Abstract: The present invention provides an integrated circuit. The integrated circuit comprises: a plurality of core power sources; and a plurality of core power domains, coupled to the core power sources, respectively; wherein the core power domains are overlapped with each other.

Abstract: A dust filter barrel includes a sheet filter cylinder, a mesh cylinder and a fixation base. The sheet filter cylinder has two end faces, an inner layer and an outer layer laminated on the inner layer; wherein the inner layer has a plurality of pores having a first pore diameter, the outer layer has a plurality of pores having a second pore diameter, and the second pore diameter is smaller than the first pore diameter. The mesh cylinder is non-contact with the outer layer of the sheet filter cylinder and sleeved outside the sheet filter cylinder and has two end faces. The fixation base has a first and second cover bodies disposed on the two end faces of the sheet filter cylinder and the mesh cylinder respectively, and the second cover body is formed with at least one opening communicated with the sheet filter cylinder.

Abstract: A dust filter barrel includes a sheet filter cylinder, a mesh cylinder and a fixation base. The sheet filter cylinder has two end faces, an inner layer and an outer layer laminated on the inner layer; wherein the inner layer has a plurality of pores having a first pore diameter, the outer layer has a plurality of pores having a second pore diameter, and the second pore diameter is smaller than the first pore diameter. The mesh cylinder is non-contact with the outer layer of the sheet filter cylinder and sleeved outside the sheet filter cylinder and has two end faces. The fixation base has a first and second cover bodies disposed on the two end faces of the sheet filter cylinder and the mesh cylinder respectively, and the second cover body is formed with at least one opening communicated with the sheet filter cylinder.

Abstract: A control circuit and a method for maintaining light transmittance of an electrochromic device are revealed. An input power source is turned off once a current input into an electrochromic device is decreased to a preset value. Then a voltage between two electrodes of the electrochromic device is detected. When the voltage between two electrodes of the electrochromic device is dropped to a preset value, the input power source is restored. According to the above steps, the coloration of the electrochromic device is maintained within a preset range. Thus light transmittance of the electrochromic device is kept at a certain range.

Abstract: A control circuit and a method for maintaining light transmittance of an electrochromic device are revealed. An input power source is turned off once a current input into an electrochromic device is decreased to a preset value. Then a voltage between two electrodes of the electrochromic device is detected. When the voltage between two electrodes of the electrochromic device is dropped to a preset value, the input power source is restored. According to the above steps, the coloration of the electrochromic device is maintained within a preset range. Thus light transmittance of the electrochromic device is kept at a certain range.

Abstract: The present invention provides an intergrated circuit. The intergrated circuit comprises: a plurality of core power sources; and a plurality of core power domains, coupled to the core power sources, respectively; wherein the core power domains are overlapped with each other.

Abstract: An integrated circuit chip includes a power/ground interconnection network in a topmost metal layer over a semiconductor substrate and at least a bump pad on/over the power/ground interconnection network. The power/ground mesh interconnection network includes a first power/ground line connected to the bump pad and extending along a first direction, and a connection portion connected to the bump pad and extending along a second direction.

Abstract: A method for manufacturing a thin film solar cell device includes forming a back contact layer on a substrate, forming an CIGS absorber layer on the back contact layer, treating the CIGS absorber layer with a metal-based alkaline solution, and forming a buffer layer on the CIGS absorber layer where the treatment of the CIGS absorber layer improves the adhesion between the CIGS absorber layer and the buffer layer and also improves the quality of the p-n junction at the CIGS absorber layer/buffer layer interface.

Abstract: A method for manufacturing a thin film solar cell device includes forming a back contact layer on a substrate, forming an CIGS absorber layer on the back contact layer, treating the CIGS absorber layer with a metal-based alkaline solution, and forming a buffer layer on the CIGS absorber layer where the treatment of the CIGS absorber layer improves the adhesion between the CIGS absorber layer and the buffer layer and also improves the quality of the p-n junction at the CIGS absorber layer/buffer layer interface.

Abstract: A thin film solar cell and process for forming the same. The solar cell includes a bottom electrode layer, semiconductor light absorbing layer, and a TCO top electrode layer. In one embodiment, a TCO seed layer is formed between the top electrode and absorber layers to improve adhesion of the top electrode layer to the absorber layer. In one embodiment, the seed layer is formed at a lower temperature than the TCO top electrode layer and has a different microstructure.

Abstract: A method for forming an opening in a semiconductor device is provided, including: providing a semiconductor substrate with a silicon oxide layer, a polysilicon layer and a silicon nitride layer sequentially formed thereover; patterning the silicon nitride layer, forming a first opening in the silicon nitride layer, wherein the first opening exposes a top surface of the polysilicon layer; performing a first etching process, using gasous etchants including hydrogen bromide (HBr), oxygen (O2), and fluorocarbons (CxFy), forming a second opening in the polysilicon layer, wherein a sidewall of the polysilicon layer adjacent to the second opening is substantially perpendicular to a top surface of the silicon oxide layer, wherein x is between 1-5 and y is between 2-8; removing the silicon nitride layer; and performing a second etching process, forming a third opening in the silicon oxide layer exposed by the second opening.

Abstract: A digital circuit block includes first to fourth conducting segments, a digital logic, first and second conducting layers, and a dielectric layer. The first and second conducting segments are coupled to first and second supply voltages, respectively. The digital logic and dielectric layer are between the first and second conducting segments. The third conducting segment includes a first end electrically connected to the first conducting segment, a second end not electrically connected to the second conducting segment, and a first portion located at the first conducting layer. The fourth conducting segment includes a first end electrically connected to the second conducting segment, a second end not electrically connected to the first conducting segment, and a second portion located at the second conducting layer. The first and second portions and dielectric layer are formed a first capacitive element to reduce the supply voltage drop between the first and second supply voltages.

Abstract: A method for fabricating a fin-shaped semiconductor structure is provided, including: providing a semiconductor substrate with a semiconductor island and a dielectric layer formed thereover; forming a mask layer over the semiconductor island and the dielectric layer; forming an opening in the mask layer, exposing a top surface of the semiconductor island and portions of the dielectric layer adjacent to the semiconductor island; performing an etching process, simultaneously etching portions of the mask layer, and portions of the semiconductor island and the dielectric layer exposed by the opening; and removing the mask layer and the dielectric layer, leaving an etched semiconductor island with curved top surfaces and various thicknesses over the semiconductor substrate.

Abstract: A method of via formation in a semiconductor device includes the following steps of providing a photoresist with a photoresist pattern defining an opening of a via, wherein the photoresist comprising a thermally cross-linking material is disposed on a structure layer; dry-etching the structure layer to a first depth through the opening; baking the thermally cross-linking material to reduce the opening; and dry-etching the structure layer to a second depth through the reduced opening, wherein the second depth is greater than the first depth.

Abstract: A method for fabricating a fin-shaped semiconductor structure is provided, including: providing a semiconductor substrate with a semiconductor island and a dielectric layer formed thereover; forming a mask layer over the semiconductor island and the dielectric layer; forming an opening in the mask layer, exposing a top surface of the semiconductor island and portions of the dielectric layer adjacent to the semiconductor island; performing an etching process, simultaneously etching portions of the mask layer, and portions of the semiconductor island and the dielectric layer exposed by the opening; and removing the mask layer and the dielectric layer, leaving an etched semiconductor island with curved top surfaces and various thicknesses over the semiconductor substrate.

Abstract: An integrated circuit chip includes a power/ground interconnection network in a topmost metal layer over a semiconductor substrate and at least a bump pad on/over the power/ground interconnection network. The power/ground mesh interconnection network includes a first power/ground line connected to the bump pad and extending along a first direction, and a connection portion connected to the bump pad and extending along a second direction.

Abstract: A method for forming an opening in a semiconductor device is provided, including: providing a semiconductor substrate with a silicon oxide layer, a polysilicon layer and a silicon nitride layer sequentially formed thereover; patterning the silicon nitride layer, forming a first opening in the silicon nitride layer, wherein the first opening exposes a top surface of the polysilicon layer; performing a first etching process, using gasous etchants including hydrogen bromide (HBr), oxygen (O2), and fluorocarbons (CxFy), forming a second opening in the polysilicon layer, wherein a sidewall of the polysilicon layer adjacent to the second opening is substantially perpendicular to a top surface of the silicon oxide layer, wherein x is between 1-5 and y is between 2-8; removing the silicon nitride layer; and performing a second etching process, forming a third opening in the silicon oxide layer exposed by the second opening.

Abstract: The present invention relates to a pulse-plasma etching method and apparatus for preparing a depression structure with reduced bowing. The pulse-plasma etching apparatus comprises a container, an upper electrode plate, a lower electrode plate, a gas source, a first ultrahigh RF power supply, a bias RF power supply, and a pulsing module. When the pulsing module supplies an ultrahigh-frequency voltage between the upper electrode plate and the lower electrode plate, an ultrahigh-frequency voltage is switched to the off state, and a large amount of electrons pass through the plasma and reach the substrate to neutralize the positive ions during the duration of the off state (Toff).

Abstract: A method of via formation in a semiconductor device includes the following steps of providing a photoresist with a photoresist pattern defining an opening of a via, wherein the photoresist comprising a thermally cross-linking material is disposed on a structure layer; dry-etching the structure layer to a first depth through the opening; baking the thermally cross-linking material to reduce the opening; and dry-etching the structure layer to a second depth through the reduced opening, wherein the second depth is greater than the first depth.

Abstract: A method for performing pulse-etching in a semiconductor device includes the steps of providing a semiconductor substrate, wherein a metal layer is disposed on the semiconductor substrate, and a hard mask layer is blanketed over the metal layer; introducing the semiconductor substrate into a processing container; introducing, into the processing container, etching gases in which a deposition-type gas composed of at least two of C, H, and F is added to etching gas selected from the group consisting of Cl2 gas, BCl3 gas, HBr gas, and the combination thereof; applying a pulse-modulated high-frequency voltage between a pair of electrodes that are provided in the processing container so as to be opposed to each other and to hold the semiconductor substrate, such that the high-frequency voltage is turned on and off to establish a duty ratio; generating a plasma between the pair of electrodes; and etching the semiconductor substrate using the plasma.