Abstract: An n-well resistor device and its method of fabrication. The n-well resistor device of the present invention comprises a first n-type region and a second n-type region formed in an n-type silicon region. A gate dielectric layer formed on said n-type silicon region. A polysilicon gate formed on said gate dielectric.

Abstract: The preferred embodiments described herein relate to a monolithic integrated circuit comprising a three-dimensional memory array having a plurality of layers of memory cells stacked vertically above one another and above the substrate of the integrated circuit. Support circuitry for the three-dimensional memory array is formed in the substrate at least partially under the three-dimensional memory array and defines open area in the substrate under the three-dimensional memory array. In one preferred embodiment, one or more memory arrays are formed at least partially in the open area under the three-dimensional memory array, while in another preferred embodiment, logic circuitry implementing one or more functions is formed at least partially in the open area under the three-dimensional memory array. In yet another preferred embodiment, both one or more memory arrays and logic circuitry are formed at least partially in the open area under the three-dimensional memory array.

Abstract: An integrated circuit for measuring internal clock skew is provided. The integrated circuit includes a first controlled delay module, which is operable to receive one of a sampling clock signal and a sampled clock signal. The integrated circuit further includes a first flip-flop having a first input coupled to the first controlled delay module and a second input coupled to one of the sampling clock signal and said sampled clock signal. The first flip-flop is operable to generate an output based on skew between the sampled clock signal and the sampling clock signal.

Abstract: A circuit in accordance with the invention includes an output driver, where the output driver includes a pull-up device and a pull-down device, the pull-up device having a first control terminal coupled with an RC-timer so as to bias the pull-up device on in response to an electrostatic discharge (ESD) event, and the pull-down device having a second control terminal coupled in the circuit so as to be in a substantially indeterminate state during said ESD event.

Abstract: A method for ensuring proper strobe pre and post driving between a first data transfer and a second data transfer in a microprocessor system. The method includes generating a first strobe signal and a second strobe signal, pre-driving one of said first and second strobe signals before the first data transfer, post driving said pre-driven signal, determining which of said first and second strobe signals will be post driven, and pre-driving one of said first and second strobe signals before the second data transfer.

Abstract: A circuit to detect predetermined power supply levels so that sufficient power is provided for an integrated circuit to function properly and drive a bus. A first circuit indicates whether a first voltage has reached a first level, a second circuit indicates whether a second voltage has reached a second level, and a third circuit causes the second circuit to operate in a low power mode when the second voltage has reached a predetermined level. The first voltage is provided by an I/O power supply and the second voltage is provided by a core power supply.

Abstract: A method and apparatus for glitch protection for differential strobe input buffers in a source-synchronous environment. The present invention provides a solution to the problem of noise sensitivity of differential strobe input buffers in a source-synchronous environment, which may cause functional problems. The present invention enables the use of fully differential strobe signals to improve electrical performance of the source synchronous data transfers while removing the noise sensitivity problem associated with these signals. This is accomplished by providing a glitch protection circuit that provides protection against input glitches for a first predetermined period of time after each strobe transition. The present invention also provides a detection circuit that detects when both differential strobe signals are in the same logic state, which corresponds to a transition between bus masters (a dead cycle).

Abstract: A method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit. One disclosed apparatus includes a compensated driver circuit having a number of subcomponents. At least one compensation factor, which may be provided by a compensation circuit, controls which of the subcomponents to enable. An additional circuit is coupled to provide controllable values for the at least one compensation factor.

Abstract: Controlling the slew rate of a driver circuit. According to one embodiment of the present invention an output buffer includes a driver circuit having an impedance and a pre-driver circuit to control a slew rate of the driver circuit based on the impedance of the driver circuit.

Abstract: A method and apparatus for glitch protection for differential strobe input buffers in a source-synchronous environment. The present invention provides a solution to the problem of noise sensitivity of differential strobe input buffers in a source-synchronous environment, which may cause functional problems. The present invention enables the use of fully differential strobe signals to improve electrical performance of the source synchronous data transfers while removing the noise sensitivity problem associated with these signals. This is accomplished by providing a glitch protection circuit that provides protection against input glitches for a first predetermined period of time after each strobe transition. The present invention also provides a detection circuit that detects when both differential strobe signals are in the same logic state, which corresponds to a transition between bus masters (a dead cycle).

Abstract: A method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit. One disclosed apparatus includes a compensated driver circuit having a number of subcomponents. At least one compensation factor, which may be provided by a compensation circuit, controls which of the subcomponents to enable. An additional circuit is coupled to provide controllable values for the at least one compensation factor.

Abstract: A method and apparatus for post-driving and pre-driving a terminated bus that shortens dead cycles on a bus during bus master change-overs. In one embodiment, a first bus agent giving up control of the bus drives the bus to termination voltage levels during a first portion of the dead cycle. A second bus agent gaining control of the bus also drives the bus to termination voltage levels during a last portion of the dead cycle. For the time period between the first portion and the second portion, termination components such as resistors or transistors maintain the bus at termination voltage levels. By driving the bus to termination voltage levels with bus agents, bus transients are settled more quickly than with termination components alone, which improves performance of the bus over configurations pulled to termination voltage levels with termination components alone.

Abstract: An n-well resistor device and its method of fabrication. The n-well resistor device of the present invention comprises a first n-type region and a second n-type region formed in an n-type silicon region. A gate dielectric layer formed on said n-type silicon region. A polysilicon gate formed on said gate dielectric.

Abstract: A method and apparatus for compensating system components based on system topology. The present invention provides a method and apparatus for performance optimization through topology dependent compensation. In one embodiment, one or more components of a computer system are coupled to a bus via self-compensated buffer(s). The self-compensated buffer(s) allow operating characteristics to be set via external signals such as voltage levels. System components have compensation units that receive external signals and configure the operating characteristics of the self-compensated buffer(s). In this manner a system designer may set operating characteristics for various system components based on the topology of the specific system rather than designing for a worst-case scenario.

Abstract: Controlling the slew rate of a driver circuit. According to one embodiment of the present invention an output buffer includes a driver circuit having an impedance and a pre-driver circuit to control a slew rate of the driver circuit based on the impedance of the driver circuit.

Abstract: A multiple synthesizer based timing signal generation scheme is described that allows accurate data and strobe generation in high speed source synchronous system interfaces. Multiple loop locked clock synthesizers (e.g., phase locked loops, delay locked loops) are used to generate multiple clock signals. Data and strobe signals are triggered off of transitions of one of the clock signals. Because multiple loop locked clock synthesizers are used to generate the clock signals, optimal or near optimal alignment of the data and strobe signals can be achieved. Improved alignment of the data and strobe signals provides improved data transmission rates.

Abstract: A computer system with a semi-differential bus-signaling scheme is described. The computer system includes a transmitter coupled to a common bus. The transmitter sends clock signals and a data signal to logic-comparing devices within a receiver. The logic-comparing devices compare the data signal to a reference voltage while comparing the clock signals to each other. After the comparison, the clock signals can be used to capture the data into a retiming circuit.

Abstract: A component powered by a first power supply activates a driving signal. The driving signal indicates that both a second power supply voltage has a magnitude greater than a reference voltage and an enable signal is active. A driver transfers the output signal when the driving signal is active. In a multi-processor computer system implementation, each of two processor cores are independently supplied power by each of two core power supplies while a single I/O power supply supplies power to the I/O rings of both processors. Each processor includes a bus isolation circuit to prevent its respective processor from loading the system bus in the event that a core power supply fails.

Abstract: A buffer for enabling a signal to be applied to a bus. The buffer includes a first transistor coupled to a bus and a voltage supply. The logic buffer includes a first logic circuit which has an input coupled to receive a data signal and adapted to charge a terminal of the transistor at a first rate in response to a transition in the data signal. A second logic circuit charges the terminal at a faster rate during an initial transition period, until a first preselected condition is met. The buffer also includes a third logic circuit to charge the terminal at a second faster rate during a final transition period, after a second preselected condition is met. A method for controlling a voltage level of a signal applied to a terminal of a transistor includes charging the terminal at a fast rate until a first preselected condition is met.

Abstract: A method and an apparatus for testing compensated input/output buffers. In one embodiment, a compensated input/output buffer includes a node from which a plurality of compensation devices are coupled in parallel to a particular voltage level, such as for example V.sub.CC or ground. Compensation control signals are received by each one of the compensation devices such that the compensation signals are configured to selectively switch on and off each one of the plurality of compensation devices. An input/output test bus is coupled to the node and thus has access to each one of the compensation devices. Test circuitry is configured to selectively switch on and off each one of the compensation devices such that a switchable conductive path is formed from the node to the particular potential level through each one of the plurality of compensation devices.