Patents Examined by Temilade Rhodes-Vivour
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Patent number: 10054631Abstract: An electrical arc detector for a series electrical connection as may be associated with an electric meter may comprise: an arc detector housing; a source of electrical power; a de-tuned resonant tank circuit configured to receive a magnetic field and/or an electric field generated by an electrical arc at a series electrical connection; an electrical detector for detecting signals generated in the de-tuned resonant tank circuit responsive to the magnetic field and/or the electric field generated by an electrical arc; and an output device responsive to the electrical detector and configured to provide a human perceivable indication of detection of an electrical arc at the series electrical connection.Type: GrantFiled: February 2, 2016Date of Patent: August 21, 2018Assignee: Advent Design CorporationInventors: Thomas Alan Lawton, Ralph Nicolas Amato, Richard Hughes Hewitt
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Patent number: 10048094Abstract: An encoder includes an encoder circuit including first and second switches, a first resistor connected in series to the first switch, and a second resistor connected in series to the second switch, the encoder circuit defined by the first switch and the first resistor and the second switch and the second resistor being connected between a power supply voltage and a ground, and a control circuit connected between the first and second resistors and the power supply voltage to turn off power supply from the power supply voltage to the first resistor when the first switch is closed and to turn off power supply from the power supply voltage to the second resistor when the second switch is closed. The control circuit is connected to a first connection point between the first resistor and the first switch and to a second connection point between the second resistor and the second switch.Type: GrantFiled: October 17, 2017Date of Patent: August 14, 2018Assignee: Murata Manufacturing Co., Ltd.Inventor: Akihiro Kitamura
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Patent number: 10048326Abstract: An electronic device equipped with a magnetic sensor which detects a magnetic field around the electronic device, a connector connection section to connect to a magnetic connector including a magnet which is positioned on one end side of a connection cable, and a CPU, in which the CPU controls to stop a measuring operation in the magnetic sensor when judged that the connector connection section is connected to the magnetic connector.Type: GrantFiled: January 28, 2016Date of Patent: August 14, 2018Assignee: CASIO COMPUTER CO., LTD.Inventor: Keiichi Nomura
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Patent number: 10024899Abstract: A method for detecting the presence of an energized e-field in a space, wherein the space includes at least one electrically conductive element disposed in the space and coupled with a controller, the method including receiving in the controller a signal from the at least one electrically conductive element, determining that an energized e-field occupies the space, and sending a signal from the controller indicative of the presence of the energized e-field in the space.Type: GrantFiled: February 28, 2017Date of Patent: July 17, 2018Assignee: Whirlpool CorporationInventors: Mark L. Herman, Garry L. Peterman, Daniel M. Putnam
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Patent number: 10024901Abstract: A testing method for a micro electro-mechanical system is described, comprising the steps of: i) feeding a system to be tested on a first tray; ii) collecting the system from the first tray; and iii) verifying correct operation of the system collected from the first tray; the method further comprises step iv) of acquiring at least one parameter associated with the presence or otherwise of the system on the first tray; and/or with the fact that the system matches or otherwise a correct identification code; and/or with correct or incorrect orientation and/or position of the system on the first tray; step iv) being performed prior to step ii).Type: GrantFiled: March 30, 2016Date of Patent: July 17, 2018Assignee: OSAI A.S. S.P.A.Inventors: Marco Guolo, Carlo Ferrero
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Patent number: 10018653Abstract: An electrical Kelvin contact assembly for testing IC testing apparatus that uses an assembly design that reduces the tolerance to a near negligible range. The assembly does not use any screws, dowel pins, adhesives or welding to fasten the electrical contacts to the housing. The design of the assembly uses rows of contacts with specially designed protrusions that sit snugly in openings located on three plate-like layers. These layers contain the contacts in the horizontal plane by securing the protrusions in the opening, as well as in the vertical plane by means of a sandwich between three separate layers. A second contact is slid into back slits formed by the three layers.Type: GrantFiled: February 2, 2017Date of Patent: July 10, 2018Assignee: JF MICROTECHNOLOGY SDN. BHD.Inventors: Wei Kuong Foong, Kok Sing Goh, Shamal Mundiyath, Eng Kiat Lee
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Patent number: 10012714Abstract: A method and device for establishing a protocol relating to a measurement sequence for controlling a magnetic resonance tomography system, the measurement sequence is segmented into various groups of partial modules that are similar to one another. A partial module that potentially generates the greatest physiological exposure for a patient is identified. Furthermore, a test is carried out by means of a model function to determine whether physiological limiting values are being observed in the measurement sequence for the partial module. If the physiological limiting values are not being observed, parameters influencing the measurement sequence are modified and the preceding test step is repeated.Type: GrantFiled: April 7, 2015Date of Patent: July 3, 2018Assignee: Siemens AktiengesellschaftInventors: Thorsten Feiweier, Peter Speier
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Patent number: 10006952Abstract: A method of eliminating spurs in measurements of an electrical response of a device under test (OUT) obtained uses a measurement instrument including a mixer and a receiver. The measurement instrument is configured to generate, via the mixer, an intermediate frequency (IF) signal for use by the receiver from a radio frequency (RF) signal and a local oscillator (LO) signal. Input is received from a user at the measurement instrument and includes start frequency and end frequency. Parameters for a frequency sweep are generated based on the input. A measurement for each frequency of the frequency sweep is calculated using averaging of a plurality of samples obtained at that frequency. Frequencies are identified within the frequency sweep at which spurs will occur due to the measurement instrument. The parameters for a frequency of the frequency sweep at which a spur will occur are modified so that a null for a measurement at the frequency falls on the spur.Type: GrantFiled: January 26, 2017Date of Patent: June 26, 2018Assignee: ANRITSU COMPANYInventor: Donald Anthony Bradley
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Patent number: 10001360Abstract: A shape measurement device and a shape measurement method according to the present invention measure, for first and second distance measurement units which are disposed so as to be opposed to each other with a measurement object to be measured interposed therebetween and each measure a distance to the measurement object, first and second displacements of the first and second distance measurement units in an opposition direction, and obtain, as a shape of the measurement object, a thickness of the measurement object in the opposition direction, the thickness being corrected with the measured first and second displacements, based on first and second distance measurement results measured by the first and second distance measurement units, respectively.Type: GrantFiled: July 31, 2015Date of Patent: June 19, 2018Assignees: Kobe Steel, Ltd., KOBELCO RESEARCH INSTITUTE, INC.Inventors: Masato Kannaka, Kazuhiko Tahara, Hideki Matsuoka, Noritaka Morioka, Hidetoshi Tsunaki
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Patent number: 9995783Abstract: A method and apparatus for extracting the contents of voids and/or pores present in a semiconductor device to obtain information indicative of the nature of the voids and/or pores, e.g. to assist with metrology measurements. The method includes heating the semiconductor wafer to expel the contents of the voids and/or pores, collecting the expelled material in a collector, and measuring a consequential change in mass of the semiconductor wafer and/or the collector, to extract information indicative of the nature of the voids. This information may include information relating to the distribution of the voids and/or pores, and/or the sizes of the voids and/or pores, and/or the chemical contents of the voids and/or pores. The collector may include a condenser having a temperature-controlled surface (e.g. in thermal communication with a refrigeration unit) for condensing the expelled material.Type: GrantFiled: June 28, 2016Date of Patent: June 12, 2018Assignee: METRYX LIMITEDInventor: Adrian Kiermasz
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Patent number: 9989666Abstract: A method for determining at least one electrical property of an earth formation includes emitting an electromagnetic signal into the earth formation from an antenna and measuring an electromagnetic signal from the earth formation. The antenna is a broadband log antenna mounted on a substrate having at least a high dielectric permittivity, defined as a dielectric permittivity of about ?=100 to ?=1000 or a gigantic dielectric permittivity, defined as a dielectric permittivity of about ?=1000 or greater. The antenna has a radius between about 2.5 millimeters (mm) and 10 centimeters (cm). The method further includes determining at least one electrical property of one or more of a borehole, a borehole fluid, and the earth formation based on measuring the electromagnetic signal.Type: GrantFiled: April 2, 2014Date of Patent: June 5, 2018Assignee: BAKER HUGHES, A GE COMPANY, LLCInventors: Sergey A. Terentev, Yuliy Dashevsky
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Patent number: 9989564Abstract: A circuit including over-current protection includes a voltage input, first and second switching transistors that are complementarily switched and that receive current from the voltage input, a first resistor, a first diode including a first anode and a first cathode, and a second diode including a second anode and a second cathode. The first anode and the second anode are connected to each other and are connected to the voltage input via the first resistor. The first cathode is connected to the first switching transistor and the second cathode is connected to the second switching transistor such that the connection of the first and second anodes provides an over-current signal that is related to the current in the first and second switching transistors.Type: GrantFiled: October 9, 2013Date of Patent: June 5, 2018Assignee: MURATA MANUFACTURING CO., LTD.Inventors: Atul Abhyankar, Peter Cheung
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Patent number: 9970960Abstract: A probe having a sliding rail is provided and includes a probe head, a probe tail, an elastic element made of an elastic material and connected between the probe head and the probe tail, and a sliding rail assembly. The sliding rail assembly includes a slide rail and a position limit protrusion. The slide rail has a fixed end and a free end. The fixed end is fixedly connected to the probe tail, and the free end extends to the probe head. The position limit protrusion is fixedly connected to the probe head, and has a sliding slot formed thereon through which the slide rail can pass. The sliding rail assembly is made of a conductive material, and a cross-section area of the slide rail is greater than a cross-section area of the elastic material of the elastic element.Type: GrantFiled: February 23, 2017Date of Patent: May 15, 2018Assignee: CHUNGHWA PRECISION TEST TECH. CO., LTD.Inventor: Chih-Peng Hsieh
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Patent number: 9964580Abstract: A solid state impedance tuner or impedance tuner system including a housing structure and at least two solid state tuner modules electrically combined and disposed in one package within the housing structure. Each tuner module includes at least one solid state control element. Another embodiment is directed to an impedance tuner module card configured in a standardized system architecture. The card includes a chassis board, and at least one solid state tuner module integrated on the card and supported on or by the chassis board, each module including at least one solid state control element. Methods for calibrating a solid state impedance tuner that includes at least two solid state tuner modules combined in one package are disclosed.Type: GrantFiled: May 15, 2017Date of Patent: May 8, 2018Assignee: Maury Microwave, Inc.Inventors: Ali Boudiaf, Roman Meierer, Gary R. Simpson
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Patent number: 9934639Abstract: A method and apparatus for using a magnetic element to detect the presence of foreign materials, or anomalies, embedded in an object including placing magnetic field viewing film over an object such as a coin and passing the magnetic element over the object in prescribed patterns. The object to be tested for an anomaly may be covered or encased in magnetic paper. The presence of a foreign material in the object will be detected by the film when a magnetic element passes by the anomaly. An anomaly, such as of tungsten hidden in a gold coin or nugget, is detected by the film due to the disruption of the magnetic field of the anomaly. The film will present a dark spot adjacent to the location of the hidden anomaly.Type: GrantFiled: January 19, 2016Date of Patent: April 3, 2018Inventor: Esker Coffey
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Patent number: 9916710Abstract: A coin-shaped detection object discriminating device may be used with a detection object in a coin shape, and the coin-shaped detection object discriminating device may include a passage through which the detection object is passed; a permanent magnet; and a magnetic sensor disposed opposite to the permanent magnet across the passage.Type: GrantFiled: April 7, 2014Date of Patent: March 13, 2018Assignee: NIDEC SANKYO CORPORATIONInventor: Shogo Momose
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Patent number: 9915710Abstract: A magnetic sensor is provided in which in a case where magnetization amounts of the first ferromagnetic layer and the second ferromagnetic layer in the first magnetic sensor element are respectively set to be Mst11 and Mst12 and magnetization amounts of the first ferromagnetic layer and the second ferromagnetic layer in the second magnetic sensor element are respectively set to be Mst21 and Mst22, in a case of Mst11>Mst12, a relationship of Mst21>Mst22 is satisfied, and in a case of Mst11<Mst12, a relationship of Mst21<Mst22 is satisfied.Type: GrantFiled: April 1, 2016Date of Patent: March 13, 2018Assignee: ALPS ELECTRIC CO., LTD.Inventors: Fumihito Koike, Hirofumi Okumura, Eiji Shinohara, Kazuhiro Shigeta, Taku Saito
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Patent number: 9910183Abstract: A tripod, a vertical coil and a total-field magnetometer are utilized to measure a geomagnetic field T0 without an additional magnetic field imposed, as well as two composite magnetic field values T?1 and T?2 when the geomagnetic field is added with a vertical upward magnetic field Tf and a double vertical upward magnetic field 2Tf, respectively. Calculate a vertical component Z, a horizontal component H and a geomagnetic inclination I of the geomagnetic field. Set up a horizontal coil such that a geometric center of the horizontal coil coincides with a geometric center of the vertical coil. Use the total-field magnetometer to measure two composite magnetic field values T+? and T?? after the geomagnetic field has been added with a horizontal forward magnetic field and a horizontal reverse magnetic field, respectively. Calculate a geomagnetic declination D.Type: GrantFiled: June 9, 2014Date of Patent: March 6, 2018Assignee: CHINA METALLURGICAL GEOLOGY BUREAU GEOLOGICAL EXPLORATION INSTITUTE OF SHANDONG ZHENGYUANInventor: Jiandong Gao
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Patent number: 9897656Abstract: A method for sensing a welded relay contact when breaking both sides of a power line on a HVAC device including the steps: applying a first signal to one of a pair of switching devices; electronically sensing a second signal, with a sensing device, whether the other of said two switching devices is welded closed; and sending a third signal from the sensing device indicative of whether the other of said two switching devices is welded closed.Type: GrantFiled: April 30, 2014Date of Patent: February 20, 2018Assignee: Carrier CorporationInventors: Jeffrey P Lothamer, Daniel L Kelly
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Patent number: 9897512Abstract: Embodiments of methods of non-destructively testing whether a laminated substrate satisfies structural requirements are disclosed herein. Additionally, laminated substrates that can be non-destructively tested are also disclosed along with methods of manufacturing the same. To non-destructively test whether the laminated substrates satisfies the structural requirement, an electrical characteristic of the laminated substrate may be detected. Since the detected electrical characteristic is related to a structural characteristic being tested, whether the structural characteristic complies with the structural requirement can be determined based on the electrical characteristic.Type: GrantFiled: April 16, 2012Date of Patent: February 20, 2018Assignee: Qorvo US, Inc.Inventors: Thomas Scott Morris, David C. Dening, Chris Botzis