Abstract: A storage medium includes at least one data unit defining a plurality of symbol-based inner code words and a plurality of symbol-based outer code words. Each symbol included in one of the inner code words is also included in one of the outer code words. A processor is configured to perform a first iteration of inner code error correction on the plurality of symbol-based inner code words, a first iteration of outer code error correction on the plurality of symbol-based outer code words and a second iteration of inner code error correction on the plurality of symbol-based inner code words. In the first iteration of outer code error corrections, at least one of the outer code words is correctable. In the second iteration of inner code error correction, at least one of the inner code words is correctable.

Abstract: A method for testing a data packet signal transceiver device under test (DUT) that minimizes time lost due to waiting for respective power levels of data packets transmitted by the DUT to settle at the desired nominal value for transmit signal testing. In accordance with exemplary embodiments, signals transmitted by the DUT during receive signal testing, e.g., as acknowledgement data packets, are transmitted at the nominal value for transmit signal testing, thereby allowing sufficient time for individual data packet signal power levels to settle and remain consistent at the nominal value by the time receive signal testing is completed and transmit signal testing is to begin.

Abstract: A client device or other processing device comprises a file encoding module, with the file encoding module being configured to separate a file into a plurality of sets of file blocks, to assign sets of the file blocks to respective ones of a plurality of servers, to define a plurality of parity groups each comprising a different subset of the plurality of servers, to assign, for each of the servers, each of its file blocks to at least one of the defined parity groups, and to compute one or more parity blocks for each of the parity groups. The file blocks are stored on their associated servers, and the parity blocks computed for each of the parity groups are stored on respective ones of the servers other than those within that parity group. Such an arrangement advantageously ensures that only a limited number of parity block recomputations are required in response to file block updates.

Abstract: An ECC circuit can operate in a plurality of error correction modes with different correcting capabilities for data stored in a memory. The ECC circuit calculates a syndrome with respect to information data in accordance with an error correction mode set by a control part and adds a syndrome of a fixed length in which dummy bits are added to the calculated syndrome, to the information data. When code data is read out, the ECC circuit performs a correction process on the code data by using the syndrome included in the code data.

Abstract: A method begins by a DS processing module generating a plurality of encoded slices from a data segment using an error encoding function. The method continues with the DS processing module identifying a plurality of DS storage units for storing the plurality of encoded slices. The method continues with the DS processing module selecting an encoded slice of the plurality of encoded slices for sub-slicing using a sub-slicing encoding function to produce a selected encoded slice. The method continues with the DS processing module outputting the plurality of encoded slices to the plurality of DS storage units. The method continues with the DS processing module outputting a command to a DS storage unit of the plurality of DS storage units corresponding to the selected encoded slice, wherein the command includes an instruction to sub-slice the selected encoded slice.

Abstract: A method of protecting digital words traversing multiple data paths is presented. The method identifies a number of bits for a header of a digital word and determines a number of protection bits for the header. A bit value for each of the protection bits is computed, and the computed bit values of the protection bits are transmitted through one or more data paths.

Abstract: A decoder in a device receiving data having an error correction code is described. The decoder comprises a memory storing program code having instructions including control signals for decoding an error correction code; an address generator coupled to the memory, the address generator updating an address coupled to the memory for generating a next control signal; and a data processing circuit coupled to receive an instruction from the memory and further coupled to receive syndrome data, the data processing circuit generating error correction values. A method for decoding data having an error correction code is also disclosed.

Abstract: Methods, systems, and devices are described for decoding data using a low-density parity check (LDPC) decoder. An edge memory in the LDPC decoder is configured to have a first bank and a second bank of memory partitions. The first bank stores extrinsic information for edges for a first set of N check nodes and the second bank stores extrinsic information for edges for a second set of N check nodes. The first and second banks are concurrently accessed to process 2N check nodes in parallel. The first and second sets of N check nodes may respectively correspond to odd-numbered and even-numbered check nodes from the 2N check nodes processed in parallel by the LDPC decoder. The LDPC decoder operation may include initializing channel soft information into a memory different from the edge memory and the use of incremental changes in the extrinsic information to update the extrinsic information.

Abstract: A memory device includes a memory array with random defective memory cells. The memory array is organized into rows and columns with a row and column identifying a memory location of a memory cell of the memory array. The memory device includes a row address device and a column address device and is operative to use a grouping of either the row or the column addresses to manage the random defective memory cells by mapping the memory location of a defective memory cell to an alternate memory location.

Abstract: Embodiments of the invention relate to storing data in a storage array. An aspect of the invention includes receiving and arranging read data in array that includes m rows and n columns of entries, with each entry including at least one sector. In the array, mr+s locations are assigned to parity entries, such that each row has at least r parity entries. The parity entries correspond to a partial-maximum distance separable (PMDS) code that allows recovery from up to r erasures in each of the m rows as well as s additional erasures in any locations in the data array, where s is an integer greater than zero. The write data and the associated parity entries are written to the set of storage devices.

Abstract: A circuit enabling generating a product in a decoder circuit is disclosed. The circuit comprises a first memory element coupled to receive a first error value and a first portion of a second error value; a second memory element coupled to receive the first error value and a second portion of the second error value; and an adder circuit coupled to add an output of the first memory element and an output of the second memory element. The output of the first memory element is generated in response to an address based on the first error value and the first portion of the second error value, and the output of the second memory element is generated in response to an address based on the first error value and the second portion of the second error value. A method for generating a product in a decoder circuit is also disclosed.

Abstract: REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.

Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for storing data reliably across groups of storage nodes. In one aspect, a method includes receiving (n?f) data chunks for storage across n groups of storage nodes and generating (f?1) error-correcting code chunks using an error-correcting code and the (n?f) data chunks. The (n?f) data chunks are stored at a first group of storage nodes. Each data chunk of the (n?f) data chunks is stored at a respective second group of storage nodes. Each code chunk of the (f?1) code chunks is stored at a respective third group of storage nodes. Each second group of storage nodes and each third group of storage nodes is distinct from each other and from the first group of storage nodes.

Abstract: A reconfigurable device test scheme is provided for making a test of a reconfigurable device with configuration data which is loaded a smaller number of times. A reconfigurable device used herein holds a plurality of configuration data and is capable of instantaneously switching which configuration is implemented thereby. Specifically, one transfer configuration data and one or more test configuration data are previously loaded in a configuration memory of the reconfigurable device, and a test is made while sequentially switching the transfer configuration data and the test configuration data. In this way, the same configuration data need not be reloaded over and over, so that the test can be made with a smaller number of times of loading as compared with before.

Abstract: A serial processing method and a parallel processing method of bit rate matching and apparatuses thereof are disclosed in the present invention. The serial processing method includes: receiving a system bit data stream, a check 1 data stream and a check 2 data stream, performing interleaving processing on the system bit data in the received system bit data stream, and caching in a first buffer cache of a storage; simultaneously performing interleaving processing on the corresponding data in the received check 1 data stream and the received check 2 data stream, and caching the data on which the performing interleaving processing is performed in a second buffer of the storage; and reading valid data from the storage and implementing the rate matching.

Abstract: Architecture that implements error correcting pointers (ECPs) with a memory row, which point to the address of failed memory cells, each of which is paired with a replacement cell to be substituted for the failed cell. If two error correcting pointers in the array point to the same cell, a precedence rule dictates the array entry with the higher index (the entry created later) takes precedence. To count the number of error correcting pointers in use, a null pointer address can be employed to indicate that a pointer is inactive, an activation bit can be added, and/or a counter, that represents the number of error correcting pointers that are active. Mechanisms are provided for wear-leveling within the error correction structure, or for pairing this scheme with single-error correcting bits for instances where transient failures may occur. The architecture also employs pointers to correct errors in volatile and non-volatile memories.

Abstract: In one exemplary embodiment of an apparatus for accelerating the encoding of Raptor codes, based on an inputted block length, a pre-encoding matrix generation device determines to generate an encoding matrix M corresponding to the inputted block length and computes an inverse matrix M?1, or makes a pre-coding operation list storage device output an operation list corresponding to the inputted block length; based on the encoding matrix or the inverse matrix M?1, a pre-encoding operation list generation device generates a new operation list; based on one of the aforementioned two operation lists and an inputted source symbol set, at least one prompt intermediate symbol generation device generates at least one intermediate symbol set to provide to a fountain code encoder for encoding.

Abstract: A data receiving circuit includes: a first de-interleave circuit configured to de-interleave first data which is demodulated and is soft-decision-processed; a second de-interleave circuit configured to de-interleave second data which is demodulated and is soft-decision-processed; a memory configured to be shared by the first de-interleave circuit and the second de-interleave circuit and store respective hard decision information and respective soft decision information of the first data and the second data; and a memory control circuit configured to vary a first through fourth number of bits stored in the memory, the first number corresponding to the hard decision information of the first data, the second number corresponding to the soft decision information of the first data, the third number corresponding to the hard decision information of the second data, the fourth number corresponding to the soft decision information of the second data.

Abstract: A system and method for designing a field programmable gate array (FPGA) with built-in test mechanism includes several enhancements to traditional circular self-test path (CSTP) BIST architecture. The FPGA BIST scheme isolates primary inputs and primary outputs to improve test coverage. Multiple signature output taps are inserted at CSTP registers throughout the test path to help improve signature aliasing probability. Enhanced CSTP register selection algorithms help prevent register adjacency problems and optimize overall resource utilization for implementation. Multiple clock domains are also handled by the FPGA BIST to allow full chip implementation of the FPGA BIST.

Abstract: Fault diagnosis techniques (e.g., effect-cause diagnosis techniques) can be speeded up by, for example, using a relatively small dictionary. Examples described herein exhibit a speed up of effect-cause diagnosis by up to about 160 times. The technologies can be used to diagnose defects using compacted fail data produced by test response compactors. A dictionary of small size can be used to reduce the size of a fault candidate list and also to facilitate procedures to select a subset of passing patterns for simulation. Critical path tracing can be used to handle failing patterns with a larger number of failing bits, and a pre-computed small dictionary can be used to quickly find the initial candidates for failing patterns with a smaller number of failing bits. Also described herein are exemplary techniques for selecting passing patterns for fault simulation to identify faults in an electronic circuit.