Abstract: A communication method and system for converging a 5th-generation (5G) communication system for supporting higher data rates beyond a 4th-generation (4G) system with a technology for internet of things (IoT) are provided. The disclosure may be applied to intelligent services based on the 5G communication technology and the IoT-related technology, such as smart home, smart building, smart city, smart car, connected car, health care, digital education, smart retail, security and safety services. The method and apparatus for polar encoding and rate-matching are disclosed.

Abstract: A memory system includes: an ECC unit suitable for generating third data by correcting second data and a third DBI flag by correcting a second DBI flag, based on the second data, the second DBI flag, and a second parity, which are provided through a channel; a DBI unit suitable for generating fourth data by determining whether a plurality of third data bits respectively corresponding to a plurality of DBI flag bits constituting the third DBI flag are inverted, based on the third data and the third DBI flag; and a DM unit suitable for generating a DM flag indicating whether a write operation is performed on a plurality of fourth data bits constituting the fourth data, based on the second data.

Abstract: A method is provided for distance measurement that comprises performing measurements, wherein a measurement comprises sending out at least one measuring pulse and, if reflected on an object, receiving the reflected measuring pulse. Measurements are performed accounting for previous information about objects and/or open spaces within a maximum measuring range in order to varyingly measure subranges of the maximum measuring range. The method comprises defining subranges, classifying the subranges by relevance and varyingly measuring subranges, wherein relevant subranges are measured more intensively, so that more measuring pulses per spatial unit are sent out in relevant subranges. The method has a time budget, wherein the method comprises a one-time definition and/or dynamic adjustment of how the time budget is distributed among varyingly relevant subranges, wherein a first portion of the time budget is used for focus measurements, and a second portion of the time budget is used for basic measurements.

Abstract: The present disclosure provides a multi-core processor. The multi-core processor comprises a plurality of cores and a debug circuit, the debug circuit comprising debug circuits in the same number as that of the cores, transmission controllers in the same number as that of the cores, and a master control circuit, each of the debug circuits being connected to one core and one transmission controller, respectively, and all transmission controllers being connected to the master control circuit. Each of the debug circuits is configured to generate a debug event signal and respond to the generated debug event signal or received debug event signals generated by other debug circuits. Each of the transmission controllers is configured to respectively control transmission of the debug event signal between the respectively connected debug circuit and the master control circuit. The master control circuit is configured to forward debug event signals among different transmission controllers.

Abstract: A memory system includes: an ECC unit suitable for generating third data by correcting second data and a third DBI flag by correcting a second DBI flag, based on the second data, the second DBI flag, and a second parity, which are provided through a channel; a DBI unit suitable for generating fourth data by determining whether a plurality of third data bits respectively corresponding to a plurality of DBI flag bits constituting the third DBI flag are inverted, based on the third data and the third DBI flag; and a DM unit suitable for generating a DM flag indicating whether a write operation is performed on a plurality of fourth data bits constituting the fourth data, based on the second data.

Abstract: Boundary scan test data and a command to initiate a boundary scan test are received via a universal asynchronous receiver-transmitter (UART). Based on receiving the command, a boundary scan test mode is initiated at a memory sub-system controller. A boundary scan test vector based on the boundary scan test data is synchronously streamed to a boundary scan chain. Test result data output by the scan chain is provided to a UART host via the UART.

Abstract: An example integrated circuit (IC) die in a multi-die IC package, the multi-die IC package having a test access port (TAP) comprising a test data input (TDI), test data output (TDO), test clock (TCK), and test mode select (TMS), is described. The IC die includes a Joint Test Action Group (JTAG) controller having a JTAG interface that includes a TDI, a TDO, a TCK, and a TMS, a first output coupled to first routing in the multi-die IC package, a first input coupled to the first routing or to second routing in the multi-die IC package, a master return path coupled to the first input, and a wrapper circuit configured to couple the TDI of the TAP to the TDI of the JTAG controller, and selectively couple, in response to a first control signal, the TDO of the TAP to either the master return path or the TDO of the JTAG controller.

Abstract: A memory system includes: an ECC unit suitable for generating third data by correcting second data and a third DBI flag by correcting a second DBI flag, based on the second data, the second DBI flag, and a second parity, which are provided through a channel; a DBI unit suitable for generating fourth data by determining whether a plurality of third data bits respectively corresponding to a plurality of DBI flag bits constituting the third DBI flag are inverted, based on the third data and the third DBI flag; and a DM unit suitable for generating a DM flag indicating whether a write operation is performed on a plurality of fourth data bits constituting the fourth data, based on the second data.

Abstract: A memory system includes a memory device including a plurality of memory blocks, each block having a plurality of pages to store data; and a controller suitable for detecting a number of error bits from data stored in the plurality of pages; summing the number of error bits; generating a bad word line list based on the sum of the error bits; and performing a test read operation on the plurality of pages based on the bad word line list.

Abstract: A method for detecting errors of a first field-programmable gate array (FPGA) program includes: receiving, by a monitoring program executed on a processor connected to an FPGA on which the first FPGA program is executed, a signal value read out from the first FPGA program; and comparing, by the monitoring program executed on the processor, the signal value to a reference value from a source other than the first FPGA program in order to detect errors of the first FPGA program.

Abstract: Methods, systems, and devices for error correction management are described. A system may include a memory device that supports internal detection and correction of corrupted data, and whether such detection and correction functionality is operating properly may be evaluated. A known error may be included (e.g., intentionally introduced) into either data stored at the memory device or an associated error correction codeword, among other options, and data or other indications subsequently generated by the memory device may be evaluated for correctness in view of the error. Thus, either the memory device or a host device coupled with the memory device, among other devices, may determine whether error detection and correction functionality internal to the memory device is operating properly.

Abstract: An environment control apparatus includes an apparatus body, a processing device, a plurality of heating devices, and a plurality of cooling devices. The apparatus body includes a plurality of accommodating chambers each having one of the heating devices or one of the cooling devices. Each of the heating devices has a high temperature contacting structure, and each of the cooling devices has a low temperature contacting structure. When a chip testing device carrying chips is arranged in one of the accommodating chambers, the chip testing device is supplied with electricity, and the heating device or the cooling device of the one of the accommodating chambers is in operation, the chip testing device is configured to test the chips disposed thereon.

Abstract: A method and apparatus for a CTC data copy operation, in that modification, and subsequent encoding only affects a small portion of metadata associated with copied data. By modifying and re-encoding only this small portion of metadata, a small portion of the parity data for the copied data requires updating. In embodiments where there are no errors in the read data to be copied (e.g., from an SLC portion of a NAND), decoding, modification, and encoding, may be done in parallel. Because such a small number of metadata bits are modified, in some embodiments, all possible codewords for the parity bits may be predetermined and combined (e.g., by XOR) to update the metadata parity bits.

Abstract: A control method for a memory device uses an inverting data to label that a data stored in a memory block is in an inverting state or a non-inverting state. According to the inverting data, the number of bits whose data states is changed is lower than a half of total bits in the memory block in writing operation. Therefore, an energy consumption of the memory device can reduce. The control method of the present invention also can utilize the inverting data to label a memory block with a defective bit and to select a spare block to repair the memory block with a defective bit.

Abstract: Methods, systems, and devices for scrub rate control for a memory device are described. For example, during a scrub operation, a memory device may perform an error correction operation on data read from a memory array of the memory device. The memory device may determine a quantity of errors detected or corrected during the scrub operation and determine a condition of the memory array based on the quantity of errors. The memory device may indicate the determined condition of the memory array to a host device. In some cases, the memory device may perform scrub operations based on one or more condition of the memory array. For example, as a condition of the memory array deteriorates, the memory device may perform scrub operations at an increased rate.

Abstract: A processor includes a transmitter to transmit, to a receiver, a differential pair of signals including a positive signal transmitted across a positive conductor and a negative signal transmitted across a negative conductor. A first programmable analog delay circuit is coupled to the positive conductor to provide a first delay to the positive signal and a second programmable analog delay circuit is coupled to the negative conductor to provide a second delay to the negative signal. A controller receives data based on a bit error rate (BER) of the differential pair of signals as measured by a bit error checker of the receiver. In response to determining the BER is less than a threshold BER, the controller stores a first delay value to program the first delay and store a second delay value to program the second delay.

Abstract: A software-defined linear feedback shift register (SLFSR) implements a low-power test compression for launch-on-capture (LOC). Each bit of an extra register controls a stage of the SLFSR. A control vector is shifted into the extra register to indicate whether a primitive polynomial contains the stage of the non-zero bit. Therefore, SLFSR can configure any primitive polynomials with different degrees by loading different control vectors without any hardware overhead. A low-power test compression method and design for testability (DFT) architecture provide LOC transition fault testing by using seed encoding scheme, low-power test application procedure and a software-defined linear-feedback shift-register (SLFSR) architecture. The seed encoding scheme generates seeds for all test pairs by selecting a primitive polynomial that encodes all test pairs of a compact test set.

Abstract: An apparatus and method are provided for executing debug instructions. The apparatus has processing circuitry for executing instructions fetched from memory, and a debug interface. The processing circuitry is responsive to a halt event to enter a halted mode where the processing circuitry stops executing the instructions fetched from memory, and instead is arranged to execute debug instructions received from a debugger via the debug interface. The processing circuitry is responsive to detection of a trigger condition when executing a given debug instruction to exit the halted mode transparently to the debugger, and to take an exception in order to execute exception handler code comprising a sequence of instructions fetched from memory. On return from the exception, the processing circuitry then re-enters the halted mode and performs any additional processing required to complete execution of the given debug instruction.

Abstract: The present invention relates to the technical field of integrated chips, and more particularly, to a system-level test method for a flash memory. The method comprises: step S1, providing a test flag file, and storing a test number parameter in the test flag file; step S2, determining whether a value of the test number parameter reaches a pre-set value; if not, turning to step S3; if yes, ending and counting a verification result; step S3, performing one partition mirror data check on all partitions of the flash memory, and performing one file data check on a current system file of the flash memory; and step S4, restarting a test device, subtracting one from the value of the test number parameter, and returning to step S2.

Abstract: A memory controller includes an error correction circuit that converts some bits of first data into parity bits for an error correction operation and generates second data including remaining bits of the first data and the parity bits replaced from the some bits, and a physical layer that transmits the second data instead of the first data to a memory device.