Abstract: Word-line drivers, memories, and methods of operating word-line drivers are provided. A word-line driver coupled to an array of memory cells includes a decoder powered by a first power supply. The decoder is configured to decode an address to provide a plurality of word-line signals. The word-line driver also includes a plurality of output stages powered by a second power supply that is different than the first power supply. Each of the output stages includes a first transistor having a gate controlled by a first control signal and an inverter. The inverter is coupled between the first transistor and a ground and has an input coupled to the decoder to receive one of the word-line signals. The word-line driver also includes pull-down circuitry coupled between the gates of the first transistors and the ground and activated by a second control signal.

Abstract: A memory device includes an array of memory cells, a bit line connected to the memory cells, and a power supply voltage input terminal configured to receive a power supply voltage at a first voltage level to operate the memory cells at the first voltage level. A bit line precharge circuit has an input terminal configured to receive the power supply voltage at the first voltage level, and the bit line precharge circuit is configured to precharge the bit lines to a second voltage level lower than the first voltage level.

Abstract: A memory macro includes: word lines; memory cells arranged in an array, the array including rows and columns, the rows corresponding to the word lines, each memory cell being configured to receive a first reference voltage, and each column having voltage supply nodes corresponding to corresponding ones of the memory cells in the column; and switching circuits corresponding to the columns, each switching circuit being configured to selectively provide a first voltage value of a first voltage source or a second voltage value of a second voltage source to the voltage supply nodes; and wherein the first and second voltage values differ by a predetermined voltage value; each of the first and second voltage values is different than a second reference supply voltage; and the word lines are configured to receive the second voltage value as a voltage value representing a high logical value of the word lines.

Abstract: A device for providing gated data signals includes a delay path configured to receive an input signal and output the input signal that is delayed from the input signal by a time interval; a gating signal generator configured to supply a gating signal; a gating circuit configured to receive the data signal from the delay path at the data input, receive the gating signal at the gating input, and output at the data output an output signal indicative of the received data signal when the gating signal is present at the gating input; and a delay controller configured to receive a variable delay control signal and set the delay time interval according to the delay control signal.

Abstract: Word-line drivers, memories, and methods of operating word-line drivers are provided. A word-line driver coupled to an array of memory cells includes a decoder powered by a first power supply. The decoder is configured to decode an address to provide a plurality of word-line signals. The word-line driver also includes a plurality of output stages powered by a second power supply that is different than the first power supply. Each of the output stages includes a first transistor having a gate controlled by a first control signal and an inverter. The inverter is coupled between the first transistor and a ground and has an input coupled to the decoder to receive one of the word-line signals. The word-line driver also includes pull-down circuitry coupled between the gates of the first transistors and the ground and activated by a second control signal.

Abstract: A memory device Input/Output includes a memory cell having a local bit line. A first IO circuit is coupled to the local bit line and is configured to output a local IO signal to a global bit line. A second IO circuit is coupled to the global bit line and is configured to output a global IO signal. A latch circuit is configured to latch the local IO signal in response to a data signal on the local bit line.

Abstract: A circuit is disclosed that includes an inverter unit and a switch unit. The inverter unit is coupled to a memory cell column. The inverter unit is configured to invert, in response to a first control signal and a second control signal, a first signal and to output a second signal for the enabling or disabling of a bit line keeper circuit that is configured to maintain a bit line to a voltage. The first signal is generated by the memory cell column. The switch unit is configured to couple a reference voltage to an input of the inverter unit, in response to a third control signal. The inverter unit is further configured to be deactivated in response to the reference voltage, the first control signal, and the second control signal.

Abstract: A circuit includes a plurality of memory cells, a first tracking word line driver, and a second tracking word line driver. The first tracking word line driver outputs a first signal in response to a first region of the plurality of memory cells being accessed, the first signal having a first pulse width. The second tracking word line driver outputs a second signal in response to a second region of the plurality of memory cells being accessed, the second signal having a second pulse width, the second pulse width being different from the first pulse width.

Abstract: A memory device includes control line drivers coupled to respective pairs of reference supply voltage controllers and supply voltage controllers. The control line drivers are configured to apply control signals to the reference supply voltage controllers and the supply voltage controllers. For a read operation, the reference supply voltage controllers apply a first voltage to reference voltage supply nodes of un-accessed rows of the array of memory cells and a second voltage to accessed rows. A voltage level of the first voltage is greater than a voltage level of the second voltage. For a write operation, the supply voltage controllers apply a third voltage to un-accessed rows of the array of memory cells and a fourth voltage to accessed rows. A voltage level of the third voltage is greater than a voltage level of the fourth voltage.

Abstract: Word-line drivers, memories, and methods of operating word-line drivers are provided. A word-line driver coupled to an array of memory cells includes a decoder powered by a first power supply. The decoder is configured to decode an address to provide a plurality of word-line signals. The word-line driver also includes a plurality of output stages powered by a second power supply that is different than the first power supply. Each of the output stages includes a first transistor having a gate controlled by a first control signal and an inverter. The inverter is coupled between the first transistor and a ground and has an input coupled to the decoder to receive one of the word-line signals. The word-line driver also includes pull-down circuitry coupled between the gates of the first transistors and the ground and activated by a second control signal.

Abstract: A memory macro includes: word lines; memory cells arranged in an array of columns and rows, the rows corresponding to the word lines; and switching circuits corresponding to the columns, each switching circuit being configured to selectively provide a first voltage value of a first voltage source or a different second voltage value of a second voltage source to corresponding voltage supply nodes of the columns; and wherein the word lines are configured to receive the second voltage value as a high logical value of the word lines; a selected one or more of the word lines is activated during a write operation, thereby defining an elapse of the write operation; and each switching circuit is further configured to selectively provide the corresponding first voltage value or the second voltage value substantially for an entirety of the write operation.

Abstract: A circuit is disclosed that includes an inverter unit and a switch unit. The inverter unit is coupled to a memory cell column. The inverter unit is configured to invert, in response to a first control signal and a second control signal, a first signal and to output a second signal for the enabling or disabling of a bit line keeper circuit that is configured to maintain a bit line to a voltage. The first signal is generated by the memory cell column. The switch unit is configured to couple a reference voltage to an input of the inverter unit, in response to a third control signal. The inverter unit is further configured to be deactivated in response to the reference voltage, the first control signal, and the second control signal.

Abstract: An SRAM device has a voltage input terminal configured to receive a first signal at a first voltage level. A level shifter is connected to the voltage input terminal to receive the first signal, and the level shifter is configured to output a second signal at a second voltage level higher than the first voltage level. A memory cell has a word line and a bit line. The word line is connected to the output terminal of the level shifter to selectively receive the second signal at the second voltage level, and the bit line is connected to the voltage input terminal to selectively receive the first signal at the first voltage level. A sense amplifier is connected to the bit line and is configured to provide an output of the memory cell. The sense amplifier has a sense amplifier input connected to the output terminal of the level shifter to selectively receive the second signal at the second voltage level.

Abstract: An exemplary testing environment can operate in a testing mode of operation to test whether a memory device or other electronic devices communicatively coupled to the memory device operate as expected or unexpectedly as a result of one or more manufacturing faults. The testing mode of operation includes a shift mode of operation, a capture mode of operation, and/or a scan mode of operation. In the shift mode of operation and the scan mode of operation, the exemplary testing environment delivers a serial input sequence of data to the memory device. In the capture mode of operation, the exemplary testing environment delivers a parallel input sequence of data to the memory device.

Abstract: A memory array having a first port and a second port is disclosed. The memory array includes: a first memory cell, wherein access to the first memory cell through the first port is controlled by a first word line, and access to the first memory cell through the second port is controlled by a second word line; a second memory cell, wherein access to the second memory cell through the first port is controlled by the first word line, and access to the second memory cell through the second port is controlled by the second word line; and a disturb detector, used to generate a disturb detected signal for indicating whether the first memory cell and the second memory cell are accessed at a same time. A memory array having a write assistor is also disclosed.

Abstract: A memory array having a first port and a second port is disclosed. The memory array includes: a first memory cell, wherein access to the first memory cell through the first port is controlled by a first word line, and access to the first memory cell through the second port is controlled by a second word line; a second memory cell, wherein access to the second memory cell through the first port is controlled by the first word line, and access to the second memory cell through the second port is controlled by the second word line; and a disturb detector, used to generate a disturb detected signal for indicating whether the first memory cell and the second memory cell are accessed at a same time. A memory array having a write assistor is also disclosed.

Abstract: A memory controlling device includes: a control circuit arranged to generate a multi-pulse control signal with a first duration; and a memory cell coupled to a pair of bit lines and a word line, wherein the multi-pulse control signal is coupled to the word line, and the memory cell is arranged to output an output signal on the pair of bit lines during the first duration.

Abstract: A memory macro includes: word lines; memory cells arranged in an array of columns and rows, the rows corresponding to the word lines; and switching circuits corresponding to the columns, each switching circuit being configured to selectively provide a first voltage value of a first voltage source or a different second voltage value of a second voltage source to corresponding voltage supply nodes of the columns; and wherein the word lines are configured to receive the second voltage value as a high logical value of the word lines; a selected one or more of the word lines is activated during a write operation, thereby defining an elapse of the write operation; and each switching circuit is further configured to selectively provide the corresponding first voltage value or the second voltage value substantially for an entirety of the write operation.

Abstract: Word-line drivers, memories, and methods of operating word-line drivers are provided. A word-line driver coupled to an array of memory cells includes a decoder powered by a first power supply. The decoder is configured to decode an address to provide a plurality of word-line signals. The word-line driver also includes a plurality of output stages powered by a second power supply that is different than the first power supply. Each of the output stages includes a first transistor having a gate controlled by a first control signal and an inverter. The inverter is coupled between the first transistor and a ground and has an input coupled to the decoder to receive one of the word-line signals. The word-line driver also includes pull-down circuitry coupled between the gates of the first transistors and the ground and activated by a second control signal.

Abstract: A method includes: examining, by a test engine, whether a first bit of a memory array is functional; in response to the first bit being not functional, storing, by the test engine, address information of the first bit into a memory device; and retrieving, by an assist circuit trimming (ACT) circuit, the address information of the first bit from the memory device to selectively activate at least a first one of a plurality of assist circuits associated with the first bit.