Patents by Inventor David Eggleston

David Eggleston has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8677109
    Abstract: Non-volatile memory devices and methods of their operation are provided. One such non-volatile memory device has an interface and a control circuit. The non-volatile memory device is adapted to identify itself as a boot memory in response to receiving an interrogation request on the interface.
    Type: Grant
    Filed: November 22, 2010
    Date of Patent: March 18, 2014
    Assignee: Micron Technology, Inc.
    Inventors: Cliff Zitlaw, Frankie F. Roohparvar, David Eggleston
  • Patent number: 8638584
    Abstract: Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement memory architectures configured to enhance throughput for cross point arrays including memory elements, such as memory elements based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes arrays that include memory elements being formed BEOL above a FEOL logic layer within a boundary in a plane parallel to a substrate, and array lines. Further, the integrated circuit includes array line decoders disposed in the logic layer within a region located coextensive with the boundary and between the substrate and the arrays. In some embodiments, the disposition of peripheral circuitry, such as the array line decoders, under the arrays can preserve or optimize die efficiency for throughput enhancement.
    Type: Grant
    Filed: February 2, 2010
    Date of Patent: January 28, 2014
    Assignee: Unity Semiconductor Corporation
    Inventors: Christophe Chevallier, Sri Rama Namala, Chang Hua Siau, David Eggleston
  • Publication number: 20140019826
    Abstract: Split data error correction code (ECC) circuits including a control circuit coupled to an error correction code (ECC) circuit. The ECC circuit is adapted to generate at least one ECC code from user data of a first physical sector during a data access. The split data ECC circuit is adapted to write the at least one ECC code to a second physical sector if the data access is a write access and to compare the at least one generated ECC code with at least one ECC code stored in a second physical sector if the data access is a read access.
    Type: Application
    Filed: September 16, 2013
    Publication date: January 16, 2014
    Applicant: Micron Technology, Inc.
    Inventors: David Eggleston, Anthony Moschopoulos, Michael Murray, Brady Keays
  • Patent number: 8610099
    Abstract: In an example, a single damascene structure is formed by, for example, providing a dielectric layer, forming a void in the dielectric layer, and forming a portion of a first two-terminal resistive memory cell and a portion of a second two-terminal resistive memory cell within the void. The portions of the two-terminal resistive memory cells may be vertically stacked within the void.
    Type: Grant
    Filed: August 15, 2012
    Date of Patent: December 17, 2013
    Assignee: Unity Semiconductor Corporation
    Inventors: Lidia Vereen, Bruce Bateman, Louis Parrillo, Elizabeth Friend, David Eggleston
  • Patent number: 8537614
    Abstract: A Flash memory device, system, and data handling routine is detailed with a distributed erase block sector user/overhead data scheme that splits the user data and overhead data and stores them in differing associated erase blocks. The erase blocks of the Flash memory are arranged into associated erase block pairs in “super blocks” such that when user data is written to/read from the user data area of a sector of an erase block of the super block pair, the overhead data is written to/read from the overhead data area of a sector of the other associated erase block. This data splitting enhances fault tolerance and reliability of the Flash memory device.
    Type: Grant
    Filed: May 16, 2011
    Date of Patent: September 17, 2013
    Assignee: Micron Technology, Inc.
    Inventors: David Eggleston, Anthony Moschopoulos, Michael Murray, Brady Keays
  • Publication number: 20130207066
    Abstract: In an example, a single damascene structure is formed by, for example, providing a dielectric layer, forming a void in the dielectric layer, and forming a portion of a first two-terminal resistive memory cell and a portion of a second two-terminal resistive memory cell within the void. The portions of the two-terminal resistive memory cells may be vertically stacked within the void.
    Type: Application
    Filed: August 15, 2012
    Publication date: August 15, 2013
    Applicant: Unity Semiconductor Corporation
    Inventors: Lidia Vereen, Bruce Bateman, Louis Parrillo, Elizabeth Friend, David Eggleston
  • Publication number: 20130210211
    Abstract: A method of manufacturing a memory structure includes forming a plurality of vertically-stacked horizontal line layers, interleaving a plurality of electrically conductive vertical lines with the electrically conductive horizontal lines, and forming a memory film at and between intersections of the electrically conductive vertical lines and the horizontal lines. In one embodiment of the invention, the electrically conductive vertical lines are interleaved with the horizontal lines such that a row of vertical lines is positioned between each horizontally-adjacent pair of horizontal lines in each horizontal line layer. By configuring the electrically conductive vertical lines and electrically conductive horizontal lines so that a row of vertical lines is positioned between each horizontally-adjacent pair of horizontal lines, a unit memory cell footprint of just 2F2 may be realized.
    Type: Application
    Filed: August 15, 2012
    Publication date: August 15, 2013
    Inventors: Lidia Vereen, Bruce Bateman, David Eggleston, Louis Parrillo
  • Publication number: 20130082228
    Abstract: A memory element (ME) including at least one layer of conductive metal oxide (CMO) that includes mobile oxygen ions and including at least two layers of insulating metal oxide (IMO) is disclosed. In one configuration a layer of IMO that is directly in contact with a CMO layer is specifically selected so that a material of the IMO layer is non-reactive with a material of the CMO. In another configuration, at least one pair of adjacent IMO layers are made from materials having different band gaps operative to an generate an internal electric field positioned in the layers and present in the at least two adjacent IMO layers in the absence of electrical power. The internal electric field can be a static electric field. The IMO and/or CMO layers can be deposited in part or in whole using ALD, PEALD, or nano-deposition. The ME can be formed BEOL.
    Type: Application
    Filed: September 30, 2011
    Publication date: April 4, 2013
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventors: LOUIS PARRILLO, RENE MEYER, JIAN WU, DAVID EGGLESTON, LIDIA VEREEN
  • Publication number: 20110243730
    Abstract: A system and a method for measuring deflection of a shaft in a wind turbine and adjusting a pitch angle of a rotor blade in the wind turbine based on the determined deflection are described. The system includes an emitter, a receiver, and a controller. The emitter is positioned adjacent a first portion of the shaft and is configured to emit photons. The receiver is positioned adjacent a second portion of the shaft and is configured to receive photons emitted from the emitter and determine a location on the receiver where the photons strike the receiver. The controller is communicatively coupled to the receiver and is configured to determine deflection of the shaft based on the location on the receiver where the photons strike the receiver. The controller is also configured to adjust the pitch angle of the rotor blade based on the determined deflection of the shaft to reduce deflection of the shaft.
    Type: Application
    Filed: December 14, 2010
    Publication date: October 6, 2011
    Inventor: Eric David Eggleston
  • Publication number: 20110219178
    Abstract: A Flash memory device, system, and data handling routine is detailed with a distributed erase block sector user/overhead data scheme that splits the user data and overhead data and stores them in differing associated erase blocks. The erase blocks of the Flash memory are arranged into associated erase block pairs in “super blocks” such that when user data is written to/read from the user data area of a sector of an erase block of the super block pair, the overhead data is written to/read from the overhead data area of a sector of the other associated erase block. This data splitting enhances fault tolerance and reliability of the Flash memory device.
    Type: Application
    Filed: May 16, 2011
    Publication date: September 8, 2011
    Inventors: David Eggleston, Anthony Moschopoulos, Michael Murray, Brady Keays
  • Publication number: 20110188282
    Abstract: Embodiments of the invention relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement memory architectures configured to enhance throughput for cross point arrays including memory elements, such as memory elements based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes arrays that include memory elements being formed BEOL above a FEOL logic layer within a boundary in a plane parallel to a substrate, and array lines. Further, the integrated circuit includes array line decoders disposed in the logic layer within a region located coextensive with the boundary and between the substrate and the arrays. In some embodiments, the disposition of peripheral circuitry, such as the array line decoders, under the arrays can preserve or optimize die efficiency for throughput enhancement.
    Type: Application
    Filed: February 2, 2010
    Publication date: August 4, 2011
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventors: Christophe J. Chevallier, Sri Namala, Chang Hua Siau, David Eggleston
  • Patent number: 7944748
    Abstract: A Flash memory device, system, and data handling routine is detailed with a distributed erase block sector user/overhead data scheme that splits the user data and overhead data and stores them in differing associated erase blocks. The erase blocks of the Flash memory are arranged into associated erase block pairs in “super blocks” such that when user data is written to/read from the user data area of a sector of an erase block of the super block pair, the overhead data is written to/read from the overhead data area of a sector of the other associated erase block. This data splitting enhances fault tolerance and reliability of the Flash memory device.
    Type: Grant
    Filed: May 21, 2009
    Date of Patent: May 17, 2011
    Assignee: Micron Technology, Inc.
    Inventors: David Eggleston, Anthony Moschopoulos, Michael Murray, Brady Keays
  • Publication number: 20110113163
    Abstract: There is provided a method and apparatus for bus negotiation. One such method includes determining a configuration of a first bond pad, the first bond pad indicating whether a host is configured to communicate with a fixed data storage device or a removable data storage device. If the first bond pad indicates the host is configured to communicate with a fixed data storage device, then the method additionally includes determining the configuration of a second bond pad. The second bond pad indicates the supported bus width of the fixed data storage device.
    Type: Application
    Filed: January 19, 2011
    Publication date: May 12, 2011
    Applicant: Micron Technology, Inc.
    Inventor: David Eggleston
  • Publication number: 20110113306
    Abstract: Data move operations in a memory device are described that enable identification of data errors. Error detection circuitry in the memory device can be operated using parity data or ECC data stored in the memory. Results of the error detection can be accessed by a memory controller for data repair operations by the controller.
    Type: Application
    Filed: January 17, 2011
    Publication date: May 12, 2011
    Inventors: David Eggleston, Bill Radke
  • Publication number: 20110066816
    Abstract: Non-volatile memory devices and methods of their operation are provided. One such non-volatile memory device has an interface and a control circuit. The non-volatile memory device is adapted to identify itself as a boot memory in response to receiving an interrogation request on the interface.
    Type: Application
    Filed: November 22, 2010
    Publication date: March 17, 2011
    Inventors: Cliff Zitlaw, Frankie F. Roohparvar, David Eggleston
  • Patent number: 7877669
    Abstract: Data move operations in a memory device are described that enable identification of data errors. Error detection circuitry in the memory device can be operated using parity data or ECC data stored in the memory. Results of the error detection can be accessed by a memory controller for data repair operations by the controller.
    Type: Grant
    Filed: April 17, 2009
    Date of Patent: January 25, 2011
    Assignee: Micron Technology, Inc.
    Inventors: David Eggleston, Bill Radke
  • Patent number: 7877530
    Abstract: There is provided a method and apparatus for bus negotiation. One such method includes determining a configuration of a first bond pad, the first bond pad indicating whether a host is configured to communicate with a fixed data storage device or a removable data storage device. If the first bond pad indicates the host is configured to communicate with a fixed data storage device, then the method additionally includes determining the configuration of a second bond pad. The second bond pad indicates the supported bus width of the fixed data storage device.
    Type: Grant
    Filed: November 16, 2009
    Date of Patent: January 25, 2011
    Assignee: Micron Technology, Inc
    Inventor: David Eggleston
  • Patent number: 7844811
    Abstract: A synchronous Flash memory device is described that enhances initialization and boot memory device identification in synchronous memory systems. A boot memory is typically a separate device that is tied to a specific chip select line and/or address range of a system, whereas synchronous Flash memory generally can be placed in any available memory slot and assigned one of several possible chip selects and address ranges. This lack of predictability makes installing a boot memory based on a non-volatile synchronous memory device difficult. A synchronous Flash boot memory device of the detailed invention is adapted to identify itself and its chip select/address range to the memory controller at power up, reset, or upon receiving an identification request. This allows the utilization of the detailed synchronous Flash memory as a boot memory in synchronous systems where a reserved boot memory slot and/or chip select are not provided.
    Type: Grant
    Filed: August 23, 2007
    Date of Patent: November 30, 2010
    Assignee: Micron Technology, Inc.
    Inventors: Cliff Zitlaw, Frankie F. Roohparvar, David Eggleston
  • Publication number: 20100195393
    Abstract: A data storage system for refreshing in place data stored in a non-volatile re-writeable memory is disclosed. Data from a location memory can be read into a temporary storage location; the data at the memory location can be erased; the read data error corrected if necessary; and then the read data can be programmed and rewritten back to the same memory location it was read from. One or more layers of the non-volatile re-writeable memory can be fabricated BEOL as two-terminal cross-point memory arrays that are fabricated over a substrate including active circuitry fabricated FEOL. A portion of the active circuitry can be electrically coupled with the one or more layers of two-terminal cross-point memory arrays to perform data operations on the arrays, such as refresh in place operations or a read operation that triggers a refresh in place operation. The arrays can include a plurality of two-terminal memory cells.
    Type: Application
    Filed: December 18, 2009
    Publication date: August 5, 2010
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventor: David Eggleston
  • Publication number: 20100161888
    Abstract: An optimized data storage system including non-volatile re-writeable memory having both block program and erase and full or partial page write is disclosed. A memory controller of the system can use block data operations for large data transfers, and page data operations for small data transfers. Page data operations in the non-volatile re-writeable memory do not require block rewrites. One or more layers of the non-volatile re-writeable memory can be fabricated BEOL as two-terminal cross-point memory arrays that are fabricated over a substrate including active circuitry fabricated FEOL. Some or all of the active circuitry can be electrically coupled with the one or more layers of two-terminal cross-point memory arrays to perform data operations on the arrays, such as the block program and block erase and/or full or partial page writes. The arrays can include a plurality of two-terminal memory cells.
    Type: Application
    Filed: December 18, 2009
    Publication date: June 24, 2010
    Applicant: UNITY SEMICONDUCTOR CORPORATION
    Inventor: David Eggleston