Patents Examined by Minh N. Tang
  • Patent number: 10371728
    Abstract: A method of sensing electrical power being provided to a structure using a sensing device, a calibration device, and one or more processing modules. The sensing device can include one or more magnetic field sensors. The sensing device can be attached to a panel of a circuit breaker box. The panel of the circuit breaker box can overlie at least a part of one or more main electrical power supply lines for an electrical power infrastructure of a structure. The calibration device can include a load unit. The calibration device can be electrically coupled to the electrical power infrastructure of the structure. The method can include automatically calibrating the sensing device by determining a first transfer function in a piecewise manner based on a plurality of ordinary power consumption changes in the structure.
    Type: Grant
    Filed: September 18, 2017
    Date of Patent: August 6, 2019
    Assignee: BELKIN INTERNATIONAL, INC.
    Inventors: Shwetak N. Patel, Sidhant Gupta, Matthew S. Reynolds
  • Patent number: 10365306
    Abstract: A detection circuit, provided in a gamma buffer circuit that includes at least one transistor that receives the application of a first voltage and generates gradation voltages on the basis of a plurality of gamma voltages, includes: a first comparison circuit that compares the largest gamma voltage with a substrate potential of the transistor and outputs a first comparison result signal, a second comparison circuit that includes an inverter which is operable under a second voltage as a source voltage, compares a threshold voltage of the inverter with the substrate potential, and outputs a second comparison result signal; and a detection result output circuit for outputting a detection result showing if the voltage decrease or power discontinuity of the first voltage is occurring on the basis of the first comparison result signal and the second comparison result signal.
    Type: Grant
    Filed: September 27, 2017
    Date of Patent: July 30, 2019
    Assignee: LAPIS Semiconductor Co., Ltd.
    Inventor: Toshimi Yamada
  • Patent number: 10365390
    Abstract: Systems and methods for acquiring and processing electromagnetic data in subsurface formations. In one example, a system includes an electromagnetic source, a plurality of electromagnetic receivers, and an electromagnetic data processor. The electromagnetic source is configured to generate an electromagnetic pulse that induces electromagnetic energy in subsurface formations. The electromagnetic receivers are configured to detect the electromagnetic energy reflected by the subsurface formations, and to output signals corresponding to detected electromagnetic energy reflected by the subsurface formations. The electromagnetic data processor configured to process, based on differences in travel times of the electromagnetic energy between the subsurface formations and the electromagnetic receivers, the signals output by the electromagnetic receivers.
    Type: Grant
    Filed: October 20, 2015
    Date of Patent: July 30, 2019
    Assignee: UNIVERSITY OF HOUSTON SYSTEM
    Inventors: John W. Neese, Leon Thomsen
  • Patent number: 10338133
    Abstract: Multi-layer integrated circuits having isolation cells for layer testing and related methods are disclosed. According to an aspect, an integrated circuit includes first and second layers that each have one or more electronic components. One or more electronic components of each layer can be electrically connected by a first via and a second via. The integrated circuit also includes an isolation cell operatively connected between the first via and the second via. The isolation cell is configured to controllably break electrical connection between the first via and the second via subsequent to testing of the at least one electronic component of the second layer. Example isolation cells include, but are not limited to, electronic fuses and tri-state flip-flops.
    Type: Grant
    Filed: April 26, 2017
    Date of Patent: July 2, 2019
    Assignee: Duke University
    Inventors: Krishnendu Chakrabarty, Ran Wang
  • Patent number: 10337890
    Abstract: A single housing with a non-ferromagnetic piezo-driven flexure has primary and secondary coil forms of different diameters, one coaxially inside the other, integrated in the flexure. The cylinders defining the planes of the primary and secondaries do not spatially overlap. The secondary coil forms may be wound in opposite directions and wired to provide a transformer device. Movement of the primary relative to the secondaries in the direction of the central axis of the coils can be differentially detected with high precision.
    Type: Grant
    Filed: December 13, 2016
    Date of Patent: July 2, 2019
    Assignee: Oxford Instruments AFM Inc
    Inventors: Roger Carlos Proksch, Dan Bocek, Jason Cleveland, Matthew Longmire, Matthew Klonowski
  • Patent number: 10338104
    Abstract: This current detection device is configured from: an annular magnetic material core that forms a closed magnetic path around a pair of conducting wires in which conduction currents flow; an excitation coil wound on the magnetic material core; an oscillation circuit unit that applies a rectangular wave output voltage to the excitation coil; a power supply unit that supplies power to an operation amplifier that generates the rectangular wave output voltage in the oscillation circuit unit; and a difference current calculation unit, which detects a power supply current flowing from the power supply unit to the operation amplifier, and which calculates a difference current between the conduction currents flowing in the pair of conducting wires. Consequently, excellent noise resistance is achieved, and the configuration of the current detection device is simplified.
    Type: Grant
    Filed: April 10, 2015
    Date of Patent: July 2, 2019
    Assignee: Mitsubishi Electric Corporation
    Inventors: Mitsugi Mori, Kota Kashiwamoto, Keita Hamano, Yoshimasa Watanabe
  • Patent number: 10338126
    Abstract: Systems, devices, methods, and techniques are disclosed for open load detection in the connections coming from output stages of electrical systems. In some examples, an open load detection circuit includes a circuit output configured to provide an output voltage to a load, a first switch coupled to the circuit output and coupled to a first supply voltage configured to switch the load, and at least one delta voltage circuit coupled to the circuit output configured to provide a delta voltage. The at least one delta voltage circuit is coupled to the first switch to create a reduction in voltage magnitude of the first supply voltage to a switch voltage of the first switch provided to the circuit output. The open load detection circuit also includes at least one current source coupled to the circuit output to provide a current to the circuit output.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: July 2, 2019
    Assignee: Infineon Technologies AG
    Inventors: Martin Kaltenegger, Heinz Novak
  • Patent number: 10338156
    Abstract: An ultra-sensitivity optical-fiber magneto-optic field sensor includes an input fiber passing optical power from an optical source into the sensor; a polarizer optically coupled to and downstream of the input fiber; an analyzer optically coupled to and downstream of the polarizer; an output fiber passing optical power out of the sensor to a photoreceiver; and a magneto-optic crystal element optically coupled between the polarizer and the analyzer. The ultra-sensitivity optical-fiber magneto-optic field sensor has an optical axis extending between the input and output fibers along which a beam of optical power is transmitted.
    Type: Grant
    Filed: June 1, 2016
    Date of Patent: July 2, 2019
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventors: Dong Ho Wu, Anthony Garzarella
  • Patent number: 10338417
    Abstract: Provided is a set of techniques for measuring different properties or parameters of liquid crystal mixtures by applying a driving waveform and measuring the response current and/or the optical response. This may be done by using specific liquid crystal test cells. Also provided are the optimized test cell parameters that are used in the algorithms for calculating the properties.
    Type: Grant
    Filed: May 19, 2017
    Date of Patent: July 2, 2019
    Inventors: Henry Zhong Zou, Lianhua Ji
  • Patent number: 10338171
    Abstract: Methods of generating a gradient signal, gradient signal generators and magnetic resonance imaging systems are provided. In one aspect, a method includes obtaining a target amplitude and a target duration associated with a target precision corresponding to the gradient signal; generating a first actual amplitude by intercepting the target amplitude according to an actual precision of a DAC; generating a second actual amplitude according to the first actual amplitude, wherein a difference between the second actual amplitude and the first actual amplitude is 1; determining a first actual duration of outputting the first actual amplitude and a second actual duration of outputting the second actual amplitude according to the target amplitude, the target duration, the first actual amplitude and the second actual amplitude; controlling the DAC to output the first actual amplitude according to the first actual duration and output the second actual amplitude according to the second actual duration.
    Type: Grant
    Filed: September 21, 2017
    Date of Patent: July 2, 2019
    Assignee: Shenyang Neusoft Medical Systems Co., Ltd.
    Inventors: Rong Sun, Yan Wang, Hongwei Wang
  • Patent number: 10333049
    Abstract: A superconducting quantum interference devices (SQUID) comprises a superconducting inductive loop with at least two Josephson junction, whereby a magnetic flux coupled into the inductive loop produces a modulated response up through radio frequencies. Series and parallel arrays of SQUIDs can increase the dynamic range, output, and linearity, while maintaining bandwidth. Several approaches to achieving a linear triangle-wave transfer function are presented, including harmonic superposition of SQUID cells, differential serial arrays with magnetic frustration, and a novel bi-SQUID cell comprised of a nonlinear Josephson inductance shunting the linear coupling inductance. Total harmonic distortion of less than ?120 dB can be achieved in optimum cases.
    Type: Grant
    Filed: March 6, 2017
    Date of Patent: June 25, 2019
    Assignee: Hypres, Inc.
    Inventors: Victor K. Kornev, Igor I. Soloviev, Nikolai V. Klenov, Oleg A. Mukhanov
  • Patent number: 10325716
    Abstract: In electric equipment, a switching substrate is provided along winding axes of winding parts. A part of the switching substrate is overlapped with a reactor, as viewed in a direction perpendicular to a virtual plane including the winding axes. Further, an electric current sensor is shifted from the reactor in a direction of winding axes, and a sensor substrate is provided in parallel to the virtual plane.
    Type: Grant
    Filed: May 30, 2018
    Date of Patent: June 18, 2019
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Noriaki Okamoto, Masahiro Shimada, Naoto Kochi, Satoshi Hashino, Satoru Fujita
  • Patent number: 10302585
    Abstract: An optical module includes first and second transparent substrates and a spacer between the first and second transparent substrates, holding the first transparent substrate in proximity to the second transparent substrate, with first and second diffractive optical elements (DOEs) on respective faces of the first and second transparent substrates. At least first and second capacitance electrodes are disposed respectively on the first and second transparent substrates in proximity to the first and second DOEs. Circuitry is coupled to measure changes in a capacitance between at least the first and second capacitance electrodes.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: May 28, 2019
    Assignee: APPLE INC.
    Inventors: Hannah D. Noble, Kevin A. Sawyer, Martin B. Adamcyk, Yazan Z. Alnahhas, Yu Qiao Qu, Moshe Kriman, Adar Magen
  • Patent number: 10302680
    Abstract: This current detection device is configured from: an annular magnetic material core that forms a closed magnetic path around a pair of conducting wires in which conduction currents flow; an excitation coil wound on the magnetic material core; an oscillation circuit unit that applies a rectangular wave output voltage to the excitation coil; a power supply unit that supplies power to an operation amplifier that generates the rectangular wave output voltage in the oscillation circuit unit; and a difference current calculation unit, which detects a power supply current flowing from the power supply unit to the operation amplifier, and which calculates a difference current between the conduction currents flowing in the pair of conducting wires. Consequently, excellent noise resistance is achieved, and the configuration of the current detection device is simplified.
    Type: Grant
    Filed: April 10, 2015
    Date of Patent: May 28, 2019
    Assignee: Mitsubishi Electric Corporation
    Inventors: Mitsugi Mori, Kota Kashiwamoto, Keita Hamano, Yoshimasa Watanabe
  • Patent number: 10302677
    Abstract: Multiple pin probes and methods for controlling such multiple pin probes to support parallel measurements are disclosed. The method may include: establishing electrical contact between a multiple pin probe and a subject of measurement; selecting two pins out of a plurality of pins included in the multiple pin probe as current-carrying pins; selecting more than two additional pins out of the plurality of pins included in the multiple pin probe as voltage-metering pins; injecting a current through the current-carrying pins; simultaneously measuring voltage signals through the voltage-metering pins; calculating a simulated voltage distribution curve at least partially based on the voltage signals simultaneously measured through the voltage-metering pins; and determining one or more processor monitor parameters of the subject of measurement at least partially based on the simulated voltage distribution curve.
    Type: Grant
    Filed: April 27, 2016
    Date of Patent: May 28, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Nanchang Zhu, Zhubin Shi
  • Patent number: 10302696
    Abstract: Methods, systems, and apparatus for testing semiconductor devices.
    Type: Grant
    Filed: December 30, 2016
    Date of Patent: May 28, 2019
    Assignee: Rambus Inc.
    Inventors: Adrian E. Ong, Paul Fuller, Nick van Heel, Mark Thomann
  • Patent number: 10295567
    Abstract: A probe module, which supports loopback test and is provided between a PCB and a DUT, includes an adapter, two probes, two inductive components provided at the adapter, and a capacitive component. The adapter has two connecting circuits. An end of each of the probes is connected to one of the connecting circuits, while another end thereof, which is a tip, contacts the DUT. Each of the inductive components has an end electrically connected to one of the connecting circuits, and another end electrically connected to the PCB through a conductive member, which is provided at the adapter, wherein two ends of the capacitive component are electrically connected to one of the connecting circuits, respectively. Whereby, the signal paths are changed by the differences between frequencies of signals, and the transmission path of high-frequency signals is effectively shortened.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: May 21, 2019
    Assignee: MPI CORPORATION
    Inventors: Wei-Cheng Ku, Hao Wei, Jun-Liang Lai, Chih-Hao Ho
  • Patent number: 10288683
    Abstract: In order to generate a false failure in a logic circuit without adding a new circuit to the logic circuit, a semiconductor device includes a plurality of test points includes a test point flip-flop to fix a target node within the logic circuit to a predetermined logic level when the flip-flop holds a predetermined value. A scan chain is configured by sequentially coupling a plurality of test point slip-flops. A failure injection circuit injects a failure into the target node during the normal operation of the logic circuit, by generating failure data and by setting the generated failure data to the scan chain through a scan-in node of the scan chain.
    Type: Grant
    Filed: April 21, 2017
    Date of Patent: May 14, 2019
    Assignee: RENESAS ELECTRONICS CORPORATION
    Inventors: Yoichi Maeda, Jun Matsushima
  • Patent number: 10274630
    Abstract: A system for detecting and discriminating a metal object in a bulk non-metallic material includes at least one triple-axis magnetometer adapted to detect a change of a magnetic field and output a signal including a detection signal representative of a metal object and a signal processing system adapted to detect the detection signal. The bulk non-metallic may be continuously moving through a detection volume, or may be placed in and removed from the detection volume as a batch.
    Type: Grant
    Filed: June 1, 2016
    Date of Patent: April 30, 2019
    Assignee: SYNCRUDE CANADA LTD. in trust for the owners of the Syncrude Project as such owners exist now and in the future
    Inventor: Darcy Daugela
  • Patent number: 10274534
    Abstract: A reading circuit for a die ID in a chip is provided. The reading circuit includes a chip damage detection circuit, a switch selector, a fuse controller, and a fuse device, where the fuse device stores the die ID; the fuse controller reads the die ID from the fuse device; the chip damage detection circuit detects whether a processor in the chip is capable of operating properly, so as to obtain a detection result, and notify the switch selector of the detection result; and when the detection result is that the processor is capable of operating properly, the switch selector connects the processor and the fuse controller; and when the detection result is that the processor is not capable of operating properly, the switch selector connects the fuse controller and a maintenance device that is located outside the chip.
    Type: Grant
    Filed: April 21, 2017
    Date of Patent: April 30, 2019
    Assignee: HUAWEI TECHNOLOGIES CO., LTD.
    Inventors: Bo Liang, Qi Wang, Yuan Liu