Abstract: A routing process applied to design integrated circuits uses keep-through regions. Keep-through regions specify areas which metal shapes may overlap but where metal shapes may not have line ends. The keep-through regions are generated based on end-of-line rules applicable to routing of the design. These keep-through regions are then used in determining the layout of interconnects for the design.

Abstract: A method of reducing a power consumption of a wireless device according to one embodiment includes performing, by the wireless device, a calibration of wireless communication circuitry of the wireless device in response to establishing a wireless communication connection with a wireless access point, determining, by the wireless device, a number of disconnections between the wireless device and the wireless access point over a predefined period of time, and increasing, by the wireless device, a sleep interval of the wireless communication circuitry of the wireless device in response to determining the number of disconnections between the wireless device and the wireless access point over the predefined period of time is less than a threshold number of disconnections.

Abstract: The present invention is a system for optimizing the shipping of wall panels, comprising: analyzing a building model, wherein a set of wall panels are isolated; processing a first set of data associated each of the set of wall panels, wherein the first set of data is related to members of the wall panel and the interface between these members; grouping a first group of the set of wall panels into a bundle, wherein the first group of wall panels is based on the processed first set of data; analyzing the bundle relative to the volume of a shipping vessel, wherein it is determined if the shipping vessel can container the vessel; manipulating, by at least one processor the bundle of wall panels based on limitations of the shipping vessel; and generating a graphical representation of the bundle and the position of the bundle within the shipping vessel.

Abstract: Disclosed are method(s), system(s), and article(s) of manufacture for implementing an approach to facilitate traceability and tamper detection of electronic designs. This approach allows for tracing and tamper detection at any stage of design and manufacturing, such as during layout generation, post-design, post-mask, and post manufacturing of the electronic designs.

Abstract: A device is disclosed. The cell block includes a pin disposed at a Nth metal layer in a cell layout. The first metal interconnect is disposed at a (N+1)th metal layer above the Nth metal layer and stacked over the pin, and electrically coupled to the pin. The second interconnects are disposed at a (N+2)th metal layer and stacked over the first metal interconnect, and parallel to each other. The second metal interconnects are electrically coupled to the first metal interconnect, and forming an equivalent tapping point of the pin of the cell block. The equivalent tapping point and the pin are vertically overlapped with each other, and fabrication of the device is initiated after a DRC or a SEM simulation test is passed. A first via connects the first metal interconnect to the pin, and the at least one first metal interconnect is perpendicular to the pin.

Abstract: A computer-implemented method for comparing a first version of a floorplan of a design for an integrated circuit with a second version. The method comprises (i) generating a timing information for each net in the second version by determining whether timing information is available for the net in the first version; (ii) in case no timing information is available in the first version, generating the timing information for the second version by calculating a spatial distance and timing information between two points of the net using wire length differences between the first version and the second version; (iii) otherwise, generating the timing information for the second version by calculating a spatial distance and timing information between two points of the net using a wire reach table to obtain a wire delay.

Abstract: Predictive multi-stage modelling for complex semiconductor device manufacturing process control is provided. In one aspect, a method of predictive multi-stage modelling for controlling a complex semiconductor device manufacturing process includes: collecting geometrical data from metrology measurements made at select stages of the manufacturing process; and making an outcome probability prediction at each of the select stages using a multiplicative kernel Gaussian process, wherein the outcome probability prediction is a function of a current stage and all prior stages. Machine-learning models can be trained for each of the select stages of the manufacturing process using the multiplicative kernel Gaussian process. The machine-learning models can be used to provide probabilistic predictions for a final outcome in real-time for production wafers. The probabilistic predictions can then be used to select production wafers for rework, sort, scrap or disposition.

Abstract: A method for determining an etch profile is described. The method includes determining a masking layer profile. Loading information can be determined. The loading information indicates dependence of an etch rate for the masking layer profile on a quantity and pattern of material being etched. Flux information can be determined. The flux information indicates dependence of the etch rate on an intensity and a spread angle of radiation incident on the masking layer profile. Re-deposition information can be determined. The re-deposition information indicates dependence of the etch rate on an amount of material removed from the masking layer profile that is re-deposited back on the masking layer profile. An output etch profile for the layer of the wafer is determined based on the loading information, the flux information, and/or the re-deposition information.

Abstract: Embodiments relate to the layout of photonic integrated circuits using fixed coordinate grids. In some embodiments, a method includes receiving a request to place a first photonic component within a layout of a photonic integrated circuit. Positionings of components within the layout are represented in a design database utilizing a grid with fixed coordinates. The method further includes calculating, by a processor, precise coordinates and snapped coordinates for positioning of the first photonic component. The snapped coordinates have a precision consistent with the fixed coordinate grid and the precise coordinates have a higher precision than the snapped coordinates. The method further includes, in a design database, representing the positioning of the first photonic component utilizing both the precise coordinates and the snapped coordinates.

Abstract: Techniques for designing and implementing networks-on-chip (NoCs) are provided. For example, a computer-implemented method for programming a network-on-chip (NoC) onto an integrated circuit includes determining a first portion of a plurality of registers to potentially be included in a NoC design, determining routing information regarding datapaths between registers of the first portion of the plurality of registers, and determining an expected performance associated with the first portion of the plurality of registers. The method also includes determining whether the expected performance is within a threshold range, including the first portion of the plurality of registers and the datapaths in the NoC design after determining that the expected performance is within the threshold range, and generating instructions configured to cause circuitry corresponding to the NoC design to be implemented on the integrated circuit.

Abstract: An apparatus to facilitate scalable runtime validation for on-device design rule checks is disclosed. The apparatus includes a memory to store a contention set, one or more multiplexors, and a validator communicably coupled to the memory. In one implementation, the validator is to: receive design rule information for the one or more multiplexers, the design rule information referencing the contention set; analyze, using the design rule information, a user bitstream against the contention set at a programming time of the apparatus, the user bitstream for programming the one or more multiplexors; and provide an error indication responsive to identifying a match between the user bitstream and the contention set.

Abstract: A method for analyzing an analog circuit controlled by a plurality of digital inputs is presented. The circuit is represented with a data structure with nodes connected via edges, which represent a circuit component. The data structure can be traversed across all connected nodes; and said digital inputs can be toggled between two or more input states. The method steps include identifying a set of boundary nodes in the data structure which are at a digital-analog boundary of the data structure; for each digital input, identifying associated boundary nodes which are coupled with the digital input; grouping digital inputs into input sets, where each of the different input sets are associated with mutually exclusive sets of associated boundary nodes, and analyzing the circuit by successively analyzing one or more of the input sets for all possible combinations of inputs states within that set.

Abstract: In an embodiment, a method includes: receiving data representative of an electrical circuit including an arrangement of devices, inputs, outputs, and power sources; pairing the devices based on a complimentary feature shared between the devices, the complimentary feature being associated to an operational characteristic of the devices; grouping the paired devices into device clusters based on common features shared between two or more of the paired devices; arranging the device clusters based on locations of input, outputs, or power connections of the device clusters to optimize electrical isolation or electrical connections between the device clusters; and generating discrete portions of the arranged device clusters to form a physical layout representative of a physical manifestation of the electrical circuit, such that when the discrete portions are integrated together they form a physical manifestation of the electrical circuit.

Abstract: A method for calibrating a process model and training an inverse process model of a patterning process. The training method includes obtaining a first patterning device pattern from simulation of an inverse lithographic process that predicts a patterning device pattern based on a wafer target layout, receiving wafer data corresponding to a wafer exposed using the first patterning device pattern, and training an inverse process model configured to predict a second patterning device pattern using the wafer data related to the exposed wafer and the first patterning device pattern.

Abstract: A battery charging system suitable for charging mobile devices is presented. The system includes a plurality of charging stations. The system also includes a charging station location identification system coupled with the plurality of charging stations. Further, the system includes a communications platform configured to provide a communication means for the plurality of charging stations. Additionally, the system includes a wayfinding system configured to provide prioritization information for potential users of the battery charging system and arranged to couple with the charging station location identification system and the plurality of charging stations. The system includes an alerting system configured to provide system status of a mobile device and arranged to interact with the wayfinding system. The system also includes a merchandising module configured to provide economic data and purchasing functions for the potential users of the battery charging system.

Abstract: A static timing analysis system for finding and reporting timing violations in a digital circuit design prior to circuit fabrication, and associated methods, use exhaustive path-based analysis (EPBA) that is informed by infinite-depth path-based analysis (IPBA) to provide analysis results that are driven full-depth, in contrast to conventional EPBA systems and methods, which can terminate after reaching a maximum depth of analysis as a way of avoiding prolonged or infinite runtimes. The IPBA-driven full-depth EPBA functions for hold-mode as well as setup-mode analysis and achieves reduced pessimism as compared to systems or methods employing IPBA alone, and more complete analysis of designs as compared to systems or methods employing EPBA alone. Improved IPBA signal merging using multidimensional zones for thresholding of signal clustering mitigates the occasional optimism of IPBA.

Abstract: A memory device includes at least one bit line, at least one word line, and at least one memory cell comprising a capacitor and a transistor. The transistor has a gate terminal coupled to the word line, a first terminal, and a second terminal. The capacitor has a first end coupled to the first terminal of the transistor, a second end coupled to the bit line, and an insulating material between the first end and the second end. The insulating material is configured to break down under a predetermined break-down voltage or higher applied between the first end and the second end.

Abstract: The present disclosure describes a digital signal processing (DSP) block that includes a plurality of columns of weight registers and a plurality of inputs configured to receive a first plurality of values and a second plurality of values. The first plurality of values is stored in the plurality of columns of weight registers after being received. Additionally, the DSP block includes a plurality of multipliers configured to simultaneously multiply each value of the first plurality of values by each value of the second plurality of values.

Abstract: A battery pack (2000) includes a secondary battery (2020), a sensor (2040), and a control device (2060). The secondary battery (2020) supplies electric power to a flying object (10). The sensor (2040) outputs a measurement value related to a force applied to the secondary battery (2020) or a periphery of the secondary battery. The control device (2060) has a determination unit (2062). The determination unit (2062) determines a danger level of the secondary battery (2020) based on the measurement value of the sensor (2040).

Abstract: A wireless charging circuit, a wireless charging method, a wireless charging system and a mobile terminal are provided. The wireless charging circuit includes: an acquisition unit that acquires voltage information of a battery in the mobile terminal; a charging control unit that obtains the voltage information of the battery, and determine current information of the battery according to the voltage information during a charging process of the battery; a first communication unit that transmits the voltage information and the current information of the battery to an external wireless charging device; a receiving unit that generates a charging Direct Current (DC) by inducing an electrical signal generated by the external wireless charging device according to the voltage information and the current information of the battery; and a switching unit configured to, when the switching unit is an on state, input the charging DC into the battery through the acquisition unit.