Abstract: In some examples, a memory device may be configured to provide quad bit error correction circuits. For example, the memory device may be equipped with a two layer error correction circuit. In some cases, the first layer may utilized one or more Hamming coders and the second layer may utilize one or Golay coders. In some examples, the Golay coders may be grouped into sets of Golay coders.

Abstract: The present technology relates to a data processing device and a data processing method, which are capable of securing excellent communication quality in data transmission using an LDPC code. In group-wise interleave, an LDPC code in which a code length N is 64800 bits and an encoding rate r is 6/15, 7/15, 8/15, or 9/15 is interleaved in units of bit groups of 360 bits. In group-wise deinterleave, a sequence of the LDPC code that has undergone the group-wise interleave is restored to an original sequence. For example, the present technology can be applied to a technique of performing data transmission using an LDPC code.

Abstract: The embodiments herein relate to a first user equipment (UE), a second UE and methods thereof for reliable group transmissions. The group includes multiple UEs transmitting the same Hybrid Automatic Repeat request (HARQ), buffer data packets to a network node. The method in the first UE includes receiving a predetermined number of Non ACKnowledgments (NACKs), performing a checksum calculation on the HARQ buffer, receiving a computed checksum from a second UE acting as a coordinator of the group; comparing the calculated checksum with the received computed checksum and stopping/refraining from further transmission of the HARQ buffer data to the network node when the calculated checksum and the received computed checksum differ.

Abstract: Embodiments of the present invention include an apparatus that receives date from multiple lanes, which are then aligned and synchronized for transcoding and encoding.

Abstract: An operating method of a controller includes generating a square message matrix of k×k; and generating an encoded message by encoding the square message matrix row by row through a Bose-Chadhuri-Hocquenghem (BCH) code, wherein the square message matrix includes an upper triangular matrix and a lower triangular matrix, which are symmetrical to each other with reference to zero-padding blocks included in a diagonal direction in the square message matrix, wherein the upper triangular matrix includes “?” numbers of message blocks, each of which has a size of “?+1”, and “(N??)” numbers of message blocks, each of which has a size of “?”, and wherein “?”, “?” and N have relationships represented by equations 1 and 2: ? = ? M N ? [ Equation ? ? 1 ] ? = M ? ? mod ? ? N [ Equation ? ? 2 ] where “M” represents a size of a message input from a host and “N” represents a number of message blocks forming the upper triangular matrix.

Abstract: Counting status circuits are electrically coupled to corresponding status elements. The status elements selectably store a bit status of a bit line coupled to a memory array. The bit status can indicate one of at least pass and fail. The counting status circuits are electrically coupled to each other in a sequential order. Control logic causes processing of the counting status circuits in the sequential order to determine a total of the memory elements that store the bit status. The total number of memory elements that store the bit status indicate the number of error bits or non-error bits, which can help determine whether there are too many errors to be fixed by error correction codes.

Abstract: In one embodiment, a test system comprises: a plurality of test partitions and a centralized controller configured to coordinate testing between the plurality of test partitions. At least one of the plurality of test partitions comprises: a partition test interface controller configured to control testing within at least one test partition in accordance with dynamic selection of a test mode, and at least one test chain configured to perform test operations. The dynamic selection of the test mode and control of testing within a test partition can be independent of selection of a test mode and control in others of the plurality of test partitions. In one embodiment, a free running clock signal is coupled to a test partition, and the partition test mode controller transforms the free running clock signal into a local partition test clock which is controlled in accordance with the dynamic selection of the test mode.

Abstract: An apparatus includes a convergence detector circuit coupled to an error locator polynomial generator circuit. The convergence detector circuit includes at least two computation circuits configured to generate at least two convergence signals based on a mutual error locator polynomial from the error locator polynomial generator circuit and on at least two different sets of syndromes. Each of the different sets of syndromes corresponds to a different one of the convergence signals.

Abstract: An on-chip clock (OCC) circuit of an integrated circuit includes a clock generator, an OCC controller, and an OCC observation circuit. The clock generator is configured to generate a plurality of clock signals. The OCC controller is configured to receive the clock signals and generate an OCC output for use by the scan chains of logic blocks. The OCC observation circuit is configured to generate a status output on a status output port based on the OCC output during an at-speed capture phase and a scan enable signal. Patterns of the status output with respect to the scan enable signal include a valid pattern indicating that the OCC output includes a valid number of at-speed capture pulses, a first invalid pattern indicating a first error in the OCC output, and a second invalid pattern indicating a second error in the OCC output that is different from the first error.

Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 16200 and a code rate of 3/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 256-symbol mapping.

Abstract: A method for programming a non-volatile memory in a programming operation is provided. The non-volatile memory has a number of cells and each of part of the cells stores data having at least 2 bits at least corresponding to a first page and a second page. The first programming-verifying operation including programming the first page and verifying whether the first page is successfully programmed is performed. When a first original fail-bit number for the first page is more than a predetermined fail-bit value, a second programming-verifying operation to the first page is performed to obtain a first over-counting fail-bit number for the first page and reduce the first original fail-bit number by the first over-counting fail-bit number. When the reduced first original fail-bit number is not more than the predetermined fail-bit value, the first page is set as successfully programmed.

Abstract: A method of screening for configuration-related defects in integrated circuits is provided. To detect configuration defects, test pattern configuration data and error correction data for that test pattern are loaded into configuration memory. Existing cyclic redundancy check circuitry on the integrated circuit is recruited to compute check-sum signatures based on the data stored in each frame of the memory array. Defects in configuration memory cells and configuration-related circuitry are identified by comparing the error correction data of frame to the computed check-sum signature of a frame. Localized freezing of programmable logic associated with configuration memory is optionally applied to eliminate data contention and ensure maximum coverage of the memory array during screening. Several test patterns of configuration data are also provided.

Abstract: A decoding method which includes: storing first data into a buffer memory which includes a first buffer region and a second buffer region; copying decoding data in the second buffer region to the first buffer region; performing a first type decoding operation for the first data based on the copied decoding data in the first buffer region, where the copied decoding data is different from original decoding data corresponding to the first data; and outputting decoded data if the first type decoding operation is successful.

Abstract: A decoder configured to decode a representation of the codeword includes an error locator polynomial generator circuit. The error locator polynomial circuit is configured to generate an error locator polynomial based on a decode operation that includes iteratively adjusting values of a first polynomial, a second polynomial, a third polynomial, and a fourth polynomial. The error locator polynomial circuit is also configured to initialize the third polynomial based on even-indexed coefficients of a syndrome polynomial and initialize the fourth polynomial based on odd-indexed coefficients of the syndrome polynomial.

Abstract: Systems and methods are disclosed for processing data. In one exemplary implementation, there is provided a method of generating H output data from W data input streams produced from input data. Moreover, the method may include generating the H discrete output data components via application of the W data inputs to one or more transforming components or processes having specified mathematic operations and/or a generator matrix functionality, wherein the W data inputs are recoverable via a recovery process capable of reproducing the W data inputs from a subset (any W members) of the H output data streams.

Abstract: A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.

Abstract: A method, system, and apparatus are provided for computing soft bits in a non-linear MIMO detector which decodes a signal received at a plurality of receive antennas using channel estimate information and a decoding tree to produce output data for a bit estimation value which includes a maximum likelihood solution along with a naturally ordered vector identifying all explored node metrics and node indices, where soft bits are computed for each bit estimation value by determining a set of bit-masks through repetition and indexing operations applied on the explored node indices, masking the naturally ordered vector with the set of bit-masks to generate masked node metrics, determining candidate soft bit values by subtracting metrics of all nodes that form the maximum likelihood solution from the masked node metrics, and determining a final soft bit value by identifying which of the candidate soft bit values has a lowest value.

Abstract: Dynamically adjusting an error correction effort level of a storage device, including: receiving, from a storage array controller, an error correction effort level to perform when attempting to read data from the storage device; identifying that an attempt to read the data resulted in an error; and determining whether an amount of error correction effort level required to attempt to correct the error exceeds the error correction effort level to perform when attempting to read data from the storage device.

Abstract: The present disclosure includes apparatuses and methods related to memory operations on data. An example method can include executing an operation by writing a first managed unit to a second managed unit, and placing the first managed unit in a free state, wherein the first managed unit is located at a particular distance from the second managed unit.

Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 16200 and a code rate of 2/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 16-symbol mapping.