Patents Examined by Hugh Maupin
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Patent number: 11796690Abstract: The present invention relates to a method for the quantification of radionuclides in liquid media comprising measuring a gamma-ray spectrum, a device for the quantification of radionuclides in liquid media and the use for the quantification of radionuclide concentrations in hydrometallurgical processing media, especially the quantification of uranium and/or radioactive uranium decay product concentrations in uranium mining solutions or in uranium recovery solutions or the quantification of thorium and/or radioactive 232Th decay products in rare-earth element processing solutions.Type: GrantFiled: October 8, 2020Date of Patent: October 24, 2023Assignee: UMWELT- UND INGENIEURTECHNIK GMBH DRESDENInventors: Gottfried Horst Maerten, Jens Schubert
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Patent number: 11796689Abstract: A device for detecting photons and charged particles includes a first photon-detecting panel, which causes a Compton scattering of incident radiation with charged particles, such that the wavelength thereof increases, losing part of their energy, generating a signal. A central charged particle-detecting panel, following the first photon-detecting panel on a side opposite that of the incident radiation, identifies charged particles generated in the first photon-detecting panel, generating a signal. A second photon-detecting panel, follows the central charged particle-detecting panel on a side opposite that of the first photon-detecting panel. Scattered photons and/or charged particles are generated in the first photon-detecting panel interact, generating a signal.Type: GrantFiled: November 4, 2020Date of Patent: October 24, 2023Assignees: CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS, UNIVERSITAT DE VALENCIAInventors: Gabriela Dolores Llosá Llácer, Carlos Lacasta Llácer, John Barrio Toala
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Patent number: 11796693Abstract: The invention relates to energy-resolved X-ray imaging apparatus and method. The present disclosure provides an apparatus for electromagnetic irradiation imaging. The apparatus includes one or more pixels, each pixel including a plurality of detector cells arranged in a row extending in a row direction. The row is configured to receive photons at an incident surface at one end of the row, and the received photons penetrate the plurality of detector cells in the row direction. The plurality of detector cells of the same row are configured to generate respective signals that collectively indicate an energy-resolved spectral profile of the photons based on the penetration of the photons into the row of detector cells.Type: GrantFiled: January 22, 2020Date of Patent: October 24, 2023Assignee: THE UNIVERSITY OF HONG KONGInventors: Xiaodong Cui, Chunlei Yang
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Patent number: 11796461Abstract: Disclosed is a method analysing plastic preforms, wherein plastic preforms are transported along a predetermined transport path by a transport device and an infrared absorption coefficient is determined in at least one region of the plastic preform, wherein, in order to determine the infrared absorption coefficient of the plastic preform, infrared radiation is applied to the plastic preform by a first radiation device and radiation passing through the plastic preform is received by at least one receiving device and an infrared absorption behaviour of the plastic preform is determined from this received radiation, wherein the radiation device acts upon the plastic preforms with infrared radiation in a predetermined wavelength range and an evaluation device evaluates the radiation as a function of its wavelength in a wavelength range from 1500 nm to 2000 nm.Type: GrantFiled: December 30, 2021Date of Patent: October 24, 2023Inventors: Philipp Olenberg, Simon Fischer, Robert Aust, Jochen Forsthoevel
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Patent number: 11788955Abstract: The present application relates to an N×M terahertz detector array imaging system based on a multi-frequency antenna structure, wherein a single-frequency-point terahertz antenna used for receiving terahertz signals in a traditional detector is replaced with a multi-frequency-point terahertz antenna, thereby realizing that one detector supports the detection of multiple arbitrary different frequency points. The traditional detector needs to replace detectors with different frequency points for detection of different frequency points. The present application can design a multi-frequency-point terahertz antenna with arbitrary different frequency points according to actual needs, so that one detector can support the detection of multiple arbitrary different frequency points without the replacement of the terahertz detector, effectively reducing the cost of terahertz detection and imaging.Type: GrantFiled: March 22, 2021Date of Patent: October 17, 2023Assignee: Guangdong University of TechnologyInventors: Jianguo Ma, Shaohua Zhou
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Patent number: 11782172Abstract: A scintillator array includes: a structure having scintillator segments and a first reflective layer, the first reflective layer being provided between the scintillator segments and being configured to reflect light, and the scintillator segments having a sintered compact containing a rare earth oxysulfide phosphor; and a layer having a second reflective layer provided above the structure, the second reflective layer being configured to reflect light. The first reflective layer has a portion extending into the layer.Type: GrantFiled: April 27, 2022Date of Patent: October 10, 2023Assignees: Kabushiki Kaisha Toshiba, Toshiba Materials Co., Ltd.Inventors: Hiroyasu Kondo, Yukihiro Fukuta, Kazumitsu Morimoto, Makoto Hayashi
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Patent number: 11782171Abstract: An apparatus includes a detection unit including a plurality of two-dimensionally arranged pixels with a plurality of lines located between adjacent pixels, configured to detect an incident radiation and output signals related to a radiation image, a calculation unit configured to calculate a crosstalk ratio related to crosstalk occurring between the adjacent pixels with the plurality of lines therebetween in the detection unit, and a correction unit configured to make a correction to pixel data on a pixel affected by the crosstalk among a plurality of pieces of pixel data constituting the radiation image based on the crosstalk ratio.Type: GrantFiled: September 2, 2021Date of Patent: October 10, 2023Assignee: CANON KABUSHIKI KAISHAInventor: Sota Torii
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Patent number: 11776706Abstract: An x-ray chopper wheel assembly, and corresponding method, include a chopper wheel having a solid area configured to block x-ray radiation received at a source side of the chopper wheel from an x-ray source. The chopper wheel defines one or more openings configured to pass x-ray radiation from the source side of the chopper wheel to an output side of the chopper wheel. The assembly further includes a source-side scatter plate arranged relative to the chopper wheel with a source-side gap in a range of approximately 0.2 mm to approximately 2.0 mm between the source-side scatter plate and the source side of the chopper wheel. The assembly and method can be used to limit leakage of scattered x-rays from the assembly, such as to safe levels for operation, while being significantly lighter than existing confinement enclosures.Type: GrantFiled: November 15, 2021Date of Patent: October 3, 2023Assignee: Viken Detection CorporationInventor: Peter J. Rothschild
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Patent number: 11774357Abstract: A terahertz wave attenuated total reflection spectroscopic method, includes: a first step of disposing a measurement target of which a volume is changed during a measurement period on a reflection surface; and a second step of acquiring data including a plurality of detection results respectively corresponding to a plurality of times separated from each other during the measurement period by allowing a terahertz wave to be incident on the reflection surface from a side opposite to the measurement target and by detecting the terahertz wave reflected on the reflection surface, during the measurement period. In the second step, a state in which a substantially constant pressure is applied to the measurement target disposed on the reflection surface is maintained during the measurement period.Type: GrantFiled: September 14, 2021Date of Patent: October 3, 2023Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Kazuhiro Takahashi, Kouichiro Akiyama, Hiroshi Satozono
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Patent number: 11774608Abstract: A system and method include an array of sensors electrically coupled to a material capable of converting a gamma ray to electrical charge, where distances between a center of a first sensor and centers of each sensor immediately-adjacent to the first sensor are substantially equal. Signals are collected from each sensor immediately-adjacent to the first sensor, and one of a plurality of logical sub-pixels of the first sensor is determined based on the signals collected from each sensor immediately-adjacent to the first sensor.Type: GrantFiled: April 13, 2020Date of Patent: October 3, 2023Assignee: Siemens Medical Solutions USA, Inc.Inventors: Alexander Hans Vija, Miesher Rodrigues
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Patent number: 11776703Abstract: A gauge is provided for measuring one or more characteristics of a construction material such as a road surface. The gauge includes a detector, a base that carries the detector, and a source housing carried by the base and defining a shield material circumferentially extending inwards. A source rod is positioned within the housing and carries a source that is translatable between a shielded position within the housing and a measuring position external of the housing. The source rod has a source shield on the top thereof and a shield material spaced-downwardly from the source such that the source is completely enclosed when contained within the base.Type: GrantFiled: December 13, 2021Date of Patent: October 3, 2023Assignee: Troxler Electronic Laboratories, Inc.Inventors: William F. Troxler, Jr., Wewage Hiran Linus Dep, Robert Ernest Troxler
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Patent number: 11767468Abstract: Optical tags provide a way to identify assets quickly and unambiguously, an application relevant to anti-counterfeiting and protection of valuable resources or information. The present invention is directed to a tag fluorophore that encodes multilayer complexity in a family of heterometallic rare-earth metal-organic frameworks (RE-MOFs) based on highly connected polynuclear clusters and carboxylic acid-based linkers. Both overt (visible) and covert (near infrared, NIR) properties with concomitant multi-emissive spectra and tunable luminescence lifetimes impart both intricacy and security. Tag authentication can be validated with a variety of orthogonal detection methodologies. The relationships between structure, composition, and optical properties of the family of RE-MOFs can be used to create a large library of rationally designed, highly complex, difficult to counterfeit optical tags.Type: GrantFiled: September 20, 2021Date of Patent: September 26, 2023Assignee: National Technology & Engineering Solutions of Sandia, LLCInventors: Dorina F. Sava Gallis, Kimberly Butler, Lauren E. S. Rohwer
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Patent number: 11768150Abstract: Systems and methods are provided for performing photothermal dynamic imaging. An exemplary method includes: scanning a sample to produce a plurality of raw photothermal dynamic signals; receiving the raw photothermal dynamic signals of the sample; generating a plurality of second signals by matched filtering the raw photothermal dynamic signals to reject non-modulated noise; and performing an inverse operation on the second signals to retrieve at least one thermodynamic signal in a temporal domain.Type: GrantFiled: August 5, 2022Date of Patent: September 26, 2023Assignee: Trustees of Boston UniversityInventors: Ji-Xin Cheng, Lu Lan, Jiaze Yin
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Patent number: 11762111Abstract: An arrangement for determining an energy spectrum of a beam of radiation or particles is disclosed. The arrangement comprises a plurality of polymeric bodies. Each of the plurality of polymeric bodies includes an optical waveguide. Each of the plurality of polymeric bodies has a scintillator disposed at a respective end of the optical waveguide. The scintillators are arranged relative to each other such that an energy resolution of a particle beam incident on the arrangement can be determined. Furthermore, a particle detector with the arrangement and an evaluation unit for reading out the particle detector are disclosed.Type: GrantFiled: July 7, 2020Date of Patent: September 19, 2023Assignee: Focused Energy GmbHInventors: Markus Hesse, Tina Ebert, Gabriel Schaumann, Markus Roth
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Patent number: 11754293Abstract: There is provided an auto detection system including a thermal detection device and a host. The host controls an indication device to indicate a prompt message or detection results according to a slope variation of voltage values or 2D distribution of temperature values detected by the thermal detection device, wherein the voltage values include the detected voltage of a single pixel or the sum of detected voltages of multiple pixels of a thermal sensor.Type: GrantFiled: January 26, 2022Date of Patent: September 12, 2023Assignee: PIXART IMAGING INC.Inventors: Chih-Ming Sun, Ming-Han Tsai, Chiung-Wen Lin, Po-Wei Yu, Wei-Ming Wang, Sen-Huang Huang
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Patent number: 11754497Abstract: Provided is a method for measuring interstitial oxygen concentration in a silicon wafer easily and sensitively using FT-IR. The invention provides a method for measuring an extremely low oxygen concentration of <1.0×1016 atoms/cm3 in a single-crystal silicon wafer, the method comprising: step 1 of forming a SiO2 film, nitride film or PE film on each of a measurement wafer, interstitial-oxygen-free reference wafer and standard wafer with known interstitial oxygen concentration; step 2 of measuring IR spectra of the three wafers; step 3 of determining a difference transmission spectrum from the IR spectrum of measurement wafer and that of reference wafer and determining the intensity of an absorption peak corresponding to interstitial oxygen; and step 4 of comparing the peak intensity of the interstitial oxygen and that of standard wafer and calculating the interstitial oxygen concentration in measurement wafer from ratio to the interstitial oxygen concentration of standard wafer.Type: GrantFiled: December 4, 2019Date of Patent: September 12, 2023Assignee: GLOBALWAFERS JAPAN CO., LTD.Inventor: Hiroyuki Saito
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Patent number: 11749771Abstract: Methods and devices for detecting incident radiation are provided. The methods and devices use high quality single-crystals of photoactive semiconductor compounds in combination with metal anodes and metal cathodes that provide for enhanced photodetector performance.Type: GrantFiled: November 10, 2021Date of Patent: September 5, 2023Assignee: Northwestern UniversityInventors: Mercouri G. Kanatzidis, Yihui He
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Patent number: 11737722Abstract: Provided are an X-ray detector having fabrication fault tolerant structure and a method for manufacturing the same using a micro-transfer printing (MTP) technique. The X-ray detector may include a photodiode layer formed on a base substrate within a pixel area and including a plurality of photodiode pixel units, a dummy layer formed the base substrate within a peripheral area, a plurality of pixel driving integrated chips printed on the photodiode layer, a plurality of primary column and row integrated chips printed on the dummy layer, and metal lines coupling the column and row integrated chips with pixel driving integrated chips and other constituent elements, wherein the plurality of pixel driving integrated chips and primary column and row integrated chips are manufactured separately from the photodiode layer and the dummy layer and attached on the photodiode layer and the dummy layer, respectively.Type: GrantFiled: June 10, 2022Date of Patent: August 29, 2023Assignees: RAYENCE Co., Ltd., VATECH EWOO Holdings Co., Ltd., Qpix solutions Inc.Inventors: Jin Woong Jeong, Ho Seok Lee, Chang Hyeuk Kim, Seungman Yun
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Patent number: 11730433Abstract: An X-ray detector includes a first circuit with an NPN-type bipolar transistor and a second circuit configured to compare a voltage at a terminal of the NPN-type bipolar transistor with a reference value substantially equal to a value of the terminal voltage which would occur when the first circuit has been exposed to a threshold quantity of X-rays.Type: GrantFiled: November 18, 2021Date of Patent: August 22, 2023Assignees: STMicroelectronics (Crolles 2) SAS, STMicroelectronics SAInventors: Gilles Gasiot, Severin Trochut, Olivier Le Neel, Victor Malherbe
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Patent number: 11733158Abstract: A spectral imaging system configured to obtain spectral measurements in a plurality of spectral regions is described herein. The spectral imaging system comprises at least one optical detecting unit having a spectral response corresponding to a plurality of absorption peaks of a target chemical species. In an embodiment, the optical detecting unit may comprise an optical detector array, and one or more optical filters configured to selectively pass light in a spectral range, wherein a convolution of the responsivity of the optical detector array and the transmission spectrum of the one or more optical filters has a first peak in mid-wave infrared spectral region between 3-4 microns corresponding to a first absorption peak of methane and a second peak in a long-wave infrared spectral region between 6-8 microns corresponding to a second absorption peak of methane.Type: GrantFiled: February 22, 2021Date of Patent: August 22, 2023Assignee: REBELLION PHOTONICS, INC.Inventors: Robert Timothy Kester, Ohad Israel Balila