abstract: Various implementations described herein are directed to technologies for providing error detection for a disk drive of a digital video recorder (DVR). Access data is measured according to a degree of usage of a disk drive of a DVR. The access data is stored. The stored access data is analyzed to detect performance degradation of the disk drive.

Abstract: Certain aspects of the present disclosure generally relate to wireless communications and, more particularly, to methods and apparatus for rate-matching control channels using polar codes. An exemplary method generally includes encoding a stream of bits using a polar code, determining a size of a circular buffer for storing the encoded stream of bits based, at least in part, on a minimum supported code rate and a control information size, and performing rate-matching on stored encoded stream of bits based, at least in part, on a mother code size, N, and a number of coded bits for transmission, E.

Abstract: The present technology relates to a transmission method and a reception device for securing favorable communication quality in data transmission using an LDPC code. In group-wise interleaving, the LDPC code with a code length N of 17280 bits is interleaved in units of 360-bit bit groups 0 to 47. In group-wise deinterleaving, a sequence of the LDPC code after group-wise interleaving is returned to an original sequence. The present technology can be applied, for example, in a case of performing data transmission using an LDPC code, and the like.

Abstract: Described herein are methods and systems for controlling an integrated optics control system for quantum computing using a quantum bios chip. A quantum bios chip, comprising one or more qubit connection geometries and one or more error correction codes associated with the qubit connection geometries, receives instructions associated with a quantum computing application. The quantum bios chip configures one or more switching elements of an integrated optics control system coupled to the quantum bios chip, the switching elements controlling entanglement of one or more qubits of a quantum computer and the switching elements configured based upon a selected one of the one or more qubit connection geometries and one of the one or more error correction codes that is compatible with the selected one of the one or more qubit connection geometries.

Abstract: A transmitter is provided. The transmitter includes: an outer encoder configured to encode input bits to generate outer-encoded bits including the input bits and parity bits; a zero padder configured to generate a plurality of bit groups each of which is formed of a same number of bits, maps the outer-encoded bits to some of the bits in the bit groups, and pads zero bits to remaining bits in the bit groups, based on a predetermined shortening pattern, thereby to constitute Low Density Parity Check (LDPC) information bits; and an LDPC encoder configured to encode the LDPC information bits, wherein the remaining bits in which zero bits are padded include some of the bit groups which are not sequentially disposed in the LDPC information bits.

Abstract: A row decoder located on one side of a memory array selectively drives word lines in response to a row address. A word line fault detection circuit located on an opposite side of the first memory array operates to detect an open word line fault between the opposed sides of the memory array. The word line fault detection circuit includes a first clamp circuit that operates to clamp the word lines to ground. An encoder circuit encodes signals on the word lines to generate an encoded address. The encoded address is compared to the row address by a comparator circuit which sets an error flag indicating the open word line fault has been detected if the encoded address does not match the row address.

Abstract: A data processing device includes a plurality of variable nodes configured to receive and store a plurality of target bits; a plurality of check nodes each configured to receive stored target bits from one or more corresponding variable nodes of the plurality of variable nodes, check whether received target bits have an error bit, and transmit a check result to the corresponding variable nodes; and a group state value manager configured to determine group state values of variable node groups into which the plurality of variable nodes are grouped.

Abstract: According to some embodiments, a method of operation of a transmit node in a wireless communication system comprises performing polar encoding of a set of K information bits to thereby generate a set of polar-encoded information bits. The K information bits are mapped to the first K bit locations in an information sequence SN. The information sequence SN is a ranked sequence of N information bit locations among a plurality of input bits for the polar encoding where N is equivalent to a code length. A size of the information sequence SN is greater than or equal to K. The information sequence SN is optimized for the specific value of the code length (N). The method may further comprise transmitting the set of polar-encoded information bits.

Abstract: A memory device adopting an on-chip ECC scheme includes a plurality of banks, each including a normal cell region and a parity cell region; a plurality of parity generation circuits, each generating parity bits for write data to be stored in the normal cell region within a corresponding bank; a test input circuit generating common test bits by comparing the parity bits of the respective banks, and generating individual test bits by comparing bits of the write data with the common test bits; a plurality of write circuits, each writing the write data to the normal cell region within the corresponding bank and writing the individual test bits to the parity cell region within the corresponding bank; and a plurality of test output circuits, each comparing data read from the normal region with the individual test bits read from the parity cell region within a corresponding bank.

Abstract: A memory controller includes, in one embodiment, a memory interface, a plurality of decoders, and a controller circuit. The memory interface is configured to interface with a memory having a plurality of wordlines. Each decoder of the plurality of decoders is configured to determine a bit error rate (BER). The controller circuit configured to generate a plurality of bit-error-rate estimation scan (BES) hypotheses for one wordline of the plurality of wordlines, divide the plurality of BES hypotheses among the plurality of decoders, receive BER results from the plurality of decoders based on the plurality of BES hypotheses, and adjust one or more read locations of the one wordline based on the BER results from the plurality of decoders.

Abstract: A semiconductor device comprises a plurality of memory elements, test control circuitry, and a testing interface. The test control circuitry is configure to determine that one or more clock signals associated with the memory elements have been stopped and generate a scan clock signal based on the determination that the one or more clock signals have been stopped. The test control circuitry is further configured to communicate the scan clock signal to the memory elements. The testing interface is configured to communicate test data from the memory elements. In one example, the test data is delimited with start and end marker elements. The semiconductor device is mounted to a circuit board and is communicatively coupled to communication pins of the circuit board.

Abstract: The present disclosure provides memory devices and methods for using shared latch elements thereof. A memory device includes a substrate, an interposer disposed over the substrate, and a logic die and stacked memory dies disposed over the interposer. In the logic die, the test generation module performs a memory test operation for the memory device. The functional elements stores functional data in latch elements during a functional mode of the memory device. The repair analysis module determines memory test/repair data based on the memory test operation. The memory test/repair data comprises memory addresses of faulty memory storage locations of the memory device that are identified during the memory test operation. The repair analysis module configures the latch elements into a scan chain, accesses the memory test/repair data during the test mode of the memory device, and repairs the memory device using the memory test/repair data.

Abstract: Systems and methods for correcting corrupted network packets are provided. An example method includes receiving a network packet via a communication channel. The network packet includes a payload and a Cyclic Redundancy Check (CRC) associated with the payload. The method continues with calculating a reference CRC based on the received payload and determining, based on the reference CRC and the received CRC, whether the network packet is corrupted. Based on the determination that the network packet is corrupted, the method continues with selecting a predetermined number of positions of bits in the payload of the network packet, precalculating a set of additional CRCs, and determining, based on the reference CRC and the set of additional CRCs, a combination of bit flips at the predetermined number of positions. The method also includes modifying the payload according to the combination of bit flips at the predetermined number of positions.