Abstract: An optical device for illuminating a sample located in a sample volume with illumination light and for detecting scattered and/or fluorescent light from the sample includes an optical illumination assembly, an optical detection assembly and at least one attachment element. The optical illumination assembly is configured to transmit the illumination light along an illumination path into the sample volume. The optical detection assembly is configured to collect and relay the scattered and/or fluorescent light from the sample volume along a detection path. At least portions of the illumination path and/or of the detection path extend in the at least one attachment element.

Abstract: A method for manipulating at least one beam path in a microscope includes ascertaining a refractive index of a sample arranged in a sample volume and/or of an optical medium arranged in the sample volume. At least one microscope parameter is set in dependence on the ascertained refractive index for manipulating the beam path.

Abstract: A light sheet microscope for simultaneous imaging of several object planes illuminated by a light sheet includes a camera and a detection optic defining a detection light beam between the light sheet and the camera. The object planes are arranged around the focal plane of the detection optic. The detection optic can include a microlens array.

Abstract: An illumination arrangement for a light sheet microscope, in which a sample is illuminated using an illumination light beam that is formed as a light sheet in a region of the sample, includes an illumination objective, a tube lens and astigmatic optics. The astigmatic optics are designed in such a way and arranged between the tube lens and the illumination objective in such a way that the illumination light beam exiting from the illumination objective is focused both in a sagittal plane and in a meridional plane.

Abstract: A method for adjusting a focus of an optical system includes focusing measurement light in a sample space using an optical arrangement. The measurement light is transmitted on a sample side of the optical arrangement through at least one optical medium. The measurement light reflected by a reflector and transmitted through a further optical arrangement is detected using a detector arrangement. A working distance between the optical arrangement and the reflector is ascertained based on the measurement light detected by the detector, wherein a focus of the measurement light lies on the reflector for the working distance.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a width of an image of the illumination strip projected into the detection plane.

Abstract: A microscope system includes a light sheet microscopy functional unit and at least one further light microscopy functional unit. The light sheet microscopy functional unit has an illumination objective which is formed by a first objective and a detection objective which is formed by a separate second objective. The at least one further light microscopy functional unit comprises a detection objective that is formed by the second objective.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: A method for producing a preview image with an inclined-plane microscope with a tilted illumination plane include illuminating, at successive points in time, different illumination planes, which are tilted relatively to an optical axis of an optical viewing element and spaced apart from one another. The illumination planes are imaged onto a sensor with photosensitive elements arranged line-by-line. The preview image is produced by successively reading out strip-type read-out areas of the sensor, a longitudinal extension of the read-out areas being oriented parallel to the lines of the photosensitive elements, such that the preview image reproduces a viewing plane perpendicular to the optical axis of the optical viewing element.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a longitudinal extent of an image of the illumination strip projected into the detection plane.

Abstract: A lightsheet microscope includes a detection objective for imaging a target region of a sample located in a focal plane, and an illumination objective for focusing an illumination light beam. The illumination objective and the detection objective define a sample chamber, in which a sample holder having a carrier surface is arranged. A light deflection device has a deflection surface arranged laterally offset in relation to the optical axis of the detection objective in the sample chamber which deflects the illumination light beam through the illumination objective in a direction perpendicular to the optical axis such that the deflected illumination light beam forms a lightsheet-type illumination light distribution. The light deflection device has a collision section facing toward the carrier surface. The carrier surface is inclined relative to the focal plane at a predetermined angle such that a part of the carrier surface is arranged in the focal plane.

Abstract: A light sheet microscope includes a specimen-side objective having an illumination device configured to provide a first illumination beam which is focused for forming a first light sheet for illuminating a specimen from a first direction, the first light sheet being inclined obliquely in relation to an optical axis of the objective and being guided through the objective. A detector is configured to detect light passing through the objective. The illumination device is further configured to provide at least one second illumination beam which is focused for forming at least one second light sheet for illuminating the specimen from at least one second direction that differs from the first direction, the at least one second light sheet being inclined obliquely in relation to the optical axis of the objective and being guided through the objective.

Abstract: An illumination arrangement for a microscope includes an illumination input configured to inject an illumination beam bundle and an illumination output configured to output at least two partial beam bundles generated from the illumination beam bundle. At least one diffractive optical element is configured to split the illumination beam bundle into the at least two partial beam bundles that propagate along partial beam paths, and is configured to effect a relative change in respective propagation directions of the at least two partial beam bundles with respect to one another, such that the at least two partial beam bundles output by the illumination arrangement are non-collinear with respect to one another at the illumination output.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.

Abstract: A light microscope includes a scan illumination unit, which is designed to illuminate a specimen having a line focus produced by an illumination light beam and moved transversely to a light propagation direction. A descanned detection unit is designed to produce a stationary first line image of a target region from detection light that originates from a target region of the specimen illuminated with the moving line focus. The scan illumination unit and the descanned detection unit have a common objective, which is designed to receive both the illumination light beam and the detection light. The descanned detection unit contains a dispersive element, which is designed to spectrally split the detection light in order to generate multiple second line images, corresponding to the first line image, with different spectral compositions.

Abstract: The invention relates to a method for examining a sample. The method is distinguished by the fact that the sample is illuminated with an illumination light beam in each case simultaneously in a plurality of mutually different sample planes in each case along an illumination line, and wherein each sample region illuminated along an illumination line is scanned in each case with a dedicated detection PSF and the detection light emanating from the illuminated sample regions is detected simultaneously and spatially separately from one another. The invention additionally relates to a microscope, in particular for performing such a method.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: An illumination apparatus for a microscope, for producing a de-excitation or switching light distribution, includes a light source configured to produce a primary illumination light beam and a beam splitter configured to divide the primary illumination light beam into two partial illumination light beams. An illumination objective is configured to focus the partial illumination light beams onto and/or into a sample such that the partial illumination light beams extend, spatially separated from one another, through an entry pupil of the illumination objective and are spatially superposed on and/or in the sample after passing through the illumination objective. A phase influencer is configured to cause a relative phase offset of the partial illumination light beams with respect to one another in such a way that the partial illumination light beams in the entry pupil of the illumination objective have a phase offset of ?.

Abstract: A light sheet microscope or a confocal microscope includes illumination optics configured to transmit light of at least two wavelengths from at least one light source, along respective wavelength-dependent beam paths, from an illumination side of the illumination optics to a specimen side of the illumination optics. A lateral chromatic correction system comprising at least one optical lateral chromatic correction element is configured such that the beam paths of the at least two different wavelengths have, at a specimen-side output of the lateral chromatic correction element, an offset parallel to each other and/or are inclined relative to each other in relation to the illumination side, which, on the specimen side of the illumination optics, results in an offset of the foci of the at least two wavelengths transverse to an optical axis of the illumination optics.