Patents Examined by Raphael Valencia
  • Patent number: 5508676
    Abstract: Strain gage disposed on a flexible support and probe fitted with the gage. A gage with its creep being adapted according to the test body and the application required, without having to change the mask for etching the strain-sensitive thin film. A strain gage fitted to one of the surfaces of a test body capable of deformation under the action of a quantity to be measured. The gage comprises a strain-sensitive thin film (22) etched in the form of a resistance and fitted to a flexible support (20), the film (22) comprising at least two underlying films (24, 26) having different creep values.
    Type: Grant
    Filed: March 11, 1994
    Date of Patent: April 16, 1996
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Hubert Grange, Catherine Maeder