Abstract: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

Abstract: A fixture is provided for functional testing of an assembled wireless device. The wireless device has a first port and a second port. The fixture comprises: a base having an opening formed therein for receiving a retainer, the retainer being rotatably mounted in the opening for rotating from a first position to a second position, the retainer for receiving the wireless device while in the first position; a first connector mounted in the retainer for engaging the first port of the wireless device when the wireless device is received by the retainer in the first position; and a second connector rotatably mounted on the base, the second connector for engaging the second port of the wireless device when the retainer is rotated to the second position.

Abstract: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.

Abstract: A fixture for functional testing of an assembled wireless device, the wireless device having a data port and a removable casing concealing a battery cavity having battery contacts, the fixture comprising: a base having an opening formed therein for receiving a retainer, the retainer being rotatably mounted in the opening for rotating from a first position to a second position, the retainer for receiving the wireless device with the removable casing removed while in the first position; a connector mounted in the retainer for engaging the data port of the wireless device when the wireless device is received by the retainer in the first position; and, a battery emulator insert rotatably mounted on the base, the battery emulator insert having power contacts for engaging the battery contacts in the battery cavity of the wireless device when the retainer is rotated to the second position.

Abstract: An RF isolation container that includes a counterweight system to assist an operator with opening and closing operations, an electromagnet locking mechanism for easier and consistent locking of the RF isolation container and a motion damping mechanism to relieve fatigue on operating components and on human operators.

Abstract: A fixture for functional testing of an assembled wireless device, the wireless device having a data port and a removable casing concealing a battery cavity having battery contacts, the fixture comprising: a base having an opening formed therein for receiving a retainer, the retainer being rotatably mounted in the opening for rotating from a first position to a second position, the retainer for receiving the wireless device with the removable casing removed while in the first position; a connector mounted in the retainer for engaging the data port of the wireless device when the wireless device is received by the retainer in the first position; and, a battery emulator insert rotatably mounted on the base, the battery emulator insert having power contacts for engaging the battery contacts in the battery cavity of the wireless device when the retainer is rotated to the second position.

Abstract: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed on the base and having at least a first support and at least a first resilient element. The at least a first resilient element, which may, for example, be at least a first spring, is deflectable when the test probe engages a structure, such as a device under testing (DUT). Accordingly, the improved test probe assembly of the invention can be deflected an infinite number of positions, in order to resist damage caused, for example, by misalignment between the probe and the DUT.