Abstract: A scanner for a scanning probe microscope (SPM) including a head has a scanner body that houses an actuator, and a sensor that detects scanner movement. The scanner body is removable from the head by hand and without the use of tools and has a total volume of less than about five (5) square inches. Provisions are made for insuring that movement of a probe device coupled to the scanner is restricted to be substantially only in the intended direction. A fundamental resonance frequency for the scanner can be greater than 10 kHz.

Abstract: A particle beam microscope includes an illumination system generating a particle beam having a ring-shaped conical configuration. A selective detection system is configured to selectively detect one of two groups of particles having traversed the object region. The first group of particles includes the particles that traversed the object region un-scattered or scattered by a small scattering amount. The second group of particles includes particles scattered in the object region by a greater scattering amount.

Abstract: A method for processing the surface of a component, or the processing of an optical element through an ion beam, directed onto the surface to be processed, whereby the surface is lowered and/or removed at least partially, and wherein the ions have a kinetic energy of 100 keV or more, as well as optical elements processed in accordance with the method.

Abstract: A method and apparatus to trap, release and/or separate sample components in solution passing through a channel with or without packing material present by passing ion current through the channel driven by an electric field. A portion of the ion current includes cation and/or anion species generated from second solution flows separated from the sample solution flow path by semipermeable membranes. Cation and/or anion ion species generated in the second solution flow regions are transferred into the sample solution flow path through ion selective semipermeable membranes. Ion current moving along the sample solution flow path is controlled by varying the composition of the second solutions and/or changing the voltage between membrane sections for a given sample solution composition. The sample composition may also be varied separately or in parallel to enhance trapping, release and/or separation efficiency and range.

Abstract: The present invention relates to a cryo transfer holder for TEM including: a specimen support having a specimen rod with a specimen cradle provided on one side end thereof, while being airtightly inserted reciprocatingly on the other side end thereof into a cooling tube of a thermal insulating container, and a thermal insulating pipe configured to be fixed to the thermal insulating container on one side thereof and to surround the specimen rod except the specimen cradle at the time of observation. The thermal insulating container in which a cooling medium is contained has the cooling pipe penetrated thereinto. A specimen rod-reciprocating means is configured to be coupled to the side of the thermal insulating container to allow the specimen rod to be reciprocated relative to the thermal insulating container.

Abstract: A device for deflecting a particle beam out of a beam axis, or for guiding a particle beam into the beam axis, has a simple design, requires little space, and additionally ensures that no area of an object that is not to be struck is struck by a particle beam. The device may include components in the following sequence along the beam axis: first deflection element, a magnetic apparatus for providing a magnetic field axially to the beam axis, and a second deflection element. A particle beam apparatus may have a device of this type.

Abstract: A test structure and method thereof for determining a defect in a sample of semiconductor device includes at least one transistor rendered grounded. The grounded transistor is preferably located at at least one end of a test pattern designed to be included in the sample. When the test structure is inspected by charged particle beam inspection, the voltage contrast (VC) of the transistors in the test pattern including the grounded transistor is observed for determination of the presence of defect in the sample.

Abstract: Dual beam instruments, comprising a Scanning Electron Microscope (SEM) column for imaging and a Focused Ion Beam (FIB) column for milling, are routinely used to extract samples (lamellae) from semiconductor wafers. By observing the progress of the milling with the SEM column, end pointing of the milling process can be performed. The invention offers an alternative solution to this problem, in which an instrument with only a FIB column is used. For milling a lamella to its final thickness of, for example, 30 nm, the focused ion beam 100, is scanned repeatedly along the lamella. It is found that while milling the lamella a signal can be derived from the lamella that is sufficient for end pointing. No additional electron beam for inspection is needed.

Abstract: Analyte ions are analyzed first by field asymmetric ion mobility spectrometry (FAIMS) before being analyzed by a mass analyzer. Analyte ions are produced at near atmospheric pressure and transferred via a dielectric capillary into the vacuum system of the mass analyzer. While passing through the capillary, the ions are analyzed by FAIMS via electrodes on the interior wall of the capillary. Improved ion transmission is achieved by providing smooth geometric transitions between the channel in FAIMS analyzer and the channel in the remainder of the capillary.

Abstract: Provided is a spectrophotometer using medium energy ion. The spectrophotometer using medium energy ion is configured to include: an ion source 10 generating ions; a collimator 20 collimating the ions as a parallel beam; an accelerator 30 accelerating the parallel beam; an ion beam pulse generator 40 pulsing the accelerated ion beam; a focusing objective 50 focusing the pulsed ion beam on a specimen 1; a detector 60 detecting a spectroscopic signal of scattered ion from a specimen 1; and a data analyzer 70 analyzing and processing the spectroscopic signal detected by the detector 60.

Abstract: A lens assembly for use in mass spectrometry and a method for reducing contaminant build up on ion optic components in a lens assembly for use in a mass spectrometer are disclosed herein. In various embodiments of applicant's teachings, the lens assembly comprises a plurality of ion optic components assembled to form an ion lens and a heater. The plurality of ion optic components has a generally similar expansion coefficient. The heater is operatively coupled to the ion optic components. The heater heats the ion optic components to reduce the accumulation of debris on the ion optic components. In various embodiments, the method includes receiving, in a lens assembly, ions from an ion source. The lens assembly includes a plurality of ion optic components assembled to form an ion lens, the plurality of ion optic components having a generally similar expansion coefficient. The method also comprises heating the ion optic components to a first temperature.

Abstract: A laryngoscope disinfector characterized by a drawer that provides positioning for laryngoscopes in the drawer so that all surfaces of the laryngoscopes are exposed to ultraviolet radiation. The drawer provides for the laryngoscope blades to be positioned generally horizontally and generally vertically for disinfection of the blades. The drawer also provides, in some embodiments, positioning for the laryngoscope handles.

Abstract: Disclosed are embodiments of an ion beam sample preparation thermal management apparatus and methods for using the embodiments. The apparatus comprises an ion beam irradiating means in a vacuum chamber that may direct ions toward a sample, a shield blocking a portion of the ions directed toward the sample, and a shield retention stage with shield retention means that replaceably and removably holds the shield in a position. The shield has datum features which abut complementary datum features on the shield retention stage when the shield is held in the shield retention stage. The shield has features which enable the durable adhering of the sample to the shield for processing the sample with the ion beam. The complementary datum features on both shield and shield retention stage enable accurate and repeatable positioning of the sample in the apparatus for sample processing and reprocessing. A heat sink means is configured to conduct heat away from the sample undergoing sample preparation in the ion beam.

Abstract: An analyzer performs dielectric barrier discharge and ionization of a sample by a reaction between the sample and excited molecules or ions generated by the dielectric barrier discharge at a pressure lower than an atmospheric pressure.

Abstract: A device provides a radiant electromagnetic energy output. During standby operation of the device, the output is provided at one or more frequencies selected to dissipate excess power through atmospheric absorption. Circuitry is included to tune the output of the device to a second frequency different than the first frequency for various directed energy applications that make use of the excess power. The circuitry can be arranged to further utilize frequency agility for power dissipation, to provide different operating modes involving a radiant output, or the like.

Abstract: Radiation shielding devices are provided herein. In particular, the devices provided herein can be adapted to shield radiation emitted by one or more radioactive brachytherapy seeds contained within, for example, a vial or a cartridge.

Abstract: An exterior container has a primary base, side walls and an open top. A primary floor is located in the exterior chamber and forms an operational chamber. An interior container has a square secondary floor, side walls and top. The interior container is removably received within the exterior container. A retainer is positioned within the interior chamber for receiving a catheter. A source of light is provided within the exterior chamber to irradiate the catheter.

Abstract: Apparatus for curing a photocurable material applied to a floor surface includes a carriage having wheels, a source of curing light carried by the carriage, and a solid state ballast circuit selectively energizing said light source. The apparatus is free of a shutter that would selectively cover the source of curing light.

Abstract: A mass spectrometer that allows easy replacement of an MCP (microchannel plate) and is enabled to secure orthogonality between an incident surface of the MCP and an ion track at high accuracy is provided. A flight tube 2 where ions fly is arranged in a vacuum vessel composed of a vacuum flange 6 and a body 1, and an MCP group 4 is attached to a tail end of the flight tube 2 via an MCP-IN electrode 3. A vacuum flange 6 is attachably and detachably attached to the body 1, and the MCP group 4, by a spring 710 provided on a circuit board 7 for detection attached to the vacuum flange 6, is urged toward an end portion of the flight tube 2 so that its orthogonality with respect to an ion flight track is secured.

Abstract: An instrument system is controlled to acquire an optical image of an object, with the optical image defining a first coordinate system. The object is positioned in a second coordinate system and a point in the optical image is selected. The object is repositioned so that a point on the object corresponding to the selected point in the optical image is positioned at a predetermined point in the second coordinate system. Alternatively, movement of the object causes an indicia on the optical image to move to a point thereon corresponding to the point on the object that is positioned at the predetermined point in the second coordinate system.