Abstract: Disclosed herein are systems for monitoring and protecting an electric power system using a plurality of conductor-mounted detectors (CMDs). In one embodiment, a plurality of CMDs are coupled to an electrical conductor. Each CMD may harvest power from the electrical conductor and may monitor electrical current in the conductor. When the electrical current in the conductor exceeds a fault current threshold a fault signal may be transmitted. A receiver in communication with each of the plurality of CMDs may receive the fault signal from at least one of the plurality of CMDs. A protective action may be generated and implemented to clear the fault. A portion of the electric power system affected by the fault may be determined based on identification of each of the plurality of CMDs to transmit the fault signal.

Abstract: A workpiece evaluating method evaluates the gettering property of a device wafer having a plurality of devices formed on the front side of the wafer and having a gettering layer formed inside the wafer. The method includes the steps of applying excitation light for exciting a carrier to the wafer, applying microwaves to a light applied area where the excitation light is applied and also to an area other than the light applied area, measuring the intensity of the microwaves reflected from the light applied area and from the area other than the light applied area, subtracting the intensity of the microwaves reflected from the area other than the light applied area from the intensity of the microwaves reflected from the light applied area to thereby obtain a differential signal, and determining the gettering property of the gettering layer according to the intensity of the differential signal obtained above.

Abstract: A system for measuring or characterizing a multi-element antenna having at least two antenna elements comprises a vector network analyzer with at least two input/output ports. Each input/output port of the vector network analyzer is connected to one antenna element of the multi-element antenna. The vector network analyzer has generator means for generating waves at each of its input/output ports, which are coherent to each other.

Abstract: Provided is a current detecting device comprising a current detecting resistor including a pair of electrodes and a resistive element; a pair of lands on which the current detecting resistor is adapted to be mounted; connection portions adapted to connect the two electrodes and the two lands, respectively; and a pair of wires connected to the two respective electrodes and adapted to detect a voltage. Positions where the two wires are connected to the two respective electrodes are located in regions on a further inner side than inner ends of the connection portions.

Abstract: A circuit arrangement for detecting a solenoid valve type in vehicles, including at least one solenoid valve in the circuit arrangement for detecting the solenoid valve type and having at least one coil winding having a resistance of the typical order of magnitude for a predetermined vehicle electrical distribution system supply voltage, a constant current source, arranged to impress a predetermined measurement current into the one coil winding of the solenoid valve, a current mirror circuit, arranged to generate a second voltage on a detection section of the circuit arrangement from a first voltage produced as a result of the impressed measurement current on the at least one coil winding of the at least one solenoid valve, in which the second voltage produced on the detection section is passed out, on the detection section, directly to a microcontroller in a control device for determining the type of solenoid valve.

Abstract: Example embodiments associated with characterizing a sample using NMR fingerprinting are described. One example NMR apparatus includes an NMR logic that repetitively and variably samples a (k, t, E) space associated with an object to acquire a set of NMR signals that are associated with different points in the (k, t, E) space. Sampling is performed with t and/or E varying in a non-constant way. The NMR apparatus may also include a signal logic that produces an NMR signal evolution from the NMR signals and a characterization logic that characterizes a tissue in the object as a result of comparing acquired signals to reference signals. Example embodiments facilitate distinguishing diseased tissue from healthy tissue based on tissue component fractions identified using the NMR fingerprinting.

Abstract: A tester interface unit comprising a test hardware module. The test hardware module may have a simple construction, relying on control and/or signal processing in one or more tester instruments to generate or analyze test signals for a device under test. The test hardware module may be disposed within the tester interface unit, providing a short and high integrity signal path length to the device under test. The tester interface unit may include a purge gas chamber and a cooling chamber, with the hardware module penetrate a separator between those chambers, sealing an opening between the purge gas chamber and the cooling chamber. A heat spreader may move heat generated on the portion of the test hardware module in the purge gas chamber to the cooling chamber.

Abstract: A system and method for geophysical data collection, for use with resistivity and induced polarization. The system and method include the use of a single voltage reference wire to which all voltage recorders or nodes are connected by means of a piercing wire connector, the voltage recorders providing a measurement of the potential voltage between the reference wire and the ground and allowing for calculation of relative voltage potentials between adjacent recorders.

Abstract: A method for calibrating a current sensor which is configured to determine, in a vehicle's onboard power system, an electric operating current which flows through a measuring resistor, based on comparison of a voltage drop at the measuring resistor caused by the operating current and based on a rule which is dependent on the measuring resistor, including: determining an operating voltage drop brought about at the measuring resistor by the operating current; impressing a known electric calibration current into the measuring resistor, detecting an overall voltage drop brought about at the measuring resistor by the calibration current and the operating current, filtering the operating voltage drop from the overall voltage drop, such that a calibration voltage drop which is brought about by the calibration current remains, and calibrating the rule, dependent on the measuring resistor, based on the comparison of the calibration current and the calibration voltage drop.

Abstract: Electrical current transducer (2) of a closed-loop type for measuring a primary current (IP) flowing in a primary conductor (1), comprising a fluxgate measuring head (7) and an electronic circuit (16) including a microprocessor (18) for digital signal processing. The measuring head includes a secondary coil (6) and a fluxgate detector (4) comprising an excitation coil and a magnetic material core. The electronic circuit comprises an excitation coil drive circuit (14) configured to generate an alternating excitation voltage to supply the excitation coil with an alternating excitation current (Ifx), the secondary coil (6) connected in a feedback loop (12) of the electronic circuit to the excitation coil drive circuit (14), the electronic circuit further comprising a ripple compensation circuit (26, 28) configured to compensate for a ripple signal generated by the alternating excitation voltage.

Abstract: A gate driver is described that includes a gate signal module configured to output a gate signal of the gate driver for driving a gate terminal of a semiconductor device. The gate driver further includes a test module configured to generate a simulated failure condition at a semiconductor device during a test of a monitoring and protection feature of the gate driver. The gate drier further includes a monitor module configured to output an indication of the simulated failure condition in response to detecting the simulated failure condition at the semiconductor device.

Abstract: The present invention relates to a method for monitoring at least one electronic switching contact for a door system for a vehicle, wherein the switching contact has a first connection for a first electrical line and a second connection for a second electrical line. The method comprises a step of reading a first signal from a first monitoring point connected to the first connection in order to obtain a first monitoring signal, a step of reading a second signal from a second monitoring point connected to the second connection in order to obtain a second monitoring signal, and a step of combining the first monitoring signal and the second monitoring signal in order to determine at least one state of the at least one switching contact.

Abstract: An abnormality detection device includes: a coupling-capacitor having a first-end and a second-end coupled with a high-voltage circuit; a signal output unit; a signal extraction unit; and a signal input unit. The signal output unit is coupled with the first-end of the coupling-capacitor via a detection-resistor, and outputs an alternating-current inspection-signal. The signal extraction unit extracts the inspection-signal, as an extraction-signal, output between the detection-resistor and the coupling-capacitor. The signal input unit detects abnormality of insulation resistance of the high-voltage circuit based on a level of the inputted extraction-signal. The signal extraction unit includes a signal removing filter and a subtraction circuit. The filter removes a signal equal in frequency to the inspection-signal and passes low-frequency noises lower in frequency than the inspection-signal.

Abstract: A method for measuring a line resistance RL (7) and determining control line (16) faults in a hazard warning and control system. The control lines (16) connect a control device (20) to an actuator (10) using an actuation voltage UA in the case of an event and supplies the actuator (10) with a monitoring voltage UM in the case of a monitoring process using a monitoring module (21). Furthermore, the control device (20) has a constant current sink (6), which can be activated by a microcontroller (1), and a switchover device (5). In order to determine the line resistance RL (7), a constant voltage supply is provided in a measurement time interval ?tM by an energy store (9) integrated into the monitoring module (21) and is fed back to the control device (20), and the switchover device (5) deactivates the monitoring voltage UM supply from the control device (20) to the actuator (10) during the entire measurement time interval ?tM.

Abstract: A test assembly adapted to test a semiconductor device is provided. The test assembly includes a main circuit board, a space transformer, an intermediary supporting element, an adhesive element, a plurality of electrical connection elements and a plurality of test probes. The space transformer is disposed on the main circuit board and has a first surface and a second surface opposite to the first surface. The first surface faces the main circuit board. The intermediary supporting element is disposed between the main circuit board and the first surface. The adhesive element is disposed between the intermediary supporting element and the first surface. The space transformer is attached to the intermediary supporting element through the adhesive element. The electrical connection elements are disposed between the main circuit board and the first surface.

Abstract: A test structure includes a dedicated addressing circuit that allows large numbers of test devices to be tested simultaneously and the measurement signals read out serially for different test devices. The test structure may be configured for wafer, die or package-level testing. The test structure may be integrated on a common die with the test devices in a single package, provided on separate die in a common package, separately packaged chips or in the form of a collection of standard die configured as the test structure. If on separate die, the test and addressing circuitry is fabricated from a more mature fabrication process than that being characterized for the devices under test. The processes being characterized may be unqualified whereas the test circuitry may be fabricated with different and more mature or qualified processes.

Abstract: A probe unit according to the present invention is suitable for allowing a large current to flow. In the probe unit that accommodates a plurality of contact probes for electrically connecting an inspection target object and a signal processing device used to output an inspection signal, both ends of a large current probe (3) are electrically connected to electrodes of a contact target object, and a large current is made to flow via a metal block (50) that comes into contact with both end portions of the large current probe (3).

Abstract: A proximity detector circuit that receives a single-ended sensor signal includes (a) an adaptive level control circuit maintaining the single-ended sensor signal within a predetermined voltage range relative a common mode reference signal; and (b) a programmable gain amplifier receiving the single-ended sensor signal and the common mode reference signal as a differential input signal, and providing an output signal derived from amplifying the differential input signal.

Abstract: A probe device of a vertical probe card is provided and includes a die assembly and at least one pin assembly. The die assembly includes a first die, a second die, and a middle die disposed between the first die and the second die. The at least one pin assembly has a first pin, a second pin, and at least one electrical connector. The at least one electrical connector is connected to the first pin and the second pin. The at least one pin assembly is electrically contacted with at least one contact pad of a device under test. The at least one contact pad leans against the at least one pin assembly, so that the at least one pin assembly generates a deformation in a longitudinal direction.

Abstract: A position sensor connected to first and second electric signal sources to output a first electric signal with a first frequency and a second electric signal with a second frequency. The position sensor includes: a primary coil generating a magnetic alternating field with the first frequency; a first and a second secondary coil, the first and second secondary coils each magnetically coupled to the primary coil by the position transmitter, and third and fourth electric signals induced in the first and second secondary coils respectively by the generated magnetic alternating field; a frequency converter converts the third and fourth electric signals into respective first and second intermediate frequency signals, the frequency converter connectable to the second electric signal source. A Goertzel filter bank demodulates the first intermediate frequency signal to obtain a first demodulated signal and demodulates the second intermediate frequency signal to obtain a second demodulated signal.