Patents Examined by Regis Betsch
  • Patent number: 11002710
    Abstract: A method for measuring mechanical parameters of a multilayer composite thin film structure and belongs to the technical field of online tests of micro-electro-mechanical system (MEMS for short) material parameters. Equivalent Young modulus and equivalent residual stress of each layer of the multilayer composite thin film structure can be obtained in one step by means of solving an equation set on the basis of a relationship between first-order resonance frequency of multilayer composite fixed-fixed beams and multilayer composite cantilever beams and parameters such as material characteristics and structure size, the online test of multilayer thin film materials can be realized, the test structure and calculating method are simple, and the accuracy is higher. The present invention further discloses a device for measuring mechanical parameters of the multilayer composite thin film structure.
    Type: Grant
    Filed: February 11, 2018
    Date of Patent: May 11, 2021
    Assignee: SOUTHEAST UNIVERSITY
    Inventors: Zaifa Zhou, Chao Sun, Xinge Guo, Qingan Huang
  • Patent number: 10253619
    Abstract: A production pipe arrangement for a producing petroleum well with at least one of the well fluids (oil, gas, or water) with influx fluids two or more influx zones or influx locations to a production flow in a central production pipe in said well, with tracer sources with distinct tracer materials in known levels of the well, one or more separate delay chambers arranged as a completion component in said pipe, the delay chambers provided with said one or more of the tracers sources arranged in an annular space formed between the completion pipe and a borehole wall, with at least one of said tracer sources arranged exposed to the fluids in at least one of said influx zones, the delay chambers having one or more apertures to the fluid flow in said central pipe.
    Type: Grant
    Filed: May 3, 2013
    Date of Patent: April 9, 2019
    Assignee: RESMAN AS
    Inventor: Fridtjof Nyhavn
  • Patent number: 10222425
    Abstract: A battery control IC includes a voltage measurement unit that measures, in a normal current mode, a voltage value of each of a plurality of unit battery cells forming a battery pack, and measures, in a short-time large-current mode, a voltage value of a unit battery cell that has exhibited a lowest voltage value in the normal current mode, and a calculation unit that calculates an available power value of the battery pack in the short-time large-current mode based on a voltage value, measured in the short-time large-current mode, of the unit battery cell that has exhibited the lowest voltage value in the normal current mode.
    Type: Grant
    Filed: November 10, 2017
    Date of Patent: March 5, 2019
    Assignee: Renesas Electronics Corporation
    Inventors: Hidekazu Nagato, Hiromasa Takahashi, Masaki Komatsu, Kenta Kobayashi
  • Patent number: 10218300
    Abstract: A method includes determining whether transformer phases should be permuted. The method includes, responsive to a determination that the transformer phases should be permuted, permuting the transformer phases, based on historical aging information of transformer input phases, to cause transformer input phases with higher ages to be connected to transformer output phases with lower output loads and transformer input phases with lower ages to be connected to transformer output phases with higher output loads. Multiple apparatus and program products are also disclosed.
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: February 26, 2019
    Assignee: International Business Machines Corporation
    Inventors: Gary S. Ditlow, Dung T. Phan, Jinjun Xiong
  • Patent number: 10203268
    Abstract: Methods are disclosed for nondestructive testing and measuring the structural health of prestressed concrete structures, such as slabs, columns, girders, bridges, towers, elevated storage tanks, silos, cooling towers, wind power generation towers, liquefied gas storage tanks, nuclear power containment buildings, and the like. Measurements are made as the structure undergoes tensioning and detensioning operations. By measuring actual movements of cardinal points on the structure, in an absolute three-dimensional coordinate system, and comparing the measurements to a model—as tension on a tendon is changed—a margin of safety is assured. High accuracy measurements are made by electronic distance measurement (EDM) instruments over hundreds of meters, which yield coordinates of cardinal points with an uncertainty of the order of one part per million.
    Type: Grant
    Filed: May 26, 2016
    Date of Patent: February 12, 2019
    Inventor: Sophie Lin
  • Patent number: 10191017
    Abstract: A dynamic characteristic calculation apparatus for a machine tool calculates dynamic characteristic of the machine tool executing an interrupted machining by moving a rotational tool relative to a workpiece. The apparatus includes a detector detecting acoustic wave generated by vibration of the rotational tool or detecting magnetic property being variable by the vibration of the rotational tool where said rotational tool is excited to vibrate, and a calculation division calculating a natural frequency f of the one or plural tool tips in a vibration system, in which the one or plural tool tips of said rotational tool is a vibration body, on a basis of a value detected by the detector.
    Type: Grant
    Filed: June 25, 2013
    Date of Patent: January 29, 2019
    Assignee: JTEKT CORPORATION
    Inventors: Yoshihiko Yamada, Hiroshi Watanabe, Takayuki Azuma, Kenji Hamada
  • Patent number: 10180402
    Abstract: A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.
    Type: Grant
    Filed: October 29, 2013
    Date of Patent: January 15, 2019
    Assignee: SRI International
    Inventors: David S. Stoker, Erik Frank Matlin, Motilal Agrawal, James R. Potthast, Neil William Troy
  • Patent number: 10162000
    Abstract: Various exemplary embodiments relate to an integrated circuit device that includes a plurality of input/output pins, device circuitry, a first testing protocol interface connected to the device circuitry and to the plurality of input/output pins, and a second testing protocol interface connected to the device circuitry and to the same plurality of input/output pins as the first testing protocol interface. The first testing protocol interface is configured to test the device circuitry with a first testing protocol, and the second testing protocol interface is configured to test the device circuitry with a second testing protocol.
    Type: Grant
    Filed: February 16, 2012
    Date of Patent: December 25, 2018
    Assignee: NXP B.V.
    Inventor: Tom Waayers
  • Patent number: 10156488
    Abstract: Prism coupling systems and methods for characterizing curved parts are disclosed. A coupling surface of a coupling prism is interfaced to the curved outer surface of the curved part to define a coupling interface. Measurement light is directed through the coupling prism and to the interface, wherein the measurement light has a width of 3 mm or less. TE and TM mode spectra reflected from the interface are digitally captured. These mode spectra are processed to determine at least one characteristic of the curved part, such as the stress profile, compressive stress, depth of layer, refractive index profile and birefringence.
    Type: Grant
    Filed: August 29, 2013
    Date of Patent: December 18, 2018
    Assignee: CORNING INCORPORATED
    Inventors: Anping Liu, Rostislav Vatchev Roussev, Robert Anthony Schaut
  • Patent number: 10157804
    Abstract: The invention relates to a method for determining a critical dimension variation of a photolithographic mask which comprises (a) using layout data of the photolithographic mask to determine at least two sub-areas of the photolithographic mask, each sub-area comprising a group of features, (b) measuring a distribution of a transmission of each sub-area, (c) determining a deviation of the transmission from a mean transmission value for each sub-area, (d) determining a constant specific for each sub-area, and (e) determining the critical dimension variation of the photolithographic mask by combining for each sub-area the deviation of the transmission and the sub-area specific constant.
    Type: Grant
    Filed: July 20, 2012
    Date of Patent: December 18, 2018
    Assignee: Carl Zeiss SMS Ltd.
    Inventor: Rainer Pforr
  • Patent number: 10152049
    Abstract: Infusion systems, infusion devices, and related operating methods are provided. An exemplary method of operating an infusion device capable of delivering fluid to a user involves determining one or more signal characteristics associated with a subset of the measurements corresponding to a monitoring period, determining a reliability metric for the monitoring period based on the one or more signal characteristics, and providing indication of a maintenance condition when the reliability metric violates a threshold.
    Type: Grant
    Filed: May 19, 2014
    Date of Patent: December 11, 2018
    Assignee: MEDTRONIC MINIMED, INC.
    Inventors: Keith Nogueira, Xiaolong Li, Rajiv Shah, Brian T. Kannard
  • Patent number: 10145676
    Abstract: A two-dimension layout system identifies points and their coordinates, and transfers identified points on a solid surface to other surfaces in a vertical direction. Two leveling laser light transmitters are used with a remote unit to control certain functions. The laser transmitters rotate about the azimuth, and emit vertical (plumb) laser planes. After being set up using benchmark points, the projected lines of the laser planes will intersect on the floor of a jobsite at any point of interest in a virtual floor plan, under control of a user with the remote unit. An “active target” can be used to more automatically create benchmarks. A laser distance meter can be installed on base units to automatically scan a room or a wall to determine certain key features.
    Type: Grant
    Filed: January 9, 2015
    Date of Patent: December 4, 2018
    Assignee: Trimble Navigation Limited
    Inventors: James N. Hayes, Chris W. Snyder, Ayman Hajmousa, Eric Keith Unger
  • Patent number: 10139873
    Abstract: A computer program product for redundant thermal sensing is configured to determine, based on component temperature information of a thermal sensor associated with a component, that a temperature of the component has surpassed a temperature threshold. The program code can be configured to identify a thermal sensor that is downstream from the component as defined by airflow. The program code can determine downstream temperature information as measured by the downstream sensor. The program code can be configured to compare the downstream temperature information and the component temperature information.
    Type: Grant
    Filed: August 29, 2013
    Date of Patent: November 27, 2018
    Assignee: International Business Machines Corporation
    Inventor: Arden L. Moore
  • Patent number: 10136303
    Abstract: A computer implemented method for determining the location of a target device is disclosed. A locate request is received for the target device. The locate request is forwarded. A locate for the target device in response to the locate request is received, the locate including a location and a location accuracy. The received location accuracy is compared with an accuracy threshold, and a calculated location of the target device is forwarded when the received location accuracy is not within the accuracy threshold.
    Type: Grant
    Filed: January 6, 2012
    Date of Patent: November 20, 2018
    Assignee: Location Labs, Inc.
    Inventor: Andrew Weiss
  • Patent number: 10120042
    Abstract: A magnetic field sensor has an error correction signal generator circuit to inject an error correction signal into a primary signal channel to cancel an error signal component in the primary signal channel.
    Type: Grant
    Filed: December 23, 2013
    Date of Patent: November 6, 2018
    Assignee: Allegro MicroSystems, LLC
    Inventors: Aurelian Diaconu, Ryan Metivier
  • Patent number: 10113929
    Abstract: A compactor gathers GPS, orientation and wheel slip data to identify the location of a soft spot in a surface that is being compacted and to isolate the soft spot to a particular side of the compactor if the wheel slip data indicates that the soft spot is located beneath only one of the compactor wheels. The GPS, orientation and wheel slip data are displayed as location information to an operator and/or sent to a remote location to facilitate the fast and accurate repair of the soft spot.
    Type: Grant
    Filed: August 21, 2014
    Date of Patent: October 30, 2018
    Assignee: Caterpillar Paving Products Inc.
    Inventors: Thomas J. Frelich, Kyle David Hendricks
  • Patent number: 10096987
    Abstract: A power distribution and communication system includes nodes connected by power lines and communication links. The system receives power from one or more power sources. Each node contains at least one power port, data port and load port. Associated with each power port and load port is a port monitor for measuring current flowing into or out of the port and the voltage difference between the port outlet and ground, which measurements are passed to a processing element. The processing element and monitor analyze measured values to detect fault conditions. Upon fault condition detection, the port is disabled by opening a switch, disconnecting the port from the system voltage. The processing element receives power directly from the power line, thus receiving power from a live power line even if the associated power port is disabled allowing the processing element to enable a disabled node following a failure.
    Type: Grant
    Filed: November 14, 2012
    Date of Patent: October 9, 2018
    Assignee: Applied Invention, LLC
    Inventors: W. Daniel Hillis, Anthony N. Gardner, Russel Howe, Randall Adam Yates
  • Patent number: 10073126
    Abstract: Proposed are a C-V characteristic measurement system and a method of measuring C-V characteristics that allow for less change in resistivity with time in repeated measurement of a single crystal silicon wafer using a mercury electrode, as compared to those in the related arts. Measurement is conducted with use of a C-V characteristic measurement system including: a mercury probe 30 for putting mercury as an electrode to contact with a single crystal silicon wafer; an LCR meter 40 for forming a depletion layer by supplying a high-frequency wave to the single crystal silicon wafer via the mercury probe 30 to apply a reverse bias voltage to the single crystal silicon wafer while measuring a capacitance of the depletion layer; analysis software for calculating C-V characteristics based on the reverse bias voltage and the capacitance of the depletion layer; and a static electricity removing device 20 for removing static electricity of the single crystal silicon wafer.
    Type: Grant
    Filed: February 19, 2013
    Date of Patent: September 11, 2018
    Assignee: SHIN-ETSU HANDOTAI CO., LTD.
    Inventors: Fumitaka Kume, Hisatoshi Kashino
  • Patent number: 10068508
    Abstract: Systems and techniques are provided for measuring consistency of animation and/or video rendering on a device, and providing a user with an indication of one or more consistency scores of the user's device. The consistency score indicates generally the consistency of user experience that is expected for the user device. In some cases, the consistency score is calculated based upon the differences in rendering times between adjacent frames in an animation, and/or the number of frames that have a render difference that differs from a standard or baseline value. A consistency score also may be based upon the framerate achievable by the device when rendering a video at a constant quality.
    Type: Grant
    Filed: August 30, 2013
    Date of Patent: September 4, 2018
    Assignee: Google LLC
    Inventors: Guru Nagarajan, Stuart Murray Scott
  • Patent number: 10018370
    Abstract: An economizer controller with sensor calibration. A controller sensor may be used to measure a parameter. At the same time at the same location of the measurement with the controller sensor, a measurement of the same parameter may be made with a precision sensor. The difference between the two measurements may be saved to a controller memory as an offset. The offset may be used to compensate future measurements of the same parameter by the controller sensor. Additional offsets at various magnitudes may be obtained between the precision and the controller sensors for compensating subsequent measurements by the controller sensor. Measurements with the compensated sensor may be used for calibrating sensors in other economizer controllers, for example, at remote locations in the field.
    Type: Grant
    Filed: September 24, 2010
    Date of Patent: July 10, 2018
    Assignee: Honeywell International Inc.
    Inventors: Cory Grabinger, Adrienne Thomle, Miroslav Mikulica