Patents Examined by J. Kerveros
  • Patent number: 6249129
    Abstract: A system for transmission measurement with the aid of microwaves for the continuous determination of the concentration of a substance, the system being composed of: a transmission waveguide antenna for radiating microwave energy; a receiving waveguide a for receiving radiated microwave energy, each of the waveguides being provided with a window that is transparent to microwave radiation; and a signal processing circuit connected to the waveguides for supplying a microwave signal to the transmission waveguide antenna to cause the transmission waveguide antenna to radiate microwave energy via the window of the transmission waveguide antenna and for receiving from the receiving waveguide antenna a microwave signal created in the receiving waveguide antenna by microwave radiation received by the receiving waveguide antenna through the window in the receiving waveguide antenna.
    Type: Grant
    Filed: November 30, 1998
    Date of Patent: June 19, 2001
    Assignee: Berthold GmbH & Co. KG
    Inventors: Oliver Burk, Ulrich Klute, Wilfried Reuter, Jean-Marie Weber
  • Patent number: 6246224
    Abstract: An apparatus (2) comprising one substantially transparent electrode (12), a second shielded electrode (10) where the document (26) is to be placed between the first and second electrodes (12, 10), an optical device (18) capable of generating a rapid optical pulse that would be incident upon the document and an electrical impulse detection device connected to the second electrode (10) for detecting charge given off by the piezoelectric material in response to the optical pulse.
    Type: Grant
    Filed: February 6, 1998
    Date of Patent: June 12, 2001
    Assignee: Measurement Specialties Inc.
    Inventor: Richard Hunter Brown
  • Patent number: 6242924
    Abstract: The size of an internal void in an electrically conductive lead is measured by determining its electrical resistance at a plurality of A.C. frequencies, ranging from D.C. to a frequency on the order of 50 to 100 GHz at which the majority of current flows along the skin of the lead. The test data is compared with reference data for an electrically conductive reference lead having characteristics which are essentially similar to the test lead. The difference between the two sets of data increases with the size of an internal void in the test lead. The difference will be greatest at D.C. because the current will flow through substantially the entire cross-section of the lead and the cross-sectional area will be reduced by the internal void. The test data will approach the reference data as the frequency increases because the majority of the current will flow through the skin of the test lead and will be less affected by the internal void.
    Type: Grant
    Filed: January 25, 1999
    Date of Patent: June 5, 2001
    Assignee: Advanced Micro Devices
    Inventors: Tsui Ting Yiu, Yow Juang W. Liu, Young-Chang Joo, Sunil N. Shabde
  • Patent number: 6236220
    Abstract: A method for testing whether an antenna circuit of a contactless chip card is defective. The antenna circuit is an inductive resonant circuit comprising a capacitor and an antenna coil. The antenna coil of the resonant circuit is excited by inductive coupling using a test coil wherein the excitation is then sharply interrupted. By detecting in the test coil a response signal generated by self-induction in the antenna coil of the resonant circuit and retransmitted to the test coil by inductive coupling, the response signal can be analyzed for determining whether a contactless chip card is defective. Application is well suited to the testing of antenna circuits for electronic portable devices working without contact, such as contactless chip cards, electronic labels, etc.
    Type: Grant
    Filed: November 17, 1998
    Date of Patent: May 22, 2001
    Assignee: STMicroelectronics S.A.
    Inventor: Jean-Pierre Enguent
  • Patent number: 6236225
    Abstract: A method of testing a DMOS power transistor that includes arranging a switch between low-voltage circuitry and the gate terminal of the DMOS power transistor, maintaining the switch in an open condition, applying a stress voltage to the gate terminal, testing the functionality of the DMOS power transistor, and, if the test has a positive outcome, short-circuiting the switch through zapping by fusing a normally-open fusible link. An integrated circuit device with DMOS transistor is provided that includes a gate terminal of the DMOS transistor coupled to a control element, a normally-open switch element coupled in series between the gate terminal and the control element and including two metallic regions with an insulating between them connected in parallel with the switch element and in series between the gate terminal and the control element.
    Type: Grant
    Filed: April 1, 1998
    Date of Patent: May 22, 2001
    Assignee: STMicroelectronics S.r.l.
    Inventors: Franco Bertotti, Bruno Murari, Enrico Novarini
  • Patent number: 6236226
    Abstract: In a system composed of an uninterruptible power supply UPS) and a computer that is supplied with power from the UPS, the UPS includes a test switch that is turned off by the control of the computer until a test time period has elapsed. The computer includes a test flag memory that holds its data when the UPS does not supply power to the computer. The computer uses the test flag memory to determine whether the UPS is under abnormal conditions.
    Type: Grant
    Filed: November 4, 1998
    Date of Patent: May 22, 2001
    Assignee: NEC Corporation
    Inventor: Yoshihiro Hagiwara
  • Patent number: 6236216
    Abstract: A temperature/voltage detecting unit has a temperature detector and a voltage detector. The temperature detector has a light electric system stabilized power supply for stabilizing a light electric system power supply voltage, a temperature resistance element provided close to a corresponding battery element, for changing its resistance value based on a change in temperature, and a voltage-to-frequency converter operating based on a voltage from the light electric system stabilized power supply, for detecting a terminal voltage of the temperature resistance element to which a constant current flows from the light electric system stabilized power supply, converting this value into frequency information and outputting the frequency information.
    Type: Grant
    Filed: January 15, 1999
    Date of Patent: May 22, 2001
    Assignee: Yazaki Corporation
    Inventors: Kenichi Shimoyama, Yoichi Arai, Toshifumi Maemoto
  • Patent number: 6232791
    Abstract: A testing board for testing the electric characteristics of semiconductor integrated circuit elements by applying a voltage to each of the testing electrodes of the semiconductor integrated circuit elements comprises a wiring board having a wiring layer at the surface thereof opposing the semiconductor integrated circuit elements. An elastic sheet is disposed in spaced relation to the opposing surface of the wiring board. Probe terminals are disposed on the surface of the elastic sheet opposing the semiconductor integrated circuit elements to correspond to the testing electrodes. A conductive wire has both end portions joined to the wiring layer of the wiring board and a middle portion spaced from the opposing surface of the wiring board. An elastic member for biasing the conductive wire such that the middle portion of the conductive wire is brought into contact with the probe terminal is disposed between the wiring board and the conductive wire.
    Type: Grant
    Filed: July 14, 1999
    Date of Patent: May 15, 2001
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Kenro Jitsumori, Kenji Furumoto, Shoichi Tanaka, Tomoyuki Nakayama, Mikiya Mai, Tugio Murayama
  • Patent number: 6225814
    Abstract: This invention relates to apparatus for detecting the contact or nip width between two contacting surfaces. The apparatus includes first and second insulating substrates each of which has a pattern of conductive material formed on a facing inner surface thereof, which substrates are adapted to be fitted between the contacting surfaces. For a first embodiment, the pattern of conductive material on one substrate includes a pair of conductive terminals spaced by a distance greater than the contact width to be measured and the conductive pattern on the other substrate includes a conductor which extends over at least a distance greater than the maximum width W to be measured.
    Type: Grant
    Filed: April 13, 1999
    Date of Patent: May 1, 2001
    Assignee: Tekscan, Inc
    Inventors: Boris Oreper, Mark Lowe, Charles McWilliams, Charles Malacaria, Anthony Coviello, Jay Winters
  • Patent number: 6222368
    Abstract: An ion current detection apparatus which can detect ion current with a high degree of accuracy regardless of the presence of voltage damped oscillation and which does not cause contamination of a spark plug. A spark discharge current Isp generated upon spark discharge of a spark plug 10 flows through a charge diode 28, a capacitor 24, and a diode 22, which form a closed loop together with the spark plug 10 and a secondary winding L2 of an ignition coil 12 that constitutes an ignition apparatus. As a result, a Zener diode 26 connected in parallel to these components generates a Zener voltage Vz and thereby charges the capacitor 24. When a preset wait time has elapsed after the ignition timing for starting spark discharge, the discharge switch 30 short-circuits the opposite ends of the charge diode 28 to discharge the capacitor 24, so that a high voltage having a polarity opposite that in the case of spark discharge is applied to the spark plug.
    Type: Grant
    Filed: January 28, 1999
    Date of Patent: April 24, 2001
    Assignee: NGK Spark Plug Co., Ltd.
    Inventors: Hiroshi Inagaki, Noriaki Kondo, Shigeru Miyata
  • Patent number: 6218853
    Abstract: A circuit arrangement for simulating an alternating current load. The simulating circuit includes a current waveform generating circuit capable of generating a phase control signal with a phase angle coherent, lagged, or leading to that of the alternating current power source voltage. A voltage and current phase control circuit generates a first and second switching control signals according to the phase control signal generated by the current waveform generating circuit and a series of counting pulses generated by a voltage zero-crossing detecting circuit. The switching control signals are used to control a switch circuit so as to generate a power source current with a phase angle coherent, lagged, or leading to the phase angle of the power source voltage.
    Type: Grant
    Filed: December 11, 1998
    Date of Patent: April 17, 2001
    Inventor: Daniel Liu
  • Patent number: 6218825
    Abstract: Current sensor with a magnetic core (8) on which, besides a primary winding (9) in which the current to be measured (i) flows, at least one secondary winding (5) is wound, into which winding an alternating current that is generated by a generator circuit (1 to 7; 14 to 29) is fed, said current saturating the magnetic core (8) in alternating fashion in at least one direction, whereby the generator circuit is self-running, whereby the polarity of the alternating current generated by the generator circuit (1 to 7; 14 to 29) alternates depending on the current flowing in the secondary winding (5) and on at least one threshold value for this current.
    Type: Grant
    Filed: July 30, 1999
    Date of Patent: April 17, 2001
    Assignee: Vacuumschmelze GmbH
    Inventor: Friedrich Lenhard
  • Patent number: 6218826
    Abstract: A measurement probe includes a sacrificial assembly fixture as part of the probe head. The probe head has probing contact at one end thereof and a transmission cable extending from the other end thereof and includes a housing having interior surfaces with the probing contact disposed in one end of the housing and the transmission cable extending from the other end. A substrate is disposed within the housing and is electrically connected to the probing contact and the transmission cable. An alignment fixture has a base with deformable ribs formed on one surface thereof and opposing sidewalls extending from the base opposite the surface with the deformable ribs. Each sidewall has an interior surface with a channel formed therein at the exposed ends of the sidewalls for engaging the substrate.
    Type: Grant
    Filed: April 28, 1999
    Date of Patent: April 17, 2001
    Assignee: Tektronix, Inc.
    Inventor: Mark W. Nightingale
  • Patent number: 6215296
    Abstract: An arrangement for measuring alternating or direct current based on the magnetic field generated by the flow of the current includes a sensor for sensing the magnetic field generated by the flow of the current, a measuring circuit for determining the current from the magnetic field, and a device for sensing an external parasitic magnetic field and producing a correction signal applied to the measuring circuit for accurate measurement of the current.
    Type: Grant
    Filed: January 13, 1999
    Date of Patent: April 10, 2001
    Assignee: Chauvin Arnoux
    Inventors: Axel Arnoux, Claude Genter, Didier Piaud
  • Patent number: 6215314
    Abstract: A system and method for locating a break in a single conductor unshielded wire is provided. The system includes a transmitter generating two continuous wave radio frequency signals attached to each of the wire segments of a broken wire. Each signal has a unique frequency and is transmitted in opposite directions around the wire. When a locator is operated near a wire transmitting one of the signals, an audible tone of the appropriate frequency is generated. The volume of the tone decreases as the locator is moved closer to the break. In this manner, the operator can determine the location of the break within a margin of about six inches. Accordingly, no unnecessary digging is required to locate the break in the wire.
    Type: Grant
    Filed: April 27, 1999
    Date of Patent: April 10, 2001
    Assignee: Radio Systems Corporation
    Inventor: Walter J. Frankewich, Jr.
  • Patent number: 6215317
    Abstract: A method and apparatus for measuring in-place soil density and moisture content. A cylindrical cell is disclosed which may be used to measure the density and the dielectric constant of a soil sample placed within the cylindrical cell. Also disclosed is a multiple rod probe which is designed to contact spikes driven into the ground to measure the in-place dielectric constant of soil. The multiple rod probe includes adjustable studs which ensure complete contact with the spikes. Both measurements are performed using time domain reflectometry. The present invention develops equations for determining the density of the soil in-place from the measured dielectric constant of the soil in-place and the measured density and dielectric constant of the soil in the cylindrical cell.
    Type: Grant
    Filed: April 27, 1999
    Date of Patent: April 10, 2001
    Assignee: Purdue Research Foundation
    Inventors: Shafiqul I. Siddiqui, Vincent P. Drnevich
  • Patent number: 6211680
    Abstract: A process for recognizing ignition failures in an internal-combustion engine which has two spark plugs per cylinder, based on a measurement of the ionic current at the spark plugs. In this process, the ionic current signals of the two spark plugs are each integrated using an assigned integrator over an entire combustion cycle and the integrator values are compared with one another. Since, in the case of a defective spark plug, an ionic current signal will occur only some time after the ignition (specifically after the arrival of the flame from the ignited spark plug), its integration value is significantly lower than that of the intact spark plug. From this information, the correct operation of the spark plugs is determined.
    Type: Grant
    Filed: August 13, 1998
    Date of Patent: April 3, 2001
    Assignee: DaimlerChrysler AG
    Inventors: Peter Hohner, Juergen Schenk, Hartung Wilstermann
  • Patent number: 6204673
    Abstract: A capacitance measuring device and method including ratio transformers, a reference capacitor(s), multiplying digital-to-analog converters connected to form a bridge, the converters being adjustable to at least partially balance the bridge, digital signal processor (DSP) for driving and control functions, and feedback to the DSP to maintain and to correct in real time desired amplitudes and phase relation of the signals produced by the ratio transformers. Commutation is used to balance or to average feedback signals to enhance precision, accuracy, resolution and stability. The bridge uses DSP generated phase shifted signals and reference capacitors to balance the real part of the unknown impedance.
    Type: Grant
    Filed: December 1, 1998
    Date of Patent: March 20, 2001
    Assignee: Andeen-Hagerling, Inc.
    Inventors: Carl G. Andeen, Carl W. Hagerling, Stephen E. Flocke
  • Patent number: 6204669
    Abstract: The invention includes apparatus and method for detecting defects in various barrier materials including surgical gloves and food packaging. Voltage is applied across electrodes and a barrier material and the voltage measured and compared with voltage control measurements for the same barrier material without a defect. Sensitivity of measurements is increased by adjusting partial pressure across the barrier material which is subjected to the passage of an ionized gas detected by suitable instrumentation.
    Type: Grant
    Filed: July 2, 1998
    Date of Patent: March 20, 2001
    Assignee: Drexel University
    Inventors: Richard B. Beard, Kambiz Pourrezaei, Shengke Zeng, Frederick Prout, Frank M. Kepics, Jin Park, Allen Rothwarf, Siddharth Deliwala, Robert Schmukler
  • Patent number: 6198274
    Abstract: An IC testing apparatus in which an accident occurring when a measurement part mounted on a test head is changed can be avoided. A type signal generating device 301 is provided on each of measurement parts so that a type signal TYPE can be sent from the type signal generating device 301 when a measurement part 300 is mounted on a test head 200. The type signal is read by a type signal reading device 102 provided in an IC tester 100. The type signal is transmitted to a handler 400 together with the number of simultaneous tests SUM extracted from a test program loaded in a main controller 101 of the IC tester. In the handler, a decision device 402 determines, based on the transmitted number of simultaneous tests and the type signal, whether or not the test program is proper and whether or not the arrangement of IC sockets set in the handler coincides with the arrangement of IC sockets of the measurement part.
    Type: Grant
    Filed: March 19, 1999
    Date of Patent: March 6, 2001
    Assignee: Advantest Corporation
    Inventor: Takeshi Onishi