Abstract: The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.

Abstract: A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.

Abstract: This invention provides a system and method for determining position of a viewed object in three dimensions by employing 2D machine vision processes on each of a plurality of planar faces of the object, and thereby refining the location of the object. First a rough pose estimate of the object is derived. This rough pose estimate can be based upon predetermined pose data, or can be derived by acquiring a plurality of planar face poses of the object (using, for example multiple cameras) and correlating the corners of the trained image pattern, which have known coordinates relative to the origin, to the acquired patterns. Once the rough pose is achieved, this is refined by defining the pose as a quaternion (a, b, c and d) for rotation and a three variables (x, y, z) for translation and employing an iterative weighted, least squares error calculation to minimize the error between the edgelets of trained model image and the acquired runtime edgelets.

Abstract: An effervescent tablet that includes from about 20% by weight to about 80% by weight effervescent agent that includes an acid and a base, from about 5% by weight to about 25% by weight a first binder, and at least 0.1% by weight oil component that includes at least one of a fatty acid comprising an alkyl chain having at least 10 carbon atoms, safflower oil, canola oil, sunflower oil, flax seed oil, and wheat germ oil, the tablet having a hardness of at least 2 kiloponds. The tablet optionally includes from about 2% by weight to about 20% by weight of a component (e.g. Aspartame) that is insoluble in water, slightly soluble in water, or sparingly soluble in water or exhibits delayed solubility in water.

Abstract: A magnesia-carbon brick comprised of about 50 to about 95% by weight magnesia and about 1 to about 20% by weight carbon, with or without metallic additions, such that the chemical analysis of the mixture of aggregates used in the brick will comprise, by chemical analysis, about 2 to about 15% SiO2, about 3 to about 50% Al2O3, and about 50 to about 95% MgO.

Abstract: This invention provides a system and method for runtime determination (self-diagnosis) of camera miscalibration (accuracy), typically related to camera extrinsics, based on historical statistics of runtime alignment scores for objects acquired in the scene, which are defined based on matching of observed and expected image data of trained object models. This arrangement avoids a need to cease runtime operation of the vision system and/or stop the production line that is served by the vision system to diagnose if the system's camera(s) remain calibrated. Under the assumption that objects or features inspected by the vision system over time are substantially the same, the vision system accumulates statistics of part alignment results and stores intermediate results to be used as indicator of current system accuracy. For multi-camera vision systems, cross validation is illustratively employed to identify individual problematic cameras.

Abstract: Digital image processing methods are applied to an image of a semiconductor interconnection pad to preprocess the image prior to an inspection or registration. An image of a semiconductor pads exhibiting spatial patterns from structure, texture or features are filtered without affecting features in the image not associated with structure or texture. The filtered image is inspected in a probe mark inspection operation.

Abstract: A magnesia-carbon brick comprised of about 50 to about 95% by weight magnesia and about 1 to about 20% by weight carbon, with or without metallic additions, such that the chemical analysis of the mixture of aggregates used in the brick will comprise, by chemical analysis, about 2 to about 15% SiO2, about 3 to about 50% Al2O3, and about 50 to about 95% MgO.

Abstract: A vision system is provided to determine a positional relationship between a semiconductor wafer on a platen and an element on a processing machine, such as a printing screen, on a remote side of the semiconductor wafer from the platen. A source directs ultraviolet light through an aperture in the platen to illuminate the semiconductor wafer and cast a shadow onto the element adjacent an edge of the semiconductor wafer. A video camera produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. The edge of the semiconductor wafer in the image is well defined by a dark/light transition.

Abstract: A method and apparatus is provided for illuminating a wafer during wafer alignment using machine vision. An illumination device is fabricated using electroluminescent material, that provides diffuse illumination uniformly over the surface of the lamp to provide backlighting of the wafer. Contrast between the image of the wafer and the diffuse illumination produce edge features in the image that can be analyzed to determine the position and orientation of the wafer.

Abstract: A vision system is provided to determine a positional relationship between a photovoltaic device wafer on a platen and a printing element, such as a printing screen, on a remote side of the photovoltaic device wafer from the platen. A source emits ultraviolet light along a path that is transverse to a longitudinal axis of an aperture through the platen, and a diffuser panel is located along that path. A reflector directs the light from the diffuser panel toward the aperture. A video camera is located along the longitudinal axis of the aperture and produces an image using light received from the platen aperture, wherein some of that received light was reflected by the wafer. A band-pass filter is placed in front of the camera to block ambient light. The use of diffused ultraviolet light enhances contrast in the image between the wafer and the printing element.

Abstract: This invention provides a system and method for determining position of a viewed object in three dimensions by employing 2D machine vision processes on each of a plurality of planar faces of the object, and thereby refining the location of the object. First a rough pose estimate of the object is derived. This rough pose estimate can be based upon predetermined pose data, or can be derived by acquiring a plurality of planar face poses of the object (using, for example multiple cameras) and correlating the corners of the trained image pattern, which have known coordinates relative to the origin, to the acquired patterns. Once the rough pose is achieved, this is refined by defining the pose as a quaternion (a, b, c and d) for rotation and a three variables (x, y, z) for translation and employing an iterative weighted, least squares error calculation to minimize the error between the edgelets of trained model image and the acquired runtime edgelets.

Abstract: The invention provides, in some aspects, a wafer alignment system comprising an image acquisition device, an illumination source, a rotatable wafer platform, and an image processor that includes functionality for mapping coordinates in an image of an article (such as a wafer) on the platform to a “world” frame of reference at each of a plurality of angles of rotation of the platform.

Abstract: A refractory brick, comprised of a refractory material having about 55% to about 96% by weight magnesia particles or magnesia particles containing spinel precipitates, about 3% to about 20% by weight fine zirconia particles having a particle size less than 35 Tyler mesh (less than 425 ?m), and about 1% to about 25% of a material selected from the group consisting of coarse zirconia, coarse spinel, coarse alumina-zirconia, and combinations thereof.

Abstract: An efficient and reliable method and apparatus is disclosed that finds a reference point of an object profile within an image when the object is of an unknown size. The object profile is modeled using a synthetic labeled-projection model, which in conjunction with the image, is projected over a portion of the image of the object profile to derive a histogram. The histogram is normalized and a maximum of a first derivative of the histogram is defined for that position. The position of the labeled-projection model is moved relative to the image, and the process is repeated until a selected portion of the image has been examined. The first derivative of the normalized labeled projection is greatest when a feature of the image and the feature denoted by a specific synthetic label of the labeled-projection model are aligned. The method and apparatus can locate the center of the object with reliability, because use of the labeled-projection model and the histogram minimizes the * effects of image artifacts.

Abstract: A system and method for analyzing 3D captured image data of scanned surfaces to locate object of interest, such as solder balls. A 3D model is created of an object of interest, the 3D model including weighted “don't care” areas where a match is not required. The 3D models which are used include geometric shapes, including a frustum, and models created from actual 3D image data of real objects. The 3D captured image data is processed to locate objects matching the 3D models, including processing by normalized correlation. Once the objects are located, the system selects data points within the 3D captured image data that are a predetermined distance away from the located objects. These data points are analyzed to determine a surface plane which fits the selected data points, thereby locating the surface in the 3D capture image data.

Abstract: During statistical training and automated inspection of objects by a machine vision system, a General Affine Transform is advantageously employed to improve system performance. During statistical training, the affine poses of a plurality of training images are determined with respect to an alignment model image. Following filtering to remove high frequency content, the training images and their corresponding affine poses are applied to an affine transformation. The resulting transformed images are accumulated to compute template and threshold images to be used for run-time inspection. During run-time inspection, the affine pose of the run-time image relative to the alignment model image is determined. Following filtering of the run-time image, the run-time image is affine transformed by its affine pose. The resulting transform image is compared with the template and threshold images computed during statistical training to determine object status.

Abstract: Inspection of solder paste on a printed circuit board using a before printing image (pre-application image) to normalize an after printing image (post-application image) of the printed circuit board. Existing lighting and optics used for alignment of the screen-printing stencil to the printed circuit board are used for the solder paste inspection. An embodiment is described wherein pad regions of the printed circuit board are inspected for information about the solder paste applied on the pad regions of the printed circuit board. A stencil in the screen printing process is also inspected using a before printing image (pre-application) to normalize an after printing image (post-application) of the stencil.

Abstract: A method is provided for determining a calibration relationship between a reference frame of motion of an object and a reference frame of a camera that generates images of the object. The method includes the steps of coupling a target to an object and placing the object at each of plural locations and orientations that are known with respect to the motion reference frame of the object. The location of the target(s) with respect to the object need not be known. An image of the object and target is generated while the object is at each of those locations/orientations. From each those images, the method determines the location/orientation of the target with respect to the reference frame of the camera.

Abstract: During statistical training and automated inspection of objects by a machine vision system, a General Affine Transform is advantageously employed to improve system performance. During statistical training, the affine poses of a plurality of training images are determined with respect to an alignment model image. Following filtering to remove high frequency content, the training images and their corresponding affine poses are applied to an affine transformation. The resulting transformed images are accumulated to compute template and threshold images to be used for run-time inspection. During run-time inspection, the affine pose of the run-time image relative to the alignment model image is determined. Following filtering of the run-time image, the run-time image is affine transformed by its affine pose. The resulting transform image is compared with the template and threshold images computed during statistical training to determine object status.