Abstract: Memory space management and memory access control method and apparatus are provided. The method includes: upon receiving an access request, acquiring an access address and an accessor identifier in the access request; checking a current state of a memory space pointed by the access address to obtain a check result, wherein the state of the memory space includes a first state and a second state; determining whether the accessor identifier belongs to an access permission set among a plurality of access permission sets that corresponds to the check result; and generating an instruction according to the check result, wherein the instruction indicates whether or not the accessor is permitted to access the memory space. With the above method, the invention reduces resource waste and system costs.

Abstract: An apparatus for managing a memory having a plurality of command/address pins is provided. The apparatus includes a command generating module and a control module. The command generating module generates a set of target commands. The set of target commands include a plurality of command groups. Each of the command groups corresponds to at least one command/address pin of the plurality of command/address pins. It is known that the memory accesses the set of target commands from the plurality of command/address pins at a target time point. The control module controls the command groups to have different transition times prior to the target time points when the command groups are transmitted on the plurality of command/address pins.

Abstract: A memory self-testing device for testing a plurality of memory control units includes: a test control unit, coupled to the memory control units, generating a plurality of access request signals and a plurality of sets of data; a channel control unit, coupled to the test control unit and the memory control units, determining a leading feedback signal among a plurality of feedback signals; and a data control unit, coupled to the test control unit and the memory control units, storing the sets of data, and transmitting the sets of data to the memory control units according to a plurality of read/write signals. The feedback signals and the read/write signals are generated by the memory control units in response to the access request signals. The test control units generate the sets of data according to the leading feedback signal.

Abstract: A memory test data generating circuit and method for generating a plurality of sets of test data is provided. The plurality of sets of test data is provided to a memory via a plurality of channels by a memory controller and is for testing the memory. The memory test data generating circuit includes: a plurality of counters, generating a plurality of counter values; and a data repetition and combination unit, generating the plurality of sets of test data according to the plurality of counter values, a bit width between the memory test data generating circuit and the memory controller, and a bit width between the memory controller and the memory. The test data of each channel is an identical and periodical data series.

Abstract: A timing controller for a panel display system includes: an image signal receiver that receives an image signal; an overdrive circuit that receives and converts the image signal from the image signal receiver according to successive first frame data and second frame data in the image signal; an image signal transmitter that receives the converted image signal from the overdrive circuit and transmits the same to a display panel; a memory; and a memory interface unit. In a normal read/write period, the memory interface unit receives the first frame data from the overdrive circuit and stores the same in the memory, and fetches the first frame data from the memory when the overdrive circuit receives the second frame data in the image signal and transmits the same to the overdrive circuit. The memory interface unit further obtains sampling results to generate a preferred delay phase.

Abstract: A memory self-testing device for testing a plurality of memory control units includes: a test control unit, coupled to the memory control units, generating a plurality of access request signals and a plurality of sets of data; a channel control unit, coupled to the test control unit and the memory control units, determining a leading feedback signal among a plurality of feedback signals; and a data control unit, coupled to the test control unit and the memory control units, storing the sets of data, and transmitting the sets of data to the memory control units according to a plurality of read/write signals. The feedback signals and the read/write signals are generated by the memory control units in response to the access request signals. The test control units generate the sets of data according to the leading feedback signal.

Abstract: A memory controller and an associated signal generating method are provided. A generating sequence of commands is properly arranged to enlarge latching intervals of an address signal and a bank signal for stable access of a DDR memory module.

Abstract: A memory controller is connected to a double-data-rate dynamic random access memory (DDR DRAM) and an accessing unit. The memory controller includes: a processing unit, configured to receive a system address generated by the accessing unit; and a mapping unit, located in the processing unit, configured to convert the system address to a memory address and transmitting the memory address to the DDR DRAM. When a burst length of the DDR DRAM is L and L=2x (where L and x are positive integers), an (x+1)th bit of the memory address from a least significant bit (LSB) is included in a bank group address of the memory address.

Abstract: The invention is directed to a memory controller and an associated signal generating method. By appropriately arranging a sequence according to which command signals are generated and expanding a latching interval of a part of address signals, not only the memory controller is enabled to control the DDR memory modules in a functional manner to further overcome issues of conventionally small latching intervals, but also system stability and access performance are reinforced as the memory access clock speed continue to increase.

Abstract: A dynamic memory signal phase tracking method is provided. The method, applied to a memory controller that accesses a memory module, includes: issuing a memory access command and an access request to an arbiter to request for an access right of the memory module; when the access right is obtained, forwarding the memory access command to the memory module and asserting a flag signal; during a period of asserting the flag signal, sequentially using a plurality of candidate delay phases to adjust a memory signal for latching test data from the memory module, determining a delay phase according to latching results corresponding to the candidate delay phases, and recording the determined delay phases; updating an optimal delay phase according to the determined delay phase; and accessing the memory module according to the updated optimal delay phase.

Abstract: An apparatus for managing a memory having a plurality of command/address pins is provided. The apparatus includes a command generating module and a control module. The command generating module generates a set of target commands. The set of target commands include a plurality of command groups. Each of the command groups corresponds to at least one command/address pin of the plurality of command/address pins. It is known that the memory accesses the set of target commands from the plurality of command/address pins at a target time point. The control module controls the command groups to have different transition times prior to the target time points when the command groups are transmitted on the plurality of command/address pins.

Abstract: A timing controller for a panel display system includes: an image signal receiver that receives an image signal; an overdrive circuit that receives and converts the image signal from the image signal receiver according to successive first frame data and second frame data in the image signal; an image signal transmitter that receives the converted image signal from the overdrive circuit and transmits the same to a display panel; a memory; and a memory interface unit. In a normal read/write period, the memory interface unit receives the first frame data from the overdrive circuit and stores the same in the memory, and fetches the first frame data from the memory when the overdrive circuit receives the second frame data in the image signal and transmits the same to the overdrive circuit. The memory interface unit further obtains sampling results to generate a preferred delay phase.

Abstract: A dynamic memory signal phase tracking method is provided. The method, applied to a memory controller that accesses a memory module, includes: issuing a memory access command and an access request to an arbiter to request for an access right of the memory module; when the access right is obtained, forwarding the memory access command to the memory module and asserting a flag signal; during a period of asserting the flag signal, sequentially using a plurality of candidate delay phases to adjust a memory signal for latching test data from the memory module, determining a delay phase according to latching results corresponding to the candidate delay phases, and recording the determined delay phases; updating an optimal delay phase according to the determined delay phase; and accessing the memory module according to the updated optimal delay phase.

Abstract: A memory controller and an associated signal generating method are provided. A generating sequence of commands is properly arranged to enlarge latching intervals of an address signal and a bank signal for stable access of a DDR memory module.

Abstract: A chip with flexible pad sequence manipulation is provided. The chip can be a memory controller, and includes a hub unit. The hub unit, formed by a gate array, is placed in a hub region predetermined during placing and routing procedures, and is capable of supporting re-placing and re-routing for changing interior interconnections and a pad sequence of the chip.

Abstract: The invention is directed to a memory controller and an associated signal generating method. By appropriately arranging a sequence according to which command signals are generated and expanding a latching interval of a part of address signals, not only the memory controller is enabled to control the DDR memory modules in a functional manner to further overcome issues of conventionally small latching intervals, but also system stability and access performance are reinforced as the memory access clock speed continue to increase.

Abstract: A memory controller is connected to a double-data-rate dynamic random access memory (DDR DRAM) and an accessing unit. The memory controller includes: a processing unit, configured to receive a system address generated by the accessing unit; and a mapping unit, located in the processing unit, configured to convert the system address to a memory address and transmitting the memory address to the DDR DRAM. When a burst length of the DDR DRAM is L and L=2x (where L and x are positive integers), an (x+1)th bit of the memory address from a least significant bit (LSB) is included in a bank group address of the memory address.

Abstract: A multi-core electronic system for accessing a data storage device includes a plurality of processors, a data transmission interface and a rate adjustment module. The processors respectively provide a bandwidth requirement, and communicate with the data storage device via the shared data transmission interface. The rate adjustment module receives the bandwidth requirements, and determines a transmission rate of the data transmission interface according to the bandwidth requirements.

Abstract: A DRAM controller including a judging module, a determination module, and a transmission module is provided. The judging module judges an address content difference between a first command and a third command. The determination module determines a plurality of buffering address contents, associated with at least one second command, according to the address content difference. The transmission module then sequentially transmits the first command, the at least one second command, and the third command to the DRAM.

Abstract: A built-in self-test circuit (BIST) applied to a high speed I/O port is provided. The BIST circuit includes a detecting unit, a flag unit and a selecting unit. The detecting unit has a first input terminal for receiving a serial output signal, a second input terminal for receiving a serial enable signal, and an output terminal for generating a detection signal. The flag unit receives the detection signal and generates a flag signal. The selecting unit receives the serial output signal, the serial enable signal and the flag signal. When a reset signal is at a first level, the selecting unit transmits the serial output signal and the serial enable signal to the I/O port. When the reset signal is at a second level, the serial output signal and the serial enable signal possesses a predetermined relationship.