Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

Abstract: Methods, apparatuses, and computer-readable media for compressing data for storage or transmission. Input data is compressed in a first stage utilizing a first compression algorithm and the frequencies of occurrence of symbols and symbol pairs in the output from the first stage is calculated. The output from the first stage is then encoded to a final compressed bit string in a second stage utilizing a second compression algorithm based on the calculated frequencies of occurrence of the symbols and the symbol pairs.

Abstract: Systems and methods presented herein provide for mitigating errors in a storage device. In one embodiment, a storage system includes a storage device comprising a plurality of storage areas operable to store data, and a controller operable to evaluate operating conditions of the storage device, to perform a background scan on a first of the storage areas to characterize a read retention of the first storage area, and to adjust a read signal of the first storage area based on the characterized read retention and the operating conditions of the storage device.

Abstract: Systems, methods and computer-readable memory for garbage collection in a storage device. One method comprises, upon a write of data to a first garbage collection unit (GCU) of the storage device, incrementing a number of logical mapping units stored in the first GCU along with a number of logical mapping units with valid data stored in the first GCU. A number of logical mapping units with invalid data stored in a second GCU is decremented based on the incremented number of logical mapping units with valid data stored in the first GCU. The second GCU is erased when a valid data rate of the second GCU is below a valid data rate of the first GCU.

Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

Abstract: An apparatus may include a circuit configured to determine a first encoded address is in a bitwise range of addresses, determine a first physical address in a storage memory from the first encoded address using bitwise mapping and retrieve first data from the first physical address in the storage memory. The circuit may further be configured to determine a second encoded address is in an offset linear range of addresses, determine a second physical address in the storage memory from the second encoded address using offset linear mapping and write second data to the second physical address in the storage memory.

Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

Abstract: Systems, devices, and methods are presented that allow a data channel to adaptively vary a change in a reference voltage used to read data from a solid state memory. The change in the reference voltage may be determined based on a measured error statistic of the solid state memory. A hard decision low density parity check (HLDPC) decoder may be utilized in conjunction with a soft decision low density parity check (SLDPC).

Abstract: A memory controller manages memory access operations through a flash memory interface of a memory array of a solid-state storage device connected to a host. The memory controller executes a first memory access operation in the memory array. The first memory access operation has a first priority. The memory controller detects a suspending memory access operation available for execution in the memory array and having a higher priority than the first priority. The detection operation distinguishes between suspending memory access operations and non-suspending memory access operations. The memory controller suspends execution of the first memory access operation in the memory array and executes one or more memory access operations having higher priorities than the first priority and being available for execution in the memory array. The memory controller resumes the execution of the first memory access operation in the memory array.

Abstract: A memory controller manages memory access operations through a flash memory interface of a memory array of a solid-state storage device connected to a host. The memory controller executes a first memory access operation in the memory array. The first memory access operation has a first priority. The memory controller detects a suspending memory access operation available for execution in the memory array and having a higher priority than the first priority. The detection operation distinguishes between suspending memory access operations and non-suspending memory access operations. The memory controller suspends execution of the first memory access operation in the memory array and executes one or more memory access operations having higher priorities than the first priority and being available for execution in the memory array. The memory controller resumes the execution of the first memory access operation in the memory array.

Abstract: Apparatus and method for reducing read disturbed data in a non-volatile memory (NVM). Read operations applied to a first location in the NVM are counted to accumulate a read disturb count (RDC) value. Once the RDC value reaches a predetermined threshold, a flag bit is set and a first bit error statistic (BES) value is evaluated. If acceptable, the RDC value is reduced and additional read operations are applied until the RDC value reaches the predetermined threshold a second time. A second BES value is evaluated and data stored at the first location are relocated if an unacceptable number of read errors are detected by the second BES value. Different thresholds are applied to the first and second BES values so that fewer read errors are acceptable during evaluation of the second BES value as compared to the first BES value.

Abstract: Systems, devices, and methods are presented that allow a data channel to adaptively vary a change in a reference voltage used to read data from a solid state memory. The change in the reference voltage may be determined based on a measured error statistic of the solid state memory. A hard decision low density parity check (HLDPC) decoder may be utilized in conjunction with a soft decision low density parity check (SLDPC).

Abstract: Systems and methods presented herein provide for testing degradation in a storage device. In one embodiment, a storage controller is operable to test individual portions of a first of the plurality of storage areas of the storage device by: analyzing individual portions of the first storage area; determining that one or more of the individual portions of the first storage area have failed; and retire the failed one or more portions of the first storage area. The storage controller is further operable to write to the first storage area using an error correction code (ECC), and to test the remaining portions of the first storage area to determine whether the first storage area should be retired in response to writing to the first storage area.

Abstract: A method operable with a storage system comprises processing an Input/Output (I/O) request to a storage device, extracting a logical mapping unit from the I/O request, determining that the I/O request is for variable length data, and accessing a map that links the logical mapping unit to one or more physical addresses of the storage device. The method also comprises calculating a number of physical mapping units at the physical addresses to service the I/O request.

Abstract: A device may include a SSD having multiple storage units and a deduplication control circuit configured to determine whether selected data content to be stored is a duplicate of previous data content already in a first buffer of data buffered to be stored in a set of storage units. The deduplication circuit may be further configured to, based on a determination that the selected data content is a duplicate of first previous data content already buffered in the first buffer, instead of buffering another copy of the selected data content, buffer a first header including a first pointer that associates the first header with the first previous data content already buffered in the first buffer. The deduplication circuit may also be configured to reorder the first buffer such that individual data contents in the first buffer are grouped near headers associated with the individual data contents.

Abstract: Systems and methods presented herein provide for open block handling of an SSD. In one embodiment, an SSD includes a buffer, and an MLC flash device. The SSD also includes a controller operable to write data in the buffer based on an Input/Output (I/O) request (e.g., from a host), to begin copying the data from the buffer to a block of the MLC flash device, to copy a portion of the data associated with open word lines of the block to another location in the buffer after a power cycle, and to update a lookup table for the copied portion of the data with the other location so that the copied portion of the data can be accessed via a subsequent I/O request.

Abstract: Systems and methods presented herein provide for open block handling of an SSD. In one embodiment, an SSD includes a buffer, and an MLC flash device. The SSD also includes a controller operable to write data in the buffer based on an Input/Output (I/O) request (e.g., from a host), to begin copying the data from the buffer to a block of the MLC flash device, to copy a portion of the data associated with open word lines of the block to another location in the buffer after a power cycle, and to update a lookup table for the copied portion of the data with the other location so that the copied portion of the data can be accessed via a subsequent I/O request.

Abstract: Apparatus and method for reducing read disturbed data in a non-volatile memory (NVM). Read operations applied to a first location in the NVM are counted to accumulate a read disturb count (RDC) value. Once the RDC value reaches a predetermined threshold, a flag bit is set and a first bit error statistic (BES) value is evaluated. If acceptable, the RDC value is reduced and additional read operations are applied until the RDC value reaches the predetermined threshold a second time. A second BES value is evaluated and data stored at the first location are relocated if an unacceptable number of read errors are detected by the second BES value. Different thresholds are applied to the first and second BES values so that fewer read errors are acceptable during evaluation of the second BES value as compared to the first BES value.

Abstract: Systems and methods presented herein provide for open block handling of an SSD. In one embodiment, an SSD includes a buffer, and an MLC flash device. The SSD also includes a controller operable to write data in the buffer based on an Input/Output (I/O) request (e.g., from a host), to begin copying the data from the buffer to a block of the MLC flash device, to copy a portion of the data associated with open word lines of the block to another location in the buffer after a power cycle, and to update a lookup table for the copied portion of the data with the other location so that the copied portion of the data can be accessed via a subsequent I/O request.

Abstract: Methods and apparatus are provided for improved iterative error-erasure decoding. A signal is decoded by obtaining a plurality of symbols associated with the signal and one or more corresponding reliability values; generating at least one erasure list comprised of L symbols and at least one shortened erasure list comprised of L? symbols, where L? is less than L; and constructing an erasure set by taking erasures from at least one of the erasure list and the shortened erasure list. A signal is also processed by generating one or more reliability values using a soft-output detector; generating an erasure list of symbols by comparing the reliability values to at least one reliability threshold value (or by sorting); and performing error erasure decoding using the erasure list. The size of the erasure list can optionally be adjusted using feedback information.