Abstract: An integrated circuit probe station comprises a table having a substantially planar upper surface, an IC probe positioned over the table in spaced relationship with the upper surface of the table, a chuck carrier, and a chuck. The chuck carrier has a substantially planar lower surface that is positioned in confronting relationship with the upper surface of the table, and a film of viscous material is interposed between the upper surface of the table and the lower surface of the chuck carrier, whereby the chuck carrier may be moved manually relative to the table in horizontal directions while resting on the table. The chuck is carried on the chuck carrier and is movable vertically relative to the chuck carrier. A mechanical prime mover is effective between the chuck carrier and the chuck for bringing about vertical movement of the chuck relative to the chuck carrier.

Abstract: A scanning microscope scans over the surface of a specimen to be tested in point-by-point fashion with a probe. The scan rate of the probe is controlled as dependent on a secondary electrical signal derived from the measuring point of the specimen surface and, thus, serves as a control signal to the output signal of a signal processing unit which is evaluated at a window discriminator or comparator. The output signal is supplied to a voltage controlled oscillator of the scan generator through an adjustable timer element. Simultaneously, the evaluated output signal is used for modulating the intensity of the write beam of a display means for controlling the intensity of the probe.

Abstract: An electronic demand register includes a microprocessor including a program clock for performing timekeeping functions for the register. A power supply connected across the AC voltage source provides power to the microprocessor through a voltage regulator. The program clock is maintained by the line frequency of the AC source. Electronic circuits are provided for calibrating the program clock to be compatible with either a 50 Hz or a 60 Hz line frequency. A detection signal corresponding to the line frequency is generated by a line frequency detector circuit in the power supply. A reference signal is generated by a quartz crystal clock. A frequency comparator circuit includes a microprocessor program that measures the time period between detection signal pulses. This time period is compared to the known period of a 50 Hz or a 60 Hz signal and respective counters are incremented accordingly.

Abstract: An improved burn-in board cartridge for use in burn-in and testing of IC packages in an automated burn-in and test system is disclosed. The cartridge includes printed circuit cards mounted on a single or both side faces of the cartridge, thereby permitting IC packages to be mounted on either or both sides of the cartridge. The cartridge includes a sturdy frame holding in place the printed circuit cards and providing strength to reduce damage to the circuit cards. Attached to the frame are rails which are used to position the cartridge in various apparatus such as burn-in chambers. Cooling tubes and electrical components can be placed inside the two-sided cartridge, between the printed circuit cards. The burn-in chamber is divided into zones with each zone having a number of slots into which a burn-in board is placed. The chamber includes rotating air diverters positioned at each end of a zone which are capable of channeling the heated air within the chamber around any one zone.

Abstract: In a digital oscilloscope, the recording of transients exceeding a predetermined tolerance range is to be provided by simple means. A method and a device for carrying out this method are provided in which two envelope curves are stored in an envelope curve memory and these are then compared with cyclically repetitive amplitude samples of a signal curve. A trigger signal ensures that the signal curve containing the disturbance is served if one of the signal curves exceeds the tolerance range delimited by the envelope curves, which is the case, in particular, when interference signals occur. This curve can then be displayed for analysis on the screen. The invention can be applied within the context of digital measuring technology wherever signal curves are recorded and instantaneous disturbances must be detected.

Abstract: A current-measuring device in accordance with the invention comprises an annular magnetic circuit having separate first and second magnetic circuit portions (1, 2) with ends suitable for coming face-to-face to form a closed magnetic circuit, a housing (5) surrounding at least the first portion (1) of the magnetic circuit the first portion being slidably mounted within the housing, magnetic flux detection means (12) for detecting a magnetic flux in the magnetic circuit; the housing includes a bearing member against which the second portion of magnetic is firmly held when slided with the first portion from a position where the second portion does not face the bearing member to a position where the second portion faces the bearing member.

Abstract: A flex dot wafer probe having utility as an electrical interface between semiconductor wafers and electronic test systems for determining the electrical integrity and performance of integrated circuits. The wafer probe comprises a wafer probe head having a preformed resilient, bendable, formable film mounted on a support member for flexible movement. The wafer probe head is integrated with a probe board which interfaces with an external test system. Wafer contact pads and protrusions are formed on the film in "mirror-image" patterns corresponding to the contact elements of the integrated circuits and interface contact pads of the probe board, respectively. Coplanar line conductors, formed to control the characteristic impedance of the wafer probe head, provide electrical continuity between the wafer contact pads and the protrusions.

Abstract: An adapter for a printed circuit board testing device, by means of which the test contacts located on the grid can be connected to test points of a printed circuit board to be tested that are located on and/or off grid means of test pins that are received in guide holes in the adapter and each have a pointed contacting section that is directed towards the respective contact point of the printed circuit board and projects from the adapter and an adjacent guidance section that is guided in the associated guide hole of the adapter, is to be designed so that even test pieces in which the test points are relatively close together and/or with large displacements from the grid can be tested. This is done by reducing the cross-section of the guidance section conically or in steps towards the contacting section, and that the cross-section of the guide bores is correspondingly reduced.

Abstract: A signal processing device having a level adapter circuit, in particular a broad band oscilloscope, having an operational amplifier with an amplification factor determined by the ratio of a first resistor between the signal input and the inverting input of the operational amplifier--the virtual ground--and a second resistor between the inverting input of the operational amplifier and the signal output, in which the resistors may optionally be complex, in which at least one parallel resistor is provided for the first resistor, the first terminal of which is firmly connected to the signal input or a connecting point of a plurality of partial resistors forming the first resistor, and the second terminal of which can be switched over between the inverting input of the operational amplifier, which input forms the virtual ground, and the real reference potential for the amplifier input.

Abstract: A test pin for an adapter for connecting test contacts of a printed circuit board testing device that are located on a grid with test points of a test-piece such as a printed circuit board located on and/or off the grid, wherein in order to connect associated test contacts and test points the test pin can be inserted into guide holes at different inclinations in the adapter and has a pointed contact section that is directed towards the respective contact point of the circuit board and projects from the adapter and an adjacent guidance section that is guided in the associated guide hole of the adapter, is designed so that test-pieces with their test points only a relatively short distance apart can be tested. This is achieved by reducing the cross-section of the guidance section conically or stepwise towards the contact section.

Abstract: An AC electric energy meter is coupled to a source of AC electrical energy and to an AC load. A sensing circuit senses the amount of AC electric energy consumed by the AC electric load. An AC electric energy measuring circuit generates a pulse signal representative of the amount of AC electric energy consumed by the AC electric load. A switching circuit receives the pulse signal from the AC electrical energy measuring circuit and controls current flow from the AC electrical energy source to a stepper motor to drive an output shaft of the stepper motor in a unidirectional manner based on the pulse signal. A register is coupled to the output shaft of the stepper motor for registering the amount of electrical energy consumed by the AC electric load based on the amount of rotation of the output shaft of the stepper motor.

Abstract: The invention is concerned with a current-transformer arrangement for a static electricity meter, including a primary conductor carrying the alternating current to be measured and a secondary winding consisting of at least two coils connected in series, the output voltage from which is passed to an electronic integrating stage to produce a measuring signal independent of frequency.

Abstract: An electronic device testing system of the type in which a test head is mounted for pivotal movement about three orthogonal axes. A cable is introduced to the test head along an axis peripendicular to the horizontal axis extending through the means by which the test head is mounted for pivotal movement about the horizontal axis. The system also has a cable support attached at one end to the test head cabinet containing part of the electronics. The cable, extending between the test cabinet and the test head, is supported by the cable support. The cable support is arranged to adjust to changes in the spacing of its end and the orientation of its axis caused by changes in the position or orientation of the test head.

Abstract: A device and process for programmatically controlled in-circuit pin checks and gross functionality tests of digital to analog converters. The tests provide deterministic bit checks for higher order bits and non-deterministic or "delta" bit checks of low order bits independent of other circuitry on the printed circuit board of which the digital to analog converter is a component.

Abstract: A mutual inductance differential current transducer employs a toroidal coil mounted coaxially and generally centrally of the length of an alternating current conductor wiht a conductive sheet therebetween surrounding the conductor and of substantially the same length and in insulated relationship from the conductor. The axial length of the coil is less than approximately one-third the length of the conductor, and the toroidal cross-section has a longer leg parallel to the axis of the conductor and a cross-sectional area eliminating the need for external capacitive and magnetic shielding. The coil is wound with an integer number of layers of the same number of turns per layer, the total number of turns being selected to produce a predetermined range of voltage levels of the analog voltage signal output of the coil, produced in response to and representative of the differential current flow through the conductor.

Abstract: A voltage detector detects a voltage developing in a selected area of an object such as an integrated circuit by utilizing an electro-optic material equipped in an optical probe. A change in refractive index of the electro-optic material hwich is caused by the voltage in the object, is detected as a change of polarization of a light beam passing through the electro-optic material. In order to simplify the optical system, the electro-optic material itself has a function to change the light-traveling path. In the first aspect, a surface of light-incidence side is worked into a lens shape. In the second aspect, the electro-optic material has a graded refractive index profile as a result of ion diffusion.

Abstract: A current detecting device for detecting current flowing in a first electric wire arranged close to a second electric wire having a portion extending in a predetermined direction. The device comprises: a portion of the first electric wire extending at right angles to the second electric wire; a magnetic core arranged around the above portion of the first electric wire, the magnetic core having an axis thereof extending at right angles to the above portion of the second electric wire; and a magnetic-to-electric transducer associated with the magnetic core for generating an electric signal indicative of the intensity of a magnetic field generated around the above portion of the first electric wire by current flowing in the first electric wire.

Abstract: A semiconductor integrated circuit device, comprises a semiconductor integrated circuit chip having a plurality of signal wires and a plurality of test terminals connected to said signal wires. The test terminals are concentrated in at least one selected circuit area of the semiconductor integrated circuit chip to permit chip diagnosis using an image mode electron beam detector.

Abstract: A non-contacting electrostatic voltage follower employs a vibrating capacitance detector coupled to a measured surface containing both wideband electrostatic A.C. data and D.C. potentials. A detector amplifier having an inverting input is connected to the detector, while its output is connected to the input of a high bandwidth amplifier. A first feedback path is provided from the output of the high bandwidth amplifier to the non-inverting input of the detector amplifier which provides both a signal which is equal to and follows the wideband electrostatic A.C. potentials on the measured surface, and a signal, at the vibrating capacitance modulation frequency, representative of the D.C. potential of the measured surface. A second feedback path is provided including a demodulator and integrator to monitor the first feedback path to provide a D.C.

Abstract: Apparatus for measuring current over a wide range generates an eight bit accurate, 16-bit dynamic range digital signal from a current transformer secondary. Two signals proportional to the rectified secondary current, one generated by a large burden resistor and the other by an amplifier with programmable gain and an overrange indication, are applied through a multiplexer to an eight bit analog to digital converter which has three selectable reference voltages. A microprocessor selects the input signal, converter reference voltage, and one of four levels of amplifier gain which provide the greatest resolution for the magnitude of the current being measured, and provides an appropriate scale factor, from 2.sup.0 to 2.sup.8, for the eight bit accurate digital signal generated by the analog to digital converter.