Patents Examined by Tara S Pajoohi Gomez
  • Patent number: 8634080
    Abstract: A method for determining an active dopant concentration profile of a semiconductor substrate based on optical measurements is disclosed. The active dopant concentration profile includes a concentration level and a junction depth. In one aspect, the method includes obtaining a photomodulated optical reflectance (PMOR) amplitude offset curve and a PMOR phase offset curve for the semiconductor substrate based on PMOR measurements, determining a decay length parameter based on a first derivative of the amplitude offset curve, determining a wavelength parameter based on a first derivative of the phase offset curve, and determining, from the decay length parameter and the wavelength parameter, the concentration level and the junction depth of the active dopant concentration profile.
    Type: Grant
    Filed: January 18, 2013
    Date of Patent: January 21, 2014
    Assignees: IMEC, Katholieke Universiteit Leuven
    Inventor: Janusz Bogdanowicz
  • Patent number: 8634067
    Abstract: Apparatus including a broadband illumination source and a confocal optical system. The confocal optical system is configured and arranged to receive a portion of light projected onto an object by the broadband illumination source. The apparatus can include an illumination source, a confocal optical system, and at least one detector configured and arranged to receive angularly separated light corresponding to a confocal volume. There is also provided a light scattering spectroscopic device including a broadband illumination source, a two-dimensional detector, and a spectral separation device configured and arranged to receive scattered light from an object and to direct at least a portion of the scattered light onto the two-dimensional detector. The method and apparatus can combine confocal microscopy techniques with light scattering spectroscopy techniques to create a confocal light scattering spectroscopy (CLSS) system.
    Type: Grant
    Filed: May 11, 2005
    Date of Patent: January 21, 2014
    Assignee: Beth Israel Deaconess Medical Center, Inc.
    Inventors: Lev T. Perelman, Juan G. Alvarez, Mark D. Modell
  • Patent number: 8625110
    Abstract: A method of inspecting a structure. The method includes preparing preliminary spectrums of reference diffraction intensities according to critical dimensions of reference structures, obtaining a linear spectrum from the preliminary spectrums in a set critical dimension range, radiating light to respective measurement structures formed on a substrate, measuring measurement diffraction intensities of the light diffracted by the measurement structures, and obtaining respective critical dimensions of the measurement structures from the measurement diffraction intensities using the linear spectrum.
    Type: Grant
    Filed: March 30, 2010
    Date of Patent: January 7, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Seouk-Hoon Woo, Jeong-Ho Yeo, Byeong-Ok Cho, Joo-On Park, Chang-Min Park, Won-Sun Kim
  • Patent number: 8625101
    Abstract: There is provided a method for referencing and correcting the beating spectrum generated by the interference of the components of a frequency comb source. The proposed method allows monitoring of variations of a mapping between the source and the beating replica. This can then be used to compensate small variations of the source in Fourier transform spectroscopy or in any other interferometry application in order to overcome the accuracy and measurement time limitations of the prior art. Constraints on source stability are consequently reduced.
    Type: Grant
    Filed: May 31, 2013
    Date of Patent: January 7, 2014
    Assignee: Université Laval
    Inventors: Philippe Giaccari, Pierre Tremblay, Philippe Saucier, Jérôme Genest, Jean-Daniel Deschênes
  • Patent number: 8625089
    Abstract: A foreign-matter inspection apparatus is implemented which allows the stable detection sensitivity to be maintained. A laser beam emitted from a laser apparatus is applied to a beam irradiation sample via an irradiation unit and a mirror. Then, the laser beam is captured into a beam-capturing camera via an image-forming lens and a beam-direction switching mirror. Based on the captured beam image, an image computational processing unit judges inclination of the laser beam, then adjusting the irradiation unit thereby to correct the inclination of the laser beam. Also, the beam is captured into the beam-capturing camera in specified number-of-times while focus of the laser beam is being changed by an arbitrary amount by the irradiation unit. Based on the captured beam, the focus of the laser beam is corrected by adjusting the irradiation unit.
    Type: Grant
    Filed: December 10, 2010
    Date of Patent: January 7, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoshio Bamba, Masayuki Ochi, Shigehisa Nozawa
  • Patent number: 8625102
    Abstract: An aberration measurement system includes an interferometer that includes a polarization adjuster configured to adjust a polarization plane of coherent light, and a phase shifter configured to shift a phase of reference light. The aberration measurement system further includes a signal processing unit configured to obtain a nonpolarization aberration of the test object, and coefficients a=sin ? cos 2?, b=sin ? sin 2?, and c=cos ? for a retardation amount 2? and a principal axis direction ? of a polarization aberration of the test object, based on data of a plurality of interference pattern images which provide at least three complex visibilities obtained from the interferometer after a polarization adjuster adjusts the polarization plane of the coherent light, and to determine signs of the coefficients a, b, and c based on the nonpolarization aberration.
    Type: Grant
    Filed: December 7, 2010
    Date of Patent: January 7, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yasuhiro Sawada, Satoru Komatsu
  • Patent number: 8619257
    Abstract: Disclosed herein are methods and devices for detection of bacterial HAI. Disclosed methods may be utilized for continuous in vivo monitoring of a potential bacterial infection site and may be utilized to alert patients and/or health care providers to the presence of pathogenic bacteria at an early stage of infection. Disclosed methods include utilization of recombinant bacteriophage to deliver to pathogenic bacteria a translatable genetic sequence encoding an optically detectable marker or an enzyme capable of producing an optically detectable marker. Upon detection of the optical signal produced by the marker, medical personnel may be alerted to the presence of pathogenic bacteria at the site of inquiry. Any bacterial causative agent of HAI may be detected according to disclosed methods.
    Type: Grant
    Filed: December 13, 2007
    Date of Patent: December 31, 2013
    Assignee: Kimberley-Clark Worldwide, Inc.
    Inventors: Thomas Edward Plowman, Erica M. Phillips, Richard Hantke, Daniel Baird, Mike Rainone, Talbot Presley
  • Patent number: 8610885
    Abstract: Apparatus and methodology for testing coated optical-fiber bend fatigue and operational reliability by subjecting a coated optical-fiber carrying an optical signal to bending motion. The motion can be either: (1) in the same angular direction for multiple revolutions or (2) alternating clockwise and counterclockwise directions for repetitive single revolutions. The motions are achieved by using either a single conical-cylindrical form or two conically-shaped forms separated from each other by a constant gap width with the coated optical-fiber under test strung in the gap between the forms. With the two cones, the fiber is wrapped over each form in an alternating manner by a rotating arm that makes only single revolutions in clockwise and counterclockwise directions. With either embodiment, varied circumferences are controllably presented to the optical fiber resulting in varying bend radii.
    Type: Grant
    Filed: June 17, 2010
    Date of Patent: December 17, 2013
    Assignee: Verizon Patent and Licensing Inc.
    Inventors: David Zhi Chen, Vijay Jain
  • Patent number: 8610904
    Abstract: An inspecting apparatus inspects a tampon that includes a tampon main body that has a cord and an applicator that is cylindrical and that accommodates the tampon main body in such a manner that the cord is exposed from a rear end of the applicator. The inspecting apparatus includes a suction mechanism that extends the cord along a longitudinal direction of the tampon by sucking air, and a cord-length inspecting mechanism that inspects a length of the cord while the suction mechanism is sucking the air.
    Type: Grant
    Filed: November 17, 2009
    Date of Patent: December 17, 2013
    Assignee: Uni-Charm Corporation
    Inventors: Shinobu Seki, Hideki Onishi, Masashi Hosokawa
  • Patent number: 8610897
    Abstract: The present invention relates to a high-resolution scanning surface-plasmon microscope including a source (LG) of coherent light and a medium for coupling and confining a surface plasmon including an objective (O, OM) with a large numerical aperture, immersion oil (Hi), and a glass cover slip (GS). A metal layer (MS) covers a surface of the glass cover slip (GS). The microscope also includes a heterodyne-mode Twyman-Green interferometer placed between the light source and means (PL1, PL2, EC) for scanning the metal layer using a light beam and means (PD) for detecting the beam from the interferometer connected to processing means (S, F, DTec, COMP) for forming an image from that beam. According to the invention, at least one polarization converter (CP) for converting the light beams (L) emitted by the light source (LG) from linear polarization to radial polarization is disposed between the light source and the interferometer.
    Type: Grant
    Filed: December 11, 2008
    Date of Patent: December 17, 2013
    Assignees: Ecole Normale Superieure de Lyon, Centre National de la Recherche Scientifique
    Inventors: Lofti Berguiga, Francoise Argoul
  • Patent number: 8605266
    Abstract: A component measurement apparatus includes a confocal optical system including a laser emitting laser light, a collimating lens collimating the laser light emitted from the laser, an objective lens condensing the collimated light having exited the collimating lens in order to illuminate internal tissue of an object of measurement, a half mirror redirecting reflected light reflected by the internal tissue of the object of measurement and refracted by the objective lens, a pin hole through which the reflected light redirected by the half mirror passes, and a light-receiving element receiving the reflected light having passed through the pin hole. The component measurement apparatus also includes a data analyzer section measuring a component of the object of measurement in accordance with data output from the light-receiving element. In the component measurement the apparatus, a focal position of the objective lens is adjustable along an optical axis.
    Type: Grant
    Filed: March 4, 2011
    Date of Patent: December 10, 2013
    Assignee: Yokogawa Electric Corporation
    Inventors: Shin-ichiro Tezuka, Hitoshi Hara
  • Patent number: 8582094
    Abstract: Systems and methods for inspecting a specimen are provided. One system includes an illumination subsystem configured to direct light to the specimen at an oblique angle of incidence. The light is polarized in a plane that is substantially parallel to the plane of incidence. The system also includes a detection subsystem configured to detect light scattered from the specimen. The detected light is polarized in a plane that is substantially parallel to the plane of scattering. In addition, the system includes a processor configured to detect defects on the specimen using signals generated by the detection subsystem. In one embodiment, such a system may be configured to detect defects having a size that is less than half of a wavelength of the light directed to the specimen.
    Type: Grant
    Filed: April 20, 2005
    Date of Patent: November 12, 2013
    Assignee: KLA-Tencor Technologies Corp.
    Inventors: David Shortt, Stephen Biellak, Christian Wolters
  • Patent number: 8576399
    Abstract: A method for turbidity measurement in a measured medium uses a turbidity sensor, which comprises at least a first and a second emitter and at least a first and a second detector. The first and the second emitters are excited one after the other to produce light signals directed into the measured medium; wherein each light signal travels along a first propagation path through the measured medium to the first detector, and is converted by such into a first detector signal; and travels along a second propagation path through the measured medium to the second detector, and is converted by such into a second detector signal. A turbidity value is ascertained based on the first and the second detector signals; wherein, by means of at least one additional detector, to which at least one of the light signals travels along an additional propagation path, an additional detector signal is ascertained, and, on the basis of the additional detector signal, the turbidity value is checked as regards its plausibility.
    Type: Grant
    Filed: April 9, 2009
    Date of Patent: November 5, 2013
    Assignee: Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG
    Inventors: Edin Andelic, Rudiger Frank
  • Patent number: 8570511
    Abstract: A mobility spectrometer to measure a nanometer particle size distribution is disclosed. The mobility spectrometer includes a conduit and a detector. The conduit is configured to receive and provide fluid communication of a fluid stream having a charged nanometer particle mixture. The conduit includes a separator section configured to generate an electrical field of two dimensions transverse to a dimension associated with the flow of the charged nanometer particle mixture through the separator section to spatially separate charged nanometer particles of the charged nanometer particle mixture in said two dimensions. The detector is disposed downstream of the conduit to detect concentration and position of the spatially-separated nanometer particles.
    Type: Grant
    Filed: September 8, 2010
    Date of Patent: October 29, 2013
    Assignee: Brookhaven Science Associates, LLC
    Inventor: Jian Wang
  • Patent number: 8570518
    Abstract: A test system includes an optical medium, a binding agent capable of capturing a target complex, and a light detector. The optical medium provides a light path, and the binding agent is positioned to hold the target complex in an evanescent field created by propagation of light along the light path. The complex interacts with the evanescent field and emits light that the detector positioned to detect. The optical medium and the detector can be included in an optical integrated circuit where detected light passes through the optical medium transverse to the direction of the light path.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: October 29, 2013
    Assignee: Alverix, Inc.
    Inventors: Nicholas M. Sampas, Rene P. Helbing, Bo U. Curry, Julie E. Fouquet, Carol T. Schembri
  • Patent number: 8570501
    Abstract: Described herein are systems and methods for uniquely identifying, or “fingerprinting,” optical fibers based upon measurements from an optical time-domain reflectometer (“OTDR”). One embodiment of the disclosure of this application is related to a computer readable storage medium including a set of instructions that are executable by a processor. The set of instructions being operable to retrieve a profile for an intended fiber, the profile including unique measurement data of the intended fiber, collect further measurement data from a connected fiber within a network, compare the unique measurement data of the intended fiber to the further measurement data of the connected fiber, and confirm an identity of the connected fiber as being the intended fiber when the unique measurement data matches the further measurement data, and trigger an alert when the unique measurement data does not match the further measurement data.
    Type: Grant
    Filed: December 17, 2009
    Date of Patent: October 29, 2013
    Assignee: AT&T Intellectual Property I, LP.
    Inventors: Jonathan Nagel, Sheryl Woodward
  • Patent number: 8553223
    Abstract: Biodegradable waveguides and their uses with devices, such as medical devices, are described. In one embodiment, an optically transmissive fibrous structure comprising biodegradable fiber waveguides may be disposed on a surface of a bandage. The bandage in combination with the optically transmissive fibrous structure may allow for simultaneously monitoring and covering an injured area of a patient. In one embodiment, the fiber waveguides may be provided as multi-channel/multi-core biodegradable fiber waveguides for transmitting light to and from a patient tissue. In some implementations, the bandage may include hydrogel-based biodegradable fiber waveguides that may deliver therapeutics to an injured patient area.
    Type: Grant
    Filed: March 31, 2010
    Date of Patent: October 8, 2013
    Assignee: Covidien LP
    Inventor: Edward McKenna
  • Patent number: 8547556
    Abstract: A method of analyzing a fluid sample from a reservoir comprises: collecting the sample in a sampling container, wherein the sample container includes a sample receptacle, and wherein the step of collecting comprises allowing or causing the sample to flow into the sample receptacle; and determining at least one property of the sample, wherein the step of determining comprises using a multivariate optical element (MOE) calculation device, and wherein the step of determining is performed during the step of collecting and wherein the MOE calculation device is located at one end of the sample receptacle, or the step of determining is performed after the step of collecting. The sample is analyzed as the sample flows into the sample container or as the sample is being transferred from the sample container into a container.
    Type: Grant
    Filed: July 5, 2012
    Date of Patent: October 1, 2013
    Assignee: Halliburton Energy Services, Inc.
    Inventor: Cyrus A. Irani
  • Patent number: 8547550
    Abstract: A fluorescence-cued Raman identification system comprises a collection subsystem to collect samples, a reagent treatment subsystem to treat collected samples and a fluorescence imaging subsystem that automatically takes at least one image of the collected sample. The subsystems further include a Raman spectroscopy subsystem that measures the spectrum of viable organisms located from at least one collected image, a visible imaging microscope subsystem that provides a visual image of the particle analyzed by the Raman spectroscopy subsystem and a processor configured to perform image processing to locate viable organisms within the sample, which are targeted by the Raman spectroscopy subsystem. The processor further analyzes the spectrum recorded by the Raman spectroscopy subsystem to make a preliminary identification of the targeted organisms, which can be verified by an operator using the visible imaging microscope subsystem.
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: October 1, 2013
    Assignee: Battelle Memorial Institute
    Inventor: Jeffrey P. Carpenter
  • Patent number: 8502973
    Abstract: An optical emission analyzer is provided with a circuit-closing switch (56) for changing the state of an arc-generating circuit 5 between the closed state and the open state and a reverse-blocking diode (55) for preventing a spark current from flowing into the circuit-closing switch (56). The circuit-closing switch (56) is turned on before the beginning of a spark discharge between a discharge electrode (31) and a sample (32) to initiate excitation of a coil (53). Consequently, the excitation current of the coil (53) can be increased to a target value within the duration of the spark discharge without using a low-inductance coil or increasing the switching frequency of a switching element (52).
    Type: Grant
    Filed: September 4, 2007
    Date of Patent: August 6, 2013
    Assignee: Shimadzu Corporation
    Inventor: Haruki Osa