Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

Abstract: The disclosed implementations provide for power reduction in microcontrollers by reactivating a clock in the microcontroller for one or more peripheral modules in response to an internal or external trigger event, thus allowing the one or more peripheral modules to respond to events while operating in a low-power sleep mode. In some implementations, one or more peripheral modules in a microcontroller provide a clock request signal to a clock generator in the microcontroller. In response to the clock request signal, the clock generator reactivates one or more oscillator sources. The clock generator resumes clock generation only for the one or more requesting peripheral modules, keeping power consumption in the microcontroller to a minimum and not disturbing other modules in the microcontroller.

Abstract: This document relates to apparatus and methods to store and retrieve trace information in on-chip system memory of microcontrollers. A microcontroller comprises a microprocessor and a memory device accessible through a data bus and an address bus coupled to the microprocessor. The microcontroller includes on-chip debug logic coupled to the microprocessor. Trace data can be retrieved from system memory using a debug port of the debug logic. A system in accordance with the present invention will lower the cost of implementation of trace features in microcontrollers, and strongly reduce the cost of supporting such features in debug tools.

Abstract: A system for debugging a device under test may include a processor register with a program count and a debug program register that receives the program count upon execution of an instruction by a processor. In one implementation, a microcontroller under test by a debugger is accessed using a serial interface, such as a JTAG interface. The interface can communicate directly with a debug register to retrieve program count values, both when the microcontroller is halted and when it is executing instructions. The polling interval to retrieve the program count values may be adjusted by a user of the debugger based on considerations such as bandwidth and accuracy. The microcontroller may transmit the program count value to the debug register from a processing register that is not accessible to the debugger.

Abstract: A system for configuring or testing memory may cycle a memory array while substantially concurrently performing other functional testing. In particular implementations, the system may configure, or cycle, a flash memory using a serial interface and test other functional units using the same serial interface substantially concurrently with cycling the flash memory. In some implementations, cycling the flash memory includes erasing and writing to the flash memory in specific patterns in order to dissipate charge that may have accumulated during a fabrication process.

Abstract: System and methods transfer data over a microcontroller system test interface. The system can read data from and write data to microcontroller system memory using the described method. The method provides for the efficient transfer of data, minimizing redundancies and overhead present in conventional microcontroller test system protocols.

Abstract: A system for debugging a device under test may include a processor register with a program count and a debug program register that receives the program count upon execution of an instruction by a processor. In one implementation, a microcontroller under test by a debugger is accessed using a serial interface, such as a JTAG interface. The interface can communicate directly with a debug register to retrieve program count values, both when the microcontroller is halted and when it is executing instructions. The polling interval to retrieve the program count values may be adjusted by a user of the debugger based on considerations such as bandwidth and accuracy. The microcontroller may transmit the program count value to the debug register from a processing register that is not accessible to the debugger.

Abstract: Methods and systems are provided for debugging a program executing on a processor. In a first implementation, a processing system includes a processor configured for switching to a debug mode from a non-debug mode upon executing a software breakpoint. The system may include a program memory configured to hold instructions for a program, where the software breakpoint replaces at least one of the instructions. The system may also include an instruction replacement register separate from the program memory that is configured to receive the replaced instruction from any of the processor and an external debugger. The system may further include a control component that controls whether the processor fetches a next instruction for execution from the program memory or from the instruction replacement register.

Abstract: A system and methods to transfer data between a testing interface and an IC. The system may include a synchronization subsystem to monitor the transitions of the test interface clock and/or IC clock to determine a clock adjustment appropriate to substantially synchronize the clocks. In certain implementations, a synchronization unit on an IC under test counts a predetermined number of transitions of an internal clock of an embedded device and generates a signal upon reaching a terminal count, which signal is received by a host controller associated with a JTAG test fixture. In such implementations, the host controller determines the number of IC clock cycles that occurred during the predetermined number of IC clock cycles and synthesizes a synchronized JTAG clock that is a integral fraction of the IC clock.

Abstract: A microcontroller is disclosed. The microcontroller includes a central processor unit (CPU) and a Flash program memory in communication with the CPU via an instruction bus. The microcontroller includes an on-chip debug (OCD) logic coupled to the CPU. The OCD logic containing logic that detects a zero opcode on an instruction bus between the CPU and the Flash program memory to provide a program breakpoint. This is an advantage over prior art in that any number of such breakpoints can be inserted into the Flash program memory, without requiring the memory to be erased. A system and method in accordance with the present invention provides a vastly improved support for program breakpoints in Flash program memory-based microcontrollers with a minimum increase in on-chip debug logic and complexity.

Abstract: A system and method for executing a sequential data memory access through a serial access port is provided. The system may include a memory access controller to receive a block access command and successively access data elements in the block. In certain implementations, a test device, such as a JTAG host, transmits a block read or write command specifying a start address and an increment value to an embedded device under test, whereupon a memory access controller in the embedded device sequentially accesses the data at the start address, increments the address by the increment value, accesses the data at the incremented address, and repeats this procedure to sequentially access each of the remaining data elements in the block.

Abstract: Writing to a page of flash memory may include receiving write commands that are substantially independent of an internal architecture of the flash memory. In certain embodiments, two operand flash commands are received at a flash controller from a remote controller. In various implementations, the writing process may further include translating each two-operand write command into architecture-dependent flash commands; executing the architecture-dependent flash commands to fill a page buffer associated with the flash memory; and subsequently transferring contents of the page buffer to the page of flash memory.