Abstract: The present invention relates to a contact and a socket device for testing a semiconductor device. The contact of the present invention is a spring contact which is integrally formed by blanking and bending a metal plate member and includes an elastic portion made of various strips of certain pattern and a tip provided at both ends of the elastic portion. Preferably, an inner volume of the contact is filled with a filler having conductivity and elasticity, whereby durability and electrical characteristics are excellent. Further, the test socket according to the present invention is a rubber type employing the above-mentioned contact and has an advantage that it is suitable for testing a fine pitch device.

Abstract: In a voltage detection apparatus for detecting voltage of battery modules, it is possible to detect that a shut-off element performed operation in a certain one of a plurality of battery modules connected in parallel. The voltage detection apparatus detects voltage of the plurality of battery modules each including a shut-off element and connected in parallel with respect to a load, and decides whether the shut-off elements are operating based on the cell voltage in a state that the plurality of battery modules are disconnected from a power supply line by switching wares.

Abstract: Detection of electric power generator stator ground fault conditions and protection of the generator due to such conditions is provided herein. In one embodiment, a generator protection element may calculate generator third harmonic voltage quantities using measurements from the generator terminals, and determine a stator ground fault condition using the calculated generator third harmonic voltage quantity. A tripping subsystem may issue a trip command based upon detection of a stator ground fault condition.

Abstract: In a device for diagnosing a mechanical system driven by an electric drive motor, the drive motor thereof, and the shifting device thereof include at least one sensor for detecting the current curve in a conductor of the electric connection of the drive motor. The precision and the degree of detail of the diagnosis are to be improved compared to the prior art and expanded to include the drive motor and the shifting device in order to improve the efficiency and aim of the maintenance process carried out in response to the diagnosis. This is achieved in that the device additionally has sensors for detecting the voltage curves in the conductors of the electric connection of the drive motor, wherein each conductor is paired with a sensor for detecting the current curve and with a sensor in interaction with a sensor in order to detect the voltage curve.

Abstract: The present disclosure provides a method for measuring an internal resistance of a battery, after discharging/charging the battery under a preset constant-current, acquiring voltages of the battery within a period from ending the discharging/charging to a time when the voltage reaches stable, and then calculating different corresponding internal resistances caused by ohmic polarization, electrochemical polarization and concentration polarization separately. Since it is different for the orders of the magnitude of the characteristic time which these different polarizations need to get back into new equilibrium state after ending the discharging/charging, the method of the present disclosure classifies the internal resistances caused by these polarizations and calculated different internal resistances corresponding to the polarizations.

Abstract: An encoder applied to a rotatable device including a code disc set, at least one bearing, a bearing housing, a main housing, a sensor and an elastic assembly. The code disc set is disposed on a rotation end of the rotatable device. The bearing is disposed around the rotation end, and the bearing housing is disposed around the bearing. The main housing is connected with a first end of the bearing housing. The sensor is disposed on the main housing and corresponds to the disc wheel set, and there is an interval between the sensor and the code disc set. The elastic assembly is connected with a second end of the bearing housing and a fixing end of the rotatable device. Therefore, the interval between the sensor and the code disc set is maintained to be fixed, and the good position detection performance and stable signals are obtained.

Abstract: A packaged integrated circuit (IC) chip that provides input/output (I/O) signal fail safe verification is disclosed. The packaged IC chip includes a first processing unit, a first control peripheral coupled to receive a first processed signal from the processing unit and to provide an output signal, and compare logic. The compare logic is coupled to receive the output signal and a comparison signal, to compare the output signal and the comparison signal, and to provide an error signal responsive to a difference between the output signal and the comparison signal.

Abstract: An antenna assembly that includes a bobbin including arcuate first and second bobbin portions positioned about a tool mandrel. A protective layer is formed about the first and second bobbin portions, and a cover occludes a portion of an axially extending gap defined between the first and second bobbin portions to prevent the protective layer from extruding into the gap.

Abstract: A load bank for testing power sources includes a load resistor assembly having a plurality of resistors which can be switched between wye and delta configurations for testing a variety of voltages and power sources requiring various load applications. First and second power connections are connected with primary and redundant power sources and a relay alternately connects the first and second power connections with the load resistor assembly for alternately testing the primary and redundant power sources while maintaining the sources electrically isolated. A damper is arranged adjacent the load resistor assembly and is operable between an open position which permits cold air to be delivered to the load resistor assembly to cool the assembly when the load bank is operating and a closed position which prevents hot air from being recirculated when the load bank is not operating.

Abstract: A sensor assembly includes a shank shaped for mating with a socket in a head of a bolt about which a portion of a rear suspension of a bicycle pivots. A magnetometer (or a permanent magnet) is coupled to the shank. A permanent magnet with a north pole and a south pole (or a magnetometer) is positioned adjacent to the magnetometer (or permanent magnet) and pivotable relative thereto. A linkage couples the permanent magnet (or magnetometer) to the portion of the rear suspension that pivots about the bolt. The magnetometer senses changes in the magnetic field as the suspension pivots.

Abstract: An electrical equipment includes a calculator or a data concentrator for connecting to a tachometer via a cable that includes a measurement wire and a test wire. The electrical equipment has a measurement input to which the measurement wire can be connected and a test input to which the test wire can be connected, measurement acquisition components connected to the measurement input and arranged to acquire an electrical measurement signal present on the measurement wire and produced by the tachometer, test acquisition components connected to the test input and arranged to detect whether the test wire is or is not open-circuit, and processor components arranged to detect a break of the measurement wire if the test wire is open-circuit.

Abstract: A method for determining a switching status of an impedance sensor comprising a measuring probe, which can be influenced in its capacity by a medium surrounding the measuring probe, a measuring oscillator circuit in which the measuring probe is arranged as a capacity-determining element, an electronic unit with a signal generator to excite the measuring oscillator circuit, and a signal detector to determine a response signal of the measuring oscillator circuit, and an evaluation and control unit which is connected to the electronic unit, with the signal generator being addressed with an input signal, the response signal of the measuring oscillator circuit being determined, a switching status being issued based on the output value, and a plurality of amplitude minima of the frequency response being determined, whereby in the event that precisely one minimum is determined, here the minimum being issued as the output value.

Abstract: Systems and methods of determining a communication time delay in electrical power systems are provided. In one embodiment, a method of determining a communication time delay in a communication network between a local terminal and each of a plurality of remote terminals in a multi-terminal multi-junction electrical power system includes: (a) calculating a respective initial communication time delay between each remote terminal and the local terminal; (b) calculating a respective junction time delay between respective first, second and third pairs of adjacent junctions; and (c) correcting the calculated initial communication time delay of each remote terminal spaced from the local terminal by two or more junctions according to each corresponding junction time delay arising between the or each remote terminal and the local terminal.

Abstract: A wiring substrate for inspection apparatus includes a base substrate and a plurality of tile substrates. The tile substrate is composed of a ceramic substrate section and a first resin substrate section. Each ceramic substrate section is composed of a plurality of ceramic layers and has a plurality of upper-surface connection terminals provided on an upper surface thereof, a plurality of lower-surface connection terminals provided on a lower surface thereof, and a plurality of through conductors for conducting electricity between the upper-surface connection terminals and the lower-surface connection terminals. The first resin substrate section is laminated on the upper surface and includes a laminate of a plurality of resin layers, a plurality of probe pads formed on a resin front-surface thereof, a plurality of inner wiring layers formed between the resin layers, and a plurality of electrically conductive paths for conducting electricity between the probe pads and the upper-surface connection terminals.

Abstract: A testing device with enhanced accessibility for repair and replacement purposes includes a base, an upper seat, a test board and a needle seat. The upper seat is mounted on the base. The test board is sandwiched between the base and the upper seat. A receiving groove is defined on the upper seat. The receiving groove extends through the upper seat to partially expose the test board. The needle seat is detachably fixed to the upper seat. A lower part of the needle seat is received in the receiving groove and abuts against the test board. An upper portion of the needle seat protrudes from the upper seat and is configure for connecting connection terminals of a product to be tested.

Abstract: Pin probes and pin probe arrays are provided that allow electric contact to be made with selected electronic circuit components. Some embodiments include one or more compliant pin elements located within a sheath. Some embodiments include pin probes that include locking or latching elements that may be used to fix pin portions of probes into sheaths. Some embodiments provide for fabrication of probes using multi-layer electrochemical fabrication methods.

Abstract: An example analog-test-bus (ATB) apparatus includes a plurality of comparator circuits, each having an output port, and a pair of input ports of opposing polarity including an inverting port and a non-inverting port, a plurality of circuit nodes to be selectively connected to the input ports of a first polarity, and at least one digital-to-analog converter (DAC) to drive the input ports of the plurality of comparator circuits. The apparatus further includes data storage and logic circuitry that accounts for inaccuracies attributable to the plurality of comparator circuits by providing, for each comparator circuit, a set of calibration data indicative of the inaccuracies for adjusting comparison operations performed by the plurality of comparator circuits.

Abstract: A testing device for an apparatus of an energy system which has inputs that can be connected in a conductive manner to at least one current transformer and at least one voltage transformer. The testing device is designed to apply a first test signal to a secondary side of the voltage transformer and, at the same time, to apply a second test signal to a primary side of the current transformer.

Abstract: Disclosed are an apparatus and a method for diagnosing a failure of an electromagnetic-inductive power supply apparatus, which diagnoses whether a power-generation CT has failed by comparing the values detected in a sensor CT and the power-generation CT, thereby preventing the generating efficiency from being reduced. The disclosed apparatus for diagnosing the failure of the electromagnetic-inductive power supply apparatus detects detection values of a power-generation CT and a sensor CT, converts detection values into converted value by scaling detection values, and diagnoses whether the current transformer has failed and whether the power-outage has occurred based on converted values.

Abstract: Multi-layer integrated circuits having isolation cells for layer testing and related methods are disclosed. According to an aspect, an integrated circuit includes multiple isolation cells. Example isolation cells include, but are not limited to, electronic fuses and tri-state flip-flops. The integrated circuit also includes a first layer having first and second sets of electronic components, the first set of electronic components being operatively connected to the second set of electronic components via the isolation cells. Further, the integrated circuit includes multiple transmission gates associated with the isolation cells. The integrated circuit also includes a second layer having electrical circuitry operatively connected to the electronic components of the first layer. The electrical circuitry is configured to apply test patterns to the electronic components of the first layer.