Patents Examined by Steve Nguyen
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Patent number: 9891985Abstract: A parser and checksum circuit includes a 256-bit data bus, IPV4, IPV6, TCP, and UDP state signal buses, a checksum summer and compare circuit, four 64-bit parsing circuits, a V6 extension processor, and a parse state context circuit. Each of the 64-bit parsing circuits includes two 32-bit parsing circuits. The data bus receives a data signal that is part of a packet. IPV4, IPV6, TCP, and UDP state signals are each configurable into 1-hot states where at most 1-bit is digital logic high. Each of the 1-hot states corresponds to a segment of a packet header of one of the IPV4, IPV6, TCP, and UDP protocols. Each 32-bit parsing circuit receives a 1-bit shifted version of the state signals received by the adjacent 32-bit parsing circuit and receives a portion of the data signal. State signals and the data signal portion are received in parallel during a single clock cycle.Type: GrantFiled: October 31, 2015Date of Patent: February 13, 2018Assignee: Netronome Systems, Inc.Inventors: Joseph M. Lamb, Benjamin D. Findlen
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Patent number: 9886340Abstract: A memory system and a method for the error correction of memory are disclosed herein. The method for the error correction of memory is performed by a memory system including a plurality of memory chips. The method for the error correction of memory may include reading, by a first ECC engine unit included in each of a plurality of memory chips, a chunk including a plurality of data bursts, first parity bits, and position bits from each of the plurality of memory chips; extracting, by the first ECC engine unit, a single data burst having an error from the plurality of data bursts using the position bits; and performing, by the first ECC engine unit, first error correction using the first parity bit corresponding to the extracted error data burst.Type: GrantFiled: March 2, 2016Date of Patent: February 6, 2018Assignees: SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION, WISCONSIN ALUMNI RESEARCH FOUNDATIONInventors: Jung Ho Ahn, Namsung Kim
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Patent number: 9885753Abstract: Efficient scan system presented can comprise: an array including a plurality of array non scannable components and a plurality of array quasi-scannable components wherein each column of the array includes at least one of the plurality of array quasi-scannable components; and an input interface configured to receive and selectively forward data and scan information to at least a portion of the array. At least a portion of the plurality of array quasi-scannable components can form a diagonal pattern in the array. The input interface can include: an input interface selection component wherein an output of the input interface selection component is communicatively coupled to an input of the input interface quasi-scannable component associated with one row and an input of the input interface selection component is communicatively coupled to an output of one of the plurality of array quasi-scannable components associated with another row.Type: GrantFiled: October 9, 2013Date of Patent: February 6, 2018Assignee: NVIDIA CORPORATIONInventors: Amit Sanghani, Farideh Golshan, Venkata Kottapalli, Milind Sonawane, Ketan Kulkarni
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Patent number: 9852813Abstract: Methods, apparatus and systems pertain to performing READ, WRITE functions in a memory which is coupled to a repair controller. One such repair controller could receive a row address and a column address associated with the memory and store a first plurality of tag fields indicating a type of row/column repair to be performed for at least a portion of a row/column of memory cells, and a second plurality of tag fields to indicate a location of memory cells used to perform the row/column repair.Type: GrantFiled: May 28, 2015Date of Patent: December 26, 2017Assignee: Micron Technology, Inc.Inventor: Todd Houg
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Patent number: 9817711Abstract: An ECC circuit can operate in a plurality of error correction modes with different correcting capabilities for data stored in a memory. The ECC circuit calculates a syndrome with respect to information data in accordance with an error correction mode set by a control part and adds a syndrome of a fixed length in which dummy bits are added to the calculated syndrome, to the information data. When code data is read out, the ECC circuit performs a correction process on the code data by using the syndrome included in the code data.Type: GrantFiled: September 5, 2014Date of Patent: November 14, 2017Assignee: MegaChips CorporationInventors: Takahiko Sugahara, Eri Fukushita
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Patent number: 9812193Abstract: A bit flip count is determined for each bin in a plurality of bins, including by: (1) performing a first read on a group of solid state storage cells at a first threshold that corresponds to a lower bound for a given bin and (2) performing a second read on the group of solid state storage cells at a second threshold that corresponds to an upper bound for the given bin. A minimum is determined using the bit flip counts corresponding to the plurality of bins and the minimum is used to estimate an optimal threshold.Type: GrantFiled: September 9, 2014Date of Patent: November 7, 2017Assignee: SK Hynix Inc.Inventors: Christopher S. Tsang, Frederick K. H. Lee, Xiangyu Tang, Zheng Wu, Jason Bellorado
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Patent number: 9806851Abstract: The invention relates to a transmitting system, comprising an SNS client that receives SNS messages from at least one SNS server, and a transmitter which transmits a broadcast signal, including the SNS messages and mobile service data, for a mobile broadcast. The transmitter includes: an RS frame encoder, which performs RS encoding and CRC encoding on the mobile service data for the mobile broadcast so as to build RS frames, and divides each RS frame into a plurality of portions; a group-forming unit, which forms data groups that contain each of the plurality of portions, and which adds known data sequences and signaling data to each data group; an inter-leaver for interleaving data of the data groups; and a trellis encoding unit for trellis-encoding the interleaved data.Type: GrantFiled: March 19, 2012Date of Patent: October 31, 2017Assignee: LG ELECTRONICS INC.Inventors: Pilsup Shin, Jeongwoo Kim, Minsung Kwak
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Patent number: 9800268Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 16200 and a code rate of 4/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 64-symbol mapping.Type: GrantFiled: May 21, 2015Date of Patent: October 24, 2017Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEInventors: Sung-Ik Park, Sun-Hyoung Kwon, Bo-Mi Lim, Jae-Young Lee, Heung-Mook Kim, Nam-Ho Hur
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Patent number: 9793926Abstract: A bit interleaver, a bit-interleaved coded modulation (BICM) device and a bit interleaving method are disclosed herein. The bit interleaver includes a first memory, a processor, and a second memory. The first memory stores a low-density parity check (LDPC) codeword having a length of 16200 and a code rate of 2/15. The processor generates an interleaved codeword by interleaving the LDPC codeword on a bit group basis. The size of the bit group corresponds to a parallel factor of the LDPC codeword. The second memory provides the interleaved codeword to a modulator for 64-symbol mapping.Type: GrantFiled: May 20, 2015Date of Patent: October 17, 2017Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTEInventors: Sung-Ik Park, Sun-Hyoung Kwon, Bo-Mi Lim, Jae-Young Lee, Heung-Mook Kim, Nam-Ho Hur
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Patent number: 9791510Abstract: A circuit includes a plurality of scan chains arranged in a ring network topology. Each scan chain includes a plurality of scan blocks, each of the plurality of scan blocks including a storage element and a switching device. Each switching device includes a first input configured to receive an output of a storage element in a different scan chain from the scan chain in which the switching device is disposed, and a second input configured to receive one of a function logic signal or a test scan signal. The switching device configured to selectively couple the first input or the second input to an input of the storage element.Type: GrantFiled: October 22, 2015Date of Patent: October 17, 2017Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.Inventor: Sandeep Kumar Goel
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Patent number: 9785501Abstract: A data storage device includes a non-volatile memory and a controller. A method includes writing a first logical page to a physical page of the non-volatile memory. In response to a multistate error indication satisfying a threshold, the method further includes rewriting the first logical page at the non-volatile memory. The multistate error indication is determined based on the first logical page.Type: GrantFiled: February 18, 2014Date of Patent: October 10, 2017Assignee: SANDISK TECHNOLOGIES LLCInventors: Idan Alrod, Eran Sharon
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Patent number: 9774352Abstract: There is provided a transmitting apparatus. The transmitting apparatus includes an encoder configured to perform Low Density Parity Check (LDPC) encoding with respect to input data, based on a parity check matrix, a parity interleaver configured to interleave parity bits from among LDPC codewords generated by the LDPC encoding, and a puncturer configured to puncture at least a part of the interleaved parity bits, and the puncturer groups the parity bits based on an interval at which a pattern of columns is repeated in an information word sub matrix constituting the parity check matrix and perform puncturing based on the number of punctured parity bits and a position of punctured parity bit groups from among the grouped parity bit groups.Type: GrantFiled: September 17, 2014Date of Patent: September 26, 2017Assignee: SAMSUNG ELECTRONICS CO., LTD.Inventors: Se-ho Myung, Hong-sil Jeong, Kyung-joong Kim
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Patent number: 9766837Abstract: Examples of the present disclosure provide apparatuses and methods related to redundant array of independent disks (RAID) stripe mapping in memory. An example method comprises writing data in a number of stripes across a storage volume of a plurality of memory devices according to a stripe map; wherein each of the number of stripes includes a number of elements; and wherein the stripe map includes a number of stripe indexes to identify the number of stripes and a number of element identifiers to identify elements included in each of the number of stripes.Type: GrantFiled: June 10, 2015Date of Patent: September 19, 2017Assignee: Micron Technology, Inc.Inventors: Edward McGlaughlin, Joseph M. Jeddeloh
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Patent number: 9766990Abstract: A checkpoint device is a transaction-based block device wherein data is committed to non-volatile memory (NVM) or tiered storage upon completion of a checkpoint. Automatic and instant rollback to the previous checkpoint is provided upon restart if any failure occurred during the previous checkpoint. Related techniques are also described.Type: GrantFiled: September 23, 2014Date of Patent: September 19, 2017Assignee: EMC IP HOLDING COMPANY LLCInventor: Adrian Michaud
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Patent number: 9753793Abstract: Examples may include a basic input/output system (BIOS) for a computing platform communicating with a controller for a non-volatile dual in-line memory module (NVDIMM). Communication between the BIOS and the controller may include a request for the controller to scan and identify error locations in non-volatile memory at the NVDIMM. The non-volatile memory may be capable of providing persistent memory for the NVDIMM.Type: GrantFiled: June 30, 2014Date of Patent: September 5, 2017Assignee: INTEL CORPORATIONInventors: Mohan J. Kumar, Murugasamy K. Nachimuthu, Camille C. Raad
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Patent number: 9740559Abstract: Embodiments are related to systems and methods for data storage, and more particularly to systems and methods for storing data to and accessing data from a flash memory.Type: GrantFiled: October 28, 2015Date of Patent: August 22, 2017Assignee: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.Inventor: Zhijun Zhao
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Patent number: 9729272Abstract: Methods and devices provide a feedback message having unequal error protection. The feedback message may include channel quality indicators. The channel quality indicators may have different levels of error protection based on a transmission property.Type: GrantFiled: August 17, 2015Date of Patent: August 8, 2017Assignee: IDTP HOLDINGS, INC.Inventors: George Jongren, Patrick Svedman, Bo Goransson
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Patent number: 9727437Abstract: Example apparatus and methods monitor conditions in an object storage system. The conditions monitored may include a load balance measure in the system, a capacity balance measure in the system, a fault tolerance measure in the system, or a usage pattern measure in the system. A distribution plan or redistribution plan for storing or moving erasure codes in the object storage system may be determined based on the conditions. The distribution plan or the redistribution plan for the erasure codes may be updated dynamically in response to changing conditions in the object storage system. The distribution or redistribution may depend on a weighted combination of the load balance measure, the capacity balance measure, the fault tolerance measure, or the usage pattern measure so that responding to one sub-optimal condition (e.g., load imbalance) does not create a different sub-optimal condition (e.g., unacceptable fault tolerance).Type: GrantFiled: February 18, 2014Date of Patent: August 8, 2017Assignee: Quantum CorporationInventor: John Reinart
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Patent number: 9722632Abstract: A system for hardware error-correcting code (ECC) detection or correction of a received codeword from an original codeword includes an error-detecting circuit configured to process a selection of symbols of the received codeword using a set of factors, the original codeword being recomputable from a corresponding said selection of symbols of the original codeword using the set of factors. The error-detecting circuit includes a hardware multiplier and accumulator configured to use the set of factors and the selection of symbols of the received codeword to recompute remaining symbols of the original codeword, and a hardware comparator configured to compare the recomputed remaining symbols of the original codeword with corresponding said remaining symbols of the received codeword and to output first results of this comparison.Type: GrantFiled: September 22, 2014Date of Patent: August 1, 2017Assignee: STREAMSCALE, INC.Inventor: Michael H. Anderson
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Patent number: 9720036Abstract: A post-fabrication debug and on-line error checking framework for 2D- and 3D-ICs with integrated memories is described. A design-for-debug (DfD) architecture can include, for an IC with on-chip memory, a debug module connected to a functional bus of the IC. The debug module receives trace data for an interval, generates compact signatures based on the received data, and compares these signatures to expected signatures. Intervals containing erroneous trace data can be identified by the debug module and stored in on-chip memory. A single iteration of signal tracing for debug testing between automated test equipment and the IC is possible.Type: GrantFiled: August 18, 2014Date of Patent: August 1, 2017Assignee: Duke UniversityInventors: Sergej Deutsch, Krishnendu Chakrabarty