Abstract: A method and system for generating Key Performance Indicators (KPIs) for a software based on debugging information is disclosed. In some embodiments, the method includes creating a mapping of each of a plurality of lines in a log of the software to at least one issue Identifier (ID) from a set of issue IDs. The method further includes generating a mapping database consisting of the logs along with their predicted issued ID based on the aforementioned mapping. The method further includes identifying, for each of the set of issue IDs, a set of mapped sentences based on a set of mapped lines. The method further includes generating, for each of the set of issue IDs, a KPI based on the associated set of mapped sentences and the associated set of mapped lines.

Abstract: A method and system for generating Key Performance Indicators (KPIs) for a software based on debugging information is disclosed. In some embodiments, the method includes creating a mapping of each of a plurality of lines in a log of the software to at least one issue Identifier (ID) from a set of issue IDs. The method further includes generating a mapping database consisting of the logs along with their predicted issued ID based on the aforementioned mapping. The method further includes identifying, for each of the set of issue IDs, a set of mapped sentences based on a set of mapped lines. The method further includes generating, for each of the set of issue IDs, a KPI based on the associated set of mapped sentences and the associated set of mapped lines.

Abstract: An apparatus and method for improving the performance of an electronic device is disclosed. An idle voltage state is introduced by an adaptive voltage generator when providing or removing a high voltage signal from a line or a node in a circuit. The idle state reduces the undesirable effects of switching disturbances caused by sudden voltage changes in a line or node.

Abstract: An apparatus and method for improving the performance of an electronic device is disclosed. An idle voltage state is introduced by an adaptive voltage generator when providing or removing a high voltage signal from a line or a node in a circuit. The idle state reduces the undesirable effects of switching disturbances caused by sudden voltage changes in a line or node.

Abstract: An apparatus and method for improving the performance of an electronic device is disclosed. An idle voltage state is introduced by an adaptive voltage generator when providing or removing a high voltage signal from a line or a node in a circuit. The idle state reduces the undesirable effects of switching disturbances caused by sudden voltage changes in a line or node.

Abstract: A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.

Abstract: A plurality of memory sub-arrays are formed in a p-well region. Each of the memory sub-arrays has at least one first-level column decoder that includes a plurality of low-voltage MOS selector transistors that are also formed within the p-well. A last-level decoder is formed outside of the p-well region and includes high-voltage MOS transistors to provide an output signal to one of an array of sense amplifiers. During a memory erase mode of operation, a high voltage is provided to bias the p-well region and a plurality of high-voltage switches are activated to provide a high voltage to gate terminals of the selector transistor in the first-level column decoders. One or more intermediate-level column decoders are formed as low-voltage selector transistors in the p-well between the first-level column decoder and the last-level column decoder.

Abstract: A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.

Abstract: A plurality of memory sub-arrays are formed in a p-well region. Each of the memory sub-arrays has at least one first-level column decoder that includes a plurality of low-voltage MOS selector transistors that are also formed within the p-well. A last-level decoder is formed outside of the p-well region and includes high-voltage MOS transistors to provide an output signal to one of an array of sense amplifiers. During a memory erase mode of operation, a high voltage is provided to bias the p-well region and a plurality of high-voltage switches are activated to provide a high voltage to gate terminals of the selector transistor in the first-level column decoders. One or more intermediate-level column decoders are formed as low-voltage selector transistors in the p-well between the first-level column decoder and the last-level column decoder.

Abstract: Regulating a program voltage value during multilevel memory device programming includes utilizing a program path duplicate in an output pump regulator circuit. Further, the output pump regulator circuit is utilized to provide a regulated program voltage for memory cell programming, the regulated program voltage correcting for a program path voltage drop.

Abstract: An apparatus and method for improving the performance of an electronic device is disclosed. An idle voltage state is introduced by an adaptive voltage generator when providing or removing a high voltage signal from a line or a node in a circuit. The idle state reduces the undesirable effects of switching disturbances caused by sudden voltage changes in a line or node.

Abstract: A system and method for avoiding offset in and reducing the footprint of a non-volatile memory that has a plurality of memory bank circuits. Each memory bank circuit has memory cells coupled to sense amplifiers, row and column decoders coupled to the memory cells, and bias circuits coupled to the sense amplifiers. The system includes a reference cell matrix coupled to each of the plurality of memory bank circuits. The reference cell matrix is configured to provide reference cell current for each of the plurality of memory bank circuits.

Abstract: A method and system for approximating resistance in a non-volatile memory has a memory matrix. The memory matrix has a plurality of memory cells and a plurality of memory source lines that are coupled to the plurality of memory cells. A reference matrix is coupled to the memory matrix and has a reference cell. A logic generator is coupled to the reference matrix and is configured to generate an approximation, at the reference cell, of a resistance between a selected one of the plurality of memory cells and at least one of the plurality of memory source lines.

Abstract: A current mirror comprising: current source; a first p-channel transistor having a source coupled to operating potential, and a gate and drain coupled to current source; a second p-channel transistor having a source coupled to operating potential, a gate coupled to gate of first p-channel transistor, and a drain; a zero-threshold p-channel transistor having a source coupled to drain of second p-channel transistor, a gate coupled to gate of first p-channel transistor, and a drain; a first n-channel transistor having a source coupled to ground, and a gate and drain coupled to drain of zero-threshold p-channel transistor; a second n-channel transistor having a source coupled to ground, a gate coupled to gate of first n-channel transistor, and a drain; and a zero-threshold n-channel transistor having a source coupled to drain of second n-channel transistor, a gate coupled to gate of first n-channel transistor, and a drain coupled to current-output node.

Abstract: A current mirror comprising: a current source; a first p-channel MOS transistor having a source coupled to an operating potential, and a gate and a drain coupled to the current source; a second p-channel MOS transistor having a source coupled to the operating potential, a gate coupled to the gate of the first p-channel transistor, and a drain; a first n-channel MOS transistor having a source coupled to ground, and a gate and a drain coupled to the drain of the second p-channel transistor; a zero-threshold n-channel MOS transistor having a drain coupled to a current-output node, a gate coupled to the gate of the first n-channel transistor, and a source; and a second n-channel MOS transistor having a source coupled to ground, and a gate coupled to the gate of the first n-channel transistor and a drain coupled to the source of the zero-threshold n-channel transistor.

Abstract: Regulating a program voltage value during multilevel memory device programming includes utilizing a program path duplicate in an output pump regulator circuit. Further, the output pump regulator circuit is utilized to provide a regulated program voltage for memory cell programming, the regulated program voltage correcting for a program path voltage drop.

Abstract: Regulating a program voltage value during multilevel memory device programming includes utilizing a program path duplicate in an output pump regulator circuit. Further, the output pump regulator circuit is utilized to provide a regulated program voltage for memory cell programming, the regulated program voltage correcting for a program path voltage drop and compensating for temperature variation.

Abstract: A method and system for approximating resistance in a non-volatile memory has a memory matrix. The memory matrix has a plurality of memory cells and a plurality of memory source lines that are coupled to the plurality of memory cells. A reference matrix is coupled to the memory matrix and has a reference cell. A logic generator is coupled to the reference matrix and is configured to generate an approximation, at the reference cell, of a resistance between a selected one of the plurality of memory cells and at least one of the plurality of memory source lines.

Abstract: A current mirror comprising: a current source; a first p-channel MOS transistor having a source coupled to an operating potential, and a gate and a drain coupled to the current source; a second p-channel MOS transistor having a source coupled to the operating potential, a gate coupled to the gate of the first p-channel transistor, and a drain; a first n-channel MOS transistor having a source coupled to ground, and a gate and a drain coupled to the drain of the second p-channel transistor; a zero-threshold n-channel MOS transistor having a drain coupled to a current-output node, a gate coupled to the gate of the first n-channel transistor, and a source; and a second n-channel MOS transistor having a source coupled to ground, and a gate coupled to the gate of the first n-channel transistor and a drain coupled to the source of the zero-threshold n-channel transistor.

Abstract: A current mirror comprising: current source; a first p-channel transistor having a source coupled to operating potential, and a gate and drain coupled to current source; a second p-channel transistor having a source coupled to operating potential, a gate coupled to gate of first p-channel transistor, and a drain; a zero-threshold p-channel transistor having a source coupled to drain of second p-channel transistor, a gate coupled to gate of first p-channel transistor, and a drain; a first n-channel transistor having a source coupled to ground, and a gate and drain coupled to drain of zero-threshold p-channel transistor; a second n-channel transistor having a source coupled to ground, a gate coupled to gate of first n-channel transistor, and a drain; and a zero-threshold n-channel transistor having a source coupled to drain of second n-channel transistor, a gate coupled to gate of first n-channel transistor, and a drain coupled to current-output node.