Patents Examined by Tara S Pajoohi Gomez
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Patent number: 8502985Abstract: A microfluidic system includes a chip with a microfluidic channel opening onto a chip inlet and a chip outlet. The channel has a sensing area and fluid delivery area. A fluidic adaptor channel opening onto an adaptor inlet and an adaptor outlet can receive a pipette tip through the adaptor inlet wherein receipt of the pipette tip into the adaptor channel creates a direct fluid path between the pipette tip and the channel and wherein the microfluidic system is configured for sensing in the sensing area by interferometry.Type: GrantFiled: January 10, 2012Date of Patent: August 6, 2013Assignees: Molecular Sensing, Inc., Vanderbilt UniversityInventors: Scot Weinberger, Bruce J. Richardson, Darryl L. Bornhop
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Patent number: 8497990Abstract: An optical filter includes a first variable wavelength bandpass filter that extracts light of a first wavelength band and has first and second spectral bands and a second variable wavelength bandpass filter that extracts light of a second wavelength band adjacent to the first wavelength band and has third and fourth spectral bands. Part of the period during which the light of the first spectral band is extracted overlaps with the period during which the light of the third spectral band is extracted, and part of the period during which the light of the second spectral band is extracted overlaps with the period during which the light of the fourth spectral band is extracted.Type: GrantFiled: May 24, 2011Date of Patent: July 30, 2013Assignee: Seiko Epson CorporationInventor: Takeshi Nozawa
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Patent number: 8493557Abstract: A surface inspecting apparatus rotates a semiconductor wafer 100 (inspection object) as a main scan while translating the semiconductor wafer 100 as an auxiliary scan, illuminates the surface of the semiconductor wafer 100 with illuminating light 21, thereby forms an illumination spot 3 as the illumination area of the illuminating light 21, detects scattered or diffracted or reflected light from the illumination spot, and detects a foreign object existing on the surface of the semiconductor wafer 100 or in a part of the semiconductor wafer 100 in the vicinity of the surface based on the result of the detection. In the surface inspecting apparatus, the translation speed of the auxiliary scan is controlled according to the distance from the rotation center of the semiconductor wafer 100 in the main scan to the illumination spot.Type: GrantFiled: January 22, 2010Date of Patent: July 23, 2013Assignee: Hitachi High-Technologies CorporationInventor: Shigeru Matsui
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Patent number: 8493556Abstract: Some embodiments of a distributed Brillouin optical fiber sensing system employs a sensing optical fiber that supports two or more (i.e., few) guided modes. Pump light supported by one of the guided modes is used to form a dynamic Brillouin grating (DBG). Probe light supported by at least one of the other guided modes interacts with the DBG to form reflected probe light that is received and analyzed to determine a Brillouin frequency shift, a phase matching wavelength between probe and pump light, a reflection location, which in turn allows for making a measurement of at least one condition along the sensing optical fiber. Supporting the pump and probe light in different guided modes results in the optical fiber sensing system being able to simultaneously measure temperature and strain and having a higher spatial resolution than sensing systems where the pump light and probe light share a common guided mode.Type: GrantFiled: January 5, 2012Date of Patent: July 23, 2013Assignee: Corning IncorporatedInventors: Ming-Jun Li, Shenping Li, Xiaobin Wang
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Patent number: 8493555Abstract: A distributed Brillouin optical fiber sensing system employs a sensing optical fiber that supports two or more (i.e., few) guided modes. Pump light supported by one of the guided modes is used to form a dynamic Brillouin grating (DBG). Probe light supported by at least one of the other guided modes interacts with the DBG to form reflected probe light that is received and analyzed to determine a Brillouin frequency shift and a reflection location, which in turn allows for making a measurement of at least one condition along the sensing optical fiber. Supporting the pump and probe light in different guided modes results in the optical fiber sensing system having a higher spatial resolution than sensing systems where the pump light and probe light share a common guided mode.Type: GrantFiled: April 29, 2011Date of Patent: July 23, 2013Assignee: Corning IncorporatedInventors: Ming-Jun Li, Shenping Li, Xiaobin Wang
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Patent number: 8488119Abstract: A method of applying an ellipsometer or polarimeter system which operates in a frequency range between 300 GHz or lower and extending to higher than at least 1 Tera-hertz (THz), and preferably through the Infra-red (IR) range up to, and higher than 100 THz; wherein the ellipsometer or polarimeter system includes a source such as a backward wave oscillator, a Smith-Purcell cell, a free electron laser, an FTIR source or a solid state device; and a detector such as a Golay cell a bolometer or a solid state detector; and preferably includes at least one odd-bounce polarization state image rotating system and a polarizer, and at least one compensator and/or modulator, in addition to an analyzer.Type: GrantFiled: June 14, 2010Date of Patent: July 16, 2013Assignees: J.A. Woollam Co., Inc., University of Nebraska Board of RegentsInventors: Craig M. Herzinger, Mathias M. Schubert, Tino Hofmann, Martin M. Liphardt, John A. Woollam
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Patent number: 8488115Abstract: A new metric applicable to the characterization and design of multimode fiber (MMF) is described. The metric is derived from a Differential Mode Delay (DMD) measurement and when used in combination with industry-standard metrics such as Effective Modal Bandwidth (EMB) and DMD, yields a more accurate prediction of MMF channel link performance as measured by Bit Error Rate (BER) testing. The metric can also be used in the design of MMF for improved bandwidth performance. When implemented as a test algorithm in production, it can be used to select, sort, or verify fiber performance. This process can yield a multimode fiber design with a greater performance margin for a given length, and/or a greater length for a given performance margin.Type: GrantFiled: November 2, 2012Date of Patent: July 16, 2013Assignee: Panduit Corp.Inventors: Richard J. Pimpinella, Gaston E. Tudury
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Patent number: 8488120Abstract: A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material.Type: GrantFiled: April 16, 2007Date of Patent: July 16, 2013Assignee: Bioptix Diagnostics, Inc.Inventors: John Hall, Viatcheslav Petropavloskikh, Oyvind Nilsen
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Patent number: 8488130Abstract: A shape-sensing segment traverses through at least a portion of a kinematic chain of a tele-operated slave surgical instrument in a tele-operated minimally-invasive surgical system. The shape-sensing segment includes a pre-set perturbation. Shape information from the pre-set perturbation allows determination of relative partial-pose information for at least one link in the kinematic chain.Type: GrantFiled: November 13, 2009Date of Patent: July 16, 2013Assignee: Intuitive Surgical Operations, Inc.Inventors: Vincent Duindam, Giuseppe Maria Prisco, Theodore W. Rogers, John Ryan Steger
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Patent number: 8482743Abstract: Edge data for an object are obtained by placing the object in front of a medium that has greater reflectance than the object, and both are illuminated by a light source. The contrast in image intensity obtained between the object and background enables the edges of the object to be determined.Type: GrantFiled: June 20, 2005Date of Patent: July 9, 2013Assignee: Cognitens Ltd.Inventor: Avner Segev
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Patent number: 8477319Abstract: A measuring apparatus for measuring a three-dimensional shape includes a light source, a contact tip that is brought into contact with an object to be measured and scans the object to be measured, a holding portion that is movable along the object to be measured, a coupling portion for coupling the contact tip to the holding portion via a flexible support member, and an objective lens supported by the holding portion. In addition, an optical system condenses light provided by the light source on the contact tip via the objective lens, a photodetector receives backscattered light from the contact tip and detects a position of the contact tip that is brought into contact with the object to be measured, a moving unit moves the holding portion, and a position measuring instrument measures a position of the holding portion.Type: GrantFiled: September 2, 2010Date of Patent: July 2, 2013Assignee: Canon Kabushiki KaishaInventor: Ryusuke Nakajima
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Patent number: 8477308Abstract: An apparatus and method for use on precision refractive index experiments that are performed on individual faces of single crystals or liquid surfaces of material using specific wavelengths of light. The process is used to measure the major and minor axes of the optical indicatrix of a single crystal of material at a very specific wavelength. This process is repeated for each crystal face in order to form a complete picture of the refractive index for the sample.Type: GrantFiled: November 9, 2009Date of Patent: July 2, 2013Assignee: The United States of America as Represented by the Secretary of the NavyInventor: James Joseph Haycraft
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Patent number: 8467058Abstract: A lens testing device includes a light source assembly, a pattern plate, and an imaging sensor. The light source assembly includes a transparent base plate, a light guide plate, and a number of illuminants. The light source assembly uses the light guide plate to uniformize a light come from the illuminants and emit the light onto the pattern plate. The imaging sensor is placed beneath the transparent base plate to sense the light passing through the pattern plate and focused by a lens.Type: GrantFiled: June 2, 2010Date of Patent: June 18, 2013Assignee: Hon Hai Precision Industry Co., Ltd.Inventor: I-Thun Lin
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Patent number: 8467052Abstract: System and method for determining the presence of a contaminant in a sample using Raman spectroscopic data. The sample may be food or feed and the contaminant may be melamine. The sample is illuminated with substantially monochromatic light to produce Raman scattered photons. The Raman scattered photons are collected to generate Raman spectroscopic data. The Raman spectroscopic data may comprise at least one of a Raman spectrum and a spatially accurate wavelength resolved Raman image. The Raman spectroscopic data is analyzed to determine the presence or absence of a contaminant in a sample. The concentration of the contaminant in the sample can also be determined by using a ratio algorithm.Type: GrantFiled: November 6, 2009Date of Patent: June 18, 2013Assignee: The United States of America as represented by the Secretary of AgricultureInventors: Kuanglin Chao, Moon S. Kim, Alan M. Lefcourt, David Tuschel, Oksana Olkhovyk, Yongliang Liu
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Patent number: 8456632Abstract: A method and apparatus for analysing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating beam and a sample to be observed, by characterising the distribution of the state of polarization of light across a measurement plane, the method comprising the steps of generating a beam of illuminating light; controlling the state of polarization at different positions across the beam width of the light beam; focussing said illuminating light beam to a focus, wherein said focus is a tight focus and said focused light has a suitable three-dimensional vectorial structure at the focus; detecting and measuring the state of polarization of the reflected light at different positions across the width of the measurement plane to retrieve information on the three-dimensional vectorial electromagnetic interaction of the illuminated focused field and the sample.Type: GrantFiled: April 28, 2008Date of Patent: June 4, 2013Inventors: John Christopher Dainty, Oscar Gabriel Rodriguez, David Lara Saucedo
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Patent number: 8446574Abstract: The velocity calculating device includes a semiconductor laser for emitting a laser beam at a web that is the subject to be measured; a photodiode for converting into an electric signal the optical power of the semiconductor laser; a lens for focusing and emitting the beam from the semiconductor laser and for focusing the return light from the web and injecting it into the semiconductor laser; a laser driver for driving the semiconductor laser; a current-voltage converting/amplifying portion for converting the output current from the photodiode into a voltage and then amplifying; a filter portion for removing the carrier wave from the output voltage of the current-voltage converting/amplifying portion; a signal extracting portion for counting the number of interference waveforms included in the output voltage of the filter portion; and a calculating portion for calculating the velocity of the web based on the counting result of the signal extracting portion.Type: GrantFiled: November 30, 2010Date of Patent: May 21, 2013Assignee: Azbil CorporationInventor: Tatsuya Ueno
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Patent number: 8441623Abstract: The invention is a method for detecting the diameter of a single crystal grown by the Czochralski method, wherein the diameter of a single crystal is detected by both a camera and a load cell, the diameter detected by the camera is corrected based on a difference between the diameter detected by the camera and the diameter calculated by the load cell and a correction coefficient ? obtained in advance according to a growth rate of the single crystal, and a value obtained by the correction is set as the diameter of the single crystal, and a single crystal pulling apparatus including both a camera and a load cell for detecting the diameter of a single crystal to be pulled upwardly. As a result, it is possible to improve the measurement accuracy of the diameter of a large-diameter, heavy crystal and achieve the enhancement of yields and a reduction in variations in quality.Type: GrantFiled: July 30, 2008Date of Patent: May 14, 2013Assignee: Shin-Etsu Handotai Co., Ltd.Inventors: Takahiro Yanagimachi, Susumu Sonokawa
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Patent number: 8441641Abstract: The present disclosure is directed to a method for producing color spectral data of an article illuminated with lights emitted from one or more light emitting units, such as light emitting diodes (LEDs). The method is useful for obtaining accurate color spectral data of the article and for matching the color data produced from another color measuring instrument. The method is particularly useful for obtaining color spectral data using light emitting diodes as light source for color measurement. This disclosure is also directed to a color measuring system using the method disclosed therein.Type: GrantFiled: April 21, 2011Date of Patent: May 14, 2013Inventors: Larry Eugene Steenhoek, Arun Prakash
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Patent number: 8441630Abstract: System and method are disclosed for in-situ monitoring of a specimen while undergoing a defined process. The system includes a processing system adapted to perform the defined process on the specimen, and a coherent anti-Stokes Raman scattering (CARS) microscopy system adapted to in-situ monitor the specimen. In another aspect, the CARS microscopy system is adapted to in-situ monitor the specimen simultaneous with the defined process being performed on the specimen by the processing system. In still another aspect, the CARS microscopy system is adapted to perform a measurement of the specimen while the defined process being performed on the specimen is paused or temporarily halted.Type: GrantFiled: May 11, 2010Date of Patent: May 14, 2013Assignee: Newport CorporationInventors: Tommaso Baldacchini, Ruben Zadoyan
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Patent number: 8436988Abstract: A clinical laboratory testing apparatus comprises a microchip for holding a sample liquid; a rotation body for rotating the microchip; a rotation drive mechanism; a lock mechanism for locking the microchip on the rotation body; a measurement room that holds the microchip and the rotation body; a protection cover; a light source that irradiates the measuring cell of the microchip; and a light receiving unit, wherein a centrifugal separation processing of a specimen in the sample liquid is performed in the microchip.Type: GrantFiled: August 31, 2010Date of Patent: May 7, 2013Assignee: Ushio Denki Kabushiki KaishaInventor: Yoshimasa Ogawa