Abstract: A microscope includes illumination optics for fluorescence excitation of point light sources of a sample, detection optics and a camera having a sensor. A density of the point light sources is kept low so as to minimize a crossover of point light sources that are behind or close to one another in each image captured by the camera. A means for subdividing a detection aperture into individual sub-apertures is provided in a beam path of the detection optics such that images generated by the individual sub-apertures on the sensor of the camera depict an object volume from different spatial directions.

Abstract: A method for the examination of a sample includes illuminating the sample in a sample plane along a sample line with an illuminating light beam. The sample is acted upon by a depletion or switching light beam, which overlaps in the sample plane in an overlap region with the illuminating light beam. Part of fluorescent light emanating from the sample plane is detected as detection light originating from a first subregion of the overlap region, in which the probability of an interaction of the sample molecules with the depletion or switching light beam is greater than 90%, and/or originating from a second subregion which is at least partially surrounded by the first sub-region and/or in which the depletion or switching light beam has a zero point, while at the same time the fluorescent light originating from outside the first subregion and the second subregion is suppressed and not detected.

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illumination beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-like illumination light distribution illuminating the sample in a partial area from the illumination beam. A detection unit has a detector which is designed to capture detection light originating from the partial area of the sample illuminated with the illumination light distribution. The illuminator comprises a beam modulator adapted to illuminate the illumination beam along the illumination axis in such a way that light exposure of the partial area of the sample illuminated by the illumination light distribution varies along the illumination axis.

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illuminating beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-type illuminating light distribution illuminating the sample in one partial region. A detection unit has a detector that is designed to capture detection light originating from the section of the sample that is illuminated by the illuminating light distribution. An objective is provided for both the illuminator and the detection unit such that the objective is to be penetrated by the illuminating beam and the detection light. The illuminator has a beam modulator designed to modulate the illuminating beam perpendicular to the illumination axis.

Abstract: An optical arrangement for detecting scattered and/or fluorescence light in an inclined plane microscope includes an objective system with an optical axis configured to capture and transmit the scattered and/or fluorescence light from an object side to a tube side. A tube system, situated on the tube side of the objective system, having an optical axis is configured to focus the scattered and/or fluorescence light captured by the objective system in a virtual tube-detector plane. A plurality of optical lenses are arranged between the tube system and the virtual tube-detector plane. The plurality of optical lenses are configured to essentially simultaneously transmit the scattered and/or fluorescence light and focus the scattered and/or fluorescent light into a detector plane spaced apart from the virtual tube-detector plane. Each lens of the plurality of optical lenses has a lower numerical aperture (NA) than the tube system.

Abstract: A method for producing a preview image with an inclined-plane microscope with a tilted illumination plane include illuminating, at successive points in time, different illumination planes, which are tilted relatively to an optical axis of an optical viewing element and spaced apart from one another. The illumination planes are imaged onto a sensor with photosensitive elements arranged line-by-line. The preview image is produced by successively reading out strip-type read-out areas of the sensor, a longitudinal extension of the read-out areas being oriented parallel to the lines of the photosensitive elements, such that the preview image reproduces a viewing plane perpendicular to the optical axis of the optical viewing element.

Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

Abstract: A microscope for imaging a sample includes an illumination unit for emitting illumination light to the sample; a detector for capturing a detection light originating from the sample; an optical system for focusing the illumination light onto the sample and focusing the detection light onto the detector; and a scanning unit for scanning the sample using the illumination light. The illumination unit emits the illumination light as separate illumination light beams which can be focused on spatially mutually separated, strip-like sample regions simultaneously. The detector captures the detection light in the form of separate detection light beams originating from the sample regions simultaneously and in a spatially mutually separated manner. The sample regions are in sample planes, and the detector having sub-detectors, which are each assigned to a sample plane and capture a detection light beam that originates from a respective sample plane.

Abstract: The invention relates to a method for examining a sample. The method is distinguished by the fact that the sample is illuminated with an illumination light beam in each case simultaneously in a plurality of mutually different sample planes in each case along an illumination line, and wherein each sample region illuminated along an illumination line is scanned in each case with a dedicated detection PSF and the detection light emanating from the illuminated sample regions is detected simultaneously and spatially separately from one another. The invention additionally relates to a microscope, in particular for performing such a method.

Abstract: A method for examining a sample by light sheet microscopy includes illuminating a sample surface located in an illumination plane by a light sheet propagating in the illumination plane. A position of a light sheet focal point of the light sheet in the illumination plane is moved by changing an optical length of a light path of illumination light forming the light sheet. Detection light emanating from the illumination plane is detected.

Abstract: A method for examining a sample in light sheet fluorescence microscopy includes generating an illumination light beam using a light source. The illumination light beam is spatially split into at least two partial illumination light beams using a splitter. The partial illumination light beams are guided through an illumination objective shared by the partial illumination light beams. After the partial illumination light beams have passed through the illumination objective, at least one of the partial illumination light beams is deflected using at least one deflector such that the partial illumination light beams interfere with one another in an illumination plane so as to generate an illumination pattern in the illumination plane. An image of a sample region illuminated by the illumination pattern is produced, wherein detection light that emanates from the sample region reaches a position-sensitive detector through a detection objective.

Abstract: An illumination arrangement for a light sheet microscope, in which a sample is illuminated using an illumination light beam that is formed as a light sheet in a region of the sample, includes an illumination objective, a tube lens and astigmatic optics. The astigmatic optics are designed in such a way and arranged between the tube lens and the illumination objective in such a way that the illumination light beam exiting from the illumination objective is focused both in a sagittal plane and in a meridional plane.

Abstract: A microscope including an imaging objective for imaging a sample on a detector and means for illuminating the sample with a light sheet in the focus plane of the imaging objective. The illumination means includes an illumination source which emits coherent light, and Bessel optics which generate at least two plane waves from the light beam and give propagation directions for the plane waves. The propagation direction of each of the plane waves encloses an acute angle with the focus plane in each instance, the magnitude of the acute angle being identical for each of the plane waves, so that the plane waves undergo constructive interference in the focus plane so that a light sheet is generated. Similarly, the illumination means can also include an optical element by which a rotationally symmetric Bessel beam is generated from the light beam for dynamic generation of a light sheet.

Abstract: A light sheet microscope for simultaneous imaging of several object planes illuminated by a light sheet includes a camera and a detection optic defining a detection light beam between the light sheet and the camera. The object planes are arranged around the focal plane of the detection optic. The detection optic can include a microlens array.

Abstract: A method for analyzing a microscopic sample with a microscope includes illuminating at least a sub-region of the microscopic sample by illumination light. Detection light emanating from the microscopic sample is guided on a detection beam path, which includes at least one focusing optical element and which has a plurality of detection beam path branches, each with at least one detector element. The detector elements are parts of the same surface detector. By art adjusting element in at least a first one of the detection beam path branches, an optical path length of the first detection beam path branch is adjusted in such a way that the portion of the detection light guided on the first detection beam path branch is focused on the detector element of the first detection beam path branch.

Abstract: A method for single plane illumination microscopy (SPIM) analysis of a sample includes simultaneously illuminating multiple sample layers by a single sheet of light. Detection light emanating from the individual sample layers is detected at different times and/or at different positions in a detection beam path. The detection beam path is branched using beam splitters and an effective refractive power of the individual beam splitters is zero.

Abstract: A method for examining a sample includes illuminating the sample in an illumination plane along an illumination strip by an illuminating light beam which propagates along the illumination strip. The illumination strip is projected into a detection plane by detection light originating from the illumination strip being focused in the detection plane. The detection light is detected by a detector. The detector is formed as a slit detector, and the direction of a slit width of the slit detector is oriented at an angle different from zero degrees with respect to the direction of a longitudinal extent of an image of the illumination strip projected into the detection plane.

Abstract: The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Abstract: A microscope including an imaging objective for imaging a sample on a detector and means for illuminating the sample with a light sheet in the focus plane of the imaging objective. The illumination means includes an illumination source which emits coherent light, and Bessel optics which generate at least two plane waves from the light beam and give propagation directions for the plane waves. The propagation direction of each of the plane waves encloses an acute angle with the focus plane in each instance, the magnitude of the acute angle being identical for each of the plane waves, so that the plane waves undergo constructive interference in the focus plane so that a light sheet is generated. Similarly, the illumination means can also include an optical element by which a rotationally symmetric Bessel beam is generated from the light beam for dynamic generation of a light sheet.