Abstract: A current mirror comprising: a first current source; a first n-channel MOS transistor having a drain and a gate coupled to said current source and a source coupled to ground; a second n-channel MOS transistor having a drain, a gate coupled to said drain and said gate of said first n-channel MOS transistor, and a source coupled to ground; a third n-channel MOS transistor having a source coupled to said drain of said second n-channel MOS transistor, a gate, and a drain comprising an output-current node; a second current source; a p-channel MOS transistor having a drain coupled to ground, a source coupled to said second current source and said gate of said third n-channel MOS transistor, and a gate coupled to said drain and said gate of said first n-channel MOS transistor.

Abstract: Regulating a program voltage value during multilevel memory device programming includes utilizing a program path duplicate in an output pump regulator circuit. Further, the output pump regulator circuit is utilized to provide a regulated program voltage for memory cell programming, the regulated program voltage correcting for a program path voltage drop and compensating for temperature variation.

Abstract: A system and method for avoiding offset in and reducing the footprint of a non-volatile memory that has a plurality of memory bank circuits. Each memory bank circuit has memory cells coupled to sense amplifiers, row and column decoders coupled to the memory cells, and bias circuits coupled to the sense amplifiers. The system includes a reference cell matrix coupled to each of the plurality of memory bank circuits. The reference cell matrix is configured to provide reference cell current for each of the plurality of memory bank circuits.

Abstract: A current mirror comprising: a first current source; a first n-channel MOS transistor having a drain and a gate coupled to said current source and a source coupled to ground; a second n-channel MOS transistor having a drain, a gate coupled to said drain and said gate of said first n-channel MOS transistor, and a source coupled to ground; a third n-channel MOS transistor having a source coupled to said drain of said second n-channel MOS transistor, a gate, and a drain comprising an output-current node; a second current source; a p-channel MOS transistor having a drain coupled to ground, a source coupled to said second current source and said gate of said third n-channel MOS transistor, and a gate coupled to said drain and said gate of said first n-channel MOS transistor.

Abstract: A memory cell sensing circuit to sense data from a memory cell includes a reference memory cell coupled to pass a reference current. A sense amplifier has a first input and a second input coupled to a bias circuit of the data memory cell. A first mirror mirrors the reference current to a voltage coupled to the first input of the sense amplifier. A second mirror mirrors the reference current to a voltage coupled to the bias circuit of the data memory cell. A third mirror mirrors the reference current to a voltage coupled to the second input of the sense amplifier through a pass gate.

Abstract: A configurable mirror sense amplifier system for flash memory having the following features. A power source generates a reference voltage. A plurality of transistors is biased at the reference voltage. The plurality of transistors is each coupled to a second transistor. Each of the plurality of transistors is also configured to provide a current for comparison with the flash memory. The reference voltage is internal, stable and independent from variations of a power supply or temperature. The plurality of transistors is in parallel with one another. A mirror transistor is coupled to the plurality of transistors. The plurality of transistors is configured so that at least one of at least one transistor is activated with a signal in order to provide the current for comparison to the flash memory. Also, the reference voltage may be modified in order to modify the current for comparison to the flash memory.

Abstract: A method and program-load circuit is for regulating the voltages at the drain and body terminals of a non-volatile memory cell being programmed. These voltages are applied from a program-load circuit connected in a conduction pattern to transfer a predetermined voltage value to at least one terminal of the memory cell. The method includes a step of regulating the voltage value locally, within the program-load circuit, to overcome the effect of a parasitic resistor present in the conduction pattern.

Abstract: A configurable mirror sense amplifier system for flash memory having the following features. A power source generates a reference voltage. A plurality of transistors is biased at the reference voltage. The plurality of transistors is each coupled to a second transistor. Each of the plurality of transistors is also configured to provide a current for comparison with the flash memory. The reference voltage is internal, stable and independent from variations of a power supply or temperature. The plurality of transistors is in parallel with one another. A mirror transistor is coupled to the plurality of transistors. The plurality of transistors is configured so that at least one of at least one transistor is activated with a signal in order to provide the current for comparison to the flash memory. Also, the reference voltage may be modified in order to modify the current for comparison to the flash memory.

Abstract: A current mirror comprises a current source; a first n-channel MOS transistor having a drain and a gate coupled to the current source and a source coupled to a source potential; a second n-channel MOS transistor having a drain, a gate coupled, to the drain and gate of the first n-channel MOS transistor, and a source coupled to the source potential; and a zero-threshold-voltage MOS transistor having a source coupled to the drain of the second n-channel MOS transistor, a gate coupled to the drain and the gate of the first n-channel MOS transistor, and a drain comprising an output-current node.

Abstract: A memory cell sensing circuit to sense data from a memory cell includes a reference memory cell coupled to pass a reference current. A sense amplifier has a first input and a second input coupled to a bias circuit of the data memory cell. A first mirror mirrors the reference current to a voltage coupled to the first input of the sense amplifier. A second mirror mirrors the reference current to a voltage coupled to the bias circuit of the data memory cell. A third mirror mirrors the reference current to a voltage coupled to the second input of the sense amplifier through a pass gate.

Abstract: The voltage generator comprises a negative feedback loop including a programmable voltage divider having a feedback node. The voltage divider comprises a programmable resistor disposed between the output of the voltage generator and the feedback node and having variable resistance. The programmable resistor includes a fixed resistor and a plurality of additional resistors arranged in series with each other and defining a plurality of intermediate nodes. The additional resistors may be selectively connected by means of switches disposed between the output of the voltage generator and a respective intermediate node so as to define an output voltage V0 programmable on the basis of command signals supplied to the switches.

Abstract: A method and program-load circuit is for regulating the voltages at the drain and body terminals of a non-volatile memory cell being programmed. These voltages are applied from a program-load circuit connected in a conduction pattern to transfer a predetermined voltage value to at least one terminal of the memory cell. The method includes a step of regulating the voltage value locally, within the program-load circuit, to overcome the effect of a parasitic resistor present in the conduction pattern.

Abstract: A pulse programming method for a non-volatile memory device includes: addressing memory cells to be programmed within the device by selecting corresponding hierarchic decoder transistors; biasing the gate terminals of the memory cells; and programming the memory cells by applying a voltage pulse, regulated by a bias circuit, to the drain terminals of the memory cells. Advantageously, the programming method further comprises a step of precharging an internal node of the bias circuit before starting the programming step, the internal node being connected to a parasitic capacitance of the memory device.

Abstract: Described herein is a nonvolatile memory comprising a memory array organized according to global word lines and local word lines; a global row decoder; a local row decoder; a first supply stage for supplying the global row decoder; and a second supply stage for supplying the local row decoder; and a third supply stage for biasing the drain and source terminals of the memory cells of the memory array. Each of the supply stages comprises a respective resistive divider formed by a plurality of series-connected resistors, and a plurality of pass-gate CMOS switches each connected in parallel to a respective resistor. The nonvolatile memory further comprises a control circuit for controlling the pass-gate CMOS switches of the supply stages, and a switching circuit for selectively connecting the supply input of the control circuit to the output of the second supply stage during reading and programming of the memory, and to the output of the third supply stage during erasing of the memory.

Abstract: A circuit for biasing the bulk terminal of a first MOS transistor having a first terminal connected to a first line set to a first potential, and a second terminal connected to a second line set to a second potential. The biasing circuit includes a second and a third MOS transistors having first terminals connected respectively to the first line and to the second line, second terminals connected to the bulk terminal of the first MOS transistor, and control terminals connected respectively to the second and to the first line.

Abstract: A pulse programming method for a non-volatile memory device includes: addressing memory cells to be programmed within the device by selecting corresponding hierarchic decoder transistors; biasing the gate terminals of the memory cells; and programming the memory cells by applying a voltage pulse, regulated by a bias circuit, to the drain terminals of the memory cells. Advantageously, the programming method further comprises a step of precharging an internal node of the bias circuit before starting the programming step, the internal node being connected to a parasitic capacitance of the memory device.

Abstract: Described herein is a nonvolatile memory comprising a memory array organized according to global word lines and local word lines; a global row decoder; a local row decoder; a first supply stage for supplying the global row decoder; and a second supply stage for supplying the local row decoder; and a third supply stage for biasing the drain and source terminals of the memory cells of the memory array. Each of the supply stages comprises a respective resistive divider formed by a plurality of series-connected resistors, and a plurality of pass-gate CMOS switches each connected in parallel to a respective resistor. The nonvolatile memory further comprises a control circuit for controlling the pass-gate CMOS switches of the supply stages, and a switching circuit for selectively connecting the supply input of the control circuit to the output of the second supply stage during reading and programming of the memory, and to the output of the third supply stage during erasing of the memory.

Abstract: A voltage generator formed of a charge circuit and a discharge circuit having a common programmable voltage divider with variable resistance; the programmable voltage divider including a plurality of resistors arranged in series and selectively connectable to define alternatively a step-wise increasing program voltage and a fixed verify voltage. The charge circuit formed of a voltage regulator supplying at the output the precise voltage value determined by the programmable voltage divider, and the discharge circuit intervening when the output voltage must be switched in a controlled manner from a higher value to a lower value.

Abstract: The memory device comprises a memory array having an organization of the type comprising global word lines and local word lines, a global row decoder addressing the global word lines, a local row decoder addressing the local word lines, a global power supply stage supplying the global row decoder, and a local power supply stage supplying the local row decoder.

Abstract: The non volatile memory device integrates, in one and the same chip, the array of memory cells, a voltage regulator which supplies a regulated operating voltage to a selected word line, and a short circuit detecting circuit. The short circuit detecting circuit detects the output voltage of the voltage regulator, which is correlated to the current for biasing the cells of the word line selected. Once settled to the steady state condition, the output current assumes one first value in the absence of short circuits, and one second value in the presence of a short circuit between the word line selected and one or more adjacent word lines. The short circuit detecting circuit compares the output current of the voltage regulator with a reference value and generates at output a short circuit digital signal which indicates the presence or otherwise of a short circuit.