Patents Examined by Neel Shah
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Patent number: 9329237Abstract: A method of switch detection is disclosed that comprises, enabling a low power mode on a switch detection device, activating a first detection circuit for detecting, at a first expiration of a first polling time interval, a first switch state of a first switch having a first priority level, the first switch state including one of a first open state and a first closed state, comparing the detected first switch state with a prior first switch state, and activating a second detection circuit for detecting, at a second expiration of a second polling time interval, a second switch state of a second switch having a second priority level, the second switch including one of a second open state and a second closed state, and the second polling time interval being greater than the first polling time interval, and the second priority level being different from the first priority level.Type: GrantFiled: January 10, 2014Date of Patent: May 3, 2016Assignee: FREESCALE SEMICONDUCTOR, INC.Inventors: William E. Edwards, Anthony F. Andresen, Randall C. Gray
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Patent number: 9322637Abstract: A measuring system is provided that includes a magnetic field sensor array, an evaluation circuit for evaluating measurement signals of the magnetic field sensor array, and a rotatable encoder that has a mass element to change a magnetic field vector in the magnetic field sensor array. The encoder has a spring element in which the mass element is attached to the spring element. The encoder has a linear guide, and the mass element is guided in a radial direction in the linear guide such that during a rotation of the encoder the mass element can be moved by centrifugal force and the centrifugal force works against the spring force of the spring element. The magnetic field sensor array is arranged toward the encoder to measure a change, caused by the movement of the mass element, in the magnetic field vector.Type: GrantFiled: January 9, 2014Date of Patent: April 26, 2016Assignee: Micronas GmbHInventor: Yan Bondar
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Patent number: 9297849Abstract: A wafer test system includes an input device configured to transmit a test signal, a wafer including an optical port, an input port configured to receive the test signal, and an output port configured to output a result signal based on the test signal, a measuring device configured to measure the result signal, and an alignment device configured to align an optical fiber port of an optical probe with an alignment port based on the result signal and then align the optical fiber port with the optical port. The alignment port is the input port or the output port. The optical probe is configured to be the input device when the input port is the alignment port and the optical probe is configured to be the measuring device when the output port is the alignment port.Type: GrantFiled: January 21, 2014Date of Patent: March 29, 2016Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Dong Jae Shin, Yoon Dong Park, Sang Hun Choi, Kyoung Ho Ha
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Patent number: 9297863Abstract: A planarized 3-dimensional magnetic sensor chip includes a first magnetic sensing device, a second magnetic sensing device, a third magnetic sensing device and a magnetic flux bending concentrating structure on a circuit chip substrate, wherein the first magnetic sensing device and the second magnetic sensing device are used to measure the magnitude of flux in a first direction and a third direction together, and the third magnetic sensing device is used to measure the magnitude of flux in a second direction, the magnetic flux bending concentrating structure is used to bend the magnitude of flux in the third direction to the first direction, such that the magnitude of flux in the third direction can be measured by first magnetic sensing device and the second magnetic sensing device in the first direction.Type: GrantFiled: March 15, 2013Date of Patent: March 29, 2016Inventor: Meng-Huang Lai
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Patent number: 9285416Abstract: A substrate manufacturing apparatus includes a test apparatus including a test handler module for performing a test process on a substrate. The test handler module may include a conveyor unit to transfer a substrate, a handler unit for performing a test process on the substrate, and a transfer unit for transferring the substrate between the conveyor unit and the handler unit. The conveyor unit may include a feed conveyor and a discharge conveyor spaced apart from the feed conveyor.Type: GrantFiled: March 13, 2013Date of Patent: March 15, 2016Assignees: Samsung Electronics Co., Ltd., Semes Co., Ltd.Inventors: Youngchul Lee, Semin Kwon, JinHwan Lee, Jea-Muk Oh, Kyungsook Lee, Nam-Hong Lee
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Patent number: 9279702Abstract: A measuring system having a first magnetic field sensor, a second magnetic field sensor, an encoder, and an evaluation circuit to which the first magnetic field sensor and the second magnetic field sensor are connected. The evaluation circuit generates a first signal and a second measurement signal. The encoder generates a second magnetic field change with a second periodicity. The evaluation circuit generates a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function.Type: GrantFiled: January 14, 2014Date of Patent: March 8, 2016Assignee: Micronas GmbHInventors: Joachim Ritter, Joerg Franke
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Patent number: 9272674Abstract: A wire harness continuity inspection method includes: specifying a first certain electrical wire and a second certain electrical wire of which one end is connected to the other end of the first certain electrical wire, described in the first region-based connector/wiring information, and regarding them as a single electrical wire; referring to auxiliary device-based wiring information to obtain a first terminal of a first electrical component and a second terminal of a second electrical component connected by a circuit line, which are described in the auxiliary device-based wiring information; referring to the region-based connector/wiring information to specify a first electrical wire of which one end is connected to the first terminal of the first electrical component, described in the region-based connector/wiring information; and determining whether the terminal connected to the other end of the first electrical wire is identical to the second terminal of the second electrical component.Type: GrantFiled: February 4, 2011Date of Patent: March 1, 2016Assignee: Yazaki CorporationInventors: Noriaki Sasaki, Yasuhiro Mochizuki, Kohta Ohishi
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Patent number: 9261540Abstract: Disclosed are exemplary embodiments of devices for measuring voltage of a power supply. Also disclosed are exemplary embodiments of detection devices and temperature controllers comprising such devices for measuring voltage of a power supply. In exemplary embodiments, a device for measuring the voltage of a power supply generally includes a resistor, a capacitor, and a control unit. One end of the capacitor is connected with the resistor, while the other end of the capacitor is connected to ground. The control unit is connected with the power supply. The control unit includes a comparator connected with the capacitor, a reference power supply connected with the comparator, a timer, and a computing unit.Type: GrantFiled: January 13, 2014Date of Patent: February 16, 2016Assignee: Emerson Electric Co.Inventors: Lihui Tu, Liang Cao, Cuikun Chu
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Patent number: 9256003Abstract: The invention discloses three-dimensional focusing induced polarization equipment for advance geological prediction of a water inrush disaster source in underground engineering, comprising a constant-current multiplex transmitter, an intelligent multichannel receiver, an automatic multi-electrode switch, an industrial personal computer, an observation electrode array and shielding electrodes, wherein electrodes in the observation electrode array are respectively used as a source electrode and observation electrodes; the industrial personal computer controls the constant-current multiplex transmitter to transmit currents of the same polarity to the shielding electrodes and the source electrode, so that the currents of the source electrodes are nearly directed straight ahead of a driving face under the action of the shielding electrodes; the observation electrodes are used for scanning data acquisition, and the data are fed back to the industrial personal computer through the intelligent multi-channel receiver;Type: GrantFiled: January 17, 2013Date of Patent: February 9, 2016Assignee: SHAN DONG UNIVERSITYInventors: Shucai Li, Bin Liu, Lichao Nie, Qingmei Sui, Jie Song, Tingyu Hao, Yuqiang Cao, Faye Zhang, Jing Wang, Zhengyu Liu, Huaifeng Sun
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Patent number: 9250285Abstract: Detection and location of electrical faults in a network of metal structures which can receive electric cables and allow return of current by the cables. The reflectometry-based method involves injecting a probe signal into a cable coupled to the structures and analyzing the signal reflected by the anomalies. A conductive element is provided for carrying the probe signal at a constant distance from each structure. In one aspect, an insulated conductive element is arranged inside the metal structure and is built into a longitudinal groove in a surface for receiving a longitudinal plastic holder wedged into the structure. The reflected signal from the conductive element is compared to a threshold above which an anomaly is detected, and the anomaly is located by topological correlation. The invention is useful for airplane raceways having a composite skin.Type: GrantFiled: March 12, 2013Date of Patent: February 2, 2016Assignee: Airbus Operations (S.A.S.)Inventor: Gilles Millet
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Patent number: 9250283Abstract: Briefly, a method and system for testing a cable harness is disclosed. Generally, a cable harness is used to route many electric wires for power, communication, and control. The tester includes a switch system that enables one or more TDR engines to sequentially apply a TDR stimulus to substantially all the wire pairs in the cable harness, and to collect the resulting TDR waveforms. The waveforms are analyzed to determine if the cable harness meets quality standards. In some cases the tester may also perform a continuity, resistance, capacitance, or inductance test on the cable harness. The tester may also measure and use temperature in analyzing the cable harness, or may apply temperature cycling, different or varying atmospheric pressures, vibration, shaking, or shock to the cable harness.Type: GrantFiled: June 17, 2012Date of Patent: February 2, 2016Assignee: Psiber Data Systems, IncInventors: Darrell J Johnson, John C McCosh, Sara Marmolejo
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Patent number: 9242111Abstract: A defibrillator (1) comprising electrodes (3), a connection (5) for electrically connecting the electrodes together, a defibrillation circuit (9) connected to the electrodes, and an electrode test system (7), comprising a test initiation device operable to generate a test initiating signal, a test signal generator (15) operable to generate a dc voltage test signal, a test signal switch (17) connected to the electrodes and, on receipt of the test initiating signal, operable to connect the electrodes to the test signal generator for passing the dc voltage test signal to the electrodes, and a test processing device (19) connected to the test signal switch to receive a dc voltage electrode return signal and process the electrode return signal to determine a pass test result or a fail test result for the electrodes.Type: GrantFiled: September 14, 2012Date of Patent: January 26, 2016Assignee: Heartsine Technologies LimitedInventors: Allister Robert McIntyre, Johnny Houston Anderson
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Patent number: 9246434Abstract: Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current.Type: GrantFiled: September 12, 2012Date of Patent: January 26, 2016Assignee: FIRST SOLAR, INCInventors: Arnold Allenic, Oleh Petro Karpenko
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Patent number: 9239347Abstract: A non-resistive contact sensor assembly includes an electric field sensor device, including a dry electrode component for receiving an electrical signal from an object of interest and a signal processing component for processing the electrical signal, and a casing in which the signal processing component is surrounded or embedded. The processing component may include communications capabilities.Type: GrantFiled: March 15, 2013Date of Patent: January 19, 2016Assignee: RESCON LTDInventor: Thomas Andrew Dawson
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Patent number: 9239314Abstract: A probe and method for detecting magnetic particles. In one embodiment, the probe includes a probe core having a first end and a second end, the probe core defining two regions for containing coils of wire, one of the regions being adjacent the first end of the cylindrical probe core; two sense coils, one each of the sense coils being located in a respective one of the regions; and two drive coils, one each of the drive coils being located in a respective one of the regions, wherein the regions are separated by a distance equal to or greater than the diameter of one of the coils and a source of a secondary magnetic drive field. In another embodiment, the frequency of the drive signal of the secondary magnetic drive field is less than the frequency of the drive signal of the primary drive coils.Type: GrantFiled: March 13, 2013Date of Patent: January 19, 2016Assignee: ENDOMAGNETICS LTD.Inventors: Simon Richard Hattersley, Peter Georg Laitenberger, Audrius Brazdeikis
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Patent number: 9234914Abstract: An apparatus for electrical safety is disclosed. A system and an alternate apparatus also perform the functions of the apparatus. The apparatus includes a test point accessible from an exterior of an enclosure while the enclosure is in a closed state. The enclosure houses one or more electrical components and the closed state prevents a user from touching the one or more electrical components. The apparatus includes a test conductor connected to a point on a conductor connected to an electrical component of the one or more electrical components where the test conductor is within the enclosure. The apparatus includes an impedance connecting the test point to the test conductor. The impedance is within the enclosure. The test point meets an Ingress Protection code rating of 20.Type: GrantFiled: March 15, 2013Date of Patent: January 12, 2016Assignee: Rockwell Automation Technologies IncorporatedInventors: Mark Innes, Roger Alan Plemmons
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Patent number: 9234919Abstract: A sensor assembly for measuring an intensity of a current includes a first sensor apparatus configured to record an intensity of the electrical current with contact, a second sensor apparatus configured to record an intensity of the electrical current, the second sensor apparatus having a common measurement range with the first sensor apparatus, and a first analog-digital converter configured to convert analog measured values into digitized measured values. The first sensor apparatus, the second sensor apparatus and the first analog-digital converter are arranged on a common circuit carrier.Type: GrantFiled: April 16, 2012Date of Patent: January 12, 2016Assignee: Samsung SDI Co., Ltd.Inventors: Renato Mandic, Roland Plank, Guido Poscharnig
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Patent number: 9234924Abstract: A non-resistive contact sensor assembly includes an electric field sensor device, a cover, and a biasing structure. The electric field sensor devices has a dry electrode component for receiving an electrical signal from an object of interest by capacitively coupling with the entity. The signal processing component is surrounded or embedded in the cover. The biasing structure is disposed on the outside of the cover and is adapted to press the dry electrode component against a surface of the object interest when biased by an external structure.Type: GrantFiled: March 18, 2013Date of Patent: January 12, 2016Assignee: RESCON LTDInventor: Thomas Andrew Dawson
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Patent number: 9234877Abstract: A probe for detecting magnetic particles. In one embodiment, the probe includes: a cylindrical probe core having a first end and a second end, the cylindrical probe core defining two channels for containing coils of wire, one of the channels being adjacent the first end of the cylindrical probe core; two sense coils, one each of the sense coils being located in a respective one of the channels; and two drive coils, one each of the drive coils being co-located with the respective sense coil in a respective one of the channels.Type: GrantFiled: March 13, 2013Date of Patent: January 12, 2016Assignees: Endomagnetics LTD., University of HoustonInventors: Simon Richard Hattersley, Peter Georg Laitenberger, Audrius Brazdeikis
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Patent number: 9230613Abstract: A power up detecting system for generating one of a first power up detecting signal and a second power up detecting signal as the final power up detecting signal, according to power provided by a power supplier. The power up detecting system comprises: a power up detecting module, controlled by a control signal to generate the first power up detecting signal in a first mode and to generate the second power up detecting signal in a second mode, wherein a voltage level of the first power up detecting signal is transited when the power reaches a first predetermined voltage value, and the voltage level of the second power up detecting signal is transited when the power reaches a second predetermined voltage value; where the first predetermined voltage value is higher than the second predetermined voltage value.Type: GrantFiled: April 16, 2012Date of Patent: January 5, 2016Assignee: NANYA TECHNOLOGY CORP.Inventor: Wayne A. Batt