Abstract: A structured light projectors includes an illuminator configured to emit illumination light, a pattern mask configured to project structured light by partially transmitting the illumination light, and a lens configured to project the structured light, wherein the pattern mask includes a first lens distortion compensation region including a plurality of opaque first light shielding patterns having a first pattern width, respectively, and a second lens distortion compensation region surrounding the first lens distortion compensation region, the second lens distortion compensation region including a plurality of opaque second light shielding patterns having a second pattern width, respectively, wherein the second pattern width is less than the first pattern width.

Abstract: A method of custom print mode generation in a three-dimensional (3D) printing device may include printing a plurality of parts with a plurality of 3D printing devices, the parts each being printed using different process parameters, and capturing a plurality of images of the parts. The method may also include, with an image analysis module, analyzing the images to classify the parts into a plurality of defect gradings, and adjusting a number of the process parameters based on characteristics of the parts identified by a user as undesirable. The examiner may also include, with a recommending module, creating a custom print mode based on the parts defect gradings and adjusted process parameters.

Abstract: An optical characterization system is disclosed. The optical characterization system may comprise a synchrotron source, an optical characterization sub-system, and a sensor configured to receive a projected image from a set of imaging optics. The optical characterization sub-system may include at least the set of illumination optics, a set of imaging optics, and a diffractive optical element, a temporal modulator or an optical waveguide configured to match an etendue of a light beam output by the synchrotron source to the set of illumination optics. A method of matching the etendue of a light beam is also disclosed.

Abstract: An apparatus for measuring time-resolved optical spectrum includes a light source, a sensor for collecting, forming, manipulating and measuring the intensity of the optical radiation, and a controller coupled to the light source and sensor. The sensor includes at least one optical delay element to provide a time delay to a first portion of the optical radiation. The sensor arrangement further includes an optical spectral disperser to split the delayed first portion and the second portion of the optical radiation into dispersed radiation having a plurality of wavelengths, and a sensor element configured to receive each wavelength of the dispersed radiation on a different spatial region, and measure the light intensity associated with each wavelength of the dispersed radiation. The controller collects the light intensity associated with each wavelength of the dispersed radiation measured by the sensor element to form a time-resolved optical spectrum.

Abstract: Provided is a confocal sensor having a wider measuring range. A confocal sensor 1 comprises: a light source 10 that emits light at a plurality of wavelengths; a diffractive lens 130 that causes a chromatic aberration with respect to the light along an optical axis and focuses the light onto an object 200 without another intervening lens; a pinhole 120 through which reflected light passes, the reflected light being a portion of the light that was focused onto and reflected from the object 200 and focused by the diffractive lens 130; and a measuring unit 40 that measures the distance from the diffractive lens 130 to the object 200 on the basis of a wavelength of the reflected light. A distance L2 from the pinhole 120 to the diffractive lens 130 is variable.

Abstract: The method of analyzing absorbance of one or more liquid samples (3) arranged in the wells (2) of a microplate (1) comprises the steps of setting a desired wavelength falling within the wavelength range of 380 nm-750 nm for absorbance measurement (101), illuminating the samples (3) using electromagnetic radiation having a bandwidth of at most 20 nm around the set wavelength (102), measuring radiant flux transmitted through each sample (3) (103), on the basis of measured radiant flux values, determining an absorbance value for each sample (3) (104), and visualizing the absorbance values on a display (12) as a matrix comprising a plurality of cells (23), each cell (23) corresponding to a well (2) of the microplate (1) (105). The set wavelength is used as an input for determining the visual properties of the cells (23).

Abstract: A scale includes a diffraction grating configured to condense diffracted light in a periodic direction of the diffraction grating in order to detect a reference position. A light receiving element array is configured to receive light from the diffraction grating. The light receiving element array includes first to fourth light receiving elements configured to output signals having phases different from each other. The first light receiving element and the second light receiving element are adjacent to each other and are arranged between the third light receiving element and the fourth light receiving element. The processing unit generates a signal representing the reference position based on a differential signal between a signal from the first light receiving element and a signal from the third light receiving element and a differential signal between a signal from the second light receiving element and a signal from the fourth light receiving element.

Abstract: According to examples, an apparatus may include a base, a sliding assembly slideably coupled to the base, and a sensor assembly coupled to the sliding assembly. The sliding assembly may moveably support a control panel and the sensor assembly may sense positions of the sliding assembly relative to the base. The sensor assembly may include a first sensor to sense that the sliding assembly is in a first position relative to the base, and a second sensor to sense that the sliding assembly is in a second position relative to the base. A sensed state of the first sensor and a sensed state of the second sensor may be used to determine that the sliding assembly is in a third position relative to the base.

Abstract: Disclosed are a system and a method for detecting a centroid of a complementary single pixel. The system includes a lens group, a single-pixel detector assembly, a Digital Micromirror Device (DMD) and an acquisition and processing unit. The acquisition and processing unit generates two-dimensional modulation matrices A and B which are loaded into the DMD; the lens group processes light reflected or transmitted from a target object, such that an image of the target object is imaged on the DMD; and the acquisition and processing unit is connected with data output ends of two single-pixel detectors in respective, to calculate the centroid of the target object. The DMD modulates an image signal of the target object according to modulation information A and B; the single-pixel detector assembly includes a first single-pixel detector and a second single-pixel detector.

Abstract: The present disclosure provides a microfluidic substrate, a microfluidic chip and a micro total analysis system. The microfluidic substrate includes a substrate and an ultrasonic structure on the substrate. The ultrasonic structure is configured to generate ultrasonic waves during a droplet splitting process to vibrate a droplet.

Abstract: According to examples, an apparatus may include a processor and a non-transitory computer readable medium on which is stored instructions that the processor may execute to determine displacement levels of multiple locations of an image and to select a sampling density for the multiple locations. The processor may execute the instructions to generate an array of points according to the selected sampling density, the array of points identifying displaced portions of the image.

Abstract: A three-dimensional measurement apparatus measures measurement targets placed in a target measurement area on a measurement object. The apparatus includes: a measurement module that: is positioned with respect to the target measurement area, and includes: a first irradiator that irradiates the target measurement area with predetermined light for height measurement; a second irradiator that irradiates the target measurement area with predetermined patterned light for three-dimensional measurement; and an imaging device that takes an image of the target measurement area; and a control device that moves the measurement module in a height direction and successively positions the measurement module at a predetermined height position determined by mapping, and performs, based on image data taken by irradiating the target measurement area with predetermined patterned light, three-dimensional measurement to the measurement targets at the predetermined height position.

Abstract: A laser module is provided and includes a laser unit, a focusing lens, an electric device, and a temperature control device. The laser unit is configured to emit a laser light. The focusing lens corresponds in position to the laser unit, and the focusing lens is configured to converge the laser light emitted from the laser unit so as to outwardly output the laser light. The electric device includes a focusing ring, a voice coil motor, and a motor base. The voice coil motor is configured to drive and move the focusing lens in a straight line toward or away from the laser unit with the focusing ring. The temperature control device is mounted on the laser unit and includes a thermoelectric cooling module and a thermistor. The thermoelectric cooling module is configured to cooperate with the thermistor to adjust a working temperature of the laser unit.

Abstract: A measuring system for acquiring measured values by scanning, including an interface for connection to a control unit of a machine. The system is arranged on a movement axis of the machine, and an object can be measured by a measuring instrument of the system. During the measurement of the object, the measuring instrument generates a measured value that is stored in a control unit, that processes and stores the measured value. The control unit has a control module that reads out a position coordinate from the machine via the interface and compares the read-out position coordinate with a specified coordinate target range, and/or compares a time of a timer with a specified point in time, and releases a trigger signal if the control module detects that the position coordinate lies in the coordinate target range and/or if the time has reached or passed the specified point in time.

Abstract: Embodiments herein describe spectroscopy systems that use an unmodulated reference optical signal to mitigate noise, or for other advantages. In one embodiment, the unmodulated reference optical signal is transmitted through the same vapor cell as a modulated pump optical signal. As such, the unmodulated reference optical signal experiences absorption by the vapor, which converts laser phase noise to amplitude noise like the other optical signals passing through the vapor cell. In one embodiment, the unmodulated reference optical signal has an optical path in the gas cell that is offset (or non-crossing) from the optical path of the modulated pump optical signal. The unmodulated reference optical signal allows removal or mitigation of the noise on the other optical signal.

Abstract: A three-dimensional shape measuring method includes: projecting a first grid pattern based on a first light and a first full pattern based on a second light onto a target object, the first light and the second light being lights of two colors included in three primary colors of light; picking up, by a three-color camera, an image of the first grid pattern and the first full pattern projected on the target object, and acquiring a first picked-up image based on the first light and a second picked-up image based on the second light; and calculating height information of the target object, using the first picked-up image, and calculating position information of the target object, using the second picked-up image.

Abstract: A method of characterising particles in a sample, comprising: obtaining a scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample; producing a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing a scattering intensity in at least some time periods of the scattering measurement; determining a particle characteristic from the corrected scattering measurement.

Abstract: A method can include receiving image data characterizing a viewed object acquired via an image sensor of a visual inspection system and providing the image data in a display. The method can include receiving a first directional movement input via a directional input device of the visual inspection system and applying a first set of actuator drive signals to a plurality of actuators of the visual inspection system. The method can further include applying a coordinate transformation to the image data to generate transformed image data and receiving a second directional movement input via the directional input device. The method can also include applying a second set of actuator drive signals to the plurality of actuators. The second set of actuator drive signals can cause points on the viewed object to move in the first direction on the display. Related systems performing the method are also provided.

Abstract: A depth data measuring head (300), a measurement device (1400) and a measurement method. The measuring head (300) comprises: a projection device (310, 1410) used to project and scan line coded structured light across a region to be photographed; first and second image sensors (310_1, 310_2, 1410_1, 1410_2) disposed at preset relative positions and used to photograph said region so as to respectively obtain first and second two-dimensional image frames under irradiation of the structured light; and a synchronization device (330, 1430) used to synchronously activate, on the basis of a scan position of the projection device, pixel columns of the first and second image sensors (310_1, 310_2, 1410_1, 1410_2) in a line direction corresponding to the current scan position to perform imaging.

Abstract: A metrology target includes a first target structure formed within at least one of a first area and a third area of a first layer of a sample, where the first target structure comprises a plurality of first cells containing one or more first cell pattern elements; and a second target structure formed within at least one of a second area and a fourth area of a second layer of the sample, the second target structure comprising a plurality of second cells containing one or more second cell pattern elements.