Patents by Inventor Chin-Sun Shyu

Chin-Sun Shyu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6683469
    Abstract: A regulable test IC system for signal noise on the electrical analysis point, comprising: a power supply, for providing a test voltage in the system; a pulse generator, for providing a test frequency in a noise testing of the system; a regulable test IC with different signal pads capable of regulable testing signal noise with the test frequency from the pulse generator and the test voltage from the power supply in a plurality of built-in specific structures, under the basis of an assigned current standard; and a digital detection device with a display, for displaying and recording the result of the regulable test.
    Type: Grant
    Filed: May 17, 2001
    Date of Patent: January 27, 2004
    Assignee: Industrial Technology Research Institute
    Inventors: Min-Lin Lee, Chin-Sun Shyu
  • Publication number: 20030184953
    Abstract: An interleaving striped capacitor substrate structure for pressing-type print circuit boards are disclosed. To achieve the high-frequency, high-speed, and high-density trend in modern electronic systems, the interleaving striped capacitor substrate structure uses several dielectric materials of different dielectric coefficients to make a dielectric layer. According to the practical needs, one or both sides of the dielectric layer is adhered with a conductive metal layer to form a capacitor substrate so that a single capacitor substrate can provide the lower dielectric coefficient substrate required for high-speed signal transmissions and the high dielectric coefficient substrate required by the decoupling capacitor to suppress the high-frequency noise signals. This simultaneously achieves the effects of lowering the high-frequency transmission time and suppressing high-frequency noises.
    Type: Application
    Filed: March 5, 2003
    Publication date: October 2, 2003
    Inventors: Min-Lin Lee, Chin-Sun Shyu, Shur-Fen Liu, Jing-Pin Pan, Jinn-Shing King
  • Publication number: 20020024353
    Abstract: A regulable test IC system for signal noise on the electrical analysis point, comprising: a power supply, for providing a test voltage in the system; a pulse generator, for providing a test frequency in a noise testing of the system; a regulable test IC with different signal pads capable of regulable testing signal noise with the test frequency from the pulse generator and the test voltage from the power supply in a plurality of built-in specific structures, under the basis of an assigned current standard; and a digital detection device with a display, for displaying and recording the result of the regulable test.
    Type: Application
    Filed: May 17, 2001
    Publication date: February 28, 2002
    Inventors: Min-Lin Lee, Chin-Sun Shyu