Abstract: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals associated with the light; (c) a second filter for receiving light from the first filter and adapted to direct the light toward a specimen; and (d) focusing apparatus for receiving the light from the second filter, focusing the light on the specimen so as to generate the Raman signal, and returning the Raman signal to the second filter. The second filter is further configured so that when the second filter receives the Raman signal from the focusing apparatus, the second filter filters out unwanted laser excitation light before directing the Raman signal to a second optical fiber.

Abstract: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals associated with the light; (c) a second filter for receiving light from the first filter and adapted to direct the light toward a specimen; and (d) focusing apparatus for receiving the light from the second filter, focusing the light on the specimen so as to generate the Raman signal, and returning the Raman signal to the second filter. The second filter is further configured so that when the second filter receives the Raman signal from the focusing apparatus, the second filter filters out unwanted laser excitation light before directing the Raman signal to a second optical fiber.

Abstract: A Raman probe system includes: a base station; a mobile robot remotely controllable from the base station; a Raman probe assembly supported by the robot, the Raman probe assembly including a laser and a spectrometer; a camera supported by the robot; and a communication subsystem operable to communicate images from the camera and results from the Raman probe assembly to the base station. In some embodiments, a Raman probe system includes: a mobile robot remotely controllable from a base station, the robot including a body and an articulated arm; a camera supported by the robot; a Raman probe assembly supported by the robot, the optical control assembly mounted on the body of the robot; and an optical probe mounted on the articulated arm of the robot; and a wireless communication system operable to communicate images from the camera and results from the Raman probe assembly to the base station.

Abstract: A spectrometer comprising a collimating element for receiving input light and collimating the same, a dispersive optical element for receiving light from the collimating element and dispersing the same and a focusing element for receiving light from the dispersive optical element and focusing the same on a detector assembly wherein, where the wavelength dispersion of the dispersed light extends in the x-y direction, the collimating element and the focusing element are formed so as to maintain the desired optical parameters in the x-y plane while having a reduced size in the z direction.

Abstract: We disclose an apparatus comprising: a hand-portable optical analysis unit including an optical interface; and a device configured to receive and releasably engage the hand-portable optical analysis unit. The device comprises: a housing; a sample unit in the housing; and a resilient member configured to bias the sample unit and the hand-portable analysis unit towards each other when the hand-portable optical analysis unit is received in the device to compress a sample disposed between the sample unit and the optical interface of the optical analysis unit. Methods of analyzing samples are also disclosed.

Abstract: Apparatus and methods are disclosed for precision alignment and assembly of opto-electronic components relative to one another.

Abstract: A Raman probe assembly comprises: a light source for generating laser excitation light; a camera for capturing an image; a light analyzer for analyzing a Raman signature; and a light path for (i) delivering the laser excitation light from the light source to the specimen so as to produce the Raman signature for the specimen, (ii) capturing an image of the specimen and directing that image to the camera, and (iii) directing the Raman signature of the specimen to the light analyzer. A method includes providing a Raman probe assembly carried by a remote controlled robot; navigating the remote control robot to a position adjacent to a specimen; opening a shutter/wiper disposed adjacent to a window of the Raman analyzer; using a camera to aim the probe body at the specimen; energizing a light source; and analyzing the return light passed to the light analyzer.

Abstract: An optical probe assembly includes a light guide that includes a core region and a surrounding cladding region. The core region is constructed so as to minimize the creation of a relatively broadband spurious background noise signal when conveying the Raman pump light to the specimen, and the cladding region is constructed so as to satisfy the wave guiding reflection requirements of the Raman pump light and the Raman signature. A Raman spectroscopy system includes: a laser for producing Raman pump light; an optical probe assembly; and an optical spectrum analyzer for receiving the Raman signature of a specimen and identifying and characterizing the specimen based upon the spectrum of the Raman signature. Related methods are also disclosed.

Abstract: The present invention provides a novel approach for reliably and accurately detecting and identifying airborne particles. This is done by providing a novel system which incorporates electrostatic concentrators and/or ion mobility separators with Raman, IR, UV, XRF, LIF and LIBS spectroscopy and/or other spectroscopic techniques.

Abstract: Apparatus and methods are disclosed for precision alignment and assembly of opto-electronic components relative to one another.

Abstract: We disclose apparatus that includes: (a) an enclosure including an aperture; (b) a prism mounted in the enclosure so that a surface of the prism is exposed through the aperture; (c) an optical assembly contained within the enclosure, the optical assembly including a radiation source and a radiation detector, the source being configured to direct radiation towards the prism and the detector being configured to detect radiation from the source reflected from the exposed surface of the prism; and (d) an electronic processor contained within the enclosure, the electronic processor being in communication with the detector. The apparatus can be configured so that, during operation, the electronic processor determines information about a sample placed in contact with the exposed surface of the prism based on radiation reflected from the exposed prism surface while it is in contact with the sample.

Abstract: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals associated with the light; (c) a second filter for receiving light from the first filter and adapted to direct the light toward a specimen; and (d) focusing apparatus for receiving the light from the second filter, focusing the light on the specimen so as to generate the Raman signal, and returning the Raman signal to the second filter. The second filter is further configured so that when the second filter receives the Raman signal from the focusing apparatus, the second filter filters out unwanted laser excitation light before directing the Raman signal to a second optical fiber.

Abstract: Apparatus and methods for alignment and assembly of opto-electronic components relative to one another are disclosed. One apparatus comprises an optical component having a periphery forming at least one flat surface; a holding block having at least one attachment region corresponding to the at least one flat surface of the selected optical component; a positioning mechanism having a first portion and a second portion, the first portion configured to position the selected optical component relative to another opto-electronic component, and the second portion configured to position the holding block relative to the selected optical component and in contact with a platform in attachment with the another opto-electronic component; and an attachment component disposed between the selected optical component and the holding block, and the attachment component disposed between the holding block and the platform so as to fix the selected optical component in position relative to the another opto-electronic component.

Abstract: A spectrometer comprising a collimating element for receiving input light and collimating the same, a dispersive optical element for receiving light from the collimating element and dispersing the same and a focusing element for receiving light from the dispersive optical element and focusing the same on a detector assembly wherein, where the wavelength dispersion of the dispersed light extends in the x-y direction, the collimating element and the focusing element are formed so as to maintain the desired optical parameters in the x-y plane while having a reduced size in the z direction.

Abstract: Semiconductor substrate is disclosed having quantum wells having first bandgap, and quantum wells having second bandgap greater than first bandgap. Semiconductor structure is disclosed comprising substrate having quantum wells having given bandgap, other quantum wells modified to bandgap greater than given bandgap. Semiconductor substrate is disclosed comprising wafer having quantum wells, section of first bandgap, and section of second bandgap greater than first bandgap. Method for forming semiconductor substrate is provided, comprising providing wafer having given bandgap, depositing dielectric cap on portion and rapid thermal annealing to tuned bandgap greater than given bandgap. Semiconductor structure is disclosed comprising substrate having quantum wells modified by depositing cap and rapid thermal annealing to tuned bandgap greater than given bandgap.

Abstract: Semiconductor substrate is disclosed having quantum wells having first bandgap, and quantum wells having second bandgap less than second bandgap. Semiconductor structure is disclosed comprising substrate having quantum wells having given bandgap, other quantum wells modified to bandgap greater than given bandgap. Semiconductor substrate is disclosed comprising wafer having quantum wells, section of first bandgap, and section of second bandgap greater than first bandgap. Method for forming semiconductor substrate is provided, comprising providing wafer having given bandgap, depositing dielectric cap on portion and rapid thermal annealing to tuned bandgap greater than given bandgap. Semiconductor structure is disclosed comprising substrate having quantum wells modified by depositing cap and rapid thermal annealing to tuned bandgap greater than given bandgap.

Abstract: Disclosed herein are Raman probes that include: (a) a first optical fiber for receiving laser excitation light from a light source and transmitting the same; (b) a first filter for receiving light from the first optical fiber and adapted to pass the laser excitation light and to block spurious signals associated with the light; (c) a second filter for receiving light from the first filter and adapted to direct the light toward a specimen; and (d) focusing apparatus for receiving the light from the second filter, focusing the light on the specimen so as to generate the Raman signal, and returning the Raman signal to the second filter. The second filter is further configured so that when the second filter receives the Raman signal from the focusing apparatus, the second filter filters out unwanted laser excitation light before directing the Raman signal to a second optical fiber.

Abstract: An assembly is disclosed for optical components, the assembly comprising: a platform for receiving and supporting a plurality of carrier components having optical components mounted thereon; carrier component receiving stations formed on the platform, each of the stations being adapted to receive and retain one of the carrier components; a first one of the carrier components having a light beam outlet; and a second one of the carrier components having a light beam receiving port, wherein the optical component receiving stations are disposed to position the first one of the components and second one of the components relative to one another such that the light beam outlet and the light beam receiving port are in alignment with one another.

Abstract: A spectrometer comprising a collimating element for receiving input light and collimating the same, a dispersive optical element for receiving light from the collimating element and dispersing the same and a focusing element for receiving light from the dispersive optical element and focusing the same on a detector assembly wherein, where the wavelength dispersion of the dispersed light extends in the x-y direction, the collimating element and the focusing element are formed so as to maintain the desired optical parameters in the x-y plane while having a reduced size in the z direction.

Abstract: A laser package comprising a semiconductor laser having an operating temperature range and a heater, wherein the heater is configured to heat the laser when the laser package is positioned in an environment having an ambient temperature which lies outside of the operating temperature range of the laser, so that the laser will remain within the operating temperature range.