Patents by Inventor Chuichi Miyazaki
Chuichi Miyazaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6639323Abstract: A semiconductor device including a semiconductor chip having connection terminals in a peripheral part of a main surface thereof; an elastic body disposed on the main surface leaving the connection terminals exposed; an insulating tape formed on the elastic body and having openings in areas where the connection terminals are situated; plural leads formed on the top surface of the insulating tape, one end of each lead being connected to one of the connection terminals and the other end being disposed on the elastic body; plural bump electrodes formed on the other ends of the plural leads; and a resin body for sealing the connection terminals and one end of each of the leads, wherein the insulating tape protrudes beyond the chip where the plural connection terminals are arranged, and wherein the shape of the resin body is restricted by the protruding part of the insulating tape.Type: GrantFiled: October 23, 2001Date of Patent: October 28, 2003Assignees: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd., Akita ELectronics Co., Ltd.Inventors: Yukiharu Akiyama, Tomoaki Kudaishi, Takehiro Ohnishi, Noriou Shimada, Shuji Eguchi, Asao Nishimura, Ichiro Anjo, Kunihiro Tsubosaki, Chuichi Miyazaki, Hiroshi Koyama, Masanori Shibamoto, Akira Nagai, Masahiko Ogino
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Publication number: 20030153127Abstract: Techniques are provided for preventing occurrence of damage to the top surface of a semiconductor chip at the time of die bonding the semiconductor chip by use of a contact collet. A protection tape is pasted to the top surface of the semiconductor chip before die bonding of the semiconductor chip is executed by pressing the back surface (underside) of the semiconductor chip sucked and securely held by the contact collect against respective chip-mounting regions of a multi-wiring board. The contact collect is, for example, substantially cylindrical in outside shape, and a bottom part (suction head) thereof is made of a soft synthetic rubber, and so forth. The protection tape pasted to pasted to the top surface of the semiconductor chip can prevent the top surface of the semiconductor chip from coming in direct contact with the contact collet even at the time of vacuum suction by pressing the suction head of the contact collect against the top surface of the semiconductor chip.Type: ApplicationFiled: January 15, 2003Publication date: August 14, 2003Applicant: Hitachi, Ltd. Hitachi ULSI Systems Co., Ltd.Inventors: Takashi Wada, Kazunari Suzuki, Chuichi Miyazaki, Toshihiro Shiotsuki, Tomoko Higashino
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Publication number: 20030073266Abstract: A semiconductor device according to the invention is TBGA comprised of a semiconductor chip (3) mounted on a wiring board (2) on which plural leads (1) are formed and electrically connected to one end of the lead (1), sealing resin (4) for coating the semiconductor chip (3), a reinforcing frame (5) provided along the periphery of the wiring board and plural solder bumps (6) arranged along the periphery of the wiring board and electrically connected to the other end of the lead (1), and the sealing resin (4) and the reinforcing frame (5) are made of synthetic resin formed by transfer molding.Type: ApplicationFiled: November 25, 2002Publication date: April 17, 2003Applicant: Hitachi, Ltd.Inventors: Noriyuki Takahashi, Seiichi Ichihara, Chuichi Miyazaki
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Patent number: 6521981Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 22, 2001Date of Patent: February 18, 2003Assignee: Hitachi, Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6515371Abstract: A semiconductor device including a semiconductor chip having connection terminals in a peripheral part of a main surface thereof; an elastic body disposed on the main surface leaving the connection terminals exposed; an insulating tape formed on the elastic body and having openings in areas where the connection terminals are situated; plural leads formed on the top surface of the insulating tape, one end of each lead being connected to one of the connection terminals and the other end being disposed on the elastic body; plural bump electrodes formed on the other ends of the plural leads; and a resin body for sealing the connection terminals and one end of each of the leads, wherein the insulating tape protrudes beyond the chip where the plural connection terminals are arranged, and wherein the shape of the resin body is restricted by the protruding part of the insulating tape.Type: GrantFiled: October 23, 2001Date of Patent: February 4, 2003Assignees: Hitachi, Ltd., Hitachi ULSI Systems Co., Ltd., Akita Electronics Co., Ltd.Inventors: Yukiharu Akiyama, Tomoaki Kudaishi, Takehiro Ohnishi, Noriou Shimada, Shuji Eguchi, Asao Nishimura, Ichiro Anjo, Kunihiro Tsubosaki, Chuichi Miyazaki, Hiroshi Koyama, Masanori Shibamoto, Akira Nagai, Masahiko Ogino
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Publication number: 20020158343Abstract: In a semiconductor device having a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 proved on both sides of the core layer as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen a thermal stress generated between the semiconductor device and the package substrate, where a thickness ratio of core layer 1 to total buffer layer is at least 0.2, the production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability.Type: ApplicationFiled: April 30, 2002Publication date: October 31, 2002Inventors: Masahiko Ogino, Shuji Eguchi, Akira Nagai, Takumi Ueno, Masanori Segawa, Hiroyoshi Kokaku, Toshiaki Ishii, Ichiro Anjoh, Asao Nishimura, Chuichi Miyazaki, Mamoru Mita, Norio Okabe
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Publication number: 20020160185Abstract: A semiconductor device having a superior connection reliability is obtained by providing a buffer body for absorbing the difference of thermal expansion between the mounting substrate and the semiconductor element in a semiconductor package structure, even if an organic material is used for the mounting substrate. A film material is used as the body for buffering the thermal stress generated by the difference in thermal expansion between the mounting substrate and the semiconductor element. The film material has modulus of elasticity of at least 1 MPa in the reflow temperature range (200-250° C.).Type: ApplicationFiled: May 6, 2002Publication date: October 31, 2002Inventors: Akira Nagai, Shuji Eguchi, Masahiko Ogino, Masanori Segawa, Toshiak Ishii, Nobutake Tsuyuno, Hiroyoshi Kokaku, Rie Hattori, Makoto Morishima, Ichiro Anjoh, Kunihiro Tsubosaki, Chuichi Miyazaki, Makoto Kitano, Mamoru Mita, Norio Okabe
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Patent number: 6472727Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 30, 2001Date of Patent: October 29, 2002Assignees: Hitachi, Ltd., Hitahi Microcomputer System, Ltd, Hitachi ULSI Engineering Corp.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Publication number: 20020149027Abstract: A semiconductor device comprising a semiconductor chip, a wiring substrate provided surrounding the semiconductor chip, leads projected from the wiring substrate and connected to the semiconductor chip, a stiffening member provided on one main surface of the wiring substrate, surrounding-the semiconductor chip, a plurality of bumps provided along a periphery of the wiring substrate on another main surface of the wiring substrate opposite to the main surface where the stiffening member is provided, and resin covering the semiconductor chip and the leads. The leads connected to the semiconductor chip are bend-processed toward a side where the stiffening member of the wiring substrate is provided or a side where the plurality of bumps are formed. The leads and the semiconductor chip are connected such that the surface of the semiconductor chip opposite to the surface connected to the leads is positioned on a side opposite to the side where the leads are bend-processed.Type: ApplicationFiled: September 17, 1999Publication date: October 17, 2002Inventors: NORIYUKI TAKAHASHI, SEIICHI ICHIHARA, CHUICHI MIYAZAKI
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Patent number: 6433440Abstract: In a semiconductor device having a three-layered buffer layer comprising core layer 1 having interconnected foams such as a three-dimensional reticular structure and adhesive layers 2 provided on both sides of the core layer as a stress buffer layer between semiconductor chip 5 and wiring 4 to lessen a thermal stress generated between the semiconductor device and the package substrate, where a thickness ratio of core layer 1 to total buffer layer is at least 0.2, the production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability.Type: GrantFiled: June 5, 1998Date of Patent: August 13, 2002Assignees: Hitachi, Ltd., Hitachi Cable, Ltd.Inventors: Masahiko Ogino, Shuji Eguchi, Akira Nagai, Takumi Ueno, Masanori Segawa, Hiroyoshi Kokaku, Toshiaki Ishii, Ichiro Anjoh, Asao Nishimura, Chuichi Miyazaki, Mamoru Mita, Norio Okabe
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Publication number: 20020070461Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: ApplicationFiled: January 30, 2002Publication date: June 13, 2002Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Publication number: 20020068380Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: ApplicationFiled: January 30, 2002Publication date: June 6, 2002Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Publication number: 20020066181Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: ApplicationFiled: January 30, 2002Publication date: June 6, 2002Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Publication number: 20020064901Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: ApplicationFiled: January 30, 2002Publication date: May 30, 2002Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Publication number: 20020050636Abstract: A semiconductor device including a semiconductor chip having connection terminals in a peripheral part of a main surface thereof; an elastic body disposed on the main surface leaving the connection terminals exposed; an insulating tape formed on the elastic body and having openings in areas where the connection terminals are situated; plural leads formed on the top surface of the insulating tape, one end of each lead being connected to one of the connection terminals and the other end being disposed on the elastic body; plural bump electrodes formed on the other ends of the plural leads; and a resin body for sealing the connection terminals and one end of each of the leads, wherein the insulating tape protrudes beyond the chip where the plural connection terminals are arranged, and wherein the shape of the resin body is restricted by the protruding part of the insulating tape.Type: ApplicationFiled: October 23, 2001Publication date: May 2, 2002Inventors: Yukiharu Akiyama, Tomoaki Kudaishi, Takehiro Ohnishi, Noriou Shimada, Shuji Eguchi, Asao Nishimura, Ichiro Anjo, Kunihiro Tsubosaki, Chuichi Miyazaki, Hiroshi Koyama, Masanori Shibamoto, Akira Nagai, Masahiko Ogino
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Publication number: 20020047215Abstract: A semiconductor device including a semiconductor chip having connection terminals in a peripheral part of a main surface thereof; an elastic body disposed on the main surface leaving the connection terminals exposed; an insulating tape formed on the elastic body and having openings in areas where the connection terminals are situated; plural leads formed on the top surface of the insulating tape, one end of each lead being connected to one of the connection terminals and the other end being disposed on the elastic body; plural bump electrodes formed on the other ends of the plural leads; and a resin body for sealing the connection terminals and one end of each of the leads, wherein the insulating tape protrudes beyond the chip where the plural connection terminals are arranged, and wherein the shape of the resin body is restricted by the protruding part of the insulating tape.Type: ApplicationFiled: October 23, 2001Publication date: April 25, 2002Inventors: Yukiharu Akiyama, Tomoaki Kudaishi, Takehiro Ohnishi, Noriou Shimada, Shuji Eguchi, Asao Nishimura, Ichiro Anjo, Kunihiro Tsubosaki, Chuichi Miyazaki, Hiroshi Koyama, Masanori Shibamoto, Akira Nagai, Masahiko Ogino
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Patent number: 6365439Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 29, 2001Date of Patent: April 2, 2002Assignee: Hitachi, Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6355500Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 25, 2001Date of Patent: March 12, 2002Assignee: Hitachi. Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6355975Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 30, 2001Date of Patent: March 12, 2002Assignee: Hitachi, Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe
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Patent number: 6353255Abstract: A ball grid array type semiconductor package includes a semiconductor chip formed with bonding pads, an elastomer bonded to the semiconductor chip, a flexible wiring substrate bonded to the elastomer and formed with wirings connected at one end of the bonding pads of the semiconductor chip, a solder resist formed on the main surface of the flexible wiring substrate and solder bump electrodes connected to the other ends of the wirings. The elastomer is bonded to the flexible wiring substrate on the side of the tape, the solder resist is formed on the side of the wirings, and the solder bump electrodes are connected with the wirings by way of through holes formed in the solder resist.Type: GrantFiled: January 19, 2001Date of Patent: March 5, 2002Assignee: Hitachi, Ltd.Inventors: Chuichi Miyazaki, Yukiharu Akiyama, Masanori Shibamoto, Tomoaki Kudaishi, Ichiro Anjoh, Kunihiko Nishi, Asao Nishimura, Hideki Tanaka, Ryosuke Kimoto, Kunihiro Tsubosaki, Akio Hasebe