Abstract: According to example embodiments, a substrate for a power module includes first to third parts spaced apart from each other, where the third part surrounds the first and second parts, and a conductive layer on the first to third parts. A terminal of a first polarity is connected to the first part, and a terminal of a second polarity is connected to the second part. The first and second terminals may be spaced apart from each other and each have a coupling part, a body, and a contact part. The bodies of the first and second terminals may overlap each other. A power module may include the substrate.

Abstract: An audible device is provided. The audible device includes a battery which is rechargeable, a power management circuit configured to detect a first battery level of the battery, a wireless communication circuit configured to communicate with another audible device by wireless communication, an electronic component, and a control circuit electrically connected with the power management circuit, the wireless communication circuit, and the electronic component, wherein the control circuit is configured to: establish a connection with the another audible device by using the wireless communication circuit; receive a second battery level of the another audible device by using the wireless communication circuit; obtain a battery ratio between the first battery level and the second battery level; compare the battery ratio with at least one of a plurality of reference ratios; and control the operation of at least one of the audible device and the another audible device based the compared battery ratio.

Abstract: A gait helper includes an hallow tubular member that is designed to elastically fit on the toenails of an animal to treat or prevent a medical condition such as, for example, lupoid onychodystrophy, moist eczema, arthritis or other joint problems.

Abstract: A fluid analysis apparatus including: a fluid analysis cartridge comprising a fluid supplying part configured to supply a fluid sample; and a pressing member configured to press and seal the fluid supplying part, wherein the pressing member is configured to couple with the fluid analysis cartridge so that the fluid supplying part is inserted into the pressing member.

Abstract: Provided is a door hinge for heavy equipment, including: first plate and a second plate disposed on a hinge shaft of a door of heavy equipment and hinge-coupled to each other to open and close the door; and a stay unit rotatably disposed on the first plate and supporting the second plate when the door is opened to prevent the door from being closed. Thus, according to the present invention, an open state of a door can be maintained by only the stay unit without mounting a bracket by overcoming the limitation that the bracket for mounting a separate door stay must be mounted to a door body in order to maintain the open state of the existing door during opening of the door.

Abstract: An apparatus and method for providing one or more protocols for one or more electronic devices are provided. The method includes establishing, by an electronic device configured to provide a framework interface by executing instructions stored in a memory, one or more physical channels with an external electronic device, using one or more communication modules, executing, by the electronic device, two or more application programs to interface with the framework interface, and communicating, via the framework interface, data from the two or more application programs through the one or more physical channels to the external electronic device, using at least one logical channel or session for a respective one of the two or more application programs.

Abstract: An apparatus and method for providing one or more protocols for one or more electronic devices are provided. The method includes establishing, by an electronic device configured to provide a framework interface by executing instructions stored in a memory, one or more physical channels with an external electronic device, using one or more communication modules, executing, by the electronic device, two or more application programs to interface with the framework interface, and communicating, via the framework interface, data from the two or more application programs through the one or more physical channels to the external electronic device, using at least one logical channel or session for a respective one of the two or more application programs.

Abstract: Provided is a door hinge for heavy equipment, including: first plate and a second plate disposed on a hinge shaft of a door of heavy equipment and hinge-coupled to each other to open and close the door; and a stay unit rotatably disposed on the first plate and supporting the second plate when the door is opened to prevent the door from being closed. Thus, according to the present invention, an open state of a door can be maintained by only the stay unit without mounting a bracket by overcoming the limitation that the bracket for mounting a separate door stay must be mounted to a door body in order to maintain the open state of the existing door during opening of the door.

Abstract: According to example embodiments, a substrate for a power module includes first to third parts spaced apart from each other, where the third part surrounds the first and second parts, and a conductive layer on the first to third parts. A terminal of a first polarity is connected to the first part, and a terminal of a second polarity is connected to the second part. The first and second terminals may be spaced apart from each other and each have a coupling part, a body, and a contact part. The bodies of the first and second terminals may overlap each other. A power module may include the substrate.

Abstract: A method of making a bearing includes providing a bearing intermediate, which is unfinished while having an overall shape of a finished bearing product; and repeatedly impacting a surface of the bearing intermediate at one or more ultrasonic frequencies to modify characteristics of the bearing intermediate. The resulting bearing intermediate or finished bearing product includes nano-size grains at or underneath the surface.

Abstract: A test circuit of a semiconductor memory device for performing a test in cooperation with a tester having a plurality of input/output pins connected to a plurality of input/output lines. The test circuit may include a first comparing unit adapted to compare, on a bit-by-bit basis, read data that may be read from memory cells corresponding to an address with expected data, and to output the comparison results as first comparison signals, a second comparing unit adapted to perform a logic operation on the first comparison signals and to generate a flag signal when determining a failure of at least one of the memory cells on the basis of the operation result, and a storage unit adapted to store the first comparison signals in response to the flag signal.

Abstract: Provided is a case for a portable electronic device. The case includes an outer part; an inner part coupled to an inner surface of the outer part and including a plurality of holes; and fastening members, each including a main body having an outer diameter corresponding to an inner diameter of the hole in the inner part and a flange portion, wherein the flange portion is connected to an end portion of the main body, has an outer diameter greater than the outer diameter of the main body to be depressed into the inner part.

Abstract: In an embodiment, a semiconductor device is tested using a probe pad that includes a probing region with which a probe needle makes contact, and a sensing region bordering an edge of the probing region. Electrical signals are applied, and measured results indicate the probe needle's location relative to a test position on the semiconductor device.

Abstract: A method of making a bearing includes providing a bearing intermediate, which is unfinished while having an overall shape of a finished bearing product; and repeatedly impacting a surface of the bearing intermediate at one or more ultrasonic frequencies to modify characteristics of the bearing intermediate. The resulting bearing intermediate or finished bearing product includes nano-size grains at or underneath the surface.

Abstract: In an embodiment, a semiconductor device is tested using a probe pad that includes a probing region with which a probe needle makes contact, and a sensing region bordering an edge of the probing region. Electrical signals are applied, and measured results indicate the probe needle's location relative to a test position on the semiconductor device.

Abstract: In an embodiment, a semiconductor device is tested using a probe pad that includes a probing region with which a probe needle makes contact, and a sensing region bordering an edge of the probing region. Electrical signals are applied, and measured results indicate the probe needle's location relative to a test position on the semiconductor device.

Abstract: A probe sensing pad used to detect a position of a probe needle includes a probe area, at least two sensing regions contacting peripheral portions of the probe area, sensing elements of different electrical characteristics connected to corresponding sensing regions, and at least one isolation region for electrically insulting the sensing regions. The position of the probe needle relative to the probe sensing pad may be rapidly detected and automatically corrected toward a desired contact site of the probe sensing pad depending upon the voltage measured by a probe needle contacting the probe sensing pad. That is, the measured voltage will have a first value if deflected in a first direction, a second value (different from the first) if deflected in a second direction, and so on. The position of the probe needle can be corrected based on this measurement.

Abstract: A memory device may include a plurality of bit line pairs, at least one local data line pair, and/or a bit line leakage current measurement unit. The at least one local data line pair may be connected to the bit line pairs in response to a column selection signal. The bit line leakage current measurement unit may be configured to monitor a direct drain quiescent current (IDDQ) flowing though at least one measurement line connected to the at least one local data line pair in response to a test mode signal.

Abstract: A test circuit of a semiconductor memory device for performing a test in cooperation with a tester having a plurality of input/output pins connected to a plurality of input/output lines. The test circuit may include a first comparing unit adapted to compare, on a bit-by-bit basis, read data that may be read from memory cells corresponding to an address with expected data, and to output the comparison results as first comparison signals, a second comparing unit adapted to perform a logic operation on the first comparison signals and to generate a flag signal when determining a failure of at least one of the memory cells on the basis of the operation result, and a storage unit adapted to store the first comparison signals in response to the flag signal.

Abstract: Provided is a case for a portable electronic device. The case includes an outer part; an inner part coupled to an inner surface of the outer part and including a plurality of holes; and fastening members, each including a main body having an outer diameter corresponding to an inner diameter of the hole in the inner part and a flange portion, wherein the flange portion is connected to an end portion of the main body, has an outer diameter greater than the outer diameter of the main body to be depressed into the inner part.