Abstract: A laser desorption ionization instrument for measuring the molecular weight of large organic molecules includes a time of flight (TOF) mass spectrometer. The time of flight mass spectrometer includes a sample lock for holding, under vacuum, a plurality of samples to be analyzed. A sample may be inserted into and removed from the sample lock and into the mass spectrometer without breaking vacuum in the spectrometer. Signal processing electronics of the LDIM instrument include means for identifying quasi-molecular species of a molecule being measured. The instrument includes improvements in ion optics, microchannel plate detectors, laser irradiation of samples, and preparation of samples for measurement.

Abstract: A sample semiconductor device which is processed and/or observed with the focused liquid metal ion beam can be returned again to the manufacturing process in this invention. The metal ions used in this apparatus are generally Ga ions. Ga ions contaminate a semiconductor device and a semiconductor manufacturing apparatus by auto-doping. An area which is irradiated with a focused liquid metal ion is doped by the metal ions which are subsequently removed by irradiation with a gas ion beam or covered by hard fusing metal.

Abstract: A method and apparatus for treating material surfaces using a repetitively pulsed ion beam. In particular, a method of treating magnetic material surfaces in order to reduce surface defects, and produce amorphous fine grained magnetic material with properties that can be tailored by adjusting treatment parameters of a pulsed ion beam. In addition to a method of surface treating materials for wear and corrosion resistance using pulsed particle ion beams.

Abstract: A fluid treatment device comprising a housing for receiving a flow of fluid, the housing comprising a fluid inlet, a fluid outlet, a fluid treatment zone disposed between the fluid inlet and the fluid outlet, and at least one radiation source module disposed in the fluid treatment zone, the at least one radiation source module comprising a radiation source sealably connected to a leg, the leg sealably mounted to the housing, the radiation source being disposed substantially parallel to the flow of fluid. A method of treating a fluid in a housing comprising a fluid inlet, a fluid outlet, a fluid treatment zone disposed between the fluid inlet and the fluid outlet, the fluid treatment zone having at least one radiation source disposed therein is also described.

Abstract: An improved electrospray ionization (ESI) system source and method is presented including an electrospray ionization source for introducing an ionized molecular sample into a mass spectrometer for analysis. The ESI source is constructed in the configuration of a probe that makes use of a standard 0.5 inch (13 mm) vacuum lock commonly found on conventional mass spectrometers. The ESI probe comprises a desolvation tube, a voltage source for applying a voltage to the desolvation tube, a resistance coil for heating the desolvation tube, a sensor for measuring the temperature of the desolvation tube, a skimmer positioned downstream of the desolvation tube for directing the ions to the lens stack of the mass spectrometer, a voltage source for applying a voltage to the skimmer, a spacer lens positioned upstream of the skimmer for focusing the ions prior to their entering the skimmer, and an evacuable dielectric encasement for housing the components of the probe assembly.

Abstract: During ion implantation, beam heating of the substrates must be reduced to eliminate self-annealing of the wafers during implant and to eliminate damager to masking materials, principally photoresist, that is mounted on the surface of the wafers. In this work, we describe a technique which may be used with both single-wafer and batch ion implantation systems to reduce transient wafer temperatures during implant.

Abstract: A shipping container is provided for a hexagonal nuclear fuel assembly including a top nozzle having a top end, an outer barrel, an external shoulder, and an inner barrel; a plurality of grids which support fuel rods; and a bottom nozzle having an internal shoulder within a recess, a spherical taper, and a bottom end. The container may include a housing, a support for the fuel assembly, a top nozzle holder secured to the support, plural grid supports secured to the support, plural clamping frames for clamping the grids, plural guide plates for guiding the fuel assembly between adjacent grid supports, and a bottom nozzle holder secured to the support. The top nozzle holder may include a shoulder holder for holding the external shoulder, an end holder for enclosing and holding the top end, and a shoulder clamp for clamping the shoulder holder to the support.

Abstract: A small-sized circular accelerator capable of generating radiation of high brightness, an operation method of the circular accelerator, and a semiconductor irradiation system capable of using radiation of high brightness. An electron beam emitted from a pre-accelerator is injected to the inside of the storage ring by an injector, and accelerated and stored. Thereafter, each of insertion devices respectively disposed in linear orbit sections between main bending magnets and auxiliary bending magnets are excited to generate an alternating field therein. A meandering or spiral movement of the electron beam is caused by this alternating field. By superposing radiations emitted from vertexes of the meandering orbit or the spiral orbit, radiation having high brightness is generated.

Abstract: Methods and apparatus for thermally altering the near surface characteristics of a material are described. In particular, a repetitively pulsed ion beam system comprising a high energy pulsed power source and an ion beam generator are described which are capable of producing single species high voltage ion beams (0.25-2.5 MeV) at 1-1000 kW average power and over extended operating cycles (10.sup.8). Irradiating materials with such high energy, repetitively pulsed ion beams can yield surface treatments including localized high temperature anneals to melting, both followed by rapid thermal quenching to ambient temperatures to achieve both novel and heretofore commercially unachievable physical characteristics in a near surface layer of material.

Abstract: A multiple charged-particle detector system includes a plurality of charged-particle detector assemblies (10-12) which are each made up of a first arm (19-22) and a second arm (24-27) extending at an angle to each other. Charged particles (4-7) enter an aperture (14-18) at the entrance of the first arm (19-22) of each detector assembly (10-12) and strike a dynode (30-33) positioned at the intersection of the two arms causing electrons to be emitted by the dynode (30-33). Some of the electrons pass into the second arms (24-27) of the detector assemblies (10-12) and are detected by a continuous-dynode electron multiplier (35-38). The first arms (19-22) are narrower than the detectors (35-38), and the detector assemblies (10-12) are arranged in such a way that the minimum separation at which charged-particle beams (4-7) can be detected is determined by the widths of the said first arms (19-22) of the detector assemblies (10-12), and not by the widths of the detectors (35-38) themselves.

Abstract: A fluid disinfection unit comprising a fluid treatment housing, an electrical supply module and electrical connection means connecting the fluid treatment housing and the electrical supply module;the fluid treatment housing comprising a fluid inlet and a fluid outlet in communication with a reaction chamber, an ultraviolet radiation lamp disposed in the reaction chamber and having a first electrical connection receiving means at a first end thereof and a second end thereof being closed, the second end of the ultraviolet radiation lamp being received and held in place by fixture means;the electrical supply module comprising ballast means and a second electrical connection receiving means; andthe electrical connection means comprising lamp receptacle connector means at one end thereof for removable connection to the ultraviolet radiation lamp and electrical connection receiving means for connection to the electrical supply module.

Abstract: The invention provides an anesthesia monitor being able to directly make a separation and a determination in real time all components of a gas in which components having the same integer molecular weight exists, more particularly an expiration gas and an inspiration gas as the object of analysis. The monitor has a small size, a low price and a operational facility. A microscopic quantity of the expiration gas is introduced from a circular route of an anesthesia circuit for an inhalation anesthesia to the anesthesia monitor through a material pipe-line. A gas portion is transmitted by a rotary pump through valves and opening and closing valves to a measurement cell within a vacuum chamber arranged in a gap of between magnetic poles of permanent magnets in a Fourier transformation mass analyzer so that the expiration gas is subjected to a high speed sampling. An ionization of the ions is carried out within the measurement cell.

Abstract: An ion trap is provided in which higher multipole field fractions can be switched on and off and, in addition, can be electrically tuned. Specifically, the electrodes of an ideally shaped ion trap are divided into rotationally symmetrical component electrodes positioned facing the interior of the ion trap on a hyperboloidal surface with rotationally symmetry.

Abstract: Electron beam lithography for exposure of a group of elemental openings in a collective-exposure shaping diaphragm is intended to correct the positional deviation of the group of elemental openings quickly and economically.A rectangular beam is formed by rectangle openings made in a rectangle forming diaphragm and a group of elemental openings in a collective-exposure shaping diaphragm and used for irradiating a reference mark on a workpiece stand. Electrons reflected from the reference mark are detected by a reflecting electron detector to calculate errors in the configuration and position of the rectangular beam. The results of calculation are fed back to a shaping deflector and a positioning deflector to correct errors in the configuration and position of the rectangular beam, respectively.

Abstract: A microscope comprises a cantilever having a distal end equipped with an electrically conductive probe allowing current to flow and having a fine tip whose voltage is controllable, a position control mechanism for controlling position of a sample with respect to a base end of the cantilever, a small displacement measuring mechanism for measuring a deflection amount of the cantilever, and a deflection control mechanism for controlling deflection of the cantilever so as to adjust a distance between the fine tip of the probe and the sample.

Abstract: A parabolic reflector and an inclined planar light reflector in a cathodoluminescence detector are integrated with a set of photo-sensitive solid-state detector cells mounted in quadrature on a supporting plate, and supported by an electron microscope vacuum chamber specimen stage adaptor unit. Designed for CL emission operation in an electron microscope, the parabolic light reflector, the inclined planar light reflector and the photo-sensitive, solid-state detector cells are optically aligned and mechanically combined through the supporting plate of the detector cells. A readily exchangeable unit is thus obtained. The unit is further supported by the specimen stage adaptor unit so as to obtain a mechanical unit which can easily be mounted in and removed from any standard electron microscope vacuum chamber stage as a single integrated unit.

Abstract: The invention relates to an improved method and an apparatus for the mass-sequential ejection of ions from an RF quadrupole ion trap by electrical alternating fields which are generated in addition to the quadrupolar RF storage field and with different frequencies to it. In contrast to the already known ejection by a pure dipole field, the ions are here essentially ejected by a quadrupole field. The ions leave the ion trap through a perforated end cap and can be detected outside it with conventional means. A weak dipole field undertakes only excitation of the secular oscillation at the center, the amplitude increasing in linear manner in the stationary case. The more intense quadrupole field undertakes further widening of the oscillations with exponential growth in amplitudes. The dipole field is generated by an alternating voltage between the two end caps, while the quadrupole field is generated by an alternating voltage between the end caps on the one hand and the ring electrode on the other.

Abstract: A tomographic technique for measuring the current density distribution in electron beams using electron beam profile data acquired from a modified Faraday cup to create an image of the current density in high and low power beams. The modified Faraday cup includes a narrow slit and is rotated by a stepper motor and can be moved in the x, y and z directions. The beam is swept across the slit perpendicular thereto and controlled by deflection coils, and the slit rotated such that waveforms are taken every few degrees form 0.degree. to 360.degree. and the waveforms are recorded by a digitizing storage oscilloscope. Two-dimensional and three-dimensional images of the current density distribution in the beam can be reconstructed by computer tomography from this information, providing quantitative information about the beam focus and alignment.

Abstract: A mass spectrometry method in which notch-filtered noise is applied to an ion trap to resonate all ions except selected parent ions out of the region of the trapping field. Preferably, the trapping field is a quadrupole trapping field defined by a ring electrode and a pair of end electrodes positioned symmetrically along a z-axis, and the filtered noise is applied to the ring electrode(rather than to the end electrodes) to eject unwanted ions in radial directions (toward the ring electrode) rather than toward a detector mounted along the z-axis. Application of the filtered noise to the trap in this manner can significantly increase the operating lifetime of such an ion detector. Also preferably, the trapping field has a DC component selected so that the trapping field has both a high frequency and low frequency cutoff, and is incapable of trapping ions with resonant frequency below the low frequency cutoff or above the high frequency cutoff.

Abstract: A mass analyzer system uses a simultaneous mode electron multiplier detector which outputs both a pulse count and an analog signal. Depending on the ion flux intensity, the signals define a pulse count only region in which the pulse count only signal is valid, an overlap region in which both the pulse count and analog signals are valid, an analog signal only region in which only the analog signal is valid, and a neither analog nor pulse region in which neither signal is valid. The system produces a separate flag for each region. When a mass spectrum is scanned, for each dwell the pulse count and analog data are recorded together with their associated flag and are placed in memory. The signals, with the flags, can then be used to produce a mass spectrum using the pulse count only signal, the analog only signal, or both.