Patents Examined by Rufus Phillips
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Patent number: 9297980Abstract: For an optical device as a transmission-type scanning optical microscope having a pinhole or a slit for limiting the amount of a detected light beam, a method of moving a scanning beam without moving an observation sample to be scanned is realized. A scanning beam from a beam scanning mechanism that has passed through an observation sample is focused onto a reflection plate, and is then returned back again to the observation sample. A light beam that has returned back from the sample is further fed back to the beam scanning mechanism, and then, the light beam that has been limited through a fixed pinhole or a slit is detected with a photodetector.Type: GrantFiled: August 13, 2013Date of Patent: March 29, 2016Assignee: HITACHI-LG DATA STORAGE, INC.Inventor: Shigeharu Kimura
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Patent number: 9297744Abstract: Device and method for measuring phase retardation distribution and fast axis azimuth angle distribution of birefringence sample in real time. The device consists of a collimating light source, a circular polarizer, a diffractive beam-splitting component, a quarter-wave plate, an analyzer array, a charge coupled device (CCD) image sensor and a computer with an image acquisition card. The method can measure the phase retardation distribution and the fast axis azimuth angle distribution of the birefringence sample in real time and has large measurement range. The measurement result is immune to the light-intensity fluctuation of the light source.Type: GrantFiled: August 8, 2014Date of Patent: March 29, 2016Assignee: Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of SciencesInventors: Aijun Zeng, Longhai Liu, Linglin Zhu, Huijie Huang
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Patent number: 9222831Abstract: A spectroscope comprises a package provided with a light entrance part, a plurality of lead pins penetrating through a support part opposing the light entrance part in the package, a light detection unit supported on the support part within the package, and a spectroscopic unit supported on the support part within the package so as to be arranged on the support part side of the light detection unit. The light detection unit has a light transmission part for transmitting therethrough light incident thereon from the light entrance part. The spectroscopic unit has a spectroscopic part for spectrally resolving the light transmitted through the light transmission part while reflecting the light to a light detection part. The lead pins are fitted into fitting parts provided with the light detection unit and electrically connected to the light detection part.Type: GrantFiled: May 28, 2012Date of Patent: December 29, 2015Assignee: HAMAMATSU PHOTONICS K.K.Inventors: Takafumi Yokino, Katsumi Shibayama, Masaki Hirose, Katsuhiko Kato
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Patent number: 9207183Abstract: The measurement apparatus combines first and second lights from first and second light generators to focus the combined light to a sample, and detect the first or second light intensity-modulated by stimulated Raman scattering. The first light generator includes a light dispersion element separating the light from a light introducing optical system in different directions according to light frequencies, and drives at least one of the light dispersion element and part of the light introducing optical system so as to change an incident angle of the light to the light dispersion element to extract part of the separated light, thereby making a light frequency of the first light variable. The second light generator produces a plurality of the second lights having mutually different light frequencies. The apparatus measures a Raman spectrum by changing the light frequency of the first light.Type: GrantFiled: November 21, 2012Date of Patent: December 8, 2015Assignee: CANON KABUSHIKI KAISHAInventors: Yasuyuki Ozeki, Kazuyoshi Itoh, Wataru Umemura
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Patent number: 9195071Abstract: A jitter sensor including a light source and a light sensor utilizes speckle pattern analysis to detect motion.Type: GrantFiled: October 8, 2010Date of Patent: November 24, 2015Assignee: The Aerospace CorporationInventor: Thomas G. Chrien
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Patent number: 9182338Abstract: Microstructures and nanostructures (100) consisting of a substrate (110), an array of pillars (120) capped by metallic disc (130), metallic dots (clusters or granules) (140) disposed on the sidewalls of the pillars, and a metallic backplane (150) that can interact to enhance a local electric field, the absorption of the light, and the radiation of the light are disclosed. Methods to fabricate the structures (100) are also disclosed. Applications of the structures to enhance the optical signals in the detection of molecules and other materials on a structure surface, such as fluorescence, photoluminescence and surface enhanced Raman Scattering (SERS) are also disclosed.Type: GrantFiled: May 20, 2011Date of Patent: November 10, 2015Assignee: THE TRUSTEES OF PRINCETON UNIVERSITYInventors: Stephen Y. Chou, Wendi Li
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Patent number: 9182274Abstract: An optical measuring apparatus for measuring optical characteristics of a stereoscopic display device includes a test image supplier for generating a 3D test signal, a 3D display for displaying left-eye image and/or right-eye image based on the 3D test signal supplied from the test image supplier, a image selection member for selectively transmitting the left-eye image and right-eye image to be displayed on the 3D display, and a light measuring device for measuring intensity or color information of the image transmitted via the image selection member.Type: GrantFiled: October 9, 2014Date of Patent: November 10, 2015Assignee: LG Display Co., Ltd.Inventors: Jae Hong Kim, Dong Gyou Lee, Kyong Ho Lim
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Patent number: 9176048Abstract: A kind of normal incidence broadband spectroscopic polarimeter which is easy to adjust the focus, has no chromatic aberration, maintains the polarization and has simple structure. The normal incidence broadband spectroscopic polarimeter can make the probe beam normal incidence and focus on the sample surface by using at least one flat reflector element to change propagation direction of the focused beam. Moreover, the normal incidence broadband spectroscopic polarimeter contains at least one polarizer as to measure the anisotropy or non-uniform samples, such as three-dimensional profile and material optical constants of thin films consisting of the periodic structure. An optical measurement system including the normal incidence broadband spectroscopic polarimeter is also provided.Type: GrantFiled: June 1, 2011Date of Patent: November 3, 2015Assignee: BEIOPTICS TECHNOLOGY CO., LTDInventors: Guoguang Li, Tao Liu, Edgar Genio, Tiezhong Ma, Xiaolang Yan
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Patent number: 9170156Abstract: Disclosed is a normal-incidence broadband spectroscopic polarimeter containing reference beam, comprising a light source, a first reflecting unit, a first concentrating unit, a second concentrating unit, a polarizer, a first curved mirror, a first planar mirror, a second reflecting unit and a probing unit. Also disclosed is an optical measurement system, comprising the normal-incidence broadband spectroscopic polarimeter containing reference beam. The normal-incidence broadband spectroscopic polarimeter containing reference beam achieves an integral combination of the light beams after splitting, can maintain the polarization state of the light beams while increasing the light transmission efficiency, and has a low complexity.Type: GrantFiled: September 6, 2012Date of Patent: October 27, 2015Assignee: Bei Optics Technology Co., Ltd.Inventors: Guoguang Li, Tao Liu, Jiangyan Zhao, Qingyang Guo, Edgar Genio, Tiezhong Ma, Yang Xia
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Patent number: 9091643Abstract: A kernel component analysis device quantitatively analyzing a specific component contained in each of kernels on a kernel-by-kernel basis by spectroscopy includes: a light emitter configured to irradiate a kernel to be analyzed with light; a spectrum detector configured to detect a spectrum of light transmitted through and/or reflected from the kernel irradiated with the light; and a computing unit configured to calculate, on a kernel-by-kernel basis, a content of the specific component in the kernel to be analyzed, based on a spectrum value detected from an effective portion, which is suitable for quantitative analysis, of an image of the kernel by using a calibration curve indicating a relationship between a spectrum value at a specific wavelength and a content of the specific component.Type: GrantFiled: October 19, 2012Date of Patent: July 28, 2015Assignees: HIROSHIMA UNIVERSITY, SATAKE CORPORATIONInventors: Kensuke Kawamura, Hiroki Ishizuki, Hideaki Ishizu, Shinji Kaya
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Patent number: 9046347Abstract: The overall field of the invention is that of systems for detecting the posture of a moving object in space. The device according to the invention comprises: a fixed electrooptical device comprising a point emission source, a telecentric lens comprising a projection lens, a reception lens and a semireflective optical element and a photosensitive matrix-type sensor, the point emission source being arranged at the common focal point of the projection lens and of the reception lens by reflection or transmission through the semireflective optical element, and; an assembly comprising at least three corner cube retroreflectors which are arranged on the moving object. The main application of this device is the detection of the orientation of an aircraft pilot helmet.Type: GrantFiled: August 3, 2012Date of Patent: June 2, 2015Assignee: ThalesInventors: Bruno Barbier, Laurent Potin, Siegfried Rouzes
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Patent number: 9036160Abstract: The invention refers to a device for recording biometric data, such as lines of finger or hand. A rest is provided on the device for the hand and finger, respectively, as well as an illuminating unit. According to the invention an illuminating unit and/or rest is provided that can traverse and be positioned.Type: GrantFiled: June 12, 2009Date of Patent: May 19, 2015Assignee: TOUCHLESS BIOMETRIC SYSTEMS AGInventors: Chris Maurer, Roger Peter Van Diepen
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Patent number: 9025148Abstract: An alignment mark determines alignment of a first and a second exposure on a substrate on a macro level and a micro level. The alignment mark includes a first alignment pattern projected during the first exposure and a second alignment pattern projected during the second exposure. The alignment mark includes a first sub-mark at least partially defined by the first alignment pattern and a second sub-mark at least partially defined by the second alignment pattern. Relative positions of the first and second sub-marks on the substrate are representative for alignment of the first and second exposures on the macro level. At least one sub-mark is defined by image lines of the first alignment pattern and the second alignment pattern, and wherein relative positions of image lines of the first alignment pattern and image lines of the second alignment pattern of the at least one sub-mark are representative for alignment of the first and second exposures on the micro level.Type: GrantFiled: March 9, 2011Date of Patent: May 5, 2015Assignee: ASML Netherlands B.V.Inventors: David Deckers, Sam Musa
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Patent number: 9013709Abstract: A method for detecting motion direction of an object (4) comprises the steps of: laser output light (L1) is generated, using a semiconductor laser (2) having a thermal response frequency (fr); the laser is driven with rectangularly modulated DC current (I) having a modulation frequency higher than said thermal response frequency (fr) and preferably higher than twice said thermal response frequency (fr), such as to triangularly modulate the wavelength of the laser output light; the laser output light is directed to the object; a portion of reflected light (L3) is allowed to interfere with light (L0) within the laser; a portion of the laser light is used as measuring beam (5); the frequency spectrum of the measuring beam (5) is analyzed in conjunction with the modulated laser current in order to determine the direction of movement of the object (4).Type: GrantFiled: March 24, 2010Date of Patent: April 21, 2015Assignee: Koninklijke Philips N.V.Inventors: Marcel Schemmann, Cristian Presura, Carsten Heinks, Atanas Pentchev
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Patent number: 9007575Abstract: Microstructures and nanostructures (100) consisting of a substrate (110), an array of pillars (120) capped by metallic disc (130), metallic dots (clusters or granules) (140) disposed on the sidewalls of the pillars, and a metallic backplane (150) that can interact to enhance a local electric field, the absorption of the light, and the radiation of the light are disclosed. Methods to fabricate the structures (100) are also disclosed. Applications of the structures to enhance the optical signals in the detection of molecules and other materials on a structure surface, such as fluorescence, photoluminescence and surface enhanced Raman Scattering (SERS) are also disclosed.Type: GrantFiled: August 13, 2014Date of Patent: April 14, 2015Assignee: The Trustees of Princeton UniversityInventors: Stephen Y. Chou, Wendi Li
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Patent number: 9007600Abstract: A laser radar system includes: a scanner for transmitting a pulse toward a target while two-dimensionally scanning a transmitting beam, and outputting scan angle information; a lens of the receiver for receiving received light; a high aspect photo detector array for converting the received light into a received signal; a transimpedance amplifier array for amplifying the received signal; an adder circuit for adding the received signal from each element of the transimpedance amplifier array; a distance detecting circuit for measuring a light round-trip time to the target of an output signal from the adder circuit; and a signal processing unit for causing the scanner to perform a two-dimensional scanning operation in association with the scan angle information, to determine distances to multiple points on the target based on the light round-trip time and a speed of light and measure a three-dimensional shape of the target.Type: GrantFiled: April 18, 2011Date of Patent: April 14, 2015Assignee: Mitsubishi Electric CorporationInventors: Masaharu Imaki, Shumpei Kameyama, Akihito Hirai, Kimio Asaka, Yoshihito Hirano
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Patent number: 8988688Abstract: Disclosed are optical sensing devices and methods for detecting samples using the same. The optical sensing device comprises a source unit configured to generate a polychromatic light beam containing p-polarized and s-polarized components; an interferometric unit configured to split the light beam into a probe beam passing a first path and a reference beam passing a second path and to recombine the probe beam output from the first path and the reference beam output from the second path; a sensing unit disposed in the first path to introduce a first SPR effect associated with a target sample to the probe beam; and a detection unit configured to detect target sample characteristics by obtaining an intensity spectrum of the recombined light beam. The introduction of a polychromatic light source in the optical sensing device increases the detection dynamic range and the detection sensitivity.Type: GrantFiled: May 23, 2011Date of Patent: March 24, 2015Assignees: The Chinese University of Hong Kong, City University of Hong KongInventors: Lawrence Chi-man Wu, Siu pang Ng, Ho Pui Ho, Shu Yuen Wu
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Patent number: 8958068Abstract: A device for determining the volume fraction of at least one component of a multi-phase medium on the basis of the running time of an electromagnetic desired signal emitted in the multi-phase medium, having at least one emitting device for emitting the desired signal into the multi-phase medium, having at least one receiving device for receiving the desired signal, and having an evaluation device for determining the running time of the desired signal between the emitting device and the receiving device, and at least one polarization device arranged between the emitting device and the receiving device. The desired signal is emitted at least indirectly from the emitting device through the multi-phase medium to the polarization device, the polarization device influences the polarization of the desired signal and the polarization-influenced desired signal is emitted at least indirectly from the polarization device to the receiving device which receives it.Type: GrantFiled: May 24, 2012Date of Patent: February 17, 2015Assignee: KROHNE Messtechnik GmbHInventor: Christoph Baer
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Patent number: 8953175Abstract: A detector for detecting a position of a mark comprises: an image sensing device; an optical system which projects the mark onto an image sensing surface of the image sensing device; a pattern located in a position between the image sensing surface and an optical element located closest to a plane on which the mark is to be located, among optical elements forming the optical system, the position being optically conjugated with the plane; and a processor which calculates a position of the mark with respect to one of a position of the pattern and a position already known from the position of the pattern, based on a moire pattern formed on the image sensing surface by the mark and the pattern.Type: GrantFiled: December 13, 2010Date of Patent: February 10, 2015Assignee: Canon Kabushiki KaishaInventor: Hiroshi Sato
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Patent number: 8947657Abstract: Isolation of biological or chemical organisms can be accomplished using a surface enhanced Raman scattering (SERS) system. The SERS system can be a single or a stacked plurality of photonic crystal membranes with noble-metal lined through pores for flowing analyte potentially containing the biological or chemical organisms. The through pores can be adapted to trap individual biological or chemical organisms and emit SERS spectra, which can then be detected by a detector and further analyzed for viability of the biological or chemical organism.Type: GrantFiled: May 26, 2011Date of Patent: February 3, 2015Assignee: Lawrence Livermore National Security, LLCInventors: Sonia Edith Letant, Sarah Elyse Baker, Tiziana Bond, Allan Shih-Ping Chang